Search Results for Reliability. - Narrowed by: Microprocessors.SirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dSUBJECT$002509Subject$002509Microprocessors.$002509Microprocessors.$0026ic$003dtrue$0026ps$003d300?dt=list2026-09-27T13:55:55ZFundamentals of Electronic Systems Designent://SD_ILS/0/SD_ILS:4812562026-09-27T13:55:55Z2026-09-27T13:55:55Zby Lienig, Jens. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-55840-0">http://dx.doi.org/10.1007/978-3-319-55840-0</a><br/>Format: Electronic Resources<br/>Carbon Nanotubes for Interconnects Process, Design and Applicationsent://SD_ILS/0/SD_ILS:4801602026-09-27T13:55:55Z2026-09-27T13:55:55Zby Todri-Sanial, Aida. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-29746-0">http://dx.doi.org/10.1007/978-3-319-29746-0</a><br/>Format: Electronic Resources<br/>The Dark Side of Silicon Energy Efficient Computing in the Dark Silicon Eraent://SD_ILS/0/SD_ILS:4801762026-09-27T13:55:55Z2026-09-27T13:55:55Zby Rahmani, Amir M. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-31596-6">http://dx.doi.org/10.1007/978-3-319-31596-6</a><br/>Format: Electronic Resources<br/>Hardware Security and Trust Design and Deployment of Integrated Circuits in a Threatened Environmentent://SD_ILS/0/SD_ILS:4805312026-09-27T13:55:55Z2026-09-27T13:55:55Zby Sklavos, Nicolas. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-44318-8">http://dx.doi.org/10.1007/978-3-319-44318-8</a><br/>Format: Electronic Resources<br/>