Arama Sonuçları - Daraltılmış: Bush, Nathan L., author. - Open University (United Kingdom). degree granting institution. - English - Proquest E-Tez KoleksiyonuSirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dAUTHOR$002509Yazar$002509Bush$00252C$002bNathan$002bL.$00252C$002bauthor.$002509Bush$00252C$002bNathan$002bL.$00252C$002bauthor.$0026qf$003dAUTHOR$002509Yazar$002509Open$002bUniversity$002b$002528United$002bKingdom$002529.$002bdegree$002bgranting$002binstitution.$002509Open$002bUniversity$002b$002528United$002bKingdom$002529.$002bdegree$002bgranting$002binstitution.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dLOCATION$002509Lokasyon$0025091$00253APROQUESTTE$002509Proquest$002bE-Tez$002bKoleksiyonu$0026ps$003d300?dt=list2024-09-25T17:51:20ZThe impact of radiation damage on electron multiplying ccd technology for the wfirst coronagraphent://SD_ILS/0/SD_ILS:7054132024-09-25T17:51:20Z2024-09-25T17:51:20Zby Bush, Nathan L., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873924">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873924</a><br/>Format: Kitap<br/>