Search Results for Electronic apparatus and appliances. - Narrowed by: EnglishSirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/en_US/default/default/qu$003dElectronic$002bapparatus$002band$002bappliances.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ps$003d300?dt=list2026-09-20T09:30:59ZE-wasteent://SD_ILS/0/SD_ILS:11349552026-09-20T09:30:59Z2026-09-20T09:30:59Zby Barker, David, 1959- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5262225">Click to View</a><br/>Format: Electronic Resources<br/>A designer's guide to built-in self-testent://SD_ILS/0/SD_ILS:10624372026-09-20T09:30:59Z2026-09-20T09:30:59Zby Stroud, Charles E.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3035650">Click to View</a><br/>Format: Electronic Resources<br/>ESD basics from semiconductor manufacturing to useent://SD_ILS/0/SD_ILS:10008982026-09-20T09:30:59Z2026-09-20T09:30:59Zby Voldman, Steven H.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1021727">Click to View</a><br/>Format: Electronic Resources<br/>The hardware hacker : adventures in making and breaking hardwareent://SD_ILS/0/SD_ILS:11245902026-09-20T09:30:59Z2026-09-20T09:30:59Zby Huang, Andrew, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4826919">Click to View</a><br/>Format: Electronic Resources<br/>Unscrewed salvage and reuse motors, gears, switches, and more from your old electronicsent://SD_ILS/0/SD_ILS:9797602026-09-20T09:30:59Z2026-09-20T09:30:59Zby Sobey, Edwin J. C., 1948-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=716236">Click to View</a><br/>Format: Electronic Resources<br/>Electronic devicesent://SD_ILS/0/SD_ILS:11607812026-09-20T09:30:59Z2026-09-20T09:30:59Zby Floyd, Thomas L..<br/>Format: Books<br/>Electronic devices and circuitsent://SD_ILS/0/SD_ILS:1335022026-09-20T09:30:59Z2026-09-20T09:30:59Zby Millman, Jacob, 1911-<br/>Format: Books<br/>Semiconductors and semimetals. III-nitride electronic devices. : Volume 102ent://SD_ILS/0/SD_ILS:11486032026-09-20T09:30:59Z2026-09-20T09:30:59Zby Chu, Rongming, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5963013">Click to View</a><br/>Format: Electronic Resources<br/>Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examplesent://SD_ILS/0/SD_ILS:10872692026-09-20T09:30:59Z2026-09-20T09:30:59Zby Karris, Steven T.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3384198">Click to View</a><br/>Format: Electronic Resources<br/>Electronic components and processesent://SD_ILS/0/SD_ILS:10583542026-09-20T09:30:59Z2026-09-20T09:30:59Zby Maheshwari, Preeti.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3017401">Click to View</a><br/>Format: Electronic Resources<br/>Experiments in electronic devices to accompany Floyd's Electronic devices and Electronic devices, electron-flow versionent://SD_ILS/0/SD_ILS:11547832026-09-20T09:30:59Z2026-09-20T09:30:59Zby Berlin, Howard M..<br/>Format: Books<br/>Electronic systemsent://SD_ILS/0/SD_ILS:11834142026-09-20T09:30:59Z2026-09-20T09:30:59Zby Bolton, W. (William), 1933-<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780408106597">https://www.sciencedirect.com/science/book/9780408106597</a><br/>Format: Electronic Resources<br/>Electronic components, tubes and transistorsent://SD_ILS/0/SD_ILS:11769122026-09-20T09:30:59Z2026-09-20T09:30:59Zby Dummer, G. W. A. (Geoffrey William Arnold)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080106311">http://www.sciencedirect.com/science/book/9780080106311</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781483200255">http://www.sciencedirect.com/science/book/9781483200255</a><br/>Format: Electronic Resources<br/>The use of ferrites at microwave frequenciesent://SD_ILS/0/SD_ILS:11771932026-09-20T09:30:59Z2026-09-20T09:30:59Zby Thourel, L. (Léo)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080137971">https://www.sciencedirect.com/science/book/9780080137971</a><br/>Format: Electronic Resources<br/>Guide to state-of-the-art electron devicesent://SD_ILS/0/SD_ILS:10089692026-09-20T09:30:59Z2026-09-20T09:30:59Zby Burghartz, Joachim N.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1129774">Click to View</a><br/>Format: Electronic Resources<br/>Test & measurement catalog, 1993ent://SD_ILS/0/SD_ILS:12214362026-09-20T09:30:59Z2026-09-20T09:30:59Zby Hewlett-Packard Company<br/>Format: Books<br/>The Power supply handbookent://SD_ILS/0/SD_ILS:11987852026-09-20T09:30:59Z2026-09-20T09:30:59ZFormat: Books<br/>Encapsulation technologies for electronic applicationsent://SD_ILS/0/SD_ILS:11429992026-09-20T09:30:59Z2026-09-20T09:30:59Zby Ardebili, Haleh, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5548870">Click to View</a><br/>Format: Electronic Resources<br/>Thermal management of electronics. Volume 1, Phase-change-based materials in composite heat sinks-an experimental approachent://SD_ILS/0/SD_ILS:11457322026-09-20T09:30:59Z2026-09-20T09:30:59Zby Baby, Rajesh, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5742317">Click to View</a><br/>Format: Electronic Resources<br/>Multiscreen UX design : developing for a multitude of devicesent://SD_ILS/0/SD_ILS:11046902026-09-20T09:30:59Z2026-09-20T09:30:59Zby Nagel, Wolfram, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4202723">Click to View</a><br/>Format: Electronic Resources<br/>Parts selection and managementent://SD_ILS/0/SD_ILS:9307112026-09-20T09:30:59Z2026-09-20T09:30:59Zby Pecht, Michael.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=226555">Click to View</a><br/>Format: Electronic Resources<br/>Modeling, analysis, design, and tests for electronics packaging beyond Mooreent://SD_ILS/0/SD_ILS:11488842026-09-20T09:30:59Z2026-09-20T09:30:59Zby Zhang, Hengyun, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5979313">Click to View</a><br/>Format: Electronic Resources<br/>Battery power management for portable devicesent://SD_ILS/0/SD_ILS:10207912026-09-20T09:30:59Z2026-09-20T09:30:59Zby Barsukov, Yevgen, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1455534">Click to View</a><br/>Format: Electronic Resources<br/>Reliability technology principles and practice of failure prevention in electronic systemsent://SD_ILS/0/SD_ILS:9751502026-09-20T09:30:59Z2026-09-20T09:30:59Zby Pascoe, Norman.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=675299">Click to View</a><br/>Format: Electronic Resources<br/>Environmental testing techniques for electronics and materialsent://SD_ILS/0/SD_ILS:11769132026-09-20T09:30:59Z2026-09-20T09:30:59Zby Dummer, G. W. A. (Geoffrey William Arnold)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080135144">http://www.sciencedirect.com/science/book/9780080135144</a><br/>Format: Electronic Resources<br/>Components, packaging and manufacturing technology II : selected, peer reviewed papers from the 2013 3rd International Conference on Packaging and Manufacturing Technology (ICCPMT 2013), December 31, 2013 - January 2, 2014, Brisbane Australiaent://SD_ILS/0/SD_ILS:10437842026-09-20T09:30:59Z2026-09-20T09:30:59Zby Wu, Andy, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1910710">Click to View</a><br/>Format: Electronic Resources<br/>Failure analysis a practical guide for manufacturers of electronic components and systemsent://SD_ILS/0/SD_ILS:9751202026-09-20T09:30:59Z2026-09-20T09:30:59Zby Bâzu, M. I. (Marius I.), 1948-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=675196">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USAent://SD_ILS/0/SD_ILS:10551352026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (35th : 2009 : San Jose, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002438">Click to View</a><br/>Format: Electronic Resources<br/>Electronic troubleshootingent://SD_ILS/0/SD_ILS:6720872026-09-20T09:30:59Z2026-09-20T09:30:59Zby Oleksy, Jerome E.<br/>Format: Books<br/>Advanced simulation methods for ESD protection developmentent://SD_ILS/0/SD_ILS:11853732026-09-20T09:30:59Z2026-09-20T09:30:59Zby Esmark, Kai.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080441474">http://www.sciencedirect.com/science/book/9780080441474</a><br/>Format: Electronic Resources<br/>The physics of carbon nanotube devicesent://SD_ILS/0/SD_ILS:11918492026-09-20T09:30:59Z2026-09-20T09:30:59Zby Léonard, François, 1972-<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780815515739">https://www.sciencedirect.com/science/book/9780815515739</a><br/>Format: Electronic Resources<br/>Environmental requirements for electromechanical and electronic equipmentent://SD_ILS/0/SD_ILS:11851732026-09-20T09:30:59Z2026-09-20T09:30:59Zby Tricker, Ray.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750639026">https://www.sciencedirect.com/science/book/9780750639026</a><br/>Format: Electronic Resources<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:11844892026-09-20T09:30:59Z2026-09-20T09:30:59Zby Ohring, Milton, 1936-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format: Electronic Resources<br/>ESP8266 internet of things cookbook : over 50 recipes to help you master the ESP8266's functionalityent://SD_ILS/0/SD_ILS:11258072026-09-20T09:30:59Z2026-09-20T09:30:59Zby Schwartz, Marco, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4852303">Click to View</a><br/>Format: Electronic Resources<br/>Designing the internet of thingsent://SD_ILS/0/SD_ILS:10210882026-09-20T09:30:59Z2026-09-20T09:30:59Zby McEwen, Adrian.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1471865">Click to View</a><br/>Format: Electronic Resources<br/>Digital rubbish natural history of electronicsent://SD_ILS/0/SD_ILS:11013972026-09-20T09:30:59Z2026-09-20T09:30:59Zby Gabrys, Jennifer.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3570460">Click to View</a><br/>Format: Electronic Resources<br/>Introduction to microfabricationent://SD_ILS/0/SD_ILS:9684642026-09-20T09:30:59Z2026-09-20T09:30:59Zby Franssila, Sami.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=589187">Click to View</a><br/>Format: Electronic Resources<br/>Hertzian tales electronic products, aesthetic experience, and critical designent://SD_ILS/0/SD_ILS:10811882026-09-20T09:30:59Z2026-09-20T09:30:59Zby Dunne, Anthony.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3338550">Click to View</a><br/>Format: Electronic Resources<br/>Electronic materials scienceent://SD_ILS/0/SD_ILS:9307222026-09-20T09:30:59Z2026-09-20T09:30:59Zby Irene, Eugene A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=226604">Click to View</a><br/>Format: Electronic Resources<br/>Polymers for electricity and electronics materials, properties, and applicationsent://SD_ILS/0/SD_ILS:9866452026-09-20T09:30:59Z2026-09-20T09:30:59Zby Drobny, Jiri George.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=818499">Click to View</a><br/>Format: Electronic Resources<br/>ESD protection methodologies : from component to systement://SD_ILS/0/SD_ILS:11284042026-09-20T09:30:59Z2026-09-20T09:30:59Zby Bafleur, Marise, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4926959">Click to View</a><br/>Format: Electronic Resources<br/>Encapsulation technologies for electronic applicationsent://SD_ILS/0/SD_ILS:11930222026-09-20T09:30:59Z2026-09-20T09:30:59Zby Ardebili, Haleh.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515760">http://www.sciencedirect.com/science/book/9780815515760</a><br/>Format: Electronic Resources<br/>Design for at-speed test, diagnosis, and measurementent://SD_ILS/0/SD_ILS:10624242026-09-20T09:30:59Z2026-09-20T09:30:59Zby Nadeau-Dostie, Benoit.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3035636">Click to View</a><br/>Format: Electronic Resources<br/>Knowledge-based intelligent information engineering systems and allied technologies KES 2002ent://SD_ILS/0/SD_ILS:10576602026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Conference on Knowledge-Based Intelligent Information and Engineering Systems (2002 : University of Milan)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3014996">Click to View</a><br/>Format: Electronic Resources<br/>Electronic devices and circuit theoryent://SD_ILS/0/SD_ILS:6702702026-09-20T09:30:59Z2026-09-20T09:30:59Zby Boylestad, Robert<br/>Format: Books<br/>Electronic devices and circuit theory : lab manualent://SD_ILS/0/SD_ILS:6732042026-09-20T09:30:59Z2026-09-20T09:30:59Zby Boylestad, Robert<br/>Format: Books<br/>EMC for product designersent://SD_ILS/0/SD_ILS:11196802026-09-20T09:30:59Z2026-09-20T09:30:59Zby Williams, Tim, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4718338">Click to View</a><br/>Format: Electronic Resources<br/>Python playground : geeky projects for the curious programmerent://SD_ILS/0/SD_ILS:11104192026-09-20T09:30:59Z2026-09-20T09:30:59Zby Venkitachalam, Mahesh, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4503147">Click to View</a><br/>Format: Electronic Resources<br/>The complete guide to high-end audioent://SD_ILS/0/SD_ILS:10462382026-09-20T09:30:59Z2026-09-20T09:30:59Zby Harley, Robert, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1980105">Click to View</a><br/>Format: Electronic Resources<br/>System level ESD co-designent://SD_ILS/0/SD_ILS:11030772026-09-20T09:30:59Z2026-09-20T09:30:59Zby Duvvury, Charvaka, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4039349">Click to View</a><br/>Format: Electronic Resources<br/>Gaseous electronics tables, atoms, and moleculesent://SD_ILS/0/SD_ILS:9889922026-09-20T09:30:59Z2026-09-20T09:30:59Zby Raju, Gorur G., 1937-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=840389">Click to View</a><br/>Format: Electronic Resources<br/>e-waste management from waste to resourceent://SD_ILS/0/SD_ILS:9990992026-09-20T09:30:59Z2026-09-20T09:30:59Zby Kahhat, Ramzy.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=981726">Click to View</a><br/>Format: Electronic Resources<br/>The complete guide to high-end audioent://SD_ILS/0/SD_ILS:10576742026-09-20T09:30:59Z2026-09-20T09:30:59Zby Harley, Robert.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3015092">Click to View</a><br/>Format: Electronic Resources<br/>Single-electron devices and circuits in siliconent://SD_ILS/0/SD_ILS:10312262026-09-20T09:30:59Z2026-09-20T09:30:59Zby Durrani, Zahid Ali Khan.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1681717">Click to View</a><br/>Format: Electronic Resources<br/>Electrical characterization of organic electronic materials and devicesent://SD_ILS/0/SD_ILS:9654902026-09-20T09:30:59Z2026-09-20T09:30:59Zby Stallinga, Peter, 1966-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=547171">Click to View</a><br/>Format: Electronic Resources<br/>EMC for product designersent://SD_ILS/0/SD_ILS:10565102026-09-20T09:30:59Z2026-09-20T09:30:59Zby Williams, Tim, 1954-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3008655">Click to View</a><br/>Format: Electronic Resources<br/>Return of gonzo gizmos more projects & devices to channel your inner geekent://SD_ILS/0/SD_ILS:9397272026-09-20T09:30:59Z2026-09-20T09:30:59Zby Field, Simon (Simon Quellen)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=295015">Click to View</a><br/>Format: Electronic Resources<br/>ESD circuits and devicesent://SD_ILS/0/SD_ILS:9330882026-09-20T09:30:59Z2026-09-20T09:30:59Zby Voldman, Steven H.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=244869">Click to View</a><br/>Format: Electronic Resources<br/>A field guide to roadside technologyent://SD_ILS/0/SD_ILS:9826722026-09-20T09:30:59Z2026-09-20T09:30:59Zby Sobey, Edwin J. C., 1948-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=762661">Click to View</a><br/>Format: Electronic Resources<br/>Telecosmos the next great telecom revolutionent://SD_ILS/0/SD_ILS:9301102026-09-20T09:30:59Z2026-09-20T09:30:59Zby Edwards, John.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=219044">Click to View</a><br/>Format: Electronic Resources<br/>Gonzo gizmos projects & devices to channel your inner geekent://SD_ILS/0/SD_ILS:9394132026-09-20T09:30:59Z2026-09-20T09:30:59Zby Field, Simon (Simon Quellen)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=293923">Click to View</a><br/>Format: Electronic Resources<br/>Automatic test equipmentent://SD_ILS/0/SD_ILS:11932752026-09-20T09:30:59Z2026-09-20T09:30:59Zby Brindley, Keith.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750601306">http://www.sciencedirect.com/science/book/9780750601306</a><br/>Format: Electronic Resources<br/>Reflow soldering processes : SMT, BGA, CSP and flip chip technologiesent://SD_ILS/0/SD_ILS:11878612026-09-20T09:30:59Z2026-09-20T09:30:59Zby Lee, Ning-Cheng.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750672184">http://www.sciencedirect.com/science/book/9780750672184</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750672184">https://www.sciencedirect.com/science/book/9780750672184</a><br/>Format: Electronic Resources<br/>Direct-write technologies for rapid prototyping applications : sensors, electronics, and integrated power sourcesent://SD_ILS/0/SD_ILS:11868652026-09-20T09:30:59Z2026-09-20T09:30:59Zby Piqué, Alberto.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780121742317">http://www.sciencedirect.com/science/book/9780121742317</a><br/>Format: Electronic Resources<br/>Open circuits : the inner beauty of electronic componentsent://SD_ILS/0/SD_ILS:12336372026-09-20T09:30:59Z2026-09-20T09:30:59Zby Schlaepfer, Eric, author.<br/>Format: Books<br/>The maker's guide to the zombie apocalypse : defend your base with simple circuits, Arduino, and Raspberry Pient://SD_ILS/0/SD_ILS:11104332026-09-20T09:30:59Z2026-09-20T09:30:59Zby Monk, Simon, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4503167">Click to View</a><br/>Format: Electronic Resources<br/>Modern devices : the simple physics of sophisticated technologyent://SD_ILS/0/SD_ILS:11111542026-09-20T09:30:59Z2026-09-20T09:30:59Zby Joseph, Charles Lynn, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4519002">Click to View</a><br/>Format: Electronic Resources<br/>Android for the beaglebone black : design and implement android apps that interface with your own custom hardware circuits and the beaglebone blackent://SD_ILS/0/SD_ILS:10458132026-09-20T09:30:59Z2026-09-20T09:30:59Zby Henderson, Andrew, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1963426">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USAent://SD_ILS/0/SD_ILS:10551832026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002486">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USAent://SD_ILS/0/SD_ILS:10551772026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (39th : 2013 : San Jose, California)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002480">Click to View</a><br/>Format: Electronic Resources<br/>Technology for facility managers the impact of cutting-edge technology on facility managementent://SD_ILS/0/SD_ILS:9949072026-09-20T09:30:59Z2026-09-20T09:30:59Zby Teicholz, Eric.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=918225">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.ent://SD_ILS/0/SD_ILS:10551662026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (38th : 2012 : Phoenix Convention Center)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002469">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USAent://SD_ILS/0/SD_ILS:10551562026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002459">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USAent://SD_ILS/0/SD_ILS:10551402026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (36th : 2010 : Dallas, Tex.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002443">Click to View</a><br/>Format: Electronic Resources<br/>Radiating non-uniform transmission line systems and the partial element equivalent circuit methodent://SD_ILS/0/SD_ILS:9586902026-09-20T09:30:59Z2026-09-20T09:30:59Zby Nitsch, Jürgen.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=470092">Click to View</a><br/>Format: Electronic Resources<br/>Power sources and supplies world class designsent://SD_ILS/0/SD_ILS:9440742026-09-20T09:30:59Z2026-09-20T09:30:59Zby Brown, Marty, 1951-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=328609">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, Californiaent://SD_ILS/0/SD_ILS:10551062026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (31st : d2005 : San Jose, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002407">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusettsent://SD_ILS/0/SD_ILS:10551222026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (30th : 2004 : Boston, Mass.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002425">Click to View</a><br/>Format: Electronic Resources<br/>Microelectronic failure analysis desk reference. 2002 supplementent://SD_ILS/0/SD_ILS:10551312026-09-20T09:30:59Z2026-09-20T09:30:59Zby Electronic Device Failure Analysis Society.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002434">Click to View</a><br/>Format: Electronic Resources<br/>Handbook of advanced electronic and photonic materials and devices. Volume 8, Conducting polymersent://SD_ILS/0/SD_ILS:9426372026-09-20T09:30:59Z2026-09-20T09:30:59Zby Nalwa, Hari Singh, 1954- editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=313912">Click to View</a><br/>Format: Electronic Resources<br/>Microelectronic failure analysis desk reference : 2001 supplementent://SD_ILS/0/SD_ILS:10550842026-09-20T09:30:59Z2026-09-20T09:30:59Zby Electronic Device Failure Analysis Society.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002379">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.ent://SD_ILS/0/SD_ILS:10551162026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (22nd : 1996 : Los Angeles, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002419">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USAent://SD_ILS/0/SD_ILS:11067862026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (41st : 2015 : Portland, Oregon), organizer.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4392496">Click to View</a><br/>Format: Electronic Resources<br/>Microelectronics failure analysis desk referenceent://SD_ILS/0/SD_ILS:10551502026-09-20T09:30:59Z2026-09-20T09:30:59Zby Ross, Richard J.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002453">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USAent://SD_ILS/0/SD_ILS:10550332026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002319">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USAent://SD_ILS/0/SD_ILS:10550572026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (33rd : 2007 : San Jose, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002347">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.ent://SD_ILS/0/SD_ILS:10551272026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (23rd : 2006 : Austin, Tex.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002430">Click to View</a><br/>Format: Electronic Resources<br/>Microwave component mechanicsent://SD_ILS/0/SD_ILS:9309902026-09-20T09:30:59Z2026-09-20T09:30:59Zby Eskelinen, Harri.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=227630">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, Californiaent://SD_ILS/0/SD_ILS:10551282026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002431">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz.ent://SD_ILS/0/SD_ILS:10550462026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (28th : 2002 : Phoenix, Ariz.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002336">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, Californiaent://SD_ILS/0/SD_ILS:10550882026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002384">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.ent://SD_ILS/0/SD_ILS:10550772026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, Wash.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002371">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.ent://SD_ILS/0/SD_ILS:10551032026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (25th : 1999 : Santa Clara, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002404">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texasent://SD_ILS/0/SD_ILS:10551132026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (24th : 1998 : Dallas, Tex.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002415">Click to View</a><br/>Format: Electronic Resources<br/>ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, Californiaent://SD_ILS/0/SD_ILS:10551102026-09-20T09:30:59Z2026-09-20T09:30:59Zby International Symposium for Testing and Failure Analysis (23rd : 1997 : Santa Clara, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002412">Click to View</a><br/>Format: Electronic Resources<br/>Educational electronics equipment, 1967-68ent://SD_ILS/0/SD_ILS:11838352026-09-20T09:30:59Z2026-09-20T09:30:59Zby Dummer, G. W. A. (Geoffrey William Arnold)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080035666">https://www.sciencedirect.com/science/book/9780080035666</a><br/>Format: Electronic Resources<br/>High tech trash digital devices, hidden toxics, and human healthent://SD_ILS/0/SD_ILS:10767272026-09-20T09:30:59Z2026-09-20T09:30:59Zby Grossman, Elizabeth, 1957-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3317415">Click to View</a><br/>Format: Electronic Resources<br/>Modern component families and circuit block designent://SD_ILS/0/SD_ILS:11852272026-09-20T09:30:59Z2026-09-20T09:30:59Zby Kularatna, Nihal.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750699921">http://www.sciencedirect.com/science/book/9780750699921</a><br/>Format: Electronic Resources<br/>Power sources and supplies : world class designsent://SD_ILS/0/SD_ILS:11892612026-09-20T09:30:59Z2026-09-20T09:30:59Zby Brown, Marty, 1951-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750686266">http://www.sciencedirect.com/science/book/9780750686266</a><br/>Format: Electronic Resources<br/>Demystifying mixed-signal test methodsent://SD_ILS/0/SD_ILS:11879112026-09-20T09:30:59Z2026-09-20T09:30:59Zby Baker, Mark.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750676168">http://www.sciencedirect.com/science/book/9780750676168</a><br/>Format: Electronic Resources<br/>Robert Lacoste's The darker side : practical applications for electronic design conceptsent://SD_ILS/0/SD_ILS:11775102026-09-20T09:30:59Z2026-09-20T09:30:59Zby Lacoste, Robert.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9781856177627">https://www.sciencedirect.com/science/book/9781856177627</a><br/>Format: Electronic Resources<br/>Green electronics/green bottom line : environmentally responsible engineeringent://SD_ILS/0/SD_ILS:11880332026-09-20T09:30:59Z2026-09-20T09:30:59Zby Goldberg, Lee H.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750699938">https://www.sciencedirect.com/science/book/9780750699938</a><br/>Format: Electronic Resources<br/>High speed heterostructure devicesent://SD_ILS/0/SD_ILS:11901532026-09-20T09:30:59Z2026-09-20T09:30:59Zby Kiehl, Richard A.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780127521411">https://www.sciencedirect.com/science/book/9780127521411</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/bookseries/00808784/41">https://www.sciencedirect.com/science/bookseries/00808784/41</a><br/>Format: Electronic Resources<br/>EMC for product designersent://SD_ILS/0/SD_ILS:11782992026-09-20T09:30:59Z2026-09-20T09:30:59Zby Williams, Tim, 1954-<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750612647">https://www.sciencedirect.com/science/book/9780750612647</a><br/>Format: Electronic Resources<br/>Power supply cookbookent://SD_ILS/0/SD_ILS:11851502026-09-20T09:30:59Z2026-09-20T09:30:59Zby Brown, Marty.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750673297">http://www.sciencedirect.com/science/book/9780750673297</a><br/>Format: Electronic Resources<br/>Handbook of advanced electronic and photonic materials and devicesent://SD_ILS/0/SD_ILS:11864852026-09-20T09:30:59Z2026-09-20T09:30:59Zby Nalwa, Hari Singh, 1954-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125137454">http://www.sciencedirect.com/science/book/9780125137454</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780125137454">https://www.sciencedirect.com/science/book/9780125137454</a><br/>Format: Electronic Resources<br/>Semiconductors and the information revolution : magic crystals that made IT happenent://SD_ILS/0/SD_ILS:11928222026-09-20T09:30:59Z2026-09-20T09:30:59Zby Orton, J. W. (John Wilfred)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780444532404">https://www.sciencedirect.com/science/book/9780444532404</a><br/>Format: Electronic Resources<br/>Handbook of thin film devicesent://SD_ILS/0/SD_ILS:11846392026-09-20T09:30:59Z2026-09-20T09:30:59Zby Francombe, Maurice H.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122653209">http://www.sciencedirect.com/science/book/9780122653209</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780122653209">https://www.sciencedirect.com/science/book/9780122653209</a><br/>Format: Electronic Resources<br/>