Arama Sonuçları Reliability. - Daraltılmış: Power electronics.SirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dReliability.$0026qf$003dSUBJECT$002509Konu$002509Power$002belectronics.$002509Power$002belectronics.$0026ic$003dtrue$0026ps$003d300?2026-01-20T04:45:27ZPower GaN Devices Materials, Applications and Reliabilityent://SD_ILS/0/SD_ILS:4804472026-01-20T04:45:27Z2026-01-20T04:45:27Zby Meneghini, Matteo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-43199-4">http://dx.doi.org/10.1007/978-3-319-43199-4</a><br/>Format: Elektronik Kaynak<br/>Risk Based Assessment of Subsynchronous Resonance in AC/DC Systemsent://SD_ILS/0/SD_ILS:4805662026-01-20T04:45:27Z2026-01-20T04:45:27Zby Adrees, Atia. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-44947-0">http://dx.doi.org/10.1007/978-3-319-44947-0</a><br/>Format: Elektronik Kaynak<br/>Transients of modern power electronicsent://SD_ILS/0/SD_ILS:9785092026-01-20T04:45:27Z2026-01-20T04:45:27Zby Bai, Hua, 1980-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=697594">Click to View</a><br/>Format: Elektronik Kaynak<br/>Smart Grids: Security and Privacy Issuesent://SD_ILS/0/SD_ILS:4805722026-01-20T04:45:27Z2026-01-20T04:45:27Zby Boroojeni, Kianoosh G. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-45050-6">http://dx.doi.org/10.1007/978-3-319-45050-6</a><br/>Format: Elektronik Kaynak<br/>