Arama Sonuçları - Daraltılmış: Electronic Device Failure Analysis Society. - ProQuest (Firm) - EnglishSirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dAUTHOR$002509Yazar$002509Electronic$002bDevice$002bFailure$002bAnalysis$002bSociety.$002509Electronic$002bDevice$002bFailure$002bAnalysis$002bSociety.$0026qf$003dAUTHOR$002509Yazar$002509ProQuest$002b$002528Firm$002529$002509ProQuest$002b$002528Firm$002529$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ps$003d300;jsessionid=E98ABBC257982769F444752A2A714428?2024-06-21T02:53:50ZISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USAent://SD_ILS/0/SD_ILS:10551562024-06-21T02:53:50Z2024-06-21T02:53:50Zby International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002459">Click to View</a><br/>Format: Elektronik Kaynak<br/>ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USAent://SD_ILS/0/SD_ILS:10551402024-06-21T02:53:50Z2024-06-21T02:53:50Zby International Symposium for Testing and Failure Analysis (36th : 2010 : Dallas, Tex.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002443">Click to View</a><br/>Format: Elektronik Kaynak<br/>ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USAent://SD_ILS/0/SD_ILS:10551352024-06-21T02:53:50Z2024-06-21T02:53:50Zby International Symposium for Testing and Failure Analysis (35th : 2009 : San Jose, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002438">Click to View</a><br/>Format: Elektronik Kaynak<br/>ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USAent://SD_ILS/0/SD_ILS:10550332024-06-21T02:53:50Z2024-06-21T02:53:50Zby International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002319">Click to View</a><br/>Format: Elektronik Kaynak<br/>ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USAent://SD_ILS/0/SD_ILS:10550572024-06-21T02:53:50Z2024-06-21T02:53:50Zby International Symposium for Testing and Failure Analysis (33rd : 2007 : San Jose, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002347">Click to View</a><br/>Format: Elektronik Kaynak<br/>ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, Californiaent://SD_ILS/0/SD_ILS:10551062024-06-21T02:53:50Z2024-06-21T02:53:50Zby International Symposium for Testing and Failure Analysis (31st : d2005 : San Jose, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002407">Click to View</a><br/>Format: Elektronik Kaynak<br/>ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusettsent://SD_ILS/0/SD_ILS:10551222024-06-21T02:53:50Z2024-06-21T02:53:50Zby International Symposium for Testing and Failure Analysis (30th : 2004 : Boston, Mass.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002425">Click to View</a><br/>Format: Elektronik Kaynak<br/>ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, Californiaent://SD_ILS/0/SD_ILS:10551282024-06-21T02:53:50Z2024-06-21T02:53:50Zby International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002431">Click to View</a><br/>Format: Elektronik Kaynak<br/>ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz.ent://SD_ILS/0/SD_ILS:10550462024-06-21T02:53:50Z2024-06-21T02:53:50Zby International Symposium for Testing and Failure Analysis (28th : 2002 : Phoenix, Ariz.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002336">Click to View</a><br/>Format: Elektronik Kaynak<br/>Microelectronic failure analysis desk reference. 2002 supplementent://SD_ILS/0/SD_ILS:10551312024-06-21T02:53:50Z2024-06-21T02:53:50Zby Electronic Device Failure Analysis Society.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002434">Click to View</a><br/>Format: Elektronik Kaynak<br/>Microelectronic failure analysis desk reference : 2001 supplementent://SD_ILS/0/SD_ILS:10550842024-06-21T02:53:50Z2024-06-21T02:53:50Zby Electronic Device Failure Analysis Society.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002379">Click to View</a><br/>Format: Elektronik Kaynak<br/>ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, Californiaent://SD_ILS/0/SD_ILS:10550882024-06-21T02:53:50Z2024-06-21T02:53:50Zby International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002384">Click to View</a><br/>Format: Elektronik Kaynak<br/>ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.ent://SD_ILS/0/SD_ILS:10550772024-06-21T02:53:50Z2024-06-21T02:53:50Zby International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, Wash.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002371">Click to View</a><br/>Format: Elektronik Kaynak<br/>ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.ent://SD_ILS/0/SD_ILS:10551032024-06-21T02:53:50Z2024-06-21T02:53:50Zby International Symposium for Testing and Failure Analysis (25th : 1999 : Santa Clara, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002404">Click to View</a><br/>Format: Elektronik Kaynak<br/>