Arama Sonuçları - Daraltılmış: State University of New York at Albany. Physics. degree granting institution. - EnglishSirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dAUTHOR$002509Yazar$002509State$002bUniversity$002bof$002bNew$002bYork$002bat$002bAlbany.$002bPhysics.$002bdegree$002bgranting$002binstitution.$002509State$002bUniversity$002bof$002bNew$002bYork$002bat$002bAlbany.$002bPhysics.$002bdegree$002bgranting$002binstitution.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ps$003d300;jsessionid=CB0151196163C9CF4CC2C1FE3B51407D?2024-06-19T22:47:23ZEffects of interface scattering and carrier localization on conductance of Cu-based superlatticesent://SD_ILS/0/SD_ILS:6808372024-06-19T22:47:23Z2024-06-19T22:47:23Zby Kim, Jiyoon Jessica, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812412">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812412</a><br/>Format: Kitap<br/>Carrier Scattering and Localization in nm-thick Al/Ru, Al/Co and Al/Mo Superlatticesent://SD_ILS/0/SD_ILS:6808382024-06-19T22:47:23Z2024-06-19T22:47:23Zby Zhang, Yanli, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812413">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812413</a><br/>Format: Kitap<br/>Mesh and Diffraction-based X-ray Phase Imagingent://SD_ILS/0/SD_ILS:6947032024-06-19T22:47:23Z2024-06-19T22:47:23Zby He, Congxiao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10828217">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10828217</a><br/>Format: Kitap<br/>