Search ResultsElectronic Resources
Switch to list view
Switch to thumbnail view
4 Results Found Subscribe to search results
0000DEFAULT
Print
Select a list
Make this your default list.
The following items were successfully added.
    There was an error while adding the following items. Please try again.
      Cover image for System-on-chip test architectures : nanometer design for testability
      1. 
      Cover image for System-on-chip test architectures nanometer design for testability
      2. 
      System-on-chip test architectures nanometer design for testability
      by 
      Wang, Laung-Terng.
      Click to View
      Format: 
      Excerpt: 
      Touba, Nur A.
      Cover image for VLSI test principles and architectures : design for testability
      3. 
      VLSI test principles and architectures : design for testability
      by 
      Wang, Laung-Terng, editor.
      ScienceDirect https://www.sciencedirect.com/science/book/9780123705976
      Format: 
      Excerpt: 
      , Kuen-Jong Lee, and Nur A. Touba -- Logic diagnosis / Shi-Yu Huang -- Memory testing and built-in self
      Cover image for Electronic design automation : synthesis, verification, and test
      4. 
      Electronic design automation : synthesis, verification, and test
      by 
      Wang, Laung-Terng.
      ScienceDirect http://www.sciencedirect.com/science/book/9780123743640
      Format: 
      Excerpt: 
      of CMOS design / Xinghao Chen and Nur A. Touba -- Ch. 3. Design for testability / Laung-Terng Wang
      Go to:Search Results
      |
      Search Facets
      |
      Top of Page