Search Results for Electron microscopy. - Narrowed by: Beanland, R. SirsiDynix Enterprise http://katalog.baskent.edu.tr/client/en_US/default/default/qu$003dElectron$002bmicroscopy.$0026qf$003dAUTHOR$002509Author$002509Beanland$00252C$002bR.$002509Beanland$00252C$002bR.$0026ps$003d300;jsessionid=97F0E2A0939025F47012266C2B4A8FF3? 2026-01-17T10:59:35Z Electron microscopy and analysis ent://SD_ILS/0/SD_ILS:924737 2026-01-17T10:59:35Z 2026-01-17T10:59:35Z by&#160;Goodhew, Peter J.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=168520">Click to View</a><br/>Format:&#160;Electronic Resources<br/>