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      by 
      Li, Shin Hwa.
      Format: 
      Excerpt: 
      ); VII. Atomic Force Microscopy; VIII. Four-Point Probe; References.
      by 
      Ismail, Fauzi.
      Format: 
      Excerpt: 
      Microscopy (SEM) -- 3.2.2. Transmission Electron Microscopy (TEM) -- 3.2.3. Atomic Force Microscopy (AFM
      by 
      Silva Clerici, Maria Teresa Pedrosa.
      Format: 
      Excerpt: 
      Scanning Microscopy -- 2.4.4 Atomic Force Microscopy -- 2.4.5 Differential Scanning Calorimetry -- 2.4.6
      by 
      Nalwa, Hari Singh, 1954-
      Format: 
      Excerpt: 
      with Friction Force Microscopy. M.J. Yacaman and J.A. Ascencia, Electron Microscopy Techniques Applied
      by 
      Karak, Niranjan.
      Format: 
      Excerpt: 
      Microscopy -- 2.5.1.8. Atomic Force Microscopy -- 2.5.1.9. Zeta Sizer -- 2.5.1.10. Dynamic Light Scattering
      by 
      Yaragalla, Srinivasarao.
      Format: 
      Excerpt: 
      -Ray Diffraction -- 6.8.2 Raman Spectroscopy -- 6.8.3 Atomic Force Microscopy -- 6.8.4 Nanoindentation -- 6.8.5 Pin
      by 
      Herk, Alex van.
      Format: 
      Excerpt: 
      239 9.7.1 Optical Microscopy (OM) 239 9.7.2 Atomic Force Microscopy (AFM) 240 9.7.3 Electron
      by 
      Park, Soojin.
      Format: 
      Excerpt: 
      -- 3.3.5.2. Wicking Method -- 3.3.5.3. Sessile Drop Method -- 3.3.5.4. Atomic Force Microscopy Method