Search Results for Gur, Eran. SirsiDynix Enterprise http://katalog.baskent.edu.tr/client/en_US/default/default/qu$003dGur$00252C$002bEran.$0026ps$003d300?dt=list 2026-08-04T22:55:23Z New approaches to image processing based failure analysis of nano-scale ULSI devices ent://SD_ILS/0/SD_ILS:1023140 2026-08-04T22:55:23Z 2026-08-04T22:55:23Z by&#160;Zalevsky, Zeev.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1564558">Click to View</a><br/>Format:&#160;Electronic Resources<br/>