Arama Sonuçları Reliability. - Daraltılmış: Engineering mathematics.SirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dReliability.$0026qf$003dSUBJECT$002509Konu$002509Engineering$002bmathematics.$002509Engineering$002bmathematics.$0026ps$003d300?2026-01-23T23:17:14ZAdvances in Reliability and System Engineeringent://SD_ILS/0/SD_ILS:4808132026-01-23T23:17:14Z2026-01-23T23:17:14Zby Ram, Mangey. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-48875-2">http://dx.doi.org/10.1007/978-3-319-48875-2</a><br/>Format: Elektronik Kaynak<br/>Probability, statistics, and reliability for engineers and scientistsent://SD_ILS/0/SD_ILS:10272312026-01-23T23:17:14Z2026-01-23T23:17:14Zby Ayyub, Bilal M., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1631123">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probabilistic methods in geotechnical engineeringent://SD_ILS/0/SD_ILS:10847522026-01-23T23:17:14Z2026-01-23T23:17:14Zby Tang, Wilson H.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3377443">Click to View</a><br/>Format: Elektronik Kaynak<br/>New methods to engineer and seamlessly reconfigure time triggered Ethernet based systems during runtime based on the PROFINET IRT exampleent://SD_ILS/0/SD_ILS:4814912026-01-23T23:17:14Z2026-01-23T23:17:14Zby Wisniewski, Lukasz. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-54650-5">http://dx.doi.org/10.1007/978-3-662-54650-5</a><br/>Format: Elektronik Kaynak<br/>Load Assumption for Fatigue Design of Structures and Components Counting Methods, Safety Aspects, Practical Applicationent://SD_ILS/0/SD_ILS:4814052026-01-23T23:17:14Z2026-01-23T23:17:14Zby Köhler, Michael. author.<br/><a href="http://dx.doi.org/10.1007/978-3-642-55248-9">http://dx.doi.org/10.1007/978-3-642-55248-9</a><br/>Format: Elektronik Kaynak<br/>Data-Driven Technology for Engineering Systems Health Management Design Approach, Feature Construction, Fault Diagnosis, Prognosis, Fusion and Decisionsent://SD_ILS/0/SD_ILS:4816052026-01-23T23:17:14Z2026-01-23T23:17:14Zby Niu, Gang. author.<br/><a href="http://dx.doi.org/10.1007/978-981-10-2032-2">http://dx.doi.org/10.1007/978-981-10-2032-2</a><br/>Format: Elektronik Kaynak<br/>Data-Driven Fault Detection for Industrial Processes Canonical Correlation Analysis and Projection Based Methodsent://SD_ILS/0/SD_ILS:4814142026-01-23T23:17:14Z2026-01-23T23:17:14Zby Chen, Zhiwen. author.<br/><a href="http://dx.doi.org/10.1007/978-3-658-16756-1">http://dx.doi.org/10.1007/978-3-658-16756-1</a><br/>Format: Elektronik Kaynak<br/>Graph-Based Modelling in Engineeringent://SD_ILS/0/SD_ILS:4802312026-01-23T23:17:14Z2026-01-23T23:17:14Zby Zawiślak, Stanisław. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-39020-8">http://dx.doi.org/10.1007/978-3-319-39020-8</a><br/>Format: Elektronik Kaynak<br/>