Search Results for Livshits, Pavel. - Narrowed by: Başkent Library
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2026-07-28T10:16:34Z
New approaches to image processing based failure analysis of nano-scale ULSI devices
ent://SD_ILS/0/SD_ILS:1023140
2026-07-28T10:16:34Z
2026-07-28T10:16:34Z
by Zalevsky, Zeev.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1564558">Click to View</a><br/>Format: Electronic Resources<br/>