Search Results for Reliability.SirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/en_US/default/default/qu$003dReliability.$0026ps$003d300?dt=list2026-09-26T16:31:13ZApplied reliabilityent://SD_ILS/0/SD_ILS:10084162026-09-26T16:31:13Z2026-09-26T16:31:13Zby Grous, Ammar.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1124027">Click to View</a><br/>Format: Electronic Resources<br/>Applied reliabilityent://SD_ILS/0/SD_ILS:10284072026-09-26T16:31:13Z2026-09-26T16:31:13Zby Tobias, Paul A., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1648252">Click to View</a><br/>Format: Electronic Resources<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:9896092026-09-26T16:31:13Z2026-09-26T16:31:13Zby Elsayed, Elsayed A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=843664">Click to View</a><br/>Format: Electronic Resources<br/>Bayesian reliabilityent://SD_ILS/0/SD_ILS:9471882026-09-26T16:31:13Z2026-09-26T16:31:13Zby Hamada, Michael, 1955-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=364398">Click to View</a><br/>Format: Electronic Resources<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:10291342026-09-26T16:31:13Z2026-09-26T16:31:13Zby Kapur, Kailash C., 1941- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1658817">Click to View</a><br/>Format: Electronic Resources<br/>Reliability in biomechanicsent://SD_ILS/0/SD_ILS:11196712026-09-26T16:31:13Z2026-09-26T16:31:13Zby Kharmanda, Ghias, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4718313">Click to View</a><br/>Format: Electronic Resources<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:9898032026-09-26T16:31:13Z2026-09-26T16:31:13Zby Raheja, Dev.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=848525">Click to View</a><br/>Format: Electronic Resources<br/>Reliability engineering advancesent://SD_ILS/0/SD_ILS:10591322026-09-26T16:31:13Z2026-09-26T16:31:13Zby Hayworth, Gregory I.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3018679">Click to View</a><br/>Format: Electronic Resources<br/>Reliability-centred maintenanceent://SD_ILS/0/SD_ILS:11665462026-09-26T16:31:13Z2026-09-26T16:31:13Zby Moubray, John.<br/>Format: Books<br/>Advanced reliability modelingent://SD_ILS/0/SD_ILS:9334812026-09-26T16:31:13Z2026-09-26T16:31:13Zby Dohi, Tadashi.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=253960">Click to View</a><br/>Format: Electronic Resources<br/>Advances in reliabilityent://SD_ILS/0/SD_ILS:11841942026-09-26T16:31:13Z2026-09-26T16:31:13Zby Balakrishnan, N., 1956- editor.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/0444500782">Click for electronic access to e-book.</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444500786">http://www.sciencedirect.com/science/book/9780444500786</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/handbooks/01697161/20">http://www.sciencedirect.com/science/handbooks/01697161/20</a><br/>Format: Electronic Resources<br/>Improving machinery reliabilityent://SD_ILS/0/SD_ILS:11852502026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bloch, Heinz P., 1933-<br/><a href="https://www.sciencedirect.com/science/bookseries/18746942/1">Available from ScienceDirect. Online version available for university members only. This requires an institutional login off-campus.</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Electronic Resources<br/>Machine tool reliabilityent://SD_ILS/0/SD_ILS:11076132026-09-26T16:31:13Z2026-09-26T16:31:13Zby Lad, Bhupesh K., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4403257">Click to View</a><br/>Format: Electronic Resources<br/>Solder Joint Reliabilityent://SD_ILS/0/SD_ILS:9386182026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ricky Lee, S. W.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=289873">Click to View</a><br/>Format: Electronic Resources<br/>Probabilistic reliability modelsent://SD_ILS/0/SD_ILS:9933952026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ushakov, I. A. (Igorʹ Alekseevich)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=894405">Click to View</a><br/>Format: Electronic Resources<br/>Reliability of engineering materialsent://SD_ILS/0/SD_ILS:11772892026-09-26T16:31:13Z2026-09-26T16:31:13Zby Smith, Alrick L.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780408015073">http://www.sciencedirect.com/science/book/9780408015073</a><br/>Format: Electronic Resources<br/>Reliability-based mechanical designent://SD_ILS/0/SD_ILS:11665402026-09-26T16:31:13Z2026-09-26T16:31:13Zby Le, Xiaobin.<br/>Format: Books<br/>Reliability of large systemsent://SD_ILS/0/SD_ILS:11866552026-09-26T16:31:13Z2026-09-26T16:31:13Zby Kołowrocki, Krzysztof.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format: Electronic Resources<br/>Reliability engineering and servicesent://SD_ILS/0/SD_ILS:11441572026-09-26T16:31:13Z2026-09-26T16:31:13Zby Jin, Tongdan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630265">Click to View</a><br/>Format: Electronic Resources<br/>Reliability and quality managementent://SD_ILS/0/SD_ILS:9548052026-09-26T16:31:13Z2026-09-26T16:31:13Zby Mishra, R. C.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=442134">Click to View</a><br/>Format: Electronic Resources<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:9403262026-09-26T16:31:13Z2026-09-26T16:31:13Zby Neale, M. J. (Michael John)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=298350">Click to View</a><br/>Format: Electronic Resources<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:11851292026-09-26T16:31:13Z2026-09-26T16:31:13Zby Neale, M. J. (Michael John)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Electronic Resources<br/>Fatigue design and reliabilityent://SD_ILS/0/SD_ILS:11861712026-09-26T16:31:13Z2026-09-26T16:31:13Zby International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/bookseries/15661369/23">http://www.sciencedirect.com/science/bookseries/15661369/23</a><br/>Format: Electronic Resources<br/>Reliability of analogue circuitsent://SD_ILS/0/SD_ILS:7051152026-09-26T16:31:13Z2026-09-26T16:31:13Zby Mohd Nawi, Illani Binti, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873624">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873624</a><br/>Format: Books<br/>Optimal warranty policies and reliability modelingent://SD_ILS/0/SD_ILS:9335252026-09-26T16:31:13Z2026-09-26T16:31:13Zby Chukova, Stefanka.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=254004">Click to View</a><br/>Format: Electronic Resources<br/>Practical applications of Bayesian reliabilityent://SD_ILS/0/SD_ILS:11456932026-09-26T16:31:13Z2026-09-26T16:31:13Zby Liu, Yan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5741235">Click to View</a><br/>Format: Electronic Resources<br/>Biomechanics : optimization, uncertainties and reliabilityent://SD_ILS/0/SD_ILS:11221052026-09-26T16:31:13Z2026-09-26T16:31:13Zby Kharmanda, Ghias, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4778401">Click to View</a><br/>Format: Electronic Resources<br/>Reliability growth : enhancing defense system reliabilityent://SD_ILS/0/SD_ILS:10865262026-09-26T16:31:13Z2026-09-26T16:31:13Zby Panel on Reliability Growth Methods for Defense Systems.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3379432">Click to View</a><br/>Format: Electronic Resources<br/>Advances in mathematical modeling for reliabilityent://SD_ILS/0/SD_ILS:9471512026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bedford, T.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=363211">Click to View</a><br/>Format: Electronic Resources<br/>Advanced reliability modeling part IIent://SD_ILS/0/SD_ILS:9379922026-09-26T16:31:13Z2026-09-26T16:31:13Zby Dohi, Tadashi.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=285510">Click to View</a><br/>Format: Electronic Resources<br/>Systems reliability and failure preventionent://SD_ILS/0/SD_ILS:9309922026-09-26T16:31:13Z2026-09-26T16:31:13Zby Hecht, Herbert.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=227632">Click to View</a><br/>Format: Electronic Resources<br/>Maintenance strategies and reliability optimizationent://SD_ILS/0/SD_ILS:9316892026-09-26T16:31:13Z2026-09-26T16:31:13Zby Artiba, A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=233913">Click to View</a><br/>Format: Electronic Resources<br/>Semiconductor packaging materials interaction and reliabilityent://SD_ILS/0/SD_ILS:9835692026-09-26T16:31:13Z2026-09-26T16:31:13Zby Chen, Andrea.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=773636">Click to View</a><br/>Format: Electronic Resources<br/>Construction reliability safety, variability and sustainabilityent://SD_ILS/0/SD_ILS:10085232026-09-26T16:31:13Z2026-09-26T16:31:13Zby Baroth, Julien.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1124658">Click to View</a><br/>Format: Electronic Resources<br/>Optimal reliability design : fundamentals and applicationsent://SD_ILS/0/SD_ILS:11659812026-09-26T16:31:13Z2026-09-26T16:31:13Zby Kuo, Way.<br/>Format: Books<br/>System reliability : concepts and applicationsent://SD_ILS/0/SD_ILS:9221602026-09-26T16:31:13Z2026-09-26T16:31:13Zby Klaassen, Klaas B., 1941-<br/>Format: Books<br/>Advances in system reliability engineeringent://SD_ILS/0/SD_ILS:11436852026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ram, Mangey, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5603078">Click to View</a><br/>Format: Electronic Resources<br/>Reliability of large and complex systemsent://SD_ILS/0/SD_ILS:10291132026-09-26T16:31:13Z2026-09-26T16:31:13Zby Kołowrocki, Krzysztof, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1657928">Click to View</a><br/>Format: Electronic Resources<br/>Accelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:9782392026-09-26T16:31:13Z2026-09-26T16:31:13Zby Klyatis, Lev M.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=693204">Click to View</a><br/>Format: Electronic Resources<br/>Multistate systems reliability theory with applicationsent://SD_ILS/0/SD_ILS:9721932026-09-26T16:31:13Z2026-09-26T16:31:13Zby Natvig, Bent, 1946-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=624778">Click to View</a><br/>Format: Electronic Resources<br/>Mathematical methods of reliability theoryent://SD_ILS/0/SD_ILS:11773852026-09-26T16:31:13Z2026-09-26T16:31:13Zby Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781483230535">http://www.sciencedirect.com/science/book/9781483230535</a><br/>Format: Electronic Resources<br/>An elementary guide to reliabilityent://SD_ILS/0/SD_ILS:11851412026-09-26T16:31:13Z2026-09-26T16:31:13Zby Dummer, G. W. A. (Geoffrey William Arnold)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format: Electronic Resources<br/>Network reliability : measures and evaluationent://SD_ILS/0/SD_ILS:11136112026-09-26T16:31:13Z2026-09-26T16:31:13Zby Chaturvedi, Sanjay K., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4570714">Click to View</a><br/>Format: Electronic Resources<br/>Lead-free solder interconnect reliabilityent://SD_ILS/0/SD_ILS:10550942026-09-26T16:31:13Z2026-09-26T16:31:13Zby Shangguan, Dongkai, 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002391">Click to View</a><br/>Format: Electronic Resources<br/>Stochastic reliability modeling, optimization and applicationsent://SD_ILS/0/SD_ILS:10312382026-09-26T16:31:13Z2026-09-26T16:31:13Zby Nakamura, Syouji.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1681730">Click to View</a><br/>Format: Electronic Resources<br/>Analysis of reliability and quality controlent://SD_ILS/0/SD_ILS:10670442026-09-26T16:31:13Z2026-09-26T16:31:13Zby Grous, Ammar.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3058885">Click to View</a><br/>Format: Electronic Resources<br/>Software system reliability and securityent://SD_ILS/0/SD_ILS:9407012026-09-26T16:31:13Z2026-09-26T16:31:13Zby Broy, M., 1949-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=305176">Click to View</a><br/>Format: Electronic Resources<br/>Introduction to reliability and quality engineeringent://SD_ILS/0/SD_ILS:383182026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bentley, John<br/>Format: Books<br/>Maintenance and reliability best practicesent://SD_ILS/0/SD_ILS:11659782026-09-26T16:31:13Z2026-09-26T16:31:13Zby Gulati, Ramesh, author<br/>Format: Books<br/>Human reliability : with human factorsent://SD_ILS/0/SD_ILS:11751732026-09-26T16:31:13Z2026-09-26T16:31:13Zby Dhillon, B. S. (Balbir S.), 1947-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080327747">http://www.sciencedirect.com/science/book/9780080327747</a><br/>Format: Electronic Resources<br/>Transportation systems reliability and safetyent://SD_ILS/0/SD_ILS:9759462026-09-26T16:31:13Z2026-09-26T16:31:13Zby Dhillon, B. S. (Balbir S.), 1947-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=681292">Click to View</a><br/>Format: Electronic Resources<br/>Process risk and reliability managementent://SD_ILS/0/SD_ILS:10374522026-09-26T16:31:13Z2026-09-26T16:31:13Zby Sutton, Ian, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1782850">Click to View</a><br/>Format: Electronic Resources<br/>Advances in Reliability and System Engineeringent://SD_ILS/0/SD_ILS:4808132026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ram, Mangey. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-48875-2">http://dx.doi.org/10.1007/978-3-319-48875-2</a><br/>Format: Electronic Resources<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:4814862026-09-26T16:31:13Z2026-09-26T16:31:13Zby Birolini, Alessandro. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-54209-5">http://dx.doi.org/10.1007/978-3-662-54209-5</a><br/>Format: Electronic Resources<br/>Cloud Reliability Engineering: Technologies and Toolsent://SD_ILS/0/SD_ILS:12141962026-09-26T16:31:13Z2026-09-26T16:31:13Zby Achary, Rathnakar<br/>Format: Books<br/>Leading a high reliability schoolent://SD_ILS/0/SD_ILS:11378652026-09-26T16:31:13Z2026-09-26T16:31:13Zby Marzano, Robert J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5395032">Click to View</a><br/>Format: Electronic Resources<br/>Reliability prediction and testing textbookent://SD_ILS/0/SD_ILS:11406412026-09-26T16:31:13Z2026-09-26T16:31:13Zby Klyatis, Lev M., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5452229">Click to View</a><br/>Format: Electronic Resources<br/>Photovoltaic modules : technology and reliabilityent://SD_ILS/0/SD_ILS:11182802026-09-26T16:31:13Z2026-09-26T16:31:13Zby Wirth, Harry, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4691383">Click to View</a><br/>Format: Electronic Resources<br/>Reliability and availability of cloud computingent://SD_ILS/0/SD_ILS:1398622026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bauer, Eric<br/>Format: Books<br/>Durability and reliability of medical polymersent://SD_ILS/0/SD_ILS:10244162026-09-26T16:31:13Z2026-09-26T16:31:13Zby Jenkins, Mike.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1581410">Click to View</a><br/>Format: Electronic Resources<br/>Machine tools design, reliability and safetyent://SD_ILS/0/SD_ILS:10608292026-09-26T16:31:13Z2026-09-26T16:31:13Zby Anderson, Scott P.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3021649">Click to View</a><br/>Format: Electronic Resources<br/>Safety and reliability of bridge structuresent://SD_ILS/0/SD_ILS:9673072026-09-26T16:31:13Z2026-09-26T16:31:13Zby New York City Bridge Conference (5th : 2009 : New York, N.Y.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=565988">Click to View</a><br/>Format: Electronic Resources<br/>Measures of interobserver agreement and reliabilityent://SD_ILS/0/SD_ILS:9740262026-09-26T16:31:13Z2026-09-26T16:31:13Zby Shoukri, M. M. (Mohamed M.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=665632">Click to View</a><br/>Format: Electronic Resources<br/>Accelerated quality and reliability solutionsent://SD_ILS/0/SD_ILS:11855832026-09-26T16:31:13Z2026-09-26T16:31:13Zby Klyatis, Lev M.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format: Electronic Resources<br/>Recent advances in reliability and quality engineeringent://SD_ILS/0/SD_ILS:10304522026-09-26T16:31:13Z2026-09-26T16:31:13Zby Pham, Hoang.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679593">Click to View</a><br/>Format: Electronic Resources<br/>Reliability and risk models : setting reliability requirementsent://SD_ILS/0/SD_ILS:11030842026-09-26T16:31:13Z2026-09-26T16:31:13Zby Todinov, M. T., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4039470">Click to View</a><br/>Format: Electronic Resources<br/>Modern statistical and mathematical methods in reliabilityent://SD_ILS/0/SD_ILS:9400832026-09-26T16:31:13Z2026-09-26T16:31:13Zby Wilson, Alyson G., 1967-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=296177">Click to View</a><br/>Format: Electronic Resources<br/>Fault detection & reliability : knowledge based & other approachesent://SD_ILS/0/SD_ILS:11756352026-09-26T16:31:13Z2026-09-26T16:31:13Zby European Workshop on Fault Diagnostics, Reliability, and Related Knowledge-Based Approaches (2nd : 1987 : University of Manchester Institute of Science and Technology)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080349220">https://www.sciencedirect.com/science/book/9780080349220</a><br/>Format: Electronic Resources<br/>Reliability of electronic packages and semiconductor devicesent://SD_ILS/0/SD_ILS:898862026-09-26T16:31:13Z2026-09-26T16:31:13Zby Giacomo, Giulio Di<br/>Format: Books<br/>Electronics reliability and measurement technology : nondestructive evaluationent://SD_ILS/0/SD_ILS:11898942026-09-26T16:31:13Z2026-09-26T16:31:13Zby Heyman, Joseph S.<br/>MacEwan University Access <a href="http://www.sciencedirect.com/science/book/9780815511717">(Unlimited Concurrent Users)</a> from ScienceDirect
ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780815511717">https://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Electronic Resources<br/>System reliability : evaluation and prediction in engineeringent://SD_ILS/0/SD_ILS:661722026-09-26T16:31:13Z2026-09-26T16:31:13Zby Pages, Alain<br/>Format: Books<br/>Methods for reliability improvement and risk reductionent://SD_ILS/0/SD_ILS:11430312026-09-26T16:31:13Z2026-09-26T16:31:13Zby Todinov, Michael, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5553528">Click to View</a><br/>Format: Electronic Resources<br/>Recent developments in reliability-based civil engineeringent://SD_ILS/0/SD_ILS:10149902026-09-26T16:31:13Z2026-09-26T16:31:13Zby Haldar, Achintya.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1214938">Click to View</a><br/>Format: Electronic Resources<br/>An introduction to reliability and maintainability engineeringent://SD_ILS/0/SD_ILS:11666642026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ebeling, Charles E..<br/>Format: Books<br/>Rules of thumb for maintenance and reliability engineersent://SD_ILS/0/SD_ILS:9480132026-09-26T16:31:13Z2026-09-26T16:31:13Zby Smith, Ricky.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=405204">Click to View</a><br/>Format: Electronic Resources<br/>Reliability modelling and analysis in discrete timeent://SD_ILS/0/SD_ILS:11380092026-09-26T16:31:13Z2026-09-26T16:31:13Zby Nair, N. Unnikrishnan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5396573">Click to View</a><br/>Format: Electronic Resources<br/>Artificial neural network for software reliability predictionent://SD_ILS/0/SD_ILS:11297882026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bisi, Manjubala, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5056371">Click to View</a><br/>Format: Electronic Resources<br/>Human reliability and error in medical systement://SD_ILS/0/SD_ILS:10304172026-09-26T16:31:13Z2026-09-26T16:31:13Zby Dhillon, B. S. (Balbir S.), 1947-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679549">Click to View</a><br/>Format: Electronic Resources<br/>Risk-based management : a reliability-centered approachent://SD_ILS/0/SD_ILS:10284562026-09-26T16:31:13Z2026-09-26T16:31:13Zby Jones, Richard B., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1649062">Click to View</a><br/>Format: Electronic Resources<br/>Logics and languages for reliability and securityent://SD_ILS/0/SD_ILS:9666272026-09-26T16:31:13Z2026-09-26T16:31:13Zby Esparza, Javier.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=557042">Click to View</a><br/>Format: Electronic Resources<br/>Rules of thumb for maintenance and reliability engineersent://SD_ILS/0/SD_ILS:11891422026-09-26T16:31:13Z2026-09-26T16:31:13Zby Smith, Ricky.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750678629">https://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Electronic Resources<br/>Cognitive reliability and error analysis method : CREAMent://SD_ILS/0/SD_ILS:11857442026-09-26T16:31:13Z2026-09-26T16:31:13Zby Hollnagel, Erik, 1941-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Electronic Resources<br/>The reliability, availability and productiveness of systemsent://SD_ILS/0/SD_ILS:378072026-09-26T16:31:13Z2026-09-26T16:31:13Zby Sherwin, D.J.<br/>Format: Books<br/>Reliability and maintainability of in service pipelinesent://SD_ILS/0/SD_ILS:11394242026-09-26T16:31:13Z2026-09-26T16:31:13Zby Mojtaba, Mahmoodian, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5434362">Click to View</a><br/>Format: Electronic Resources<br/>Reliability based airframe maintenance optimization and applicationsent://SD_ILS/0/SD_ILS:11245472026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ren, He, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4826425">Click to View</a><br/>Format: Electronic Resources<br/>Reliability and radiation effects in compound semiconductorsent://SD_ILS/0/SD_ILS:9808382026-09-26T16:31:13Z2026-09-26T16:31:13Zby Johnston, Allan.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=731279">Click to View</a><br/>Format: Electronic Resources<br/>Risk and reliability coastal and hydraulic engineeringent://SD_ILS/0/SD_ILS:9551842026-09-26T16:31:13Z2026-09-26T16:31:13Zby Reeve, Dominic.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=446907">Click to View</a><br/>Format: Electronic Resources<br/>Managing risk and reliability of process plantsent://SD_ILS/0/SD_ILS:9380832026-09-26T16:31:13Z2026-09-26T16:31:13Zby Tweeddale, Mark.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=286711">Click to View</a><br/>Format: Electronic Resources<br/>Reliability characterisation of electrical and electronic systemsent://SD_ILS/0/SD_ILS:10440882026-09-26T16:31:13Z2026-09-26T16:31:13Zby Swingler, Jonathan, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1911716">Click to View</a><br/>Format: Electronic Resources<br/>Lead-free solders materials reliability for electronicsent://SD_ILS/0/SD_ILS:9918922026-09-26T16:31:13Z2026-09-26T16:31:13Zby Subramaniam, K. N., Ph. D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=875755">Click to View</a><br/>Format: Electronic Resources<br/>Process plant equipment operation, reliability, and controlent://SD_ILS/0/SD_ILS:9871642026-09-26T16:31:13Z2026-09-26T16:31:13Zby Holloway, Michael D., 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=822072">Click to View</a><br/>Format: Electronic Resources<br/>BioWatch PCR assays : building confidence, ensuring reliabilityent://SD_ILS/0/SD_ILS:10967442026-09-26T16:31:13Z2026-09-26T16:31:13Zby National Research Council (U.S.). Board on Life Sciences. Committee on PCR Standards for the BioWatch Program, issuing body.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3439887">Click to View</a><br/>Format: Electronic Resources<br/>Reliability Approach to Risk Management in Watershedsent://SD_ILS/0/SD_ILS:6871032026-09-26T16:31:13Z2026-09-26T16:31:13Zby Teklitz, Allen, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10871571">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10871571</a><br/>Format: Books<br/>Managing risk and reliability of process plantsent://SD_ILS/0/SD_ILS:11879392026-09-26T16:31:13Z2026-09-26T16:31:13Zby Tweeddale, Mark.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750677349">https://www.sciencedirect.com/science/book/9780750677349</a><br/>Format: Electronic Resources<br/>Power GaN Devices Materials, Applications and Reliabilityent://SD_ILS/0/SD_ILS:4804472026-09-26T16:31:13Z2026-09-26T16:31:13Zby Meneghini, Matteo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-43199-4">http://dx.doi.org/10.1007/978-3-319-43199-4</a><br/>Format: Electronic Resources<br/>Reliability, maintainability, and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11783002026-09-26T16:31:13Z2026-09-26T16:31:13Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750608541">http://www.sciencedirect.com/science/book/9780750608541</a><br/>Format: Electronic Resources<br/>An introduction to the basics of reliability and risk analysisent://SD_ILS/0/SD_ILS:1329502026-09-26T16:31:13Z2026-09-26T16:31:13Zby Zio, Enrico<br/>Format: Books<br/>Reliability of maintained systems subjected to wear failure mechanisms : theory and applicationsent://SD_ILS/0/SD_ILS:11459602026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bayle, Franck, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5751853">Click to View</a><br/>Format: Electronic Resources<br/>An introduction to the basics of reliability and risk analysisent://SD_ILS/0/SD_ILS:9423932026-09-26T16:31:13Z2026-09-26T16:31:13Zby Zio, Enrico.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=312287">Click to View</a><br/>Format: Electronic Resources<br/>System and Bayesian reliability essays in honor of Professor Richard E. Barlow on his 70th birthdayent://SD_ILS/0/SD_ILS:10304512026-09-26T16:31:13Z2026-09-26T16:31:13Zby Hayakawa, Yu.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679591">Click to View</a><br/>Format: Electronic Resources<br/>Reliability of high-power mechatronic systems. Volume 1, Aerospace and automotive applicationsent://SD_ILS/0/SD_ILS:11299822026-09-26T16:31:13Z2026-09-26T16:31:13Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5061866">Click to View</a><br/>Format: Electronic Resources<br/>Risk and Reliability Analysis: Theory and Applications In Honor of Prof. Armen Der Kiureghianent://SD_ILS/0/SD_ILS:4810452026-09-26T16:31:13Z2026-09-26T16:31:13Zby Gardoni, Paolo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-52425-2">http://dx.doi.org/10.1007/978-3-319-52425-2</a><br/>Format: Electronic Resources<br/>Reliability modeling in industry 4.0 : advances in reliability scienceent://SD_ILS/0/SD_ILS:12141792026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ram, Mangey, editor<br/>Format: Books<br/>Dynamic system reliability : modeling and analysis of dynamic and dependent behaviorsent://SD_ILS/0/SD_ILS:11441802026-09-26T16:31:13Z2026-09-26T16:31:13Zby Xing, Liudong, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630668">Click to View</a><br/>Format: Electronic Resources<br/>Applied reliability engineering and risk analysis probabilistic models and statistical inferenceent://SD_ILS/0/SD_ILS:10183872026-09-26T16:31:13Z2026-09-26T16:31:13Zby Frenkel, Ilia, Ph.D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1360807">Click to View</a><br/>Format: Electronic Resources<br/>Organizing for reliability : a guide for research and practiceent://SD_ILS/0/SD_ILS:11341172026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ramanujam, Rangaraj, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5219778">Click to View</a><br/>Format: Electronic Resources<br/>Reliability investigation of LED devices for public light applicationsent://SD_ILS/0/SD_ILS:11243342026-09-26T16:31:13Z2026-09-26T16:31:13Zby Baillot, Raphael, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4822046">Click to View</a><br/>Format: Electronic Resources<br/>Reliability technology principles and practice of failure prevention in electronic systemsent://SD_ILS/0/SD_ILS:9751502026-09-26T16:31:13Z2026-09-26T16:31:13Zby Pascoe, Norman.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=675299">Click to View</a><br/>Format: Electronic Resources<br/>Spiritüel distres ölçeği'nin Türkçe'ye uyarlanması; geçerlik ve güvenirlik çalışması = Turkish adaptation of the spiritual distress scale; validity and reliability studyent://SD_ILS/0/SD_ILS:12295562026-09-26T16:31:13Z2026-09-26T16:31:13Zby Arpa, Hilal, yazar.<br/>Format: Books<br/>Sağlık Bilimleri Kanıta Dayalı Uygulama Anketi'nin türkçe geçerlilik ve güvenirliği = Turkish validity and reliability of The Health Sciences Evidence-Based Practice Questionnaireent://SD_ILS/0/SD_ILS:12296122026-09-26T16:31:13Z2026-09-26T16:31:13Zby Şahin, Ayşe Nur, yazar.<br/>Format: Books<br/>Bariatrik cerrahi sonrası yeme davranışı ölçeğinin Türkçe geçerlik ve güvenirlik çalışması = Turkish validity and reliability study of the eating behavior scale after bariatric surgeryent://SD_ILS/0/SD_ILS:12377522026-09-26T16:31:13Z2026-09-26T16:31:13Zby Öztürk Gök, Saadet, yazar.<br/>Format: Books<br/>Tıkınırcasına yeme bozukluğu tarama anketinin ((BEDS-7) Binge-eating disordes screener)) Türkçe geçerlilik ve güvenilirlil çalışması = Validity and reliability study of the binge-eating disorder screening questionnaire (BEDS-7) in Turkishent://SD_ILS/0/SD_ILS:12293852026-09-26T16:31:13Z2026-09-26T16:31:13Zby Aker, Caner, Dr., yazar.<br/>Format: Books<br/>The international journal of quality & reliability management. Volume 25, Number 1, Best practice project portfolio managementent://SD_ILS/0/SD_ILS:9459112026-09-26T16:31:13Z2026-09-26T16:31:13Zby Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=348641">Click to View</a><br/>Format: Electronic Resources<br/>Pipelines 2010 climbing new peaks to infrastructure reliability--renew, rehab, and reinvest : proceedings of the 2010 Pipeline Division Specialty Congress, August 28-September 1, 2010, Keystone Coloradoent://SD_ILS/0/SD_ILS:10683572026-09-26T16:31:13Z2026-09-26T16:31:13Zby Pipeline Division Specialty Congress (2010 : Keystone, Colo.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3115529">Click to View</a><br/>Format: Electronic Resources<br/>Advanced reliability modeling proceedings of the 2004 Asian International Workshop (AIWARM 2004) : Hiroshima, Japan, 26-27 August 2004ent://SD_ILS/0/SD_ILS:9399662026-09-26T16:31:13Z2026-09-26T16:31:13Zby Asian International Workshop on Advanced Reliability Modeling (2004 : Hiroshima-shi, Japan)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=296055">Click to View</a><br/>Format: Electronic Resources<br/>Advanced reliability modeling II reliability testing and improvement : proceedings of the 2nd Asian International Workshop (AIWARM 2006), Busan, Korea, 24-26 August 2006ent://SD_ILS/0/SD_ILS:10309782026-09-26T16:31:13Z2026-09-26T16:31:13Zby Asian International Workshop on Advanced Reliability Modeling (2nd : 2006 : Pusan, Korea)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1681416">Click to View</a><br/>Format: Electronic Resources<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:11773902026-09-26T16:31:13Z2026-09-26T16:31:13Zby Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Electronic Resources<br/>International Conference on Structural Safety and Reliability : Smithsonian Institution Museum of History and Technology, Constitution Avenue, Washington, D.C., April 9, 10 and 11, 1969ent://SD_ILS/0/SD_ILS:11817172026-09-26T16:31:13Z2026-09-26T16:31:13Zby International Conference on Structural Safety and Reliability (1st : 1969 : Smithsonian Institution)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080165660">https://www.sciencedirect.com/science/book/9780080165660</a><br/>Format: Electronic Resources<br/>Problems of mechanics in pump and compressor engineering : selected, peer reviewed papers from the XIV International Scientific and Engineering Conference on Hermetic Sealing, Vibration Reliability and Ecological Safety of Pump and Compressor Machinery (HERVICON+PUMPS 2014), September 9-12, 2014, Sumy, Ukraineent://SD_ILS/0/SD_ILS:10439472026-09-26T16:31:13Z2026-09-26T16:31:13Zby International Scientific and Engineering Conference on Hermetic Sealing, Vibration Reliability and Ecological Safety of Pump and Compressor Machinery (14th : 2014 : Sumy, Ukraine)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1910938">Click to View</a><br/>Format: Electronic Resources<br/>Advances in product development and reliability III : selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, Chinaent://SD_ILS/0/SD_ILS:10415482026-09-26T16:31:13Z2026-09-26T16:31:13Zby International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China), issuing body.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1872895">Click to View</a><br/>Format: Electronic Resources<br/>Evaluation of quantification of margins and uncertainties methodology for assessing and certifying the reliability of the nuclear stockpileent://SD_ILS/0/SD_ILS:11011012026-09-26T16:31:13Z2026-09-26T16:31:13Zby National Research Council (U.S.). Committee on the Evaluation of Quantification of Margins and Uncertainties Methodology for Assessing and Certifying the Reliability of the Nuclear Stockpile.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3564163">Click to View</a><br/>Format: Electronic Resources<br/>Industrial lubrication and tribology. Volume 63, Number?, Selected papers from the 3rd International Conference on Integrity, Reliability and Failure 2009ent://SD_ILS/0/SD_ILS:9765212026-09-26T16:31:13Z2026-09-26T16:31:13Zby Seabra, J. (Jorge)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=683436">Click to View</a><br/>Format: Electronic Resources<br/>Safety, reliability, and applications of emerging intelligent control technologies : a postprint volume from the IFAC workshop, Hong Kong, 12-14 December 1994ent://SD_ILS/0/SD_ILS:11782862026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ng, Tung-Sang.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080423746">http://www.sciencedirect.com/science/book/9780080423746</a><br/>Format: Electronic Resources<br/>Multi-scale reliability and serviceability assessment of in-service long-span bridgesent://SD_ILS/0/SD_ILS:11376382026-09-26T16:31:13Z2026-09-26T16:31:13Zby Lu, Naiwei, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5382830">Click to View</a><br/>Format: Electronic Resources<br/>Konstrüksiyon elemanlarında güvenirlik (reliability) ve ömür hesapları ; teorik açıklamalar ve uygulamalarent://SD_ILS/0/SD_ILS:4891562026-09-26T16:31:13Z2026-09-26T16:31:13Zby Tahralı, Necati<br/>Format: Books<br/>Reliability theory and models : stochastic failure models, optimal maintenance policies, life testing, and structuresent://SD_ILS/0/SD_ILS:11776332026-09-26T16:31:13Z2026-09-26T16:31:13Zby Abdel-Hameed, Mohamed S.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780120414208">https://www.sciencedirect.com/science/book/9780120414208</a><br/>Format: Electronic Resources<br/>Reliability issues for DoD systems report of a workshopent://SD_ILS/0/SD_ILS:10827242026-09-26T16:31:13Z2026-09-26T16:31:13Zby Samaniego, Francisco.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3375321">Click to View</a><br/>Format: Electronic Resources<br/>Reliability of safety-critical systems : theory and applicationent://SD_ILS/0/SD_ILS:10276452026-09-26T16:31:13Z2026-09-26T16:31:13Zby Rausand, Marvin.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1637653">Click to View</a><br/>Format: Electronic Resources<br/>Improving product reliability and software quality : strategies, tools, process and implementationent://SD_ILS/0/SD_ILS:11456872026-09-26T16:31:13Z2026-09-26T16:31:13Zby Levin, Mark, 1959- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5741218">Click to View</a><br/>Format: Electronic Resources<br/>Reliability, maintainability and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11244862026-09-26T16:31:13Z2026-09-26T16:31:13Zby Smith, David J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4825735">Click to View</a><br/>Format: Electronic Resources<br/>Reliability engineering and risk analysis : a practical guideent://SD_ILS/0/SD_ILS:11381572026-09-26T16:31:13Z2026-09-26T16:31:13Zby Modarres, M. (Mohammad), author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5400700">Click to View</a><br/>Format: Electronic Resources<br/>Gas and oil reliability engineering : modeling and analysisent://SD_ILS/0/SD_ILS:11113622026-09-26T16:31:13Z2026-09-26T16:31:13Zby Calixto, Eduardo, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4526461">Click to View</a><br/>Format: Electronic Resources<br/>Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthdayent://SD_ILS/0/SD_ILS:10268912026-09-26T16:31:13Z2026-09-26T16:31:13Zby Nakamura, Syouji.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1611972">Click to View</a><br/>Format: Electronic Resources<br/>Reliability prediction from burn-in data fit to reliability modelsent://SD_ILS/0/SD_ILS:10283592026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bernstein, Joseph B., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1647477">Click to View</a><br/>Format: Electronic Resources<br/>Practical reliability engineering and analysis for system design and life-cycle sustainmentent://SD_ILS/0/SD_ILS:9636322026-09-26T16:31:13Z2026-09-26T16:31:13Zby Wessels, William R.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=533784">Click to View</a><br/>Format: Electronic Resources<br/>The OEE primer : understanding overall equipment effectiveness, reliability, and maintainabilityent://SD_ILS/0/SD_ILS:973522026-09-26T16:31:13Z2026-09-26T16:31:13Zby Stamatis, D.H.<br/>Format: Books<br/>HALT, HASS, and HASA explained : accelerated reliability techniquesent://SD_ILS/0/SD_ILS:10553092026-09-26T16:31:13Z2026-09-26T16:31:13Zby McLean, Harry W., 1946- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002645">Click to View</a><br/>Format: Electronic Resources<br/>Robust design methodology for reliability exploring the effects of variation and uncertaintyent://SD_ILS/0/SD_ILS:9558972026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bergman, Bo, 1943-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=454321">Click to View</a><br/>Format: Electronic Resources<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:9353752026-09-26T16:31:13Z2026-09-26T16:31:13Zby Smith, David John, 1943-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=269666">Click to View</a><br/>Format: Electronic Resources<br/>World class reliability using Multiple Environment Overstress Tests to make it happenent://SD_ILS/0/SD_ILS:9329232026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bhote, Keki R., 1925-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=243100">Click to View</a><br/>Format: Electronic Resources<br/>Reliability, maintainability, and supportability : best practices for systems engineersent://SD_ILS/0/SD_ILS:10431672026-09-26T16:31:13Z2026-09-26T16:31:13Zby Tortorella, Michael, 1947- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1896020">Click to View</a><br/>Format: Electronic Resources<br/>Gas and oil reliability engineering modeling and analysisent://SD_ILS/0/SD_ILS:10016802026-09-26T16:31:13Z2026-09-26T16:31:13Zby Calixto, Eduardo.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1032940">Click to View</a><br/>Format: Electronic Resources<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:9805752026-09-26T16:31:13Z2026-09-26T16:31:13Zby Smith, David J.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=730199">Click to View</a><br/>Format: Electronic Resources<br/>Reliability, maintainability and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11878352026-09-26T16:31:13Z2026-09-26T16:31:13Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format: Electronic Resources<br/>Reliability, Maintainability and Risk 8e Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:1372392026-09-26T16:31:13Z2026-09-26T16:31:13Zby Smith, David J.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Electronic Resources<br/>Reliability, Maintainability and Risk : Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:11838532026-09-26T16:31:13Z2026-09-26T16:31:13Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080969022">https://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Electronic Resources<br/>Importance measures in reliability, risk, and optimization principles and applicationsent://SD_ILS/0/SD_ILS:9944472026-09-26T16:31:13Z2026-09-26T16:31:13Zby Kuo, Way, 1951-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=912160">Click to View</a><br/>Format: Electronic Resources<br/>Risk-based reliability analysis and generic principles for risk reductionent://SD_ILS/0/SD_ILS:11856452026-09-26T16:31:13Z2026-09-26T16:31:13Zby Todinov, M. T.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Electronic Resources<br/>Reliability of MEMS testing of materials and devicesent://SD_ILS/0/SD_ILS:9609892026-09-26T16:31:13Z2026-09-26T16:31:13Zby Tabata, Osamu.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=481344">Click to View</a><br/>Format: Electronic Resources<br/>Spacecraft reliability and multi-state failures a statistical approachent://SD_ILS/0/SD_ILS:9784342026-09-26T16:31:13Z2026-09-26T16:31:13Zby Saleh, Joseph H., 1971-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=697462">Click to View</a><br/>Format: Electronic Resources<br/>Statistical theory of reliability and life testing : probability modelsent://SD_ILS/0/SD_ILS:6701822026-09-26T16:31:13Z2026-09-26T16:31:13Zby Barlow, Richard E.<br/>Format: Books<br/>Reliability analysis for asset management of electric power gridsent://SD_ILS/0/SD_ILS:11441452026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ross, Robert D., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630246">Click to View</a><br/>Format: Electronic Resources<br/>Corporate communications. Volume 23, Number 2, An International Journal : Communicating/Organizing for Reliability, Resilience, and Safetyent://SD_ILS/0/SD_ILS:11373142026-09-26T16:31:13Z2026-09-26T16:31:13Zby Barbour, Joshua B., editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5351422">Click to View</a><br/>Format: Electronic Resources<br/>Semi-Markov processes : applications in system reliability and maintenanceent://SD_ILS/0/SD_ILS:10381822026-09-26T16:31:13Z2026-09-26T16:31:13Zby Grabski, Franciszek, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1798310">Click to View</a><br/>Format: Electronic Resources<br/>Probability, statistics, and reliability for engineers and scientistsent://SD_ILS/0/SD_ILS:10272312026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ayyub, Bilal M., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1631123">Click to View</a><br/>Format: Electronic Resources<br/>Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessmentent://SD_ILS/0/SD_ILS:11279302026-09-26T16:31:13Z2026-09-26T16:31:13Zby Modarres, M. (Mohammad), author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4901681">Click to View</a><br/>Format: Electronic Resources<br/>Binary decision diagrams and extensions for system reliability analysisent://SD_ILS/0/SD_ILS:11032282026-09-26T16:31:13Z2026-09-26T16:31:13Zby Xing, Liudong, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4041105">Click to View</a><br/>Format: Electronic Resources<br/>Oxide reliability a summary of silicon oxide wearout, breakdown, and reliabilityent://SD_ILS/0/SD_ILS:10303252026-09-26T16:31:13Z2026-09-26T16:31:13Zby Dumin, D. J.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679439">Click to View</a><br/>Format: Electronic Resources<br/>Mathematical models for the study of the reliability of systemsent://SD_ILS/0/SD_ILS:11907132026-09-26T16:31:13Z2026-09-26T16:31:13Zby Kaufmann, A. (Arnold), 1911-1994.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780124023703">https://www.sciencedirect.com/science/book/9780124023703</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/publication?issn=00765392&volume=124">https://www.sciencedirect.com/science/publication?issn=00765392&volume=124</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/bookseries/00765392/124">https://www.sciencedirect.com/science/bookseries/00765392/124</a><br/>Format: Electronic Resources<br/>Reliability in computing : the role of interval methods in scientific computingent://SD_ILS/0/SD_ILS:11759752026-09-26T16:31:13Z2026-09-26T16:31:13Zby Moore, Ramon E.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780125056304">https://www.sciencedirect.com/science/book/9780125056304</a><br/>Format: Electronic Resources<br/>General principles : general principles on quality assurance for structures : general principles on reliability for structural design : reportent://SD_ILS/0/SD_ILS:11703082026-09-26T16:31:13Z2026-09-26T16:31:13Zby Joint Committee on Structural Safety.<br/>Format: Books<br/>Statistical models and methods for reliability and survival analysisent://SD_ILS/0/SD_ILS:10243132026-09-26T16:31:13Z2026-09-26T16:31:13Zby Couallier, Vincent.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1580028">Click to View</a><br/>Format: Electronic Resources<br/>Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applicationsent://SD_ILS/0/SD_ILS:10155422026-09-26T16:31:13Z2026-09-26T16:31:13Zby Wu, Bin.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1222589">Click to View</a><br/>Format: Electronic Resources<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:11844892026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ohring, Milton, 1936-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format: Electronic Resources<br/>Software reliability : measurement, prediction, application / John D. Musa, Anthony Iannino, Kazuhira Okumoto.ent://SD_ILS/0/SD_ILS:9185242026-09-26T16:31:13Z2026-09-26T16:31:13Zby Musa, John D.<br/>Format: Books<br/>Fundamentals of reliability engineering : applications in multistage interconnection networksent://SD_ILS/0/SD_ILS:10279372026-09-26T16:31:13Z2026-09-26T16:31:13Zby Gunawan, Indra, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1641079">Click to View</a><br/>Format: Electronic Resources<br/>Semi-Markov chains and hidden semi-Markov models toward applications their use in reliability and DNA analysisent://SD_ILS/0/SD_ILS:9501292026-09-26T16:31:13Z2026-09-26T16:31:13Zby Barbu, Vlad Stefan.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=417305">Click to View</a><br/>Format: Electronic Resources<br/>Fault injection techniques and tools for embedded systems reliability evaluationent://SD_ILS/0/SD_ILS:10625312026-09-26T16:31:13Z2026-09-26T16:31:13Zby Benso, Alfredo.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3036042">Click to View</a><br/>Format: Electronic Resources<br/>Probabilistic safety assessment for optimum nuclear power plant life management (PLiM) theory and application of reliability analysis methods for major power plant componentsent://SD_ILS/0/SD_ILS:10239402026-09-26T16:31:13Z2026-09-26T16:31:13Zby Arkadov, Gennadij V.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1575572">Click to View</a><br/>Format: Electronic Resources<br/>Reliability Design of Mechanical Systems A Guide for Mechanical and Civil Engineersent://SD_ILS/0/SD_ILS:4809402026-09-26T16:31:13Z2026-09-26T16:31:13Zby Woo, Seongwoo. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-50829-0">http://dx.doi.org/10.1007/978-3-319-50829-0</a><br/>Format: Electronic Resources<br/>Engineering maintainability : how to design for reliability and easy maintenanceent://SD_ILS/0/SD_ILS:11851692026-09-26T16:31:13Z2026-09-26T16:31:13Zby Dhillon, B. S. (Balbir S.), 1947-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152576">http://www.sciencedirect.com/science/book/9780884152576</a><br/>Format: Electronic Resources<br/>Theory and Practice of Quality and Reliability Engineering in Asia Industryent://SD_ILS/0/SD_ILS:4817212026-09-26T16:31:13Z2026-09-26T16:31:13Zby Tan, Cher Ming. editor.<br/><a href="http://dx.doi.org/10.1007/978-981-10-3290-5">http://dx.doi.org/10.1007/978-981-10-3290-5</a><br/>Format: Electronic Resources<br/>Reliability and Risk Evaluation of Wind Integrated Power Systemsent://SD_ILS/0/SD_ILS:1405572026-09-26T16:31:13Z2026-09-26T16:31:13Zby Billinton, Roy. editor.<br/><a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format: Electronic Resources<br/>Process risk and reliability management : operational integrity managementent://SD_ILS/0/SD_ILS:11784322026-09-26T16:31:13Z2026-09-26T16:31:13Zby Sutton, Ian S.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format: Electronic Resources<br/>Measures of response reliability in 1988 household labour force survey for Ankaraent://SD_ILS/0/SD_ILS:768492026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bilge, Hüsniye<br/>Format: Books<br/>Goal oriented methodology and applications in nuclear power plants : a modern systems reliability approachent://SD_ILS/0/SD_ILS:11487402026-09-26T16:31:13Z2026-09-26T16:31:13Zby Xiao-Jian, Yi, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5969498">Click to View</a><br/>Format: Electronic Resources<br/>Mastering selenium webdriver 3.0 : boost the performance and reliability of your automated checks by mastering Selenium WebDriver.ent://SD_ILS/0/SD_ILS:11404512026-09-26T16:31:13Z2026-09-26T16:31:13Zby Collin, Mark, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5446029">Click to View</a><br/>Format: Electronic Resources<br/>Firearm and toolmark identification : the scientific reliability of the forensic science disciplineent://SD_ILS/0/SD_ILS:11406762026-09-26T16:31:13Z2026-09-26T16:31:13Zby Nichols, Ronald, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5455401">Click to View</a><br/>Format: Electronic Resources<br/>Solid oxide fuel cell lifetime and reliability : critical challenges in fuel cellsent://SD_ILS/0/SD_ILS:11265972026-09-26T16:31:13Z2026-09-26T16:31:13Zby Brandon, Nigel P., editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4865436">Click to View</a><br/>Format: Electronic Resources<br/>Numerical methods of simulation and optimization of piecewise deterministic Markov processes : application to reliabilityent://SD_ILS/0/SD_ILS:11047542026-09-26T16:31:13Z2026-09-26T16:31:13Zby Saporta, Benoîte de, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4205869">Click to View</a><br/>Format: Electronic Resources<br/>Reliability, robustness and failure mechanisms of led devices : methodology and evaluationent://SD_ILS/0/SD_ILS:11196022026-09-26T16:31:13Z2026-09-26T16:31:13Zby Deshayes, Yannick, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4717207">Click to View</a><br/>Format: Electronic Resources<br/>Simulation of stochastic processes with given accuracy and reliabilityent://SD_ILS/0/SD_ILS:11208622026-09-26T16:31:13Z2026-09-26T16:31:13Zby Kozachenko, Yuriy, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4747211">Click to View</a><br/>Format: Electronic Resources<br/>Designing for human reliability : human factors engineering in the oil, gas, and process industriesent://SD_ILS/0/SD_ILS:10469492026-09-26T16:31:13Z2026-09-26T16:31:13Zby McLeod, Ronald W. , author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=2000913">Click to View</a><br/>Format: Electronic Resources<br/>Embedded mechatronic systems. Volume 1, Analysis of failures, predictive reliabilityent://SD_ILS/0/SD_ILS:10519342026-09-26T16:31:13Z2026-09-26T16:31:13Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=2086747">Click to View</a><br/>Format: Electronic Resources<br/>Flow networks analysis and optimization of repairable flow networks, networks with disturbed flows, static flow networks and reliability networksent://SD_ILS/0/SD_ILS:10075062026-09-26T16:31:13Z2026-09-26T16:31:13Zby Todinov, Michael T.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1114626">Click to View</a><br/>Format: Electronic Resources<br/>Electric utility resource planning economics, reliability, and decision-makingent://SD_ILS/0/SD_ILS:9874722026-09-26T16:31:13Z2026-09-26T16:31:13Zby Sim, Steven.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=826969">Click to View</a><br/>Format: Electronic Resources<br/>Fault tolerant drive by wire systems impact on vehicle safety and reliabilityent://SD_ILS/0/SD_ILS:9985582026-09-26T16:31:13Z2026-09-26T16:31:13Zby Anwar, Sohel.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=976620">Click to View</a><br/>Format: Electronic Resources<br/>The cost of being landlocked logistics, costs, and supply chain reliabilityent://SD_ILS/0/SD_ILS:9686422026-09-26T16:31:13Z2026-09-26T16:31:13Zby Arvis, Jean-François, 1960-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=589796">Click to View</a><br/>Format: Electronic Resources<br/>Axiomatic quality integrating axiomatic design with six-sigma, reliability, and quality engineeringent://SD_ILS/0/SD_ILS:9309382026-09-26T16:31:13Z2026-09-26T16:31:13Zby El-Haik, Basem.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=227550">Click to View</a><br/>Format: Electronic Resources<br/>Reliability and validity of the Turkish version of the service quality assessment scaleent://SD_ILS/0/SD_ILS:846902026-09-26T16:31:13Z2026-09-26T16:31:13Zby Gürbüz, Bülent<br/>Format: Books<br/>Ecology, engineering, and management reconciling ecosystem rehabilitation and service reliabilityent://SD_ILS/0/SD_ILS:9506762026-09-26T16:31:13Z2026-09-26T16:31:13Zby Eeten, Michel van.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=422475">Click to View</a><br/>Format: Electronic Resources<br/>Reliability of medicare hospital discharge records report of a studyent://SD_ILS/0/SD_ILS:10848512026-09-26T16:31:13Z2026-09-26T16:31:13Zby Institute of Medicine (U.S.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3377596">Click to View</a><br/>Format: Electronic Resources<br/>Electricity access in Sub-Saharan Africa : uptake, reliability, and complementary factors for economic impact, Moussa P. Blimpo and Malcolm Cosgrove-Davies.ent://SD_ILS/0/SD_ILS:11453922026-09-26T16:31:13Z2026-09-26T16:31:13Zby Blimpo, Moussa P., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5725963">Click to View</a><br/>Format: Electronic Resources<br/>A big data analytics approach to quality, reliability and risk managementent://SD_ILS/0/SD_ILS:11456102026-09-26T16:31:13Z2026-09-26T16:31:13Zby Mazzuto, Giovanni, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5734581">Click to View</a><br/>Format: Electronic Resources<br/>Risk and reliability in structural engineering : theoretical basisent://SD_ILS/0/SD_ILS:11465922026-09-26T16:31:13Z2026-09-26T16:31:13Zby Lu, Naiwei, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5780563">Click to View</a><br/>Format: Electronic Resources<br/>Durability and reliability of polymers and other materials in photovoltaic modulesent://SD_ILS/0/SD_ILS:11468702026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bruckman, Laura, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5788821">Click to View</a><br/>Format: Electronic Resources<br/>Bioelectronics and medical devices : from materials to devices - fabrication, applications and reliabilityent://SD_ILS/0/SD_ILS:11470392026-09-26T16:31:13Z2026-09-26T16:31:13Zby Pal, Kunal, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5796374">Click to View</a><br/>Format: Electronic Resources<br/>Wide bandgap power semiconductor packaging : materials, components, and reliabilityent://SD_ILS/0/SD_ILS:11382432026-09-26T16:31:13Z2026-09-26T16:31:13Zby Suganuma, Katsuaki, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5404290">Click to View</a><br/>Format: Electronic Resources<br/>Security, privacy and reliability in computer communications and networksent://SD_ILS/0/SD_ILS:11217842026-09-26T16:31:13Z2026-09-26T16:31:13Zby Sha, Kewei, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4771355">Click to View</a><br/>Format: Electronic Resources<br/>Stochastic models in survival analysis and reliability set. Volume 1, Reliability of engineering systems and technological riskent://SD_ILS/0/SD_ILS:11152762026-09-26T16:31:13Z2026-09-26T16:31:13Zby Rykov, Vladimir, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4648726">Click to View</a><br/>Format: Electronic Resources<br/>Reliability assurance of big data in the cloud : cost-effective replication-based storageent://SD_ILS/0/SD_ILS:10425632026-09-26T16:31:13Z2026-09-26T16:31:13Zby Yang, Yun, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1888753">Click to View</a><br/>Format: Electronic Resources<br/>Quality and reliability aspects in nuclear power reactor fuel engineeringent://SD_ILS/0/SD_ILS:11258542026-09-26T16:31:13Z2026-09-26T16:31:13Zby International Atomic Energy Agency.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4853266">Click to View</a><br/>Format: Electronic Resources<br/>Reliability in cognitive neuroscience a meta-meta-analysisent://SD_ILS/0/SD_ILS:10821022026-09-26T16:31:13Z2026-09-26T16:31:13Zby Uttal, William R.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3339523">Click to View</a><br/>Format: Electronic Resources<br/>Assessing the reliability of complex models mathematical and statistical foundations of verification, validation, and uncertainty quantificationent://SD_ILS/0/SD_ILS:10861332026-09-26T16:31:13Z2026-09-26T16:31:13Zby National Research Council (U.S.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3378995">Click to View</a><br/>Format: Electronic Resources<br/>Using the Weibull distribution reliability, modeling, and inferenceent://SD_ILS/0/SD_ILS:9933922026-09-26T16:31:13Z2026-09-26T16:31:13Zby McCool, John, 1936-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=894399">Click to View</a><br/>Format: Electronic Resources<br/>Microsoft SQL Server 2008 high availability minimize downtime, speed up recovery, and achieve the highest level of availability and reliability for SQL server applications by mastering the concepts of database mirroring, log shipping, clustering, and replicationent://SD_ILS/0/SD_ILS:9968422026-09-26T16:31:13Z2026-09-26T16:31:13Zby Goswami, Hemantgiri S.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=948566">Click to View</a><br/>Format: Electronic Resources<br/>Recent advances in providing QoS and reliability in the future Internet backboneent://SD_ILS/0/SD_ILS:10591222026-09-26T16:31:13Z2026-09-26T16:31:13Zby Wang, Ning, 1974-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3018661">Click to View</a><br/>Format: Electronic Resources<br/>Equipment management workbook key to equipment reliability and productivity in miningent://SD_ILS/0/SD_ILS:9734122026-09-26T16:31:13Z2026-09-26T16:31:13Zby Tomlingson, Paul D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=655785">Click to View</a><br/>Format: Electronic Resources<br/>Safety and reliability in cooperating unmanned aerial systemsent://SD_ILS/0/SD_ILS:9807482026-09-26T16:31:13Z2026-09-26T16:31:13Zby Rabbath, Camille Alain, 1969-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=731173">Click to View</a><br/>Format: Electronic Resources<br/>Equipment management key to equipment reliability and productivity in miningent://SD_ILS/0/SD_ILS:9573092026-09-26T16:31:13Z2026-09-26T16:31:13Zby Tomlingson, Paul D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=464572">Click to View</a><br/>Format: Electronic Resources<br/>Advanced manufacturing process, lead free interconnect materials and reliability modeling for electronics packagingent://SD_ILS/0/SD_ILS:9350502026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bailey, Christopher.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=267393">Click to View</a><br/>Format: Electronic Resources<br/>Risk, reliability, uncertainty, and robustness of water resources systemsent://SD_ILS/0/SD_ILS:9290212026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bogárdi, János.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=201907">Click to View</a><br/>Format: Electronic Resources<br/>Digital instrumentation and control systems in nuclear power plants safety and reliability issues : final reportent://SD_ILS/0/SD_ILS:10830752026-09-26T16:31:13Z2026-09-26T16:31:13Zby National Research Council (U.S.). Committee on Application of Digital Instrumentation and Control Systems to Nuclear Power Plant Operations and Safety.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3375677">Click to View</a><br/>Format: Electronic Resources<br/>On the Historical Reliability of Ancient Biographies: A thorough Examination of Xenophon's Agesilaus, Cornelius Nepos's Atticus, Tacitus's Agricola, and The Gospel According to Johnent://SD_ILS/0/SD_ILS:7014422026-09-26T16:31:13Z2026-09-26T16:31:13Zby Wright, Edward T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13815012">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13815012</a><br/>Format: Books<br/>Reliability Assessment of a System Integrity Protection Scheme for Transmission Networksent://SD_ILS/0/SD_ILS:7026762026-09-26T16:31:13Z2026-09-26T16:31:13Zby Liu, Nan, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870347">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870347</a><br/>Format: Books<br/>On Grid Converter Reliability: Preserving the Life of Power Electronics Through Active Thermal Boundary Controlent://SD_ILS/0/SD_ILS:7037072026-09-26T16:31:13Z2026-09-26T16:31:13Zby Lewis, Patrick T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872130">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872130</a><br/>Format: Books<br/>Efficient reliability modelling & analysis of complex systems with application to nuclear power plant safetyent://SD_ILS/0/SD_ILS:7043572026-09-26T16:31:13Z2026-09-26T16:31:13Zby George-Williams, H., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872865">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872865</a><br/>Format: Books<br/>Energy saving and reliability of wireless body area networks for health applicationsent://SD_ILS/0/SD_ILS:7045662026-09-26T16:31:13Z2026-09-26T16:31:13Zby Alshaheen, H. S. S., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873074">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873074</a><br/>Format: Books<br/>Calibration of expensive computer models using engineering reliability methodsent://SD_ILS/0/SD_ILS:7050082026-09-26T16:31:13Z2026-09-26T16:31:13Zby Gong, Zitong, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873517">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873517</a><br/>Format: Books<br/>Stochastic methods for emulation, calibration and reliability analysis of engineering modelsent://SD_ILS/0/SD_ILS:7057362026-09-26T16:31:13Z2026-09-26T16:31:13Zby Garbuno Inigo, A., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13874246">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13874246</a><br/>Format: Books<br/>The Implications of the Internet's Topological Structure for Its Efficiency, Security, and Reliabilityent://SD_ILS/0/SD_ILS:6989362026-09-26T16:31:13Z2026-09-26T16:31:13Zby Nur, Abdullah Yasin, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10980025">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10980025</a><br/>Format: Books<br/>Assessing the Reliability of the 1760 British Geographical Survey of the St. Lawrence River Valleyent://SD_ILS/0/SD_ILS:6991232026-09-26T16:31:13Z2026-09-26T16:31:13Zby Gliserman, Nicholas, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11016107">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11016107</a><br/>Format: Books<br/>The Reliability of Simultaneous Quantitative 3D Analysis of Bone and Soft Tissue Volumesent://SD_ILS/0/SD_ILS:6992632026-09-26T16:31:13Z2026-09-26T16:31:13Zby Mehryar, Paymon, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11017007">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11017007</a><br/>Format: Books<br/>Development and Evaluation of a Prototype Travel Time Reliability Monitoring System for Freeway Facilities in North Carolinaent://SD_ILS/0/SD_ILS:6993822026-09-26T16:31:13Z2026-09-26T16:31:13Zby Smith, Russell Charles, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11018101">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11018101</a><br/>Format: Books<br/>Characterization of Self-Heating Effects and Assessment of Its Impact on Reliability in FinFET Technologyent://SD_ILS/0/SD_ILS:6996352026-09-26T16:31:13Z2026-09-26T16:31:13Zby Paliwoda, Peter Christopher, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13423034">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13423034</a><br/>Format: Books<br/>Performance-Based Economical Seismic Design of Multistory Reinforced Concrete Frame Buildings and Reliability Assessmentent://SD_ILS/0/SD_ILS:6997182026-09-26T16:31:13Z2026-09-26T16:31:13Zby Zhang, Chunyu, author. (orcid)0000-0002-1073-1902<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13424086">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13424086</a><br/>Format: Books<br/>Reliability and Validity of the Active-mini for Quantifying Movement in Infants with Spinal Muscular Atrophyent://SD_ILS/0/SD_ILS:7017292026-09-26T16:31:13Z2026-09-26T16:31:13Zby Nelson, Leslie, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13846799">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13846799</a><br/>Format: Books<br/>Control of Wind Power Systems for Energy Efficiency and Reliabilityent://SD_ILS/0/SD_ILS:7017672026-09-26T16:31:13Z2026-09-26T16:31:13Zby Xiao, Yan, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13849196">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13849196</a><br/>Format: Books<br/>Inter-rater reliability of the structured assessment of violence risk in youth (savry) amongst mental health professionalsent://SD_ILS/0/SD_ILS:7075042026-09-26T16:31:13Z2026-09-26T16:31:13Zby Selby, Sarah Elizabeth, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13876017">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13876017</a><br/>Format: Books<br/>Scheduling event-triggered and time-triggered applications with optimal reliability and predictability on networked multi-core chipsent://SD_ILS/0/SD_ILS:6855612026-09-26T16:31:13Z2026-09-26T16:31:13Zby Murshed, Ayman, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10869403">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10869403</a><br/>Format: Books<br/>Advancements in Evaluating Reliability of Nondestructive Technologies for the Detection of Subsurface Fracture Damage in R.C. Bridge Decksent://SD_ILS/0/SD_ILS:7026012026-09-26T16:31:13Z2026-09-26T16:31:13Zby Sultan, Ali Abed, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870026">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870026</a><br/>Format: Books<br/>Reliability analysis for small wind turbines using bayesian hierarchical modellingent://SD_ILS/0/SD_ILS:7066022026-09-26T16:31:13Z2026-09-26T16:31:13Zby Wu, JenHao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13875114">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13875114</a><br/>Format: Books<br/>Evaluation of Factors Influencing Los Angeles Tiered-Dispatch System's Improvement on Bystander CPR Rate and Inter Reliability between Electronic Patient Care Report (ePCR) and 911 Call Review on Bystander CPR Rateent://SD_ILS/0/SD_ILS:6982772026-09-26T16:31:13Z2026-09-26T16:31:13Zby Zhang, Huihui, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10801261">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10801261</a><br/>Format: Books<br/>Target Levels of Reliability for Design of Bridge Foundations and Approach Embankments Using LRFDent://SD_ILS/0/SD_ILS:7025722026-09-26T16:31:13Z2026-09-26T16:31:13Zby Huaco, Daniel R., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13869883">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13869883</a><br/>Format: Books<br/>Modeling and simulation for microelectronic packaging assembly manufacturing, reliability and testingent://SD_ILS/0/SD_ILS:9867042026-09-26T16:31:13Z2026-09-26T16:31:13Zby Liu, S. (Sheng), 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=818629">Click to View</a><br/>Format: Electronic Resources<br/>The evolution of animal communication reliability and deception in signaling systemsent://SD_ILS/0/SD_ILS:9614422026-09-26T16:31:13Z2026-09-26T16:31:13Zby Searcy, William A., 1950-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=485769">Click to View</a><br/>Format: Electronic Resources<br/>Adhesives technology for electronic applications : materials, processes, reliabilityent://SD_ILS/0/SD_ILS:11900162026-09-26T16:31:13Z2026-09-26T16:31:13Zby Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515135">http://www.sciencedirect.com/science/book/9780815515135</a><br/>Format: Electronic Resources<br/>Graph theory in modern engineering : computer aided design, control, optimization, reliability analysisent://SD_ILS/0/SD_ILS:11908862026-09-26T16:31:13Z2026-09-26T16:31:13Zby Henley, Ernest J.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780123408501">https://www.sciencedirect.com/science/book/9780123408501</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/publication?issn=00765392&volume=98">https://www.sciencedirect.com/science/publication?issn=00765392&volume=98</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/bookseries/00765392/98">https://www.sciencedirect.com/science/bookseries/00765392/98</a><br/>Format: Electronic Resources<br/>The Reliability of Symphony Link in Emergency Scenariosent://SD_ILS/0/SD_ILS:6896642026-09-26T16:31:13Z2026-09-26T16:31:13Zby Larson, Anna, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10786579">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10786579</a><br/>Format: Books<br/>Reliability of Highly Stretchable Flexible Electronic Interconnects and Surface Improvement of DMLS Printed Partsent://SD_ILS/0/SD_ILS:6932992026-09-26T16:31:13Z2026-09-26T16:31:13Zby Zachariah, Ashwin Varkey, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10816881">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10816881</a><br/>Format: Books<br/>Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliabilityent://SD_ILS/0/SD_ILS:1375512026-09-26T16:31:13Z2026-09-26T16:31:13Zby Levinson, David M.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format: Electronic Resources<br/>Canadian Matrimonial Litigation Requires Reliability Testing for Unaudited Financial Statementsent://SD_ILS/0/SD_ILS:6808722026-09-26T16:31:13Z2026-09-26T16:31:13Zby Mailloux, Athena, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812640">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812640</a><br/>Format: Books<br/>Applications of Bayesian Hierarchical Models in Gene Expression and Product Reliabilityent://SD_ILS/0/SD_ILS:6781492026-09-26T16:31:13Z2026-09-26T16:31:13Zby Mittman, Eric T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10688357">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10688357</a><br/>Format: Books<br/>Reliability and Resiliency Driven Solutions for Electric Power Systems Operation and Planningent://SD_ILS/0/SD_ILS:6784832026-09-26T16:31:13Z2026-09-26T16:31:13Zby Sedzro, Kwami Senam A., author. (orcid)0000-0002-2107-8662<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748235">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748235</a><br/>Format: Books<br/>Reliability of Phenotype Estimation and Extended Classification of Ancestry for Forensic Applicationsent://SD_ILS/0/SD_ILS:6923982026-09-26T16:31:13Z2026-09-26T16:31:13Zby Weisz, Naomi A., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10813495">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10813495</a><br/>Format: Books<br/>Test-Retest Reliability of TRIMP and Training Effect in Collegiate Icehockey Playersent://SD_ILS/0/SD_ILS:6925302026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ulmer, Jason, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10814025">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10814025</a><br/>Format: Books<br/>Reliability Evaluation and Improvement Based on Operational Failure Rate of Power Electronics in Islanded Microgrident://SD_ILS/0/SD_ILS:6930542026-09-26T16:31:13Z2026-09-26T16:31:13Zby Zhong, Wen, author. (orcid)0000-0002-5262-5067<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815889">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815889</a><br/>Format: Books<br/>The Effect of Overloading on Reliability of Wheel Loader Structural Componentsent://SD_ILS/0/SD_ILS:6882532026-09-26T16:31:13Z2026-09-26T16:31:13Zby Achelpohl, Eric Raymond, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10689117">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10689117</a><br/>Format: Books<br/>Comparing Offender Characteristics in a Sample of Oklahoma Sexual Assault Cases with Population Demographics in Oklahoma: A Study of the Reliability of a Statistical Profiling Methodologyent://SD_ILS/0/SD_ILS:6881702026-09-26T16:31:13Z2026-09-26T16:31:13Zby Moses, Caitlin, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10685854">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10685854</a><br/>Format: Books<br/>Reliability and Security in Low Power Circuits and Systemsent://SD_ILS/0/SD_ILS:6875362026-09-26T16:31:13Z2026-09-26T16:31:13Zby Geng, Hui, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10186967">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10186967</a><br/>Format: Books<br/>Adhesives technology for electronic applications : materials, processing, reliabilityent://SD_ILS/0/SD_ILS:11838012026-09-26T16:31:13Z2026-09-26T16:31:13Zby Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format: Electronic Resources<br/>Evaluating the reliability of emergency response systems for large-scale incident operationsent://SD_ILS/0/SD_ILS:9707202026-09-26T16:31:13Z2026-09-26T16:31:13Zby Jackson, Brian A., 1972-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=618726">Click to View</a><br/>Format: Electronic Resources<br/>The delivery reliability of UK manufacturing plants: An empirical studyent://SD_ILS/0/SD_ILS:6831692026-09-26T16:31:13Z2026-09-26T16:31:13Zby Szwejczewski, Marek Gregory, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10832263">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10832263</a><br/>Format: Books<br/>Geographic Routing Reliability Enhancement in Urban Vehicular Ad Hoc Networksent://SD_ILS/0/SD_ILS:6808922026-09-26T16:31:13Z2026-09-26T16:31:13Zby Alzamzami, Ohoud, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812787">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812787</a><br/>Format: Books<br/>Novel Methods for Improving Performance and Reliability of Flash-Based Solid State Storage Systement://SD_ILS/0/SD_ILS:6963602026-09-26T16:31:13Z2026-09-26T16:31:13Zby Guo, Jiayang, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10891703">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10891703</a><br/>Format: Books<br/>Task Relevant Source Based Brain Computer Interface: Exploration of Independent Component Analysis Based Spatial Filtering with Reliabilityent://SD_ILS/0/SD_ILS:6940382026-09-26T16:31:13Z2026-09-26T16:31:13Zby Cheema, Maninderpal Singh, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823332">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823332</a><br/>Format: Books<br/>Conditional Standard Errors of Measurement, Confidence Interval, and Reliability for Individual Level Student Growth Percentilesent://SD_ILS/0/SD_ILS:6880032026-09-26T16:31:13Z2026-09-26T16:31:13Zby Choi, Jinah, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10637021">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10637021</a><br/>Format: Books<br/>Assessing the Validity and Reliability of Computer-based Case Simulations in a Nurse Anesthesia Specialtyent://SD_ILS/0/SD_ILS:6885062026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ward, Robyn Camille, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10746481">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10746481</a><br/>Format: Books<br/>Inter-rater Reliability of Physical Abuse Determinations and Abusive Fracture Incidence at a Level 1 Pediatric Trauma Centerent://SD_ILS/0/SD_ILS:6887912026-09-26T16:31:13Z2026-09-26T16:31:13Zby Buesser, Katherine Elizabeth, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10749089">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10749089</a><br/>Format: Books<br/>Counsel Confidently: Reliability of Bedside Estimated Fetal Weight to Predict Survival at Periviabilityent://SD_ILS/0/SD_ILS:6886782026-09-26T16:31:13Z2026-09-26T16:31:13Zby Krenitsky, Nicole M., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748282">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748282</a><br/>Format: Books<br/>Coating materials for electronic applications : polymers, processes, reliability, testingent://SD_ILS/0/SD_ILS:11900182026-09-26T16:31:13Z2026-09-26T16:31:13Zby Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815514923">http://www.sciencedirect.com/science/book/9780815514923</a><br/>Format: Electronic Resources<br/>Human reliability : analysis, prediction, and prevention of human errorsent://SD_ILS/0/SD_ILS:11818202026-09-26T16:31:13Z2026-09-26T16:31:13Zby Park, Kyung S. (Kyung Soo)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780444427274">https://www.sciencedirect.com/science/book/9780444427274</a><br/>Format: Electronic Resources<br/>The elasto-plastic buckling strength of imperfect hemispheres and their reliabilityent://SD_ILS/0/SD_ILS:6848632026-09-26T16:31:13Z2026-09-26T16:31:13Zby Shao, Wen Jiao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10868287">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10868287</a><br/>Format: Books<br/>Evaluation of the Reliability of Nondestructive Ultrasonic Inspection Methods for the Detection and the Characterization of Defects in Hydroelectric Turbine Welded Joints = &Eacute;valuation de la fiabilit&eacute; des m&eacute;thodes de contr&ocirc;le non destructives par ultrasons pour la d&eacute;tection et la caract&eacute;risation de d&eacute;fauts dans des joints soud&eacute;s de turbines hydro&eacute;lectriquesent://SD_ILS/0/SD_ILS:7013802026-09-26T16:31:13Z2026-09-26T16:31:13Zby Habibzadeh Boukani, Hamid, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13814436">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13814436</a><br/>Format: Books<br/>Opto-Electro-Thermal Approach to Modeling Photovoltaic Performance and Reliability from Cell to Moduleent://SD_ILS/0/SD_ILS:6784262026-09-26T16:31:13Z2026-09-26T16:31:13Zby Sun, Xingshu, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10747508">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10747508</a><br/>Format: Books<br/>Microgrid Reliability Evaluation Based on Condition-Dependent Failure Models of Power Electronic Devicesent://SD_ILS/0/SD_ILS:6930272026-09-26T16:31:13Z2026-09-26T16:31:13Zby Li, Qi, author. (orcid)0000-0001-7329-0991<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815787">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815787</a><br/>Format: Books<br/>Reliability Modeling, Testing and Optimization of Systems with Mixtures of One-Shot Unitsent://SD_ILS/0/SD_ILS:6872652026-09-26T16:31:13Z2026-09-26T16:31:13Zby Cheng, Yao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902001">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902001</a><br/>Format: Books<br/>Automated Runtime Data Analysis for System Reliability Managementent://SD_ILS/0/SD_ILS:6873212026-09-26T16:31:13Z2026-09-26T16:31:13Zby He, Pinjia, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902155">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902155</a><br/>Format: Books<br/>Evaluation of the Life-Cycle Reliability of Engineered Slopes Utilizing Multi-Source Monitoring Informationent://SD_ILS/0/SD_ILS:6967742026-09-26T16:31:13Z2026-09-26T16:31:13Zby Li, Xueyou, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903347">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903347</a><br/>Format: Books<br/>Semiconductor laser engineering, reliability and diagnostics a practical approach to high power and single mode devicesent://SD_ILS/0/SD_ILS:10078402026-09-26T16:31:13Z2026-09-26T16:31:13Zby Epperlein, Peter W.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1118506">Click to View</a><br/>Format: Electronic Resources<br/>Aerospace and automotive applications : issues, testing and analysisent://SD_ILS/0/SD_ILS:11306052026-09-26T16:31:13Z2026-09-26T16:31:13Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5108518">Click to View</a><br/>Format: Electronic Resources<br/>Data-Driven Remaining Useful Life Prognosis Techniques Stochastic Models, Methods and Applicationsent://SD_ILS/0/SD_ILS:4814752026-09-26T16:31:13Z2026-09-26T16:31:13Zby Si, Xiao-Sheng. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-54030-5">http://dx.doi.org/10.1007/978-3-662-54030-5</a><br/>Format: Electronic Resources<br/>Total quality management sustainabilityent://SD_ILS/0/SD_ILS:9315432026-09-26T16:31:13Z2026-09-26T16:31:13Zby Zairi, Mohamed.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=232302">Click to View</a><br/>Format: Electronic Resources<br/>Fluid-structure interactions and uncertainties : Ansys and fluent toolsent://SD_ILS/0/SD_ILS:11239032026-09-26T16:31:13Z2026-09-26T16:31:13Zby El Hami, Abdelkhalak, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4816334">Click to View</a><br/>Format: Electronic Resources<br/>Quality and supply chain management : integration challenges and impactsent://SD_ILS/0/SD_ILS:11109242026-09-26T16:31:13Z2026-09-26T16:31:13Zby Sampaio, Paulo, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4514356">Click to View</a><br/>Format: Electronic Resources<br/>Innovative quality management casesent://SD_ILS/0/SD_ILS:9343222026-09-26T16:31:13Z2026-09-26T16:31:13Zby Iwaarden, Jos van.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=258154">Click to View</a><br/>Format: Electronic Resources<br/>Best practice quality function deployment (QFD) casesent://SD_ILS/0/SD_ILS:9385502026-09-26T16:31:13Z2026-09-26T16:31:13Zby Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=289800">Click to View</a><br/>Format: Electronic Resources<br/>The leading edge in quality function deploymentent://SD_ILS/0/SD_ILS:9315462026-09-26T16:31:13Z2026-09-26T16:31:13Zby Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=232305">Click to View</a><br/>Format: Electronic Resources<br/>Quality improvement with design of experiments : a response surface approachent://SD_ILS/0/SD_ILS:446962026-09-26T16:31:13Z2026-09-26T16:31:13Zby Vuchkov, Ivan N.<br/>Format: Books<br/>Quality management and CSRent://SD_ILS/0/SD_ILS:9435452026-09-26T16:31:13Z2026-09-26T16:31:13Zby Hazlett, Shirley-Ann.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=320627">Click to View</a><br/>Format: Electronic Resources<br/>Systemic Decision Making Fundamentals for Addressing Problems and Messesent://SD_ILS/0/SD_ILS:4811912026-09-26T16:31:13Z2026-09-26T16:31:13Zby Hester, Patrick T. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-54672-8">http://dx.doi.org/10.1007/978-3-319-54672-8</a><br/>Format: Electronic Resources<br/>Corrosion Problems and Solutions in Oil Refining and Petrochemical Industryent://SD_ILS/0/SD_ILS:4805862026-09-26T16:31:13Z2026-09-26T16:31:13Zby Groysman, Alec. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-45256-2">http://dx.doi.org/10.1007/978-3-319-45256-2</a><br/>Format: Electronic Resources<br/>Recurrent event modeling based on the Yule process : application to water network asset managementent://SD_ILS/0/SD_ILS:11047602026-09-26T16:31:13Z2026-09-26T16:31:13Zby Le Gat, Yves, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4205903">Click to View</a><br/>Format: Electronic Resources<br/>Response modeling methodology empirical modeling for engineering and scienceent://SD_ILS/0/SD_ILS:9344452026-09-26T16:31:13Z2026-09-26T16:31:13Zby Shore, Haim.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=259265">Click to View</a><br/>Format: Electronic Resources<br/>Failure analysis a practical guide for manufacturers of electronic components and systemsent://SD_ILS/0/SD_ILS:9751202026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bâzu, M. I. (Marius I.), 1948-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=675196">Click to View</a><br/>Format: Electronic Resources<br/>Füze arayıcı başlığı için güvenilirlik analizi ve güvenilirlik iyileştirme çalışmasıent://SD_ILS/0/SD_ILS:11703152026-09-26T16:31:13Z2026-09-26T16:31:13Zby Çevik Bakırlı, Ebru.<br/>Format: Books<br/>Arıza ve tamir durumunda sistem güvenilirliği: genetik ve memetik algoritmalarent://SD_ILS/0/SD_ILS:11658112026-09-26T16:31:13Z2026-09-26T16:31:13Zby Uzuner Şahin, Merve.<br/>Format: Books<br/>Hastalık biliş anketi'nin geçerlik ve güvenilirliğient://SD_ILS/0/SD_ILS:11576492026-09-26T16:31:13Z2026-09-26T16:31:13Zby Aykul, Ayşegül.<br/>Format: Books<br/>İki parametreli üstel dağılımda rekor değerler ile ortak değişim katsayısı ve güvenirlik tahmin edicilerient://SD_ILS/0/SD_ILS:11961782026-09-26T16:31:13Z2026-09-26T16:31:13Zby Bıyıklı, Nurten.<br/>Format: Books<br/>Geçmiş dönem tatmini ve firmaya duyulan güvenin satınalma davranışı üzerine etkileri : beyaz eşya üzerine Ankara'da bir saha araştırmasıent://SD_ILS/0/SD_ILS:11603652026-09-26T16:31:13Z2026-09-26T16:31:13Zby Hızlı, Dilek.<br/>Format: Books<br/>Yüksek gaz basınç sensörlerinin sıcaklık ve titreşim koşullarında performansı ve güvenilirliğinin iyileştirilmesient://SD_ILS/0/SD_ILS:12328762026-09-26T16:31:13Z2026-09-26T16:31:13Zby Arslan, Yasin, yazar.<br/>Format: Books<br/>Elektro-mekanik aktüatörler için analitik hiyerarşi prosesi (AHP) kullanılarak güvenilirlik tabanlı bakım analizi (RCM) uygulamasıent://SD_ILS/0/SD_ILS:11563052026-09-26T16:31:13Z2026-09-26T16:31:13Zby Doğan, Deniz Can.<br/>Format: Books<br/>Pişirme ve yiyecek hazırlama becerileri ölçeğinin Türkçe geçerlik ve güvenirliğinin incelenmesient://SD_ILS/0/SD_ILS:11588472026-09-26T16:31:13Z2026-09-26T16:31:13Zby Keleş, Gizem.<br/>Format: Books<br/>Hareket korkusu nedenleri ölçeğinin (Kinesiophopia causes scale) Türkçe uyarlamasının geçerlik ve güvenilirliğient://SD_ILS/0/SD_ILS:11576532026-09-26T16:31:13Z2026-09-26T16:31:13Zby Çayır, Melis.<br/>Format: Books<br/>Stochastic risk analysis and managementent://SD_ILS/0/SD_ILS:11238892026-09-26T16:31:13Z2026-09-26T16:31:13Zby Harlamov, Boris, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4816215">Click to View</a><br/>Format: Electronic Resources<br/>Serebral palsili çocuklarda oturma esnasındaki fotoğrafik postür analizinin güvenilirliği ve postürün gövde kontrolü ve kaba motor fonksiyonlar arasındaki ilişkisient://SD_ILS/0/SD_ILS:11576652026-09-26T16:31:13Z2026-09-26T16:31:13Zby Ünsal, Betül.<br/>Format: Books<br/>Meme kanseri ilişkili lenfödem hastalarında 'quality of life measure for limb lymphoedema-arm' anketinin Türkçe geçerlilik ve güvenilirliğinin araştırılmasıent://SD_ILS/0/SD_ILS:11601632026-09-26T16:31:13Z2026-09-26T16:31:13Zby Kaya, Emine.<br/>Format: Books<br/>New autonomous systemsent://SD_ILS/0/SD_ILS:11090732026-09-26T16:31:13Z2026-09-26T16:31:13Zby Cardon, Alain, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4452676">Click to View</a><br/>Format: Electronic Resources<br/>The social roots of risk : producing disasters, promoting resilienceent://SD_ILS/0/SD_ILS:10339202026-09-26T16:31:13Z2026-09-26T16:31:13Zby Tierney, Kathleen J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1731657">Click to View</a><br/>Format: Electronic Resources<br/>Swans, swine, and swindlers coping with the growing threat of mega-crises and mega-messesent://SD_ILS/0/SD_ILS:9810172026-09-26T16:31:13Z2026-09-26T16:31:13Zby Alpaslan, Can M. (Can Murat)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=735411">Click to View</a><br/>Format: Electronic Resources<br/>