Arama Sonuçları - Daraltılmış: Technische Universitaet Muenchen (Germany). degree granting institution. - Werth, Nadine, author.
SirsiDynix Enterprise
http://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dAUTHOR$002509Yazar$002509Technische$002bUniversitaet$002bMuenchen$002b$002528Germany$002529.$002bdegree$002bgranting$002binstitution.$002509Technische$002bUniversitaet$002bMuenchen$002b$002528Germany$002529.$002bdegree$002bgranting$002binstitution.$0026qf$003dAUTHOR$002509Yazar$002509Werth$00252C$002bNadine$00252C$002bauthor.$002509Werth$00252C$002bNadine$00252C$002bauthor.$0026ps$003d300;jsessionid=63023266BDBC162049F6D2C7E5820FCB?
2024-06-13T20:37:17Z
Einsatz von mikrospiegelarrays in der elektronischen speckle-muster-interferometrie
ent://SD_ILS/0/SD_ILS:686117
2024-06-13T20:37:17Z
2024-06-13T20:37:17Z
by Werth, Nadine, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10870032">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10870032</a><br/>Format: Kitap<br/>