Search ResultsElectronic Resources
by
Bhushan, Bharat. editor.
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Lateral Forces in Cantilevers used in Atomic Force Microscopy -- Biomedical Sensing with the Atomic Force
by
Zhu, Pu, author.
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the materials used and printed samples were characterized using optical microscopy, rheometry, atomic
by
Dunlap, Bret Elliott, author.
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for microindentations and atomic force microscopy (AFM) for nanoindentations. The single crystal
by
Fei, Xing, author.
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investigated by Atomic Force Microscopy were in good agreement with the bulk rheology data. It can be concluded
by
Fairfield, Daniel Joseph, author. (orcid)0000-0001-5880-2055
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atomic force microscopy and transmission electron microscopy, perovskite crystallite sizes were observed
by
Gao, Kai, author.
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with Fourier transform infrared spectroscopy (FTIR) and atomic force microscopy (AFM). Static contact





