Arama Sonuçları - Daraltılmış: ASM International. - International Symposium for Testing and Failure Analysis (30th : 2004 : Boston, Mass.) - English - Electronic apparatus and appliances -- Testing -- Congresses.SirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dAUTHOR$002509Yazar$002509ASM$002bInternational.$002509ASM$002bInternational.$0026qf$003dAUTHOR$002509Yazar$002509International$002bSymposium$002bfor$002bTesting$002band$002bFailure$002bAnalysis$002b$00252830th$002b$00253A$002b2004$002b$00253A$002bBoston$00252C$002bMass.$002529$002509International$002bSymposium$002bfor$002bTesting$002band$002bFailure$002bAnalysis$002b$00252830th$002b$00253A$002b2004$002b$00253A$002bBoston$00252C$002bMass.$002529$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bapparatus$002band$002bappliances$002b--$002bTesting$002b--$002bCongresses.$002509Electronic$002bapparatus$002band$002bappliances$002b--$002bTesting$002b--$002bCongresses.$0026ps$003d300?dt=list2024-09-23T05:39:16ZISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusettsent://SD_ILS/0/SD_ILS:10551222024-09-23T05:39:16Z2024-09-23T05:39:16Zby International Symposium for Testing and Failure Analysis (30th : 2004 : Boston, Mass.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002425">Click to View</a><br/>Format: Elektronik Kaynak<br/>