Arama Sonuçları - Daraltılmış: Engineering. - Applied mathematics. - Measurement.
SirsiDynix Enterprise
http://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dSUBJECT$002509Konu$002509Engineering.$002509Engineering.$0026qf$003dSUBJECT$002509Konu$002509Applied$002bmathematics.$002509Applied$002bmathematics.$0026qf$003dSUBJECT$002509Konu$002509Measurement.$002509Measurement.$0026ps$003d300?
2024-06-03T05:18:17Z
The Statistical Stability Phenomenon
ent://SD_ILS/0/SD_ILS:480475
2024-06-03T05:18:17Z
2024-06-03T05:18:17Z
by Gorban, Igor I. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-43585-5">http://dx.doi.org/10.1007/978-3-319-43585-5</a><br/>Format: Elektronik Kaynak<br/>
Advanced Interfacing Techniques for Sensors Measurement Circuits and Systems for Intelligent Sensors
ent://SD_ILS/0/SD_ILS:481238
2024-06-03T05:18:17Z
2024-06-03T05:18:17Z
by George, Boby. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-55369-6">http://dx.doi.org/10.1007/978-3-319-55369-6</a><br/>Format: Elektronik Kaynak<br/>