Arama Sonu&ccedil;lar&#305; - Daralt&#305;lm&#305;&#351;: Electronic Device Failure Analysis Society. - ProQuest (Firm) - English SirsiDynix Enterprise http://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dAUTHOR$002509Yazar$002509Electronic$002bDevice$002bFailure$002bAnalysis$002bSociety.$002509Electronic$002bDevice$002bFailure$002bAnalysis$002bSociety.$0026qf$003dAUTHOR$002509Yazar$002509ProQuest$002b$002528Firm$002529$002509ProQuest$002b$002528Firm$002529$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ps$003d300;jsessionid=E98ABBC257982769F444752A2A714428? 2024-06-21T02:53:50Z ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA ent://SD_ILS/0/SD_ILS:1055156 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002459">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA ent://SD_ILS/0/SD_ILS:1055140 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;International Symposium for Testing and Failure Analysis (36th : 2010 : Dallas, Tex.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002443">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA ent://SD_ILS/0/SD_ILS:1055135 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;International Symposium for Testing and Failure Analysis (35th : 2009 : San Jose, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002438">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA ent://SD_ILS/0/SD_ILS:1055033 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002319">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA ent://SD_ILS/0/SD_ILS:1055057 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;International Symposium for Testing and Failure Analysis (33rd : 2007 : San Jose, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002347">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California ent://SD_ILS/0/SD_ILS:1055106 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;International Symposium for Testing and Failure Analysis (31st : d2005 : San Jose, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002407">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts ent://SD_ILS/0/SD_ILS:1055122 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;International Symposium for Testing and Failure Analysis (30th : 2004 : Boston, Mass.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002425">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California ent://SD_ILS/0/SD_ILS:1055128 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002431">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. ent://SD_ILS/0/SD_ILS:1055046 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;International Symposium for Testing and Failure Analysis (28th : 2002 : Phoenix, Ariz.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002336">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Microelectronic failure analysis desk reference. 2002 supplement ent://SD_ILS/0/SD_ILS:1055131 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;Electronic Device Failure Analysis Society.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002434">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Microelectronic failure analysis desk reference : 2001 supplement ent://SD_ILS/0/SD_ILS:1055084 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;Electronic Device Failure Analysis Society.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002379">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California ent://SD_ILS/0/SD_ILS:1055088 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002384">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. ent://SD_ILS/0/SD_ILS:1055077 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, Wash.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002371">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California. ent://SD_ILS/0/SD_ILS:1055103 2024-06-21T02:53:50Z 2024-06-21T02:53:50Z by&#160;International Symposium for Testing and Failure Analysis (25th : 1999 : Santa Clara, Calif.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002404">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/>