Search Results for Mathematical analysis. - Narrowed by: Physics.SirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/en_US/default/default/qu$003dMathematical$002banalysis.$0026qf$003dSUBJECT$002509Subject$002509Physics.$002509Physics.$0026ic$003dtrue$0026ps$003d300?dt=list2026-01-04T06:01:04ZMathematical Analysis of Continuum Mechanics and Industrial Applications Proceedings of the International Conference CoMFoS15ent://SD_ILS/0/SD_ILS:4816642026-01-04T06:01:04Z2026-01-04T06:01:04Zby Itou, Hiromichi. editor.<br/><a href="http://dx.doi.org/10.1007/978-981-10-2633-1">http://dx.doi.org/10.1007/978-981-10-2633-1</a><br/>Format: Electronic Resources<br/>Measurement of the Muon Anti-Neutrino Charged Current Double Differential Cross Section with No Pions in the Final State on Water Using the Pi-Zero Detector at T2Kent://SD_ILS/0/SD_ILS:6786692026-01-04T06:01:04Z2026-01-04T06:01:04Zby Campbell, Thomas, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10750268">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10750268</a><br/>Format: Books<br/>In situ Measurement of Plasma Etch Rate Using EtchRate Waferent://SD_ILS/0/SD_ILS:6937942026-01-04T06:01:04Z2026-01-04T06:01:04Zby Mahzoon, Razieh, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10822318">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10822318</a><br/>Format: Books<br/>Advanced Geometrical Opticsent://SD_ILS/0/SD_ILS:4816312026-01-04T06:01:04Z2026-01-04T06:01:04Zby Lin, Psang Dain. author.<br/><a href="http://dx.doi.org/10.1007/978-981-10-2299-9">http://dx.doi.org/10.1007/978-981-10-2299-9</a><br/>Format: Electronic Resources<br/>Handbook of Systems and Complexity in Healthent://SD_ILS/0/SD_ILS:1407762026-01-04T06:01:04Z2026-01-04T06:01:04Zby Sturmberg, Joachim P. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-4998-0">http://dx.doi.org/10.1007/978-1-4614-4998-0</a><br/>Format: Electronic Resources<br/>