Search Results for Integrated circuits -- Reliability.

Search Results for Integrated circuits -- Reliability. SirsiDynix Enterprise http://katalog.baskent.edu.tr/client/en_US/default/default/qu$003dIntegrated$002bcircuits$002b--$002bReliability.$0026ps$003d300?dt=list 2026-09-15T03:50:04Z Electronics reliability and measurement technology : nondestructive evaluation ent://SD_ILS/0/SD_ILS:1189894 2026-09-15T03:50:04Z 2026-09-15T03:50:04Z by Heyman, Joseph S.<br/>MacEwan University Access <a href="http://www.sciencedirect.com/science/book/9780815511717">(Unlimited Concurrent Users)</a> from ScienceDirect ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780815511717">https://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Electronic Resources<br/> ESD failure mechanisms and models ent://SD_ILS/0/SD_ILS:955926 2026-09-15T03:50:04Z 2026-09-15T03:50:04Z by Voldman, Steven H.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=454456">Click to View</a><br/>Format: Electronic Resources<br/> Terrestrial radiation effects in ULSI devices and electronic systems ent://SD_ILS/0/SD_ILS:1044098 2026-09-15T03:50:04Z 2026-09-15T03:50:04Z by Ibe, Eishi H., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1911831">Click to View</a><br/>Format: Electronic Resources<br/> The circuit designer's companion ent://SD_ILS/0/SD_ILS:1184033 2026-09-15T03:50:04Z 2026-09-15T03:50:04Z by Williams, Tim, 1954-<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750611428">https://www.sciencedirect.com/science/book/9780750611428</a><br/>Format: Electronic Resources<br/> Nanometer CMOS ICs From Basics to ASICs ent://SD_ILS/0/SD_ILS:480745 2026-09-15T03:50:04Z 2026-09-15T03:50:04Z by J.M. Veendrick, Harry. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-47597-4">http://dx.doi.org/10.1007/978-3-319-47597-4</a><br/>Format: Electronic Resources<br/> The circuit designer's companion ent://SD_ILS/0/SD_ILS:137140 2026-09-15T03:50:04Z 2026-09-15T03:50:04Z by Wilson, Peter.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080971384">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/> Carbon Nanotubes for Interconnects Process, Design and Applications ent://SD_ILS/0/SD_ILS:480160 2026-09-15T03:50:04Z 2026-09-15T03:50:04Z by Todri-Sanial, Aida. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-29746-0">http://dx.doi.org/10.1007/978-3-319-29746-0</a><br/>Format: Electronic Resources<br/> Reference data for engineers : radio, electronics, computer, and communications. ent://SD_ILS/0/SD_ILS:1185149 2026-09-15T03:50:04Z 2026-09-15T03:50:04Z by Middleton, Wendy.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750672917">http://www.sciencedirect.com/science/book/9780750672917</a><br/>Format: Electronic Resources<br/> Advances in electronics and electron physics. Volume 30 ent://SD_ILS/0/SD_ILS:1180006 2026-09-15T03:50:04Z 2026-09-15T03:50:04Z by Marton, L. (Ladislaus), 1901-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120145300">http://www.sciencedirect.com/science/book/9780120145300</a><br/>Format: Electronic Resources<br/> Fast Very-large-scale Integrated (VLSI) Circuits Simulations ent://SD_ILS/0/SD_ILS:679934 2026-09-15T03:50:04Z 2026-09-15T03:50:04Z by Zhao, Xueqian, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10791659">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10791659</a><br/>Format: Books<br/> An Exploration of the Electromechanical Response of Suspended Graphene and Its Applications ent://SD_ILS/0/SD_ILS:682862 2026-09-15T03:50:04Z 2026-09-15T03:50:04Z by Ng, Jimmy, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10828744">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10828744</a><br/>Format: Books<br/> High-Sn-content GeSn Alloy towards Room-temperature Mid Infrared Laser ent://SD_ILS/0/SD_ILS:695326 2026-09-15T03:50:04Z 2026-09-15T03:50:04Z by Dou, Wei, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10830648">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10830648</a><br/>Format: Books<br/> A Study on Unintentional and Intentional Sources of Variability in Nanometer Scale Digital Circuits ent://SD_ILS/0/SD_ILS:677928 2026-09-15T03:50:04Z 2026-09-15T03:50:04Z by Sengupta, Deepashree, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10273823">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10273823</a><br/>Format: Books<br/>