Search Results for Reliability. - Narrowed by: Power electronics. SirsiDynix Enterprise http://katalog.baskent.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dSUBJECT$002509Subject$002509Power$002belectronics.$002509Power$002belectronics.$0026ps$003d300?dt=list 2026-09-28T12:02:25Z Power GaN Devices Materials, Applications and Reliability ent://SD_ILS/0/SD_ILS:480447 2026-09-28T12:02:25Z 2026-09-28T12:02:25Z by&#160;Meneghini, Matteo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-43199-4">http://dx.doi.org/10.1007/978-3-319-43199-4</a><br/>Format:&#160;Electronic Resources<br/> Risk Based Assessment of Subsynchronous Resonance in AC/DC Systems ent://SD_ILS/0/SD_ILS:480566 2026-09-28T12:02:25Z 2026-09-28T12:02:25Z by&#160;Adrees, Atia. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-44947-0">http://dx.doi.org/10.1007/978-3-319-44947-0</a><br/>Format:&#160;Electronic Resources<br/> Transients of modern power electronics ent://SD_ILS/0/SD_ILS:978509 2026-09-28T12:02:25Z 2026-09-28T12:02:25Z by&#160;Bai, Hua, 1980-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=697594">Click to View</a><br/>Format:&#160;Electronic Resources<br/> Smart Grids: Security and Privacy Issues ent://SD_ILS/0/SD_ILS:480572 2026-09-28T12:02:25Z 2026-09-28T12:02:25Z by&#160;Boroojeni, Kianoosh G. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-45050-6">http://dx.doi.org/10.1007/978-3-319-45050-6</a><br/>Format:&#160;Electronic Resources<br/>