Arama Sonuçları - Daraltılmış: Engineering. - Applied mathematics.SirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dSUBJECT$002509Konu$002509Engineering.$002509Engineering.$0026qf$003dSUBJECT$002509Konu$002509Applied$002bmathematics.$002509Applied$002bmathematics.$0026ps$003d300?2024-06-03T11:39:29ZA Time Series Data Mining and Unobserved Component Modeling Approach to Credit Risk Correlation Modelingent://SD_ILS/0/SD_ILS:6796952024-06-03T11:39:29Z2024-06-03T11:39:29Zby Wilcox, Bruce A., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10789848">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10789848</a><br/>Format: Kitap<br/>The Statistical Stability Phenomenonent://SD_ILS/0/SD_ILS:4804752024-06-03T11:39:29Z2024-06-03T11:39:29Zby Gorban, Igor I. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-43585-5">http://dx.doi.org/10.1007/978-3-319-43585-5</a><br/>Format: Elektronik Kaynak<br/>Stress Concentration at Notchesent://SD_ILS/0/SD_ILS:4805422024-06-03T11:39:29Z2024-06-03T11:39:29Zby Savruk, Mykhaylo P. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-44555-7">http://dx.doi.org/10.1007/978-3-319-44555-7</a><br/>Format: Elektronik Kaynak<br/>Computational Fluid Dynamics Incompressible Turbulent Flowsent://SD_ILS/0/SD_ILS:4805882024-06-03T11:39:29Z2024-06-03T11:39:29Zby Kajishima, Takeo. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-45304-0">http://dx.doi.org/10.1007/978-3-319-45304-0</a><br/>Format: Elektronik Kaynak<br/>Computational Transport Phenomena of Fluid-Particle Systemsent://SD_ILS/0/SD_ILS:4806012024-06-03T11:39:29Z2024-06-03T11:39:29Zby Arastoopour, Hamid. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-45490-0">http://dx.doi.org/10.1007/978-3-319-45490-0</a><br/>Format: Elektronik Kaynak<br/>Dimensional Analysis Beyond the Pi Theorement://SD_ILS/0/SD_ILS:4806112024-06-03T11:39:29Z2024-06-03T11:39:29Zby Zohuri, Bahman. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-45726-0">http://dx.doi.org/10.1007/978-3-319-45726-0</a><br/>Format: Elektronik Kaynak<br/>Advances in Metaheuristic Algorithms for Optimal Design of Structuresent://SD_ILS/0/SD_ILS:4806512024-06-03T11:39:29Z2024-06-03T11:39:29Zby Kaveh, A. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-46173-1">http://dx.doi.org/10.1007/978-3-319-46173-1</a><br/>Format: Elektronik Kaynak<br/>Applications of Metaheuristic Optimization Algorithms in Civil Engineeringent://SD_ILS/0/SD_ILS:4807732024-06-03T11:39:29Z2024-06-03T11:39:29Zby Kaveh, A. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-48012-1">http://dx.doi.org/10.1007/978-3-319-48012-1</a><br/>Format: Elektronik Kaynak<br/>Bond Graphs for Modelling, Control and Fault Diagnosis of Engineering Systemsent://SD_ILS/0/SD_ILS:4807342024-06-03T11:39:29Z2024-06-03T11:39:29Zby Borutzky, Wolfgang. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-47434-2">http://dx.doi.org/10.1007/978-3-319-47434-2</a><br/>Format: Elektronik Kaynak<br/>Problems and Solutions in Thermoelasticity and Magneto-thermoelasticityent://SD_ILS/0/SD_ILS:4808082024-06-03T11:39:29Z2024-06-03T11:39:29Zby Das, B. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-48808-0">http://dx.doi.org/10.1007/978-3-319-48808-0</a><br/>Format: Elektronik Kaynak<br/>Advances in Reliability and System Engineeringent://SD_ILS/0/SD_ILS:4808132024-06-03T11:39:29Z2024-06-03T11:39:29Zby Ram, Mangey. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-48875-2">http://dx.doi.org/10.1007/978-3-319-48875-2</a><br/>Format: Elektronik Kaynak<br/>Proceedings of the 13th International Scientific Conference Computer Aided Engineeringent://SD_ILS/0/SD_ILS:4809462024-06-03T11:39:29Z2024-06-03T11:39:29Zby Rusiński, Eugeniusz. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-50938-9">http://dx.doi.org/10.1007/978-3-319-50938-9</a><br/>Format: Elektronik Kaynak<br/>Finite Element Methods A Practical Guideent://SD_ILS/0/SD_ILS:4808872024-06-03T11:39:29Z2024-06-03T11:39:29Zby Whiteley, Jonathan. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-49971-0">http://dx.doi.org/10.1007/978-3-319-49971-0</a><br/>Format: Elektronik Kaynak<br/>Solving Fault Diagnosis Problems Linear Synthesis Techniquesent://SD_ILS/0/SD_ILS:4809912024-06-03T11:39:29Z2024-06-03T11:39:29Zby Varga, Andreas. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-51559-5">http://dx.doi.org/10.1007/978-3-319-51559-5</a><br/>Format: Elektronik Kaynak<br/>Fault Diagnosis and Fault-Tolerant Control Based on Adaptive Control Approachent://SD_ILS/0/SD_ILS:4810512024-06-03T11:39:29Z2024-06-03T11:39:29Zby Shen, Qikun. author.<br/><a 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Kaynak<br/>Green IT Engineering: Components, Networks and Systems Implementationent://SD_ILS/0/SD_ILS:4812462024-06-03T11:39:29Z2024-06-03T11:39:29Zby Kharchenko, Vyacheslav. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-55595-9">http://dx.doi.org/10.1007/978-3-319-55595-9</a><br/>Format: Elektronik Kaynak<br/>Advanced Interfacing Techniques for Sensors Measurement Circuits and Systems for Intelligent Sensorsent://SD_ILS/0/SD_ILS:4812382024-06-03T11:39:29Z2024-06-03T11:39:29Zby George, Boby. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-55369-6">http://dx.doi.org/10.1007/978-3-319-55369-6</a><br/>Format: Elektronik Kaynak<br/>Load Assumption for Fatigue Design of Structures and Components Counting Methods, Safety Aspects, Practical Applicationent://SD_ILS/0/SD_ILS:4814052024-06-03T11:39:29Z2024-06-03T11:39:29Zby Köhler, Michael. author.<br/><a href="http://dx.doi.org/10.1007/978-3-642-55248-9">http://dx.doi.org/10.1007/978-3-642-55248-9</a><br/>Format: Elektronik Kaynak<br/>Theory of Periodic Conjugate Heat Transferent://SD_ILS/0/SD_ILS:4814582024-06-03T11:39:29Z2024-06-03T11:39:29Zby Zudin, Yuri B. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-53445-8">http://dx.doi.org/10.1007/978-3-662-53445-8</a><br/>Format: Elektronik Kaynak<br/>Data-Driven Fault Detection for Industrial Processes Canonical Correlation Analysis and Projection Based Methodsent://SD_ILS/0/SD_ILS:4814142024-06-03T11:39:29Z2024-06-03T11:39:29Zby Chen, Zhiwen. author.<br/><a href="http://dx.doi.org/10.1007/978-3-658-16756-1">http://dx.doi.org/10.1007/978-3-658-16756-1</a><br/>Format: Elektronik Kaynak<br/>Star Identification Methods, Techniques and Algorithmsent://SD_ILS/0/SD_ILS:4814662024-06-03T11:39:29Z2024-06-03T11:39:29Zby Zhang, Guangjun. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-53783-1">http://dx.doi.org/10.1007/978-3-662-53783-1</a><br/>Format: Elektronik Kaynak<br/>New methods to engineer and seamlessly reconfigure time triggered Ethernet 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Kaynak<br/>