Arama Sonuçları - Daraltılmış: 1988 - Conference papers and proceedings. - Heyman, Joseph S.
SirsiDynix Enterprise
http://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dPUBDATE$002509Publication$002bDate$0025091988$0025091988$0026qf$003dSUBJECT$002509Konu$002509Conference$002bpapers$002band$002bproceedings.$002509Conference$002bpapers$002band$002bproceedings.$0026qf$003dAUTHOR$002509Yazar$002509Heyman$00252C$002bJoseph$002bS.$002509Heyman$00252C$002bJoseph$002bS.$0026ps$003d300;jsessionid=67765AF4ABE659C729EE4FEFBE55F6EB?
2024-06-14T23:48:48Z
Electronics reliability and measurement technology : nondestructive evaluation
ent://SD_ILS/0/SD_ILS:1189894
2024-06-14T23:48:48Z
2024-06-14T23:48:48Z
by Heyman, Joseph S.<br/>MacEwan University Access <a href="http://www.sciencedirect.com/science/book/9780815511717">(Unlimited Concurrent Users)</a> from ScienceDirect
ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780815511717">https://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Elektronik Kaynak<br/>