Arama Sonuçları Reliability.SirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dReliability.$0026ic$003dtrue$0026ps$003d300?2026-01-22T04:49:32ZApplied reliabilityent://SD_ILS/0/SD_ILS:10084162026-01-22T04:49:32Z2026-01-22T04:49:32Zby Grous, Ammar.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1124027">Click to View</a><br/>Format: Elektronik Kaynak<br/>Applied reliabilityent://SD_ILS/0/SD_ILS:10284072026-01-22T04:49:32Z2026-01-22T04:49:32Zby Tobias, Paul A., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1648252">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:9896092026-01-22T04:49:32Z2026-01-22T04:49:32Zby Elsayed, Elsayed A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=843664">Click to View</a><br/>Format: Elektronik Kaynak<br/>Bayesian reliabilityent://SD_ILS/0/SD_ILS:9471882026-01-22T04:49:32Z2026-01-22T04:49:32Zby Hamada, Michael, 1955-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=364398">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:10291342026-01-22T04:49:32Z2026-01-22T04:49:32Zby Kapur, Kailash C., 1941- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1658817">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability in biomechanicsent://SD_ILS/0/SD_ILS:11196712026-01-22T04:49:32Z2026-01-22T04:49:32Zby Kharmanda, Ghias, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4718313">Click to View</a><br/>Format: Elektronik Kaynak<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:9898032026-01-22T04:49:32Z2026-01-22T04:49:32Zby Raheja, Dev.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=848525">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineering advancesent://SD_ILS/0/SD_ILS:10591322026-01-22T04:49:32Z2026-01-22T04:49:32Zby Hayworth, Gregory I.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3018679">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability-centred maintenanceent://SD_ILS/0/SD_ILS:11665462026-01-22T04:49:32Z2026-01-22T04:49:32Zby Moubray, John.<br/>Format: Kitap<br/>Advanced reliability modelingent://SD_ILS/0/SD_ILS:9334812026-01-22T04:49:32Z2026-01-22T04:49:32Zby Dohi, Tadashi.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=253960">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in reliabilityent://SD_ILS/0/SD_ILS:11841942026-01-22T04:49:32Z2026-01-22T04:49:32Zby Balakrishnan, N., 1956- editor.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/0444500782">Click for electronic access to e-book.</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444500786">http://www.sciencedirect.com/science/book/9780444500786</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/handbooks/01697161/20">http://www.sciencedirect.com/science/handbooks/01697161/20</a><br/>Format: Elektronik Kaynak<br/>Improving machinery reliabilityent://SD_ILS/0/SD_ILS:11852502026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bloch, Heinz P., 1933-<br/><a href="https://www.sciencedirect.com/science/bookseries/18746942/1">Available from ScienceDirect. Online version available for university members only. This requires an institutional login off-campus.</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Elektronik Kaynak<br/>Machine tool reliabilityent://SD_ILS/0/SD_ILS:11076132026-01-22T04:49:32Z2026-01-22T04:49:32Zby Lad, Bhupesh K., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4403257">Click to View</a><br/>Format: Elektronik Kaynak<br/>Solder Joint Reliabilityent://SD_ILS/0/SD_ILS:9386182026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ricky Lee, S. W.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=289873">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probabilistic reliability modelsent://SD_ILS/0/SD_ILS:9933952026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ushakov, I. A. (Igorʹ Alekseevich)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=894405">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of engineering materialsent://SD_ILS/0/SD_ILS:11772892026-01-22T04:49:32Z2026-01-22T04:49:32Zby Smith, Alrick L.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780408015073">http://www.sciencedirect.com/science/book/9780408015073</a><br/>Format: Elektronik Kaynak<br/>Reliability-based mechanical designent://SD_ILS/0/SD_ILS:11665402026-01-22T04:49:32Z2026-01-22T04:49:32Zby Le, Xiaobin.<br/>Format: Kitap<br/>Reliability of large systemsent://SD_ILS/0/SD_ILS:11866552026-01-22T04:49:32Z2026-01-22T04:49:32Zby Kołowrocki, Krzysztof.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format: Elektronik Kaynak<br/>Reliability engineering and servicesent://SD_ILS/0/SD_ILS:11441572026-01-22T04:49:32Z2026-01-22T04:49:32Zby Jin, Tongdan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630265">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and quality managementent://SD_ILS/0/SD_ILS:9548052026-01-22T04:49:32Z2026-01-22T04:49:32Zby Mishra, R. C.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=442134">Click to View</a><br/>Format: Elektronik Kaynak<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:9403262026-01-22T04:49:32Z2026-01-22T04:49:32Zby Neale, M. J. (Michael John)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=298350">Click to View</a><br/>Format: Elektronik Kaynak<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:11851292026-01-22T04:49:32Z2026-01-22T04:49:32Zby Neale, M. J. (Michael John)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Elektronik Kaynak<br/>Fatigue design and reliabilityent://SD_ILS/0/SD_ILS:11861712026-01-22T04:49:32Z2026-01-22T04:49:32Zby International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/bookseries/15661369/23">http://www.sciencedirect.com/science/bookseries/15661369/23</a><br/>Format: Elektronik Kaynak<br/>Reliability of analogue circuitsent://SD_ILS/0/SD_ILS:7051152026-01-22T04:49:32Z2026-01-22T04:49:32Zby Mohd Nawi, Illani Binti, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873624">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873624</a><br/>Format: Kitap<br/>Optimal warranty policies and reliability modelingent://SD_ILS/0/SD_ILS:9335252026-01-22T04:49:32Z2026-01-22T04:49:32Zby Chukova, Stefanka.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=254004">Click to View</a><br/>Format: Elektronik Kaynak<br/>Practical applications of Bayesian reliabilityent://SD_ILS/0/SD_ILS:11456932026-01-22T04:49:32Z2026-01-22T04:49:32Zby Liu, Yan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5741235">Click to View</a><br/>Format: Elektronik Kaynak<br/>Biomechanics : optimization, uncertainties and reliabilityent://SD_ILS/0/SD_ILS:11221052026-01-22T04:49:32Z2026-01-22T04:49:32Zby Kharmanda, Ghias, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4778401">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability growth : enhancing defense system reliabilityent://SD_ILS/0/SD_ILS:10865262026-01-22T04:49:32Z2026-01-22T04:49:32Zby Panel on Reliability Growth Methods for Defense Systems.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3379432">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in mathematical modeling for reliabilityent://SD_ILS/0/SD_ILS:9471512026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bedford, T.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=363211">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advanced reliability modeling part IIent://SD_ILS/0/SD_ILS:9379922026-01-22T04:49:32Z2026-01-22T04:49:32Zby Dohi, Tadashi.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=285510">Click to View</a><br/>Format: Elektronik Kaynak<br/>Systems reliability and failure preventionent://SD_ILS/0/SD_ILS:9309922026-01-22T04:49:32Z2026-01-22T04:49:32Zby Hecht, Herbert.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=227632">Click to View</a><br/>Format: Elektronik Kaynak<br/>Maintenance strategies and reliability optimizationent://SD_ILS/0/SD_ILS:9316892026-01-22T04:49:32Z2026-01-22T04:49:32Zby Artiba, A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=233913">Click to View</a><br/>Format: Elektronik Kaynak<br/>Semiconductor packaging materials interaction and reliabilityent://SD_ILS/0/SD_ILS:9835692026-01-22T04:49:32Z2026-01-22T04:49:32Zby Chen, Andrea.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=773636">Click to View</a><br/>Format: Elektronik Kaynak<br/>Construction reliability safety, variability and sustainabilityent://SD_ILS/0/SD_ILS:10085232026-01-22T04:49:32Z2026-01-22T04:49:32Zby Baroth, Julien.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1124658">Click to View</a><br/>Format: Elektronik Kaynak<br/>Optimal reliability design : fundamentals and applicationsent://SD_ILS/0/SD_ILS:11659812026-01-22T04:49:32Z2026-01-22T04:49:32Zby Kuo, Way.<br/>Format: Kitap<br/>System reliability : concepts and applicationsent://SD_ILS/0/SD_ILS:9221602026-01-22T04:49:32Z2026-01-22T04:49:32Zby Klaassen, Klaas B., 1941-<br/>Format: Kitap<br/>Advances in system reliability engineeringent://SD_ILS/0/SD_ILS:11436852026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ram, Mangey, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5603078">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of large and complex systemsent://SD_ILS/0/SD_ILS:10291132026-01-22T04:49:32Z2026-01-22T04:49:32Zby Kołowrocki, Krzysztof, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1657928">Click to View</a><br/>Format: Elektronik Kaynak<br/>Accelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:9782392026-01-22T04:49:32Z2026-01-22T04:49:32Zby Klyatis, Lev M.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=693204">Click to View</a><br/>Format: Elektronik Kaynak<br/>Multistate systems reliability theory with applicationsent://SD_ILS/0/SD_ILS:9721932026-01-22T04:49:32Z2026-01-22T04:49:32Zby Natvig, Bent, 1946-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=624778">Click to View</a><br/>Format: Elektronik Kaynak<br/>Mathematical methods of reliability theoryent://SD_ILS/0/SD_ILS:11773852026-01-22T04:49:32Z2026-01-22T04:49:32Zby Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781483230535">http://www.sciencedirect.com/science/book/9781483230535</a><br/>Format: Elektronik Kaynak<br/>An elementary guide to reliabilityent://SD_ILS/0/SD_ILS:11851412026-01-22T04:49:32Z2026-01-22T04:49:32Zby Dummer, G. W. A. (Geoffrey William Arnold)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format: Elektronik Kaynak<br/>Network reliability : measures and evaluationent://SD_ILS/0/SD_ILS:11136112026-01-22T04:49:32Z2026-01-22T04:49:32Zby Chaturvedi, Sanjay K., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4570714">Click to View</a><br/>Format: Elektronik Kaynak<br/>Lead-free solder interconnect reliabilityent://SD_ILS/0/SD_ILS:10550942026-01-22T04:49:32Z2026-01-22T04:49:32Zby Shangguan, Dongkai, 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002391">Click to View</a><br/>Format: Elektronik Kaynak<br/>Stochastic reliability modeling, optimization and applicationsent://SD_ILS/0/SD_ILS:10312382026-01-22T04:49:32Z2026-01-22T04:49:32Zby Nakamura, Syouji.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1681730">Click to View</a><br/>Format: Elektronik Kaynak<br/>Analysis of reliability and quality controlent://SD_ILS/0/SD_ILS:10670442026-01-22T04:49:32Z2026-01-22T04:49:32Zby Grous, Ammar.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3058885">Click to View</a><br/>Format: Elektronik Kaynak<br/>Software system reliability and securityent://SD_ILS/0/SD_ILS:9407012026-01-22T04:49:32Z2026-01-22T04:49:32Zby Broy, M., 1949-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=305176">Click to View</a><br/>Format: Elektronik Kaynak<br/>Introduction to reliability and quality engineeringent://SD_ILS/0/SD_ILS:383182026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bentley, John<br/>Format: Kitap<br/>Maintenance and reliability best practicesent://SD_ILS/0/SD_ILS:11659782026-01-22T04:49:32Z2026-01-22T04:49:32Zby Gulati, Ramesh, author<br/>Format: Kitap<br/>Human reliability : with human factorsent://SD_ILS/0/SD_ILS:11751732026-01-22T04:49:32Z2026-01-22T04:49:32Zby Dhillon, B. S. (Balbir S.), 1947-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080327747">http://www.sciencedirect.com/science/book/9780080327747</a><br/>Format: Elektronik Kaynak<br/>Transportation systems reliability and safetyent://SD_ILS/0/SD_ILS:9759462026-01-22T04:49:32Z2026-01-22T04:49:32Zby Dhillon, B. S. (Balbir S.), 1947-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=681292">Click to View</a><br/>Format: Elektronik Kaynak<br/>Process risk and reliability managementent://SD_ILS/0/SD_ILS:10374522026-01-22T04:49:32Z2026-01-22T04:49:32Zby Sutton, Ian, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1782850">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in Reliability and System Engineeringent://SD_ILS/0/SD_ILS:4808132026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ram, Mangey. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-48875-2">http://dx.doi.org/10.1007/978-3-319-48875-2</a><br/>Format: Elektronik Kaynak<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:4814862026-01-22T04:49:32Z2026-01-22T04:49:32Zby Birolini, Alessandro. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-54209-5">http://dx.doi.org/10.1007/978-3-662-54209-5</a><br/>Format: Elektronik Kaynak<br/>Cloud Reliability Engineering: Technologies and Toolsent://SD_ILS/0/SD_ILS:12141962026-01-22T04:49:32Z2026-01-22T04:49:32Zby Achary, Rathnakar<br/>Format: Kitap<br/>Leading a high reliability schoolent://SD_ILS/0/SD_ILS:11378652026-01-22T04:49:32Z2026-01-22T04:49:32Zby Marzano, Robert J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5395032">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability prediction and testing textbookent://SD_ILS/0/SD_ILS:11406412026-01-22T04:49:32Z2026-01-22T04:49:32Zby Klyatis, Lev M., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5452229">Click to View</a><br/>Format: Elektronik Kaynak<br/>Photovoltaic modules : technology and reliabilityent://SD_ILS/0/SD_ILS:11182802026-01-22T04:49:32Z2026-01-22T04:49:32Zby Wirth, Harry, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4691383">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and availability of cloud computingent://SD_ILS/0/SD_ILS:1398622026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bauer, Eric<br/>Format: Kitap<br/>Durability and reliability of medical polymersent://SD_ILS/0/SD_ILS:10244162026-01-22T04:49:32Z2026-01-22T04:49:32Zby Jenkins, Mike.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1581410">Click to View</a><br/>Format: Elektronik Kaynak<br/>Machine tools design, reliability and safetyent://SD_ILS/0/SD_ILS:10608292026-01-22T04:49:32Z2026-01-22T04:49:32Zby Anderson, Scott P.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3021649">Click to View</a><br/>Format: Elektronik Kaynak<br/>Safety and reliability of bridge structuresent://SD_ILS/0/SD_ILS:9673072026-01-22T04:49:32Z2026-01-22T04:49:32Zby New York City Bridge Conference (5th : 2009 : New York, N.Y.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=565988">Click to View</a><br/>Format: Elektronik Kaynak<br/>Measures of interobserver agreement and reliabilityent://SD_ILS/0/SD_ILS:9740262026-01-22T04:49:32Z2026-01-22T04:49:32Zby Shoukri, M. M. (Mohamed M.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=665632">Click to View</a><br/>Format: Elektronik Kaynak<br/>Accelerated quality and reliability solutionsent://SD_ILS/0/SD_ILS:11855832026-01-22T04:49:32Z2026-01-22T04:49:32Zby Klyatis, Lev M.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format: Elektronik Kaynak<br/>Recent advances in reliability and quality engineeringent://SD_ILS/0/SD_ILS:10304522026-01-22T04:49:32Z2026-01-22T04:49:32Zby Pham, Hoang.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679593">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and risk models : setting reliability requirementsent://SD_ILS/0/SD_ILS:11030842026-01-22T04:49:32Z2026-01-22T04:49:32Zby Todinov, M. T., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4039470">Click to View</a><br/>Format: Elektronik Kaynak<br/>Modern statistical and mathematical methods in reliabilityent://SD_ILS/0/SD_ILS:9400832026-01-22T04:49:32Z2026-01-22T04:49:32Zby Wilson, Alyson G., 1967-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=296177">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fault detection & reliability : knowledge based & other approachesent://SD_ILS/0/SD_ILS:11756352026-01-22T04:49:32Z2026-01-22T04:49:32Zby European Workshop on Fault Diagnostics, Reliability, and Related Knowledge-Based Approaches (2nd : 1987 : University of Manchester Institute of Science and Technology)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080349220">https://www.sciencedirect.com/science/book/9780080349220</a><br/>Format: Elektronik Kaynak<br/>Reliability of electronic packages and semiconductor devicesent://SD_ILS/0/SD_ILS:898862026-01-22T04:49:32Z2026-01-22T04:49:32Zby Giacomo, Giulio Di<br/>Format: Kitap<br/>Electronics reliability and measurement technology : nondestructive evaluationent://SD_ILS/0/SD_ILS:11898942026-01-22T04:49:32Z2026-01-22T04:49:32Zby Heyman, Joseph S.<br/>MacEwan University Access <a href="http://www.sciencedirect.com/science/book/9780815511717">(Unlimited Concurrent Users)</a> from ScienceDirect
ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780815511717">https://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Elektronik Kaynak<br/>System reliability : evaluation and prediction in engineeringent://SD_ILS/0/SD_ILS:661722026-01-22T04:49:32Z2026-01-22T04:49:32Zby Pages, Alain<br/>Format: Kitap<br/>Methods for reliability improvement and risk reductionent://SD_ILS/0/SD_ILS:11430312026-01-22T04:49:32Z2026-01-22T04:49:32Zby Todinov, Michael, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5553528">Click to View</a><br/>Format: Elektronik Kaynak<br/>Recent developments in reliability-based civil engineeringent://SD_ILS/0/SD_ILS:10149902026-01-22T04:49:32Z2026-01-22T04:49:32Zby Haldar, Achintya.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1214938">Click to View</a><br/>Format: Elektronik Kaynak<br/>An introduction to reliability and maintainability engineeringent://SD_ILS/0/SD_ILS:11666642026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ebeling, Charles E..<br/>Format: Kitap<br/>Rules of thumb for maintenance and reliability engineersent://SD_ILS/0/SD_ILS:9480132026-01-22T04:49:32Z2026-01-22T04:49:32Zby Smith, Ricky.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=405204">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability modelling and analysis in discrete timeent://SD_ILS/0/SD_ILS:11380092026-01-22T04:49:32Z2026-01-22T04:49:32Zby Nair, N. Unnikrishnan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5396573">Click to View</a><br/>Format: Elektronik Kaynak<br/>Artificial neural network for software reliability predictionent://SD_ILS/0/SD_ILS:11297882026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bisi, Manjubala, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5056371">Click to View</a><br/>Format: Elektronik Kaynak<br/>Human reliability and error in medical systement://SD_ILS/0/SD_ILS:10304172026-01-22T04:49:32Z2026-01-22T04:49:32Zby Dhillon, B. S. (Balbir S.), 1947-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679549">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk-based management : a reliability-centered approachent://SD_ILS/0/SD_ILS:10284562026-01-22T04:49:32Z2026-01-22T04:49:32Zby Jones, Richard B., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1649062">Click to View</a><br/>Format: Elektronik Kaynak<br/>Logics and languages for reliability and securityent://SD_ILS/0/SD_ILS:9666272026-01-22T04:49:32Z2026-01-22T04:49:32Zby Esparza, Javier.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=557042">Click to View</a><br/>Format: Elektronik Kaynak<br/>Rules of thumb for maintenance and reliability engineersent://SD_ILS/0/SD_ILS:11891422026-01-22T04:49:32Z2026-01-22T04:49:32Zby Smith, Ricky.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750678629">https://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Elektronik Kaynak<br/>Cognitive reliability and error analysis method : CREAMent://SD_ILS/0/SD_ILS:11857442026-01-22T04:49:32Z2026-01-22T04:49:32Zby Hollnagel, Erik, 1941-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Elektronik Kaynak<br/>The reliability, availability and productiveness of systemsent://SD_ILS/0/SD_ILS:378072026-01-22T04:49:32Z2026-01-22T04:49:32Zby Sherwin, D.J.<br/>Format: Kitap<br/>Reliability and maintainability of in service pipelinesent://SD_ILS/0/SD_ILS:11394242026-01-22T04:49:32Z2026-01-22T04:49:32Zby Mojtaba, Mahmoodian, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5434362">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability based airframe maintenance optimization and applicationsent://SD_ILS/0/SD_ILS:11245472026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ren, He, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4826425">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and radiation effects in compound semiconductorsent://SD_ILS/0/SD_ILS:9808382026-01-22T04:49:32Z2026-01-22T04:49:32Zby Johnston, Allan.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=731279">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk and reliability coastal and hydraulic engineeringent://SD_ILS/0/SD_ILS:9551842026-01-22T04:49:32Z2026-01-22T04:49:32Zby Reeve, Dominic.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=446907">Click to View</a><br/>Format: Elektronik Kaynak<br/>Managing risk and reliability of process plantsent://SD_ILS/0/SD_ILS:9380832026-01-22T04:49:32Z2026-01-22T04:49:32Zby Tweeddale, Mark.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=286711">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability characterisation of electrical and electronic systemsent://SD_ILS/0/SD_ILS:10440882026-01-22T04:49:32Z2026-01-22T04:49:32Zby Swingler, Jonathan, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1911716">Click to View</a><br/>Format: Elektronik Kaynak<br/>Process plant equipment operation, reliability, and controlent://SD_ILS/0/SD_ILS:9871642026-01-22T04:49:32Z2026-01-22T04:49:32Zby Holloway, Michael D., 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=822072">Click to View</a><br/>Format: Elektronik Kaynak<br/>Lead-free solders materials reliability for electronicsent://SD_ILS/0/SD_ILS:9918922026-01-22T04:49:32Z2026-01-22T04:49:32Zby Subramaniam, K. N., Ph. D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=875755">Click to View</a><br/>Format: Elektronik Kaynak<br/>BioWatch PCR assays : building confidence, ensuring reliabilityent://SD_ILS/0/SD_ILS:10967442026-01-22T04:49:32Z2026-01-22T04:49:32Zby National Research Council (U.S.). Board on Life Sciences. Committee on PCR Standards for the BioWatch Program, issuing body.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3439887">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability Approach to Risk Management in Watershedsent://SD_ILS/0/SD_ILS:6871032026-01-22T04:49:32Z2026-01-22T04:49:32Zby Teklitz, Allen, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10871571">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10871571</a><br/>Format: Kitap<br/>Managing risk and reliability of process plantsent://SD_ILS/0/SD_ILS:11879392026-01-22T04:49:32Z2026-01-22T04:49:32Zby Tweeddale, Mark.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750677349">https://www.sciencedirect.com/science/book/9780750677349</a><br/>Format: Elektronik Kaynak<br/>Power GaN Devices Materials, Applications and Reliabilityent://SD_ILS/0/SD_ILS:4804472026-01-22T04:49:32Z2026-01-22T04:49:32Zby Meneghini, Matteo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-43199-4">http://dx.doi.org/10.1007/978-3-319-43199-4</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability, and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11783002026-01-22T04:49:32Z2026-01-22T04:49:32Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750608541">http://www.sciencedirect.com/science/book/9780750608541</a><br/>Format: Elektronik Kaynak<br/>An introduction to the basics of reliability and risk analysisent://SD_ILS/0/SD_ILS:1329502026-01-22T04:49:32Z2026-01-22T04:49:32Zby Zio, Enrico<br/>Format: Kitap<br/>Reliability of maintained systems subjected to wear failure mechanisms : theory and applicationsent://SD_ILS/0/SD_ILS:11459602026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bayle, Franck, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5751853">Click to View</a><br/>Format: Elektronik Kaynak<br/>An introduction to the basics of reliability and risk analysisent://SD_ILS/0/SD_ILS:9423932026-01-22T04:49:32Z2026-01-22T04:49:32Zby Zio, Enrico.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=312287">Click to View</a><br/>Format: Elektronik Kaynak<br/>System and Bayesian reliability essays in honor of Professor Richard E. Barlow on his 70th birthdayent://SD_ILS/0/SD_ILS:10304512026-01-22T04:49:32Z2026-01-22T04:49:32Zby Hayakawa, Yu.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679591">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of high-power mechatronic systems. Volume 1, Aerospace and automotive applicationsent://SD_ILS/0/SD_ILS:11299822026-01-22T04:49:32Z2026-01-22T04:49:32Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5061866">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk and Reliability Analysis: Theory and Applications In Honor of Prof. Armen Der Kiureghianent://SD_ILS/0/SD_ILS:4810452026-01-22T04:49:32Z2026-01-22T04:49:32Zby Gardoni, Paolo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-52425-2">http://dx.doi.org/10.1007/978-3-319-52425-2</a><br/>Format: Elektronik Kaynak<br/>Reliability modeling in industry 4.0 : advances in reliability scienceent://SD_ILS/0/SD_ILS:12141792026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ram, Mangey, editor<br/>Format: Kitap<br/>Dynamic system reliability : modeling and analysis of dynamic and dependent behaviorsent://SD_ILS/0/SD_ILS:11441802026-01-22T04:49:32Z2026-01-22T04:49:32Zby Xing, Liudong, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630668">Click to View</a><br/>Format: Elektronik Kaynak<br/>Applied reliability engineering and risk analysis probabilistic models and statistical inferenceent://SD_ILS/0/SD_ILS:10183872026-01-22T04:49:32Z2026-01-22T04:49:32Zby Frenkel, Ilia, Ph.D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1360807">Click to View</a><br/>Format: Elektronik Kaynak<br/>Organizing for reliability : a guide for research and practiceent://SD_ILS/0/SD_ILS:11341172026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ramanujam, Rangaraj, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5219778">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability investigation of LED devices for public light applicationsent://SD_ILS/0/SD_ILS:11243342026-01-22T04:49:32Z2026-01-22T04:49:32Zby Baillot, Raphael, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4822046">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability technology principles and practice of failure prevention in electronic systemsent://SD_ILS/0/SD_ILS:9751502026-01-22T04:49:32Z2026-01-22T04:49:32Zby Pascoe, Norman.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=675299">Click to View</a><br/>Format: Elektronik Kaynak<br/>Spiritüel distres ölçeği'nin Türkçe'ye uyarlanması; geçerlik ve güvenirlik çalışması = Turkish adaptation of the spiritual distress scale; validity and reliability studyent://SD_ILS/0/SD_ILS:12295562026-01-22T04:49:32Z2026-01-22T04:49:32Zby Arpa, Hilal, yazar.<br/>Format: Kitap<br/>Sağlık Bilimleri Kanıta Dayalı Uygulama Anketi'nin türkçe geçerlilik ve güvenirliği = Turkish validity and reliability of The Health Sciences Evidence-Based Practice Questionnaireent://SD_ILS/0/SD_ILS:12296122026-01-22T04:49:32Z2026-01-22T04:49:32Zby Şahin, Ayşe Nur, yazar.<br/>Format: Kitap<br/>Tıkınırcasına yeme bozukluğu tarama anketinin ((BEDS-7) Binge-eating disordes screener)) Türkçe geçerlilik ve güvenilirlil çalışması = Validity and reliability study of the binge-eating disorder screening questionnaire (BEDS-7) in Turkishent://SD_ILS/0/SD_ILS:12293852026-01-22T04:49:32Z2026-01-22T04:49:32Zby Aker, Caner, Dr., yazar.<br/>Format: Kitap<br/>The international journal of quality & reliability management. Volume 25, Number 1, Best practice project portfolio managementent://SD_ILS/0/SD_ILS:9459112026-01-22T04:49:32Z2026-01-22T04:49:32Zby Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=348641">Click to View</a><br/>Format: Elektronik Kaynak<br/>Pipelines 2010 climbing new peaks to infrastructure reliability--renew, rehab, and reinvest : proceedings of the 2010 Pipeline Division Specialty Congress, August 28-September 1, 2010, Keystone Coloradoent://SD_ILS/0/SD_ILS:10683572026-01-22T04:49:32Z2026-01-22T04:49:32Zby Pipeline Division Specialty Congress (2010 : Keystone, Colo.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3115529">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advanced reliability modeling proceedings of the 2004 Asian International Workshop (AIWARM 2004) : Hiroshima, Japan, 26-27 August 2004ent://SD_ILS/0/SD_ILS:9399662026-01-22T04:49:32Z2026-01-22T04:49:32Zby Asian International Workshop on Advanced Reliability Modeling (2004 : Hiroshima-shi, Japan)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=296055">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advanced reliability modeling II reliability testing and improvement : proceedings of the 2nd Asian International Workshop (AIWARM 2006), Busan, Korea, 24-26 August 2006ent://SD_ILS/0/SD_ILS:10309782026-01-22T04:49:32Z2026-01-22T04:49:32Zby Asian International Workshop on Advanced Reliability Modeling (2nd : 2006 : Pusan, Korea)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1681416">Click to View</a><br/>Format: Elektronik Kaynak<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:11773902026-01-22T04:49:32Z2026-01-22T04:49:32Zby Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektronik Kaynak<br/>International Conference on Structural Safety and Reliability : Smithsonian Institution Museum of History and Technology, Constitution Avenue, Washington, D.C., April 9, 10 and 11, 1969ent://SD_ILS/0/SD_ILS:11817172026-01-22T04:49:32Z2026-01-22T04:49:32Zby International Conference on Structural Safety and Reliability (1st : 1969 : Smithsonian Institution)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080165660">https://www.sciencedirect.com/science/book/9780080165660</a><br/>Format: Elektronik Kaynak<br/>Problems of mechanics in pump and compressor engineering : selected, peer reviewed papers from the XIV International Scientific and Engineering Conference on Hermetic Sealing, Vibration Reliability and Ecological Safety of Pump and Compressor Machinery (HERVICON+PUMPS 2014), September 9-12, 2014, Sumy, Ukraineent://SD_ILS/0/SD_ILS:10439472026-01-22T04:49:32Z2026-01-22T04:49:32Zby International Scientific and Engineering Conference on Hermetic Sealing, Vibration Reliability and Ecological Safety of Pump and Compressor Machinery (14th : 2014 : Sumy, Ukraine)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1910938">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in product development and reliability III : selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, Chinaent://SD_ILS/0/SD_ILS:10415482026-01-22T04:49:32Z2026-01-22T04:49:32Zby International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China), issuing body.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1872895">Click to View</a><br/>Format: Elektronik Kaynak<br/>Evaluation of quantification of margins and uncertainties methodology for assessing and certifying the reliability of the nuclear stockpileent://SD_ILS/0/SD_ILS:11011012026-01-22T04:49:32Z2026-01-22T04:49:32Zby National Research Council (U.S.). Committee on the Evaluation of Quantification of Margins and Uncertainties Methodology for Assessing and Certifying the Reliability of the Nuclear Stockpile.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3564163">Click to View</a><br/>Format: Elektronik Kaynak<br/>Industrial lubrication and tribology. Volume 63, Number?, Selected papers from the 3rd International Conference on Integrity, Reliability and Failure 2009ent://SD_ILS/0/SD_ILS:9765212026-01-22T04:49:32Z2026-01-22T04:49:32Zby Seabra, J. (Jorge)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=683436">Click to View</a><br/>Format: Elektronik Kaynak<br/>Safety, reliability, and applications of emerging intelligent control technologies : a postprint volume from the IFAC workshop, Hong Kong, 12-14 December 1994ent://SD_ILS/0/SD_ILS:11782862026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ng, Tung-Sang.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080423746">http://www.sciencedirect.com/science/book/9780080423746</a><br/>Format: Elektronik Kaynak<br/>Multi-scale reliability and serviceability assessment of in-service long-span bridgesent://SD_ILS/0/SD_ILS:11376382026-01-22T04:49:32Z2026-01-22T04:49:32Zby Lu, Naiwei, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5382830">Click to View</a><br/>Format: Elektronik Kaynak<br/>Konstrüksiyon elemanlarında güvenirlik (reliability) ve ömür hesapları ; teorik açıklamalar ve uygulamalarent://SD_ILS/0/SD_ILS:4891562026-01-22T04:49:32Z2026-01-22T04:49:32Zby Tahralı, Necati<br/>Format: Kitap<br/>Reliability theory and models : stochastic failure models, optimal maintenance policies, life testing, and structuresent://SD_ILS/0/SD_ILS:11776332026-01-22T04:49:32Z2026-01-22T04:49:32Zby Abdel-Hameed, Mohamed S.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780120414208">https://www.sciencedirect.com/science/book/9780120414208</a><br/>Format: Elektronik Kaynak<br/>Reliability issues for DoD systems report of a workshopent://SD_ILS/0/SD_ILS:10827242026-01-22T04:49:32Z2026-01-22T04:49:32Zby Samaniego, Francisco.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3375321">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of safety-critical systems : theory and applicationent://SD_ILS/0/SD_ILS:10276452026-01-22T04:49:32Z2026-01-22T04:49:32Zby Rausand, Marvin.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1637653">Click to View</a><br/>Format: Elektronik Kaynak<br/>Improving product reliability and software quality : strategies, tools, process and implementationent://SD_ILS/0/SD_ILS:11456872026-01-22T04:49:32Z2026-01-22T04:49:32Zby Levin, Mark, 1959- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5741218">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11244862026-01-22T04:49:32Z2026-01-22T04:49:32Zby Smith, David J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4825735">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineering and risk analysis : a practical guideent://SD_ILS/0/SD_ILS:11381572026-01-22T04:49:32Z2026-01-22T04:49:32Zby Modarres, M. (Mohammad), author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5400700">Click to View</a><br/>Format: Elektronik Kaynak<br/>Gas and oil reliability engineering : modeling and analysisent://SD_ILS/0/SD_ILS:11113622026-01-22T04:49:32Z2026-01-22T04:49:32Zby Calixto, Eduardo, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4526461">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthdayent://SD_ILS/0/SD_ILS:10268912026-01-22T04:49:32Z2026-01-22T04:49:32Zby Nakamura, Syouji.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1611972">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability prediction from burn-in data fit to reliability modelsent://SD_ILS/0/SD_ILS:10283592026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bernstein, Joseph B., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1647477">Click to View</a><br/>Format: Elektronik Kaynak<br/>Practical reliability engineering and analysis for system design and life-cycle sustainmentent://SD_ILS/0/SD_ILS:9636322026-01-22T04:49:32Z2026-01-22T04:49:32Zby Wessels, William R.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=533784">Click to View</a><br/>Format: Elektronik Kaynak<br/>The OEE primer : understanding overall equipment effectiveness, reliability, and maintainabilityent://SD_ILS/0/SD_ILS:973522026-01-22T04:49:32Z2026-01-22T04:49:32Zby Stamatis, D.H.<br/>Format: Kitap<br/>Robust design methodology for reliability exploring the effects of variation and uncertaintyent://SD_ILS/0/SD_ILS:9558972026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bergman, Bo, 1943-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=454321">Click to View</a><br/>Format: Elektronik Kaynak<br/>HALT, HASS, and HASA explained : accelerated reliability techniquesent://SD_ILS/0/SD_ILS:10553092026-01-22T04:49:32Z2026-01-22T04:49:32Zby McLean, Harry W., 1946- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002645">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:9353752026-01-22T04:49:32Z2026-01-22T04:49:32Zby Smith, David John, 1943-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=269666">Click to View</a><br/>Format: Elektronik Kaynak<br/>World class reliability using Multiple Environment Overstress Tests to make it happenent://SD_ILS/0/SD_ILS:9329232026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bhote, Keki R., 1925-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=243100">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability, and supportability : best practices for systems engineersent://SD_ILS/0/SD_ILS:10431672026-01-22T04:49:32Z2026-01-22T04:49:32Zby Tortorella, Michael, 1947- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1896020">Click to View</a><br/>Format: Elektronik Kaynak<br/>Gas and oil reliability engineering modeling and analysisent://SD_ILS/0/SD_ILS:10016802026-01-22T04:49:32Z2026-01-22T04:49:32Zby Calixto, Eduardo.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1032940">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:9805752026-01-22T04:49:32Z2026-01-22T04:49:32Zby Smith, David J.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=730199">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11878352026-01-22T04:49:32Z2026-01-22T04:49:32Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format: Elektronik Kaynak<br/>Reliability, Maintainability and Risk 8e Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:1372392026-01-22T04:49:32Z2026-01-22T04:49:32Zby Smith, David J.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektronik Kaynak<br/>Reliability, Maintainability and Risk : Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:11838532026-01-22T04:49:32Z2026-01-22T04:49:32Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080969022">https://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektronik Kaynak<br/>Importance measures in reliability, risk, and optimization principles and applicationsent://SD_ILS/0/SD_ILS:9944472026-01-22T04:49:32Z2026-01-22T04:49:32Zby Kuo, Way, 1951-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=912160">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk-based reliability analysis and generic principles for risk reductionent://SD_ILS/0/SD_ILS:11856452026-01-22T04:49:32Z2026-01-22T04:49:32Zby Todinov, M. T.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Elektronik Kaynak<br/>Reliability of MEMS testing of materials and devicesent://SD_ILS/0/SD_ILS:9609892026-01-22T04:49:32Z2026-01-22T04:49:32Zby Tabata, Osamu.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=481344">Click to View</a><br/>Format: Elektronik Kaynak<br/>Spacecraft reliability and multi-state failures a statistical approachent://SD_ILS/0/SD_ILS:9784342026-01-22T04:49:32Z2026-01-22T04:49:32Zby Saleh, Joseph H., 1971-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=697462">Click to View</a><br/>Format: Elektronik Kaynak<br/>Statistical theory of reliability and life testing : probability modelsent://SD_ILS/0/SD_ILS:6701822026-01-22T04:49:32Z2026-01-22T04:49:32Zby Barlow, Richard E.<br/>Format: Kitap<br/>Reliability analysis for asset management of electric power gridsent://SD_ILS/0/SD_ILS:11441452026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ross, Robert D., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630246">Click to View</a><br/>Format: Elektronik Kaynak<br/>Corporate communications. Volume 23, Number 2, An International Journal : Communicating/Organizing for Reliability, Resilience, and Safetyent://SD_ILS/0/SD_ILS:11373142026-01-22T04:49:32Z2026-01-22T04:49:32Zby Barbour, Joshua B., editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5351422">Click to View</a><br/>Format: Elektronik Kaynak<br/>Semi-Markov processes : applications in system reliability and maintenanceent://SD_ILS/0/SD_ILS:10381822026-01-22T04:49:32Z2026-01-22T04:49:32Zby Grabski, Franciszek, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1798310">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probability, statistics, and reliability for engineers and scientistsent://SD_ILS/0/SD_ILS:10272312026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ayyub, Bilal M., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1631123">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessmentent://SD_ILS/0/SD_ILS:11279302026-01-22T04:49:32Z2026-01-22T04:49:32Zby Modarres, M. (Mohammad), author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4901681">Click to View</a><br/>Format: Elektronik Kaynak<br/>Binary decision diagrams and extensions for system reliability analysisent://SD_ILS/0/SD_ILS:11032282026-01-22T04:49:32Z2026-01-22T04:49:32Zby Xing, Liudong, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4041105">Click to View</a><br/>Format: Elektronik Kaynak<br/>Oxide reliability a summary of silicon oxide wearout, breakdown, and reliabilityent://SD_ILS/0/SD_ILS:10303252026-01-22T04:49:32Z2026-01-22T04:49:32Zby Dumin, D. J.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679439">Click to View</a><br/>Format: Elektronik Kaynak<br/>Mathematical models for the study of the reliability of systemsent://SD_ILS/0/SD_ILS:11907132026-01-22T04:49:32Z2026-01-22T04:49:32Zby Kaufmann, A. (Arnold), 1911-1994.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780124023703">https://www.sciencedirect.com/science/book/9780124023703</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/publication?issn=00765392&volume=124">https://www.sciencedirect.com/science/publication?issn=00765392&volume=124</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/bookseries/00765392/124">https://www.sciencedirect.com/science/bookseries/00765392/124</a><br/>Format: Elektronik Kaynak<br/>Reliability in computing : the role of interval methods in scientific computingent://SD_ILS/0/SD_ILS:11759752026-01-22T04:49:32Z2026-01-22T04:49:32Zby Moore, Ramon E.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780125056304">https://www.sciencedirect.com/science/book/9780125056304</a><br/>Format: Elektronik Kaynak<br/>General principles : general principles on quality assurance for structures : general principles on reliability for structural design : reportent://SD_ILS/0/SD_ILS:11703082026-01-22T04:49:32Z2026-01-22T04:49:32Zby Joint Committee on Structural Safety.<br/>Format: Kitap<br/>Statistical models and methods for reliability and survival analysisent://SD_ILS/0/SD_ILS:10243132026-01-22T04:49:32Z2026-01-22T04:49:32Zby Couallier, Vincent.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1580028">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applicationsent://SD_ILS/0/SD_ILS:10155422026-01-22T04:49:32Z2026-01-22T04:49:32Zby Wu, Bin.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1222589">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:11844892026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ohring, Milton, 1936-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format: Elektronik Kaynak<br/>Software reliability : measurement, prediction, application / John D. Musa, Anthony Iannino, Kazuhira Okumoto.ent://SD_ILS/0/SD_ILS:9185242026-01-22T04:49:32Z2026-01-22T04:49:32Zby Musa, John D.<br/>Format: Kitap<br/>Fundamentals of reliability engineering : applications in multistage interconnection networksent://SD_ILS/0/SD_ILS:10279372026-01-22T04:49:32Z2026-01-22T04:49:32Zby Gunawan, Indra, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1641079">Click to View</a><br/>Format: Elektronik Kaynak<br/>Semi-Markov chains and hidden semi-Markov models toward applications their use in reliability and DNA analysisent://SD_ILS/0/SD_ILS:9501292026-01-22T04:49:32Z2026-01-22T04:49:32Zby Barbu, Vlad Stefan.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=417305">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fault injection techniques and tools for embedded systems reliability evaluationent://SD_ILS/0/SD_ILS:10625312026-01-22T04:49:32Z2026-01-22T04:49:32Zby Benso, Alfredo.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3036042">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probabilistic safety assessment for optimum nuclear power plant life management (PLiM) theory and application of reliability analysis methods for major power plant componentsent://SD_ILS/0/SD_ILS:10239402026-01-22T04:49:32Z2026-01-22T04:49:32Zby Arkadov, Gennadij V.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1575572">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability Design of Mechanical Systems A Guide for Mechanical and Civil Engineersent://SD_ILS/0/SD_ILS:4809402026-01-22T04:49:32Z2026-01-22T04:49:32Zby Woo, Seongwoo. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-50829-0">http://dx.doi.org/10.1007/978-3-319-50829-0</a><br/>Format: Elektronik Kaynak<br/>Engineering maintainability : how to design for reliability and easy maintenanceent://SD_ILS/0/SD_ILS:11851692026-01-22T04:49:32Z2026-01-22T04:49:32Zby Dhillon, B. S. (Balbir S.), 1947-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152576">http://www.sciencedirect.com/science/book/9780884152576</a><br/>Format: Elektronik Kaynak<br/>Theory and Practice of Quality and Reliability Engineering in Asia Industryent://SD_ILS/0/SD_ILS:4817212026-01-22T04:49:32Z2026-01-22T04:49:32Zby Tan, Cher Ming. editor.<br/><a href="http://dx.doi.org/10.1007/978-981-10-3290-5">http://dx.doi.org/10.1007/978-981-10-3290-5</a><br/>Format: Elektronik Kaynak<br/>Reliability and Risk Evaluation of Wind Integrated Power Systemsent://SD_ILS/0/SD_ILS:1405572026-01-22T04:49:32Z2026-01-22T04:49:32Zby Billinton, Roy. editor.<br/><a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format: Elektronik Kaynak<br/>Process risk and reliability management : operational integrity managementent://SD_ILS/0/SD_ILS:11784322026-01-22T04:49:32Z2026-01-22T04:49:32Zby Sutton, Ian S.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format: Elektronik Kaynak<br/>Measures of response reliability in 1988 household labour force survey for Ankaraent://SD_ILS/0/SD_ILS:768492026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bilge, Hüsniye<br/>Format: Kitap<br/>Goal oriented methodology and applications in nuclear power plants : a modern systems reliability approachent://SD_ILS/0/SD_ILS:11487402026-01-22T04:49:32Z2026-01-22T04:49:32Zby Xiao-Jian, Yi, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5969498">Click to View</a><br/>Format: Elektronik Kaynak<br/>Mastering selenium webdriver 3.0 : boost the performance and reliability of your automated checks by mastering Selenium WebDriver.ent://SD_ILS/0/SD_ILS:11404512026-01-22T04:49:32Z2026-01-22T04:49:32Zby Collin, Mark, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5446029">Click to View</a><br/>Format: Elektronik Kaynak<br/>Firearm and toolmark identification : the scientific reliability of the forensic science disciplineent://SD_ILS/0/SD_ILS:11406762026-01-22T04:49:32Z2026-01-22T04:49:32Zby Nichols, Ronald, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5455401">Click to View</a><br/>Format: Elektronik Kaynak<br/>Solid oxide fuel cell lifetime and reliability : critical challenges in fuel cellsent://SD_ILS/0/SD_ILS:11265972026-01-22T04:49:32Z2026-01-22T04:49:32Zby Brandon, Nigel P., editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4865436">Click to View</a><br/>Format: Elektronik Kaynak<br/>Numerical methods of simulation and optimization of piecewise deterministic Markov processes : application to reliabilityent://SD_ILS/0/SD_ILS:11047542026-01-22T04:49:32Z2026-01-22T04:49:32Zby Saporta, Benoîte de, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4205869">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, robustness and failure mechanisms of led devices : methodology and evaluationent://SD_ILS/0/SD_ILS:11196022026-01-22T04:49:32Z2026-01-22T04:49:32Zby Deshayes, Yannick, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4717207">Click to View</a><br/>Format: Elektronik Kaynak<br/>Simulation of stochastic processes with given accuracy and reliabilityent://SD_ILS/0/SD_ILS:11208622026-01-22T04:49:32Z2026-01-22T04:49:32Zby Kozachenko, Yuriy, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4747211">Click to View</a><br/>Format: Elektronik Kaynak<br/>Embedded mechatronic systems. Volume 1, Analysis of failures, predictive reliabilityent://SD_ILS/0/SD_ILS:10519342026-01-22T04:49:32Z2026-01-22T04:49:32Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=2086747">Click to View</a><br/>Format: Elektronik Kaynak<br/>Designing for human reliability : human factors engineering in the oil, gas, and process industriesent://SD_ILS/0/SD_ILS:10469492026-01-22T04:49:32Z2026-01-22T04:49:32Zby McLeod, Ronald W. , author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=2000913">Click to View</a><br/>Format: Elektronik Kaynak<br/>Flow networks analysis and optimization of repairable flow networks, networks with disturbed flows, static flow networks and reliability networksent://SD_ILS/0/SD_ILS:10075062026-01-22T04:49:32Z2026-01-22T04:49:32Zby Todinov, Michael T.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1114626">Click to View</a><br/>Format: Elektronik Kaynak<br/>Electric utility resource planning economics, reliability, and decision-makingent://SD_ILS/0/SD_ILS:9874722026-01-22T04:49:32Z2026-01-22T04:49:32Zby Sim, Steven.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=826969">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fault tolerant drive by wire systems impact on vehicle safety and reliabilityent://SD_ILS/0/SD_ILS:9985582026-01-22T04:49:32Z2026-01-22T04:49:32Zby Anwar, Sohel.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=976620">Click to View</a><br/>Format: Elektronik Kaynak<br/>The cost of being landlocked logistics, costs, and supply chain reliabilityent://SD_ILS/0/SD_ILS:9686422026-01-22T04:49:32Z2026-01-22T04:49:32Zby Arvis, Jean-François, 1960-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=589796">Click to View</a><br/>Format: Elektronik Kaynak<br/>Axiomatic quality integrating axiomatic design with six-sigma, reliability, and quality engineeringent://SD_ILS/0/SD_ILS:9309382026-01-22T04:49:32Z2026-01-22T04:49:32Zby El-Haik, Basem.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=227550">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and validity of the Turkish version of the service quality assessment scaleent://SD_ILS/0/SD_ILS:846902026-01-22T04:49:32Z2026-01-22T04:49:32Zby Gürbüz, Bülent<br/>Format: Kitap<br/>Ecology, engineering, and management reconciling ecosystem rehabilitation and service reliabilityent://SD_ILS/0/SD_ILS:9506762026-01-22T04:49:32Z2026-01-22T04:49:32Zby Eeten, Michel van.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=422475">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of medicare hospital discharge records report of a studyent://SD_ILS/0/SD_ILS:10848512026-01-22T04:49:32Z2026-01-22T04:49:32Zby Institute of Medicine (U.S.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3377596">Click to View</a><br/>Format: Elektronik Kaynak<br/>Electricity access in Sub-Saharan Africa : uptake, reliability, and complementary factors for economic impact, Moussa P. Blimpo and Malcolm Cosgrove-Davies.ent://SD_ILS/0/SD_ILS:11453922026-01-22T04:49:32Z2026-01-22T04:49:32Zby Blimpo, Moussa P., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5725963">Click to View</a><br/>Format: Elektronik Kaynak<br/>A big data analytics approach to quality, reliability and risk managementent://SD_ILS/0/SD_ILS:11456102026-01-22T04:49:32Z2026-01-22T04:49:32Zby Mazzuto, Giovanni, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5734581">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk and reliability in structural engineering : theoretical basisent://SD_ILS/0/SD_ILS:11465922026-01-22T04:49:32Z2026-01-22T04:49:32Zby Lu, Naiwei, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5780563">Click to View</a><br/>Format: Elektronik Kaynak<br/>Durability and reliability of polymers and other materials in photovoltaic modulesent://SD_ILS/0/SD_ILS:11468702026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bruckman, Laura, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5788821">Click to View</a><br/>Format: Elektronik Kaynak<br/>Bioelectronics and medical devices : from materials to devices - fabrication, applications and reliabilityent://SD_ILS/0/SD_ILS:11470392026-01-22T04:49:32Z2026-01-22T04:49:32Zby Pal, Kunal, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5796374">Click to View</a><br/>Format: Elektronik Kaynak<br/>Wide bandgap power semiconductor packaging : materials, components, and reliabilityent://SD_ILS/0/SD_ILS:11382432026-01-22T04:49:32Z2026-01-22T04:49:32Zby Suganuma, Katsuaki, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5404290">Click to View</a><br/>Format: Elektronik Kaynak<br/>Security, privacy and reliability in computer communications and networksent://SD_ILS/0/SD_ILS:11217842026-01-22T04:49:32Z2026-01-22T04:49:32Zby Sha, Kewei, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4771355">Click to View</a><br/>Format: Elektronik Kaynak<br/>Stochastic models in survival analysis and reliability set. Volume 1, Reliability of engineering systems and technological riskent://SD_ILS/0/SD_ILS:11152762026-01-22T04:49:32Z2026-01-22T04:49:32Zby Rykov, Vladimir, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4648726">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability assurance of big data in the cloud : cost-effective replication-based storageent://SD_ILS/0/SD_ILS:10425632026-01-22T04:49:32Z2026-01-22T04:49:32Zby Yang, Yun, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1888753">Click to View</a><br/>Format: Elektronik Kaynak<br/>Quality and reliability aspects in nuclear power reactor fuel engineeringent://SD_ILS/0/SD_ILS:11258542026-01-22T04:49:32Z2026-01-22T04:49:32Zby International Atomic Energy Agency.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4853266">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability in cognitive neuroscience a meta-meta-analysisent://SD_ILS/0/SD_ILS:10821022026-01-22T04:49:32Z2026-01-22T04:49:32Zby Uttal, William R.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3339523">Click to View</a><br/>Format: Elektronik Kaynak<br/>Using the Weibull distribution reliability, modeling, and inferenceent://SD_ILS/0/SD_ILS:9933922026-01-22T04:49:32Z2026-01-22T04:49:32Zby McCool, John, 1936-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=894399">Click to View</a><br/>Format: Elektronik Kaynak<br/>Assessing the reliability of complex models mathematical and statistical foundations of verification, validation, and uncertainty quantificationent://SD_ILS/0/SD_ILS:10861332026-01-22T04:49:32Z2026-01-22T04:49:32Zby National Research Council (U.S.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3378995">Click to View</a><br/>Format: Elektronik Kaynak<br/>Recent advances in providing QoS and reliability in the future Internet backboneent://SD_ILS/0/SD_ILS:10591222026-01-22T04:49:32Z2026-01-22T04:49:32Zby Wang, Ning, 1974-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3018661">Click to View</a><br/>Format: Elektronik Kaynak<br/>Microsoft SQL Server 2008 high availability minimize downtime, speed up recovery, and achieve the highest level of availability and reliability for SQL server applications by mastering the concepts of database mirroring, log shipping, clustering, and replicationent://SD_ILS/0/SD_ILS:9968422026-01-22T04:49:32Z2026-01-22T04:49:32Zby Goswami, Hemantgiri S.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=948566">Click to View</a><br/>Format: Elektronik Kaynak<br/>Equipment management workbook key to equipment reliability and productivity in miningent://SD_ILS/0/SD_ILS:9734122026-01-22T04:49:32Z2026-01-22T04:49:32Zby Tomlingson, Paul D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=655785">Click to View</a><br/>Format: Elektronik Kaynak<br/>Equipment management key to equipment reliability and productivity in miningent://SD_ILS/0/SD_ILS:9573092026-01-22T04:49:32Z2026-01-22T04:49:32Zby Tomlingson, Paul D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=464572">Click to View</a><br/>Format: Elektronik Kaynak<br/>Safety and reliability in cooperating unmanned aerial systemsent://SD_ILS/0/SD_ILS:9807482026-01-22T04:49:32Z2026-01-22T04:49:32Zby Rabbath, Camille Alain, 1969-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=731173">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advanced manufacturing process, lead free interconnect materials and reliability modeling for electronics packagingent://SD_ILS/0/SD_ILS:9350502026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bailey, Christopher.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=267393">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk, reliability, uncertainty, and robustness of water resources systemsent://SD_ILS/0/SD_ILS:9290212026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bogárdi, János.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=201907">Click to View</a><br/>Format: Elektronik Kaynak<br/>Digital instrumentation and control systems in nuclear power plants safety and reliability issues : final reportent://SD_ILS/0/SD_ILS:10830752026-01-22T04:49:32Z2026-01-22T04:49:32Zby National Research Council (U.S.). Committee on Application of Digital Instrumentation and Control Systems to Nuclear Power Plant Operations and Safety.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3375677">Click to View</a><br/>Format: Elektronik Kaynak<br/>On the Historical Reliability of Ancient Biographies: A thorough Examination of Xenophon's Agesilaus, Cornelius Nepos's Atticus, Tacitus's Agricola, and The Gospel According to Johnent://SD_ILS/0/SD_ILS:7014422026-01-22T04:49:32Z2026-01-22T04:49:32Zby Wright, Edward T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13815012">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13815012</a><br/>Format: Kitap<br/>Characterization of Self-Heating Effects and Assessment of Its Impact on Reliability in FinFET Technologyent://SD_ILS/0/SD_ILS:6996352026-01-22T04:49:32Z2026-01-22T04:49:32Zby Paliwoda, Peter Christopher, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13423034">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13423034</a><br/>Format: Kitap<br/>Performance-Based Economical Seismic Design of Multistory Reinforced Concrete Frame Buildings and Reliability Assessmentent://SD_ILS/0/SD_ILS:6997182026-01-22T04:49:32Z2026-01-22T04:49:32Zby Zhang, Chunyu, author. (orcid)0000-0002-1073-1902<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13424086">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13424086</a><br/>Format: Kitap<br/>Reliability and Validity of the Active-mini for Quantifying Movement in Infants with Spinal Muscular Atrophyent://SD_ILS/0/SD_ILS:7017292026-01-22T04:49:32Z2026-01-22T04:49:32Zby Nelson, Leslie, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13846799">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13846799</a><br/>Format: Kitap<br/>Control of Wind Power Systems for Energy Efficiency and Reliabilityent://SD_ILS/0/SD_ILS:7017672026-01-22T04:49:32Z2026-01-22T04:49:32Zby Xiao, Yan, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13849196">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13849196</a><br/>Format: Kitap<br/>Reliability Assessment of a System Integrity Protection Scheme for Transmission Networksent://SD_ILS/0/SD_ILS:7026762026-01-22T04:49:32Z2026-01-22T04:49:32Zby Liu, Nan, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870347">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870347</a><br/>Format: Kitap<br/>On Grid Converter Reliability: Preserving the Life of Power Electronics Through Active Thermal Boundary Controlent://SD_ILS/0/SD_ILS:7037072026-01-22T04:49:32Z2026-01-22T04:49:32Zby Lewis, Patrick T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872130">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872130</a><br/>Format: Kitap<br/>Efficient reliability modelling & analysis of complex systems with application to nuclear power plant safetyent://SD_ILS/0/SD_ILS:7043572026-01-22T04:49:32Z2026-01-22T04:49:32Zby George-Williams, H., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872865">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872865</a><br/>Format: Kitap<br/>Energy saving and reliability of wireless body area networks for health applicationsent://SD_ILS/0/SD_ILS:7045662026-01-22T04:49:32Z2026-01-22T04:49:32Zby Alshaheen, H. S. S., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873074">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873074</a><br/>Format: Kitap<br/>Calibration of expensive computer models using engineering reliability methodsent://SD_ILS/0/SD_ILS:7050082026-01-22T04:49:32Z2026-01-22T04:49:32Zby Gong, Zitong, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873517">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873517</a><br/>Format: Kitap<br/>Stochastic methods for emulation, calibration and reliability analysis of engineering modelsent://SD_ILS/0/SD_ILS:7057362026-01-22T04:49:32Z2026-01-22T04:49:32Zby Garbuno Inigo, A., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13874246">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13874246</a><br/>Format: Kitap<br/>Inter-rater reliability of the structured assessment of violence risk in youth (savry) amongst mental health professionalsent://SD_ILS/0/SD_ILS:7075042026-01-22T04:49:32Z2026-01-22T04:49:32Zby Selby, Sarah Elizabeth, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13876017">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13876017</a><br/>Format: Kitap<br/>Scheduling event-triggered and time-triggered applications with optimal reliability and predictability on networked multi-core chipsent://SD_ILS/0/SD_ILS:6855612026-01-22T04:49:32Z2026-01-22T04:49:32Zby Murshed, Ayman, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10869403">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10869403</a><br/>Format: Kitap<br/>The Implications of the Internet's Topological Structure for Its Efficiency, Security, and Reliabilityent://SD_ILS/0/SD_ILS:6989362026-01-22T04:49:32Z2026-01-22T04:49:32Zby Nur, Abdullah Yasin, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10980025">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10980025</a><br/>Format: Kitap<br/>Assessing the Reliability of the 1760 British Geographical Survey of the St. Lawrence River Valleyent://SD_ILS/0/SD_ILS:6991232026-01-22T04:49:32Z2026-01-22T04:49:32Zby Gliserman, Nicholas, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11016107">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11016107</a><br/>Format: Kitap<br/>The Reliability of Simultaneous Quantitative 3D Analysis of Bone and Soft Tissue Volumesent://SD_ILS/0/SD_ILS:6992632026-01-22T04:49:32Z2026-01-22T04:49:32Zby Mehryar, Paymon, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11017007">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11017007</a><br/>Format: Kitap<br/>Development and Evaluation of a Prototype Travel Time Reliability Monitoring System for Freeway Facilities in North Carolinaent://SD_ILS/0/SD_ILS:6993822026-01-22T04:49:32Z2026-01-22T04:49:32Zby Smith, Russell Charles, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11018101">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11018101</a><br/>Format: Kitap<br/>Advancements in Evaluating Reliability of Nondestructive Technologies for the Detection of Subsurface Fracture Damage in R.C. Bridge Decksent://SD_ILS/0/SD_ILS:7026012026-01-22T04:49:32Z2026-01-22T04:49:32Zby Sultan, Ali Abed, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870026">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870026</a><br/>Format: Kitap<br/>Reliability analysis for small wind turbines using bayesian hierarchical modellingent://SD_ILS/0/SD_ILS:7066022026-01-22T04:49:32Z2026-01-22T04:49:32Zby Wu, JenHao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13875114">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13875114</a><br/>Format: Kitap<br/>Evaluation of Factors Influencing Los Angeles Tiered-Dispatch System's Improvement on Bystander CPR Rate and Inter Reliability between Electronic Patient Care Report (ePCR) and 911 Call Review on Bystander CPR Rateent://SD_ILS/0/SD_ILS:6982772026-01-22T04:49:32Z2026-01-22T04:49:32Zby Zhang, Huihui, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10801261">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10801261</a><br/>Format: Kitap<br/>Target Levels of Reliability for Design of Bridge Foundations and Approach Embankments Using LRFDent://SD_ILS/0/SD_ILS:7025722026-01-22T04:49:32Z2026-01-22T04:49:32Zby Huaco, Daniel R., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13869883">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13869883</a><br/>Format: Kitap<br/>Modeling and simulation for microelectronic packaging assembly manufacturing, reliability and testingent://SD_ILS/0/SD_ILS:9867042026-01-22T04:49:32Z2026-01-22T04:49:32Zby Liu, S. (Sheng), 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=818629">Click to View</a><br/>Format: Elektronik Kaynak<br/>The evolution of animal communication reliability and deception in signaling systemsent://SD_ILS/0/SD_ILS:9614422026-01-22T04:49:32Z2026-01-22T04:49:32Zby Searcy, William A., 1950-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=485769">Click to View</a><br/>Format: Elektronik Kaynak<br/>Adhesives technology for electronic applications : materials, processes, reliabilityent://SD_ILS/0/SD_ILS:11900162026-01-22T04:49:32Z2026-01-22T04:49:32Zby Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515135">http://www.sciencedirect.com/science/book/9780815515135</a><br/>Format: Elektronik Kaynak<br/>Graph theory in modern engineering : computer aided design, control, optimization, reliability analysisent://SD_ILS/0/SD_ILS:11908862026-01-22T04:49:32Z2026-01-22T04:49:32Zby Henley, Ernest J.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780123408501">https://www.sciencedirect.com/science/book/9780123408501</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/publication?issn=00765392&volume=98">https://www.sciencedirect.com/science/publication?issn=00765392&volume=98</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/bookseries/00765392/98">https://www.sciencedirect.com/science/bookseries/00765392/98</a><br/>Format: Elektronik Kaynak<br/>Reliability of Highly Stretchable Flexible Electronic Interconnects and Surface Improvement of DMLS Printed Partsent://SD_ILS/0/SD_ILS:6932992026-01-22T04:49:32Z2026-01-22T04:49:32Zby Zachariah, Ashwin Varkey, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10816881">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10816881</a><br/>Format: Kitap<br/>The Reliability of Symphony Link in Emergency Scenariosent://SD_ILS/0/SD_ILS:6896642026-01-22T04:49:32Z2026-01-22T04:49:32Zby Larson, Anna, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10786579">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10786579</a><br/>Format: Kitap<br/>Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliabilityent://SD_ILS/0/SD_ILS:1375512026-01-22T04:49:32Z2026-01-22T04:49:32Zby Levinson, David M.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format: Elektronik Kaynak<br/>Canadian Matrimonial Litigation Requires Reliability Testing for Unaudited Financial Statementsent://SD_ILS/0/SD_ILS:6808722026-01-22T04:49:32Z2026-01-22T04:49:32Zby Mailloux, Athena, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812640">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812640</a><br/>Format: Kitap<br/>Reliability of Phenotype Estimation and Extended Classification of Ancestry for Forensic Applicationsent://SD_ILS/0/SD_ILS:6923982026-01-22T04:49:32Z2026-01-22T04:49:32Zby Weisz, Naomi A., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10813495">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10813495</a><br/>Format: Kitap<br/>Test-Retest Reliability of TRIMP and Training Effect in Collegiate Icehockey Playersent://SD_ILS/0/SD_ILS:6925302026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ulmer, Jason, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10814025">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10814025</a><br/>Format: Kitap<br/>Reliability Evaluation and Improvement Based on Operational Failure Rate of Power Electronics in Islanded Microgrident://SD_ILS/0/SD_ILS:6930542026-01-22T04:49:32Z2026-01-22T04:49:32Zby Zhong, Wen, author. (orcid)0000-0002-5262-5067<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815889">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815889</a><br/>Format: Kitap<br/>The Effect of Overloading on Reliability of Wheel Loader Structural Componentsent://SD_ILS/0/SD_ILS:6882532026-01-22T04:49:32Z2026-01-22T04:49:32Zby Achelpohl, Eric Raymond, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10689117">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10689117</a><br/>Format: Kitap<br/>Applications of Bayesian Hierarchical Models in Gene Expression and Product Reliabilityent://SD_ILS/0/SD_ILS:6781492026-01-22T04:49:32Z2026-01-22T04:49:32Zby Mittman, Eric T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10688357">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10688357</a><br/>Format: Kitap<br/>Reliability and Resiliency Driven Solutions for Electric Power Systems Operation and Planningent://SD_ILS/0/SD_ILS:6784832026-01-22T04:49:32Z2026-01-22T04:49:32Zby Sedzro, Kwami Senam A., author. (orcid)0000-0002-2107-8662<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748235">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748235</a><br/>Format: Kitap<br/>Comparing Offender Characteristics in a Sample of Oklahoma Sexual Assault Cases with Population Demographics in Oklahoma: A Study of the Reliability of a Statistical Profiling Methodologyent://SD_ILS/0/SD_ILS:6881702026-01-22T04:49:32Z2026-01-22T04:49:32Zby Moses, Caitlin, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10685854">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10685854</a><br/>Format: Kitap<br/>Reliability and Security in Low Power Circuits and Systemsent://SD_ILS/0/SD_ILS:6875362026-01-22T04:49:32Z2026-01-22T04:49:32Zby Geng, Hui, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10186967">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10186967</a><br/>Format: Kitap<br/>Adhesives technology for electronic applications : materials, processing, reliabilityent://SD_ILS/0/SD_ILS:11838012026-01-22T04:49:32Z2026-01-22T04:49:32Zby Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format: Elektronik Kaynak<br/>Evaluating the reliability of emergency response systems for large-scale incident operationsent://SD_ILS/0/SD_ILS:9707202026-01-22T04:49:32Z2026-01-22T04:49:32Zby Jackson, Brian A., 1972-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=618726">Click to View</a><br/>Format: Elektronik Kaynak<br/>The delivery reliability of UK manufacturing plants: An empirical studyent://SD_ILS/0/SD_ILS:6831692026-01-22T04:49:32Z2026-01-22T04:49:32Zby Szwejczewski, Marek Gregory, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10832263">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10832263</a><br/>Format: Kitap<br/>Geographic Routing Reliability Enhancement in Urban Vehicular Ad Hoc Networksent://SD_ILS/0/SD_ILS:6808922026-01-22T04:49:32Z2026-01-22T04:49:32Zby Alzamzami, Ohoud, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812787">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812787</a><br/>Format: Kitap<br/>Task Relevant Source Based Brain Computer Interface: Exploration of Independent Component Analysis Based Spatial Filtering with Reliabilityent://SD_ILS/0/SD_ILS:6940382026-01-22T04:49:32Z2026-01-22T04:49:32Zby Cheema, Maninderpal Singh, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823332">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823332</a><br/>Format: Kitap<br/>Conditional Standard Errors of Measurement, Confidence Interval, and Reliability for Individual Level Student Growth Percentilesent://SD_ILS/0/SD_ILS:6880032026-01-22T04:49:32Z2026-01-22T04:49:32Zby Choi, Jinah, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10637021">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10637021</a><br/>Format: Kitap<br/>Assessing the Validity and Reliability of Computer-based Case Simulations in a Nurse Anesthesia Specialtyent://SD_ILS/0/SD_ILS:6885062026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ward, Robyn Camille, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10746481">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10746481</a><br/>Format: Kitap<br/>Counsel Confidently: Reliability of Bedside Estimated Fetal Weight to Predict Survival at Periviabilityent://SD_ILS/0/SD_ILS:6886782026-01-22T04:49:32Z2026-01-22T04:49:32Zby Krenitsky, Nicole M., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748282">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748282</a><br/>Format: Kitap<br/>Inter-rater Reliability of Physical Abuse Determinations and Abusive Fracture Incidence at a Level 1 Pediatric Trauma Centerent://SD_ILS/0/SD_ILS:6887912026-01-22T04:49:32Z2026-01-22T04:49:32Zby Buesser, Katherine Elizabeth, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10749089">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10749089</a><br/>Format: Kitap<br/>Novel Methods for Improving Performance and Reliability of Flash-Based Solid State Storage Systement://SD_ILS/0/SD_ILS:6963602026-01-22T04:49:32Z2026-01-22T04:49:32Zby Guo, Jiayang, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10891703">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10891703</a><br/>Format: Kitap<br/>Coating materials for electronic applications : polymers, processes, reliability, testingent://SD_ILS/0/SD_ILS:11900182026-01-22T04:49:32Z2026-01-22T04:49:32Zby Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815514923">http://www.sciencedirect.com/science/book/9780815514923</a><br/>Format: Elektronik Kaynak<br/>Human reliability : analysis, prediction, and prevention of human errorsent://SD_ILS/0/SD_ILS:11818202026-01-22T04:49:32Z2026-01-22T04:49:32Zby Park, Kyung S. (Kyung Soo)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780444427274">https://www.sciencedirect.com/science/book/9780444427274</a><br/>Format: Elektronik Kaynak<br/>The elasto-plastic buckling strength of imperfect hemispheres and their reliabilityent://SD_ILS/0/SD_ILS:6848632026-01-22T04:49:32Z2026-01-22T04:49:32Zby Shao, Wen Jiao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10868287">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10868287</a><br/>Format: Kitap<br/>Evaluation of the Reliability of Nondestructive Ultrasonic Inspection Methods for the Detection and the Characterization of Defects in Hydroelectric Turbine Welded Joints = &Eacute;valuation de la fiabilit&eacute; des m&eacute;thodes de contr&ocirc;le non destructives par ultrasons pour la d&eacute;tection et la caract&eacute;risation de d&eacute;fauts dans des joints soud&eacute;s de turbines hydro&eacute;lectriquesent://SD_ILS/0/SD_ILS:7013802026-01-22T04:49:32Z2026-01-22T04:49:32Zby Habibzadeh Boukani, Hamid, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13814436">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13814436</a><br/>Format: Kitap<br/>Microgrid Reliability Evaluation Based on Condition-Dependent Failure Models of Power Electronic Devicesent://SD_ILS/0/SD_ILS:6930272026-01-22T04:49:32Z2026-01-22T04:49:32Zby Li, Qi, author. (orcid)0000-0001-7329-0991<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815787">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815787</a><br/>Format: Kitap<br/>Reliability Modeling, Testing and Optimization of Systems with Mixtures of One-Shot Unitsent://SD_ILS/0/SD_ILS:6872652026-01-22T04:49:32Z2026-01-22T04:49:32Zby Cheng, Yao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902001">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902001</a><br/>Format: Kitap<br/>Automated Runtime Data Analysis for System Reliability Managementent://SD_ILS/0/SD_ILS:6873212026-01-22T04:49:32Z2026-01-22T04:49:32Zby He, Pinjia, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902155">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902155</a><br/>Format: Kitap<br/>Opto-Electro-Thermal Approach to Modeling Photovoltaic Performance and Reliability from Cell to Moduleent://SD_ILS/0/SD_ILS:6784262026-01-22T04:49:32Z2026-01-22T04:49:32Zby Sun, Xingshu, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10747508">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10747508</a><br/>Format: Kitap<br/>Evaluation of the Life-Cycle Reliability of Engineered Slopes Utilizing Multi-Source Monitoring Informationent://SD_ILS/0/SD_ILS:6967742026-01-22T04:49:32Z2026-01-22T04:49:32Zby Li, Xueyou, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903347">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903347</a><br/>Format: Kitap<br/>Semiconductor laser engineering, reliability and diagnostics a practical approach to high power and single mode devicesent://SD_ILS/0/SD_ILS:10078402026-01-22T04:49:32Z2026-01-22T04:49:32Zby Epperlein, Peter W.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1118506">Click to View</a><br/>Format: Elektronik Kaynak<br/>Aerospace and automotive applications : issues, testing and analysisent://SD_ILS/0/SD_ILS:11306052026-01-22T04:49:32Z2026-01-22T04:49:32Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5108518">Click to View</a><br/>Format: Elektronik Kaynak<br/>Data-Driven Remaining Useful Life Prognosis Techniques Stochastic Models, Methods and Applicationsent://SD_ILS/0/SD_ILS:4814752026-01-22T04:49:32Z2026-01-22T04:49:32Zby Si, Xiao-Sheng. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-54030-5">http://dx.doi.org/10.1007/978-3-662-54030-5</a><br/>Format: Elektronik Kaynak<br/>Total quality management sustainabilityent://SD_ILS/0/SD_ILS:9315432026-01-22T04:49:32Z2026-01-22T04:49:32Zby Zairi, Mohamed.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=232302">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fluid-structure interactions and uncertainties : Ansys and fluent toolsent://SD_ILS/0/SD_ILS:11239032026-01-22T04:49:32Z2026-01-22T04:49:32Zby El Hami, Abdelkhalak, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4816334">Click to View</a><br/>Format: Elektronik Kaynak<br/>Quality and supply chain management : integration challenges and impactsent://SD_ILS/0/SD_ILS:11109242026-01-22T04:49:32Z2026-01-22T04:49:32Zby Sampaio, Paulo, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4514356">Click to View</a><br/>Format: Elektronik Kaynak<br/>Innovative quality management casesent://SD_ILS/0/SD_ILS:9343222026-01-22T04:49:32Z2026-01-22T04:49:32Zby Iwaarden, Jos van.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=258154">Click to View</a><br/>Format: Elektronik Kaynak<br/>Best practice quality function deployment (QFD) casesent://SD_ILS/0/SD_ILS:9385502026-01-22T04:49:32Z2026-01-22T04:49:32Zby Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=289800">Click to View</a><br/>Format: Elektronik Kaynak<br/>The leading edge in quality function deploymentent://SD_ILS/0/SD_ILS:9315462026-01-22T04:49:32Z2026-01-22T04:49:32Zby Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=232305">Click to View</a><br/>Format: Elektronik Kaynak<br/>Quality improvement with design of experiments : a response surface approachent://SD_ILS/0/SD_ILS:446962026-01-22T04:49:32Z2026-01-22T04:49:32Zby Vuchkov, Ivan N.<br/>Format: Kitap<br/>Quality management and CSRent://SD_ILS/0/SD_ILS:9435452026-01-22T04:49:32Z2026-01-22T04:49:32Zby Hazlett, Shirley-Ann.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=320627">Click to View</a><br/>Format: Elektronik Kaynak<br/>Corrosion Problems and Solutions in Oil Refining and Petrochemical Industryent://SD_ILS/0/SD_ILS:4805862026-01-22T04:49:32Z2026-01-22T04:49:32Zby Groysman, Alec. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-45256-2">http://dx.doi.org/10.1007/978-3-319-45256-2</a><br/>Format: Elektronik Kaynak<br/>Systemic Decision Making Fundamentals for Addressing Problems and Messesent://SD_ILS/0/SD_ILS:4811912026-01-22T04:49:32Z2026-01-22T04:49:32Zby Hester, Patrick T. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-54672-8">http://dx.doi.org/10.1007/978-3-319-54672-8</a><br/>Format: Elektronik Kaynak<br/>Recurrent event modeling based on the Yule process : application to water network asset managementent://SD_ILS/0/SD_ILS:11047602026-01-22T04:49:32Z2026-01-22T04:49:32Zby Le Gat, Yves, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4205903">Click to View</a><br/>Format: Elektronik Kaynak<br/>Response modeling methodology empirical modeling for engineering and scienceent://SD_ILS/0/SD_ILS:9344452026-01-22T04:49:32Z2026-01-22T04:49:32Zby Shore, Haim.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=259265">Click to View</a><br/>Format: Elektronik Kaynak<br/>Failure analysis a practical guide for manufacturers of electronic components and systemsent://SD_ILS/0/SD_ILS:9751202026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bâzu, M. I. (Marius I.), 1948-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=675196">Click to View</a><br/>Format: Elektronik Kaynak<br/>Füze arayıcı başlığı için güvenilirlik analizi ve güvenilirlik iyileştirme çalışmasıent://SD_ILS/0/SD_ILS:11703152026-01-22T04:49:32Z2026-01-22T04:49:32Zby Çevik Bakırlı, Ebru.<br/>Format: Kitap<br/>Arıza ve tamir durumunda sistem güvenilirliği: genetik ve memetik algoritmalarent://SD_ILS/0/SD_ILS:11658112026-01-22T04:49:32Z2026-01-22T04:49:32Zby Uzuner Şahin, Merve.<br/>Format: Kitap<br/>Hastalık biliş anketi'nin geçerlik ve güvenilirliğient://SD_ILS/0/SD_ILS:11576492026-01-22T04:49:32Z2026-01-22T04:49:32Zby Aykul, Ayşegül.<br/>Format: Kitap<br/>İki parametreli üstel dağılımda rekor değerler ile ortak değişim katsayısı ve güvenirlik tahmin edicilerient://SD_ILS/0/SD_ILS:11961782026-01-22T04:49:32Z2026-01-22T04:49:32Zby Bıyıklı, Nurten.<br/>Format: Kitap<br/>Geçmiş dönem tatmini ve firmaya duyulan güvenin satınalma davranışı üzerine etkileri : beyaz eşya üzerine Ankara'da bir saha araştırmasıent://SD_ILS/0/SD_ILS:11603652026-01-22T04:49:32Z2026-01-22T04:49:32Zby Hızlı, Dilek.<br/>Format: Kitap<br/>Yüksek gaz basınç sensörlerinin sıcaklık ve titreşim koşullarında performansı ve güvenilirliğinin iyileştirilmesient://SD_ILS/0/SD_ILS:12328762026-01-22T04:49:32Z2026-01-22T04:49:32Zby Arslan, Yasin, yazar.<br/>Format: Kitap<br/>Elektro-mekanik aktüatörler için analitik hiyerarşi prosesi (AHP) kullanılarak güvenilirlik tabanlı bakım analizi (RCM) uygulamasıent://SD_ILS/0/SD_ILS:11563052026-01-22T04:49:32Z2026-01-22T04:49:32Zby Doğan, Deniz Can.<br/>Format: Kitap<br/>Pişirme ve yiyecek hazırlama becerileri ölçeğinin Türkçe geçerlik ve güvenirliğinin incelenmesient://SD_ILS/0/SD_ILS:11588472026-01-22T04:49:32Z2026-01-22T04:49:32Zby Keleş, Gizem.<br/>Format: Kitap<br/>Hareket korkusu nedenleri ölçeğinin (Kinesiophopia causes scale) Türkçe uyarlamasının geçerlik ve güvenilirliğient://SD_ILS/0/SD_ILS:11576532026-01-22T04:49:32Z2026-01-22T04:49:32Zby Çayır, Melis.<br/>Format: Kitap<br/>Stochastic risk analysis and managementent://SD_ILS/0/SD_ILS:11238892026-01-22T04:49:32Z2026-01-22T04:49:32Zby Harlamov, Boris, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4816215">Click to View</a><br/>Format: Elektronik Kaynak<br/>Serebral palsili çocuklarda oturma esnasındaki fotoğrafik postür analizinin güvenilirliği ve postürün gövde kontrolü ve kaba motor fonksiyonlar arasındaki ilişkisient://SD_ILS/0/SD_ILS:11576652026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ünsal, Betül.<br/>Format: Kitap<br/>Meme kanseri ilişkili lenfödem hastalarında 'quality of life measure for limb lymphoedema-arm' anketinin Türkçe geçerlilik ve güvenilirliğinin araştırılmasıent://SD_ILS/0/SD_ILS:11601632026-01-22T04:49:32Z2026-01-22T04:49:32Zby Kaya, Emine.<br/>Format: Kitap<br/>New autonomous systemsent://SD_ILS/0/SD_ILS:11090732026-01-22T04:49:32Z2026-01-22T04:49:32Zby Cardon, Alain, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4452676">Click to View</a><br/>Format: Elektronik Kaynak<br/>The social roots of risk : producing disasters, promoting resilienceent://SD_ILS/0/SD_ILS:10339202026-01-22T04:49:32Z2026-01-22T04:49:32Zby Tierney, Kathleen J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1731657">Click to View</a><br/>Format: Elektronik Kaynak<br/>Swans, swine, and swindlers coping with the growing threat of mega-crises and mega-messesent://SD_ILS/0/SD_ILS:9810172026-01-22T04:49:32Z2026-01-22T04:49:32Zby Alpaslan, Can M. (Can Murat)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=735411">Click to View</a><br/>Format: Elektronik Kaynak<br/>Vineland sosyal- duygusal erken çocukluk ölçeğinin geçerlik-güvenirlik çalışması ve okul öncesi eğitim kurumuna devam eden beş yaş çocuklarının sosyal-duygusal davranışlarına yaratıcı drama eğitiminin etkisinin incelenmesient://SD_ILS/0/SD_ILS:11629232026-01-22T04:49:32Z2026-01-22T04:49:32Zby Ceylan, Şehnaz.<br/>Format: Kitap<br/>