Search Results for Simulation methods. - Narrowed by: Electrical engineering.SirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/en_US/default/default/qu$003dSimulation$002bmethods.$0026qf$003dSUBJECT$002509Subject$002509Electrical$002bengineering.$002509Electrical$002bengineering.$0026ps$003d300?dt=list2026-06-11T15:44:29ZCurrent Technologies in Vehicular Communicationent://SD_ILS/0/SD_ILS:4807132026-06-11T15:44:29Z2026-06-11T15:44:29Zby Dimitrakopoulos, George. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-47244-7">http://dx.doi.org/10.1007/978-3-319-47244-7</a><br/>Format: Electronic Resources<br/>Advances in Computer Science and Ubiquitous Computing CSA-CUTE2016ent://SD_ILS/0/SD_ILS:4816962026-06-11T15:44:29Z2026-06-11T15:44:29Zby Park, James J. (Jong Hyuk). editor.<br/><a href="http://dx.doi.org/10.1007/978-981-10-3023-9">http://dx.doi.org/10.1007/978-981-10-3023-9</a><br/>Format: Electronic Resources<br/>Recent Advances in Electrical Engineering and Control Applicationsent://SD_ILS/0/SD_ILS:4808182026-06-11T15:44:29Z2026-06-11T15:44:29Zby Chadli, Mohammed. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-48929-2">http://dx.doi.org/10.1007/978-3-319-48929-2</a><br/>Format: Electronic Resources<br/>Microwave Techniques for Detection of Buried Objectsent://SD_ILS/0/SD_ILS:6815892026-06-11T15:44:29Z2026-06-11T15:44:29Zby Geng, Yuanqing, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10820104">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10820104</a><br/>Format: Books<br/>Devices to Study Cancer Cell Behaviorent://SD_ILS/0/SD_ILS:6967022026-06-11T15:44:29Z2026-06-11T15:44:29Zby Abdallah, Mohammad Ghassan, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903196">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903196</a><br/>Format: Books<br/>Fault Tolerance through Invariant Checks in Applications Using Linear Algebraic Methodsent://SD_ILS/0/SD_ILS:6944282026-06-11T15:44:29Z2026-06-11T15:44:29Zby Loh, Felix Da Yuan, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10825822">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10825822</a><br/>Format: Books<br/>Protocol Design and Analysis for Cooperative Wireless Networksent://SD_ILS/0/SD_ILS:4807562026-06-11T15:44:29Z2026-06-11T15:44:29Zby Song, Wei. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-47726-8">http://dx.doi.org/10.1007/978-3-319-47726-8</a><br/>Format: Electronic Resources<br/>Smart characterisation of damage in carbon fibre reinforced composites under static and fatigue loading conditions by means of electrical resistivity measurementsent://SD_ILS/0/SD_ILS:6832352026-06-11T15:44:29Z2026-06-11T15:44:29Zby Thiagarajan, C., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10832396">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10832396</a><br/>Format: Books<br/>Sub-10nm Transistors for Low Power Computing: Tunnel FETs and Negative Capacitance FETsent://SD_ILS/0/SD_ILS:6787792026-06-11T15:44:29Z2026-06-11T15:44:29Zby Sharma, Ankit, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10751825">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10751825</a><br/>Format: Books<br/>On-Die Transient Event Sensors and System-Level ESD Testingent://SD_ILS/0/SD_ILS:6910732026-06-11T15:44:29Z2026-06-11T15:44:29Zby Patnaik, Abhishek, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10793557">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10793557</a><br/>Format: Books<br/>Proceedings of the International Conference on Nano-electronics, Circuits & Communication Systemsent://SD_ILS/0/SD_ILS:4816942026-06-11T15:44:29Z2026-06-11T15:44:29Zby Nath, Vijay. editor.<br/><a href="http://dx.doi.org/10.1007/978-981-10-2999-8">http://dx.doi.org/10.1007/978-981-10-2999-8</a><br/>Format: Electronic Resources<br/>From Theory to Practice: Randomly Sampled Arrays for Passive Radarent://SD_ILS/0/SD_ILS:6843592026-06-11T15:44:29Z2026-06-11T15:44:29Zby Elgayar, Saad, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10867750">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10867750</a><br/>Format: Books<br/>Aggregate Modeling of Large-Scale Cyber-Physical Systemsent://SD_ILS/0/SD_ILS:6872062026-06-11T15:44:29Z2026-06-11T15:44:29Zby Zhao, Lin, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10891781">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10891781</a><br/>Format: Books<br/>Proceedings of the International Conference on Data Engineering and Communication Technology ICDECT 2016, Volume 2ent://SD_ILS/0/SD_ILS:4815792026-06-11T15:44:29Z2026-06-11T15:44:29Zby Satapathy, Suresh Chandra. editor.<br/><a href="http://dx.doi.org/10.1007/978-981-10-1678-3">http://dx.doi.org/10.1007/978-981-10-1678-3</a><br/>Format: Electronic Resources<br/>