Arama Sonuçları Reliability. - Daraltılmış: Reliability (Engineering)SirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dReliability.$0026qf$003dSUBJECT$002509Konu$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ic$003dtrue$0026ps$003d300;jsessionid=379AF1A6F4B789B5728E7BF5F6F19F2D?2026-01-22T05:17:42ZApplied reliabilityent://SD_ILS/0/SD_ILS:10084162026-01-22T05:17:42Z2026-01-22T05:17:42Zby Grous, Ammar.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1124027">Click to View</a><br/>Format: Elektronik Kaynak<br/>Applied reliabilityent://SD_ILS/0/SD_ILS:10284072026-01-22T05:17:42Z2026-01-22T05:17:42Zby Tobias, Paul A., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1648252">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:9896092026-01-22T05:17:42Z2026-01-22T05:17:42Zby Elsayed, Elsayed A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=843664">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:10291342026-01-22T05:17:42Z2026-01-22T05:17:42Zby Kapur, Kailash C., 1941- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1658817">Click to View</a><br/>Format: Elektronik Kaynak<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:9898032026-01-22T05:17:42Z2026-01-22T05:17:42Zby Raheja, Dev.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=848525">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineering advancesent://SD_ILS/0/SD_ILS:10591322026-01-22T05:17:42Z2026-01-22T05:17:42Zby Hayworth, Gregory I.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3018679">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in reliabilityent://SD_ILS/0/SD_ILS:11841942026-01-22T05:17:42Z2026-01-22T05:17:42Zby Balakrishnan, N., 1956- editor.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/0444500782">Click for electronic access to e-book.</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444500786">http://www.sciencedirect.com/science/book/9780444500786</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/handbooks/01697161/20">http://www.sciencedirect.com/science/handbooks/01697161/20</a><br/>Format: Elektronik Kaynak<br/>Reliability engineering and servicesent://SD_ILS/0/SD_ILS:11441572026-01-22T05:17:42Z2026-01-22T05:17:42Zby Jin, Tongdan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630265">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and quality managementent://SD_ILS/0/SD_ILS:9548052026-01-22T05:17:42Z2026-01-22T05:17:42Zby Mishra, R. C.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=442134">Click to View</a><br/>Format: Elektronik Kaynak<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:11851292026-01-22T05:17:42Z2026-01-22T05:17:42Zby Neale, M. J. (Michael John)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Elektronik Kaynak<br/>Fatigue design and reliabilityent://SD_ILS/0/SD_ILS:11861712026-01-22T05:17:42Z2026-01-22T05:17:42Zby International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/bookseries/15661369/23">http://www.sciencedirect.com/science/bookseries/15661369/23</a><br/>Format: Elektronik Kaynak<br/>Systems reliability and failure preventionent://SD_ILS/0/SD_ILS:9309922026-01-22T05:17:42Z2026-01-22T05:17:42Zby Hecht, Herbert.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=227632">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in system reliability engineeringent://SD_ILS/0/SD_ILS:11436852026-01-22T05:17:42Z2026-01-22T05:17:42Zby Ram, Mangey, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5603078">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of large and complex systemsent://SD_ILS/0/SD_ILS:10291132026-01-22T05:17:42Z2026-01-22T05:17:42Zby Kołowrocki, Krzysztof, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1657928">Click to View</a><br/>Format: Elektronik Kaynak<br/>Accelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:9782392026-01-22T05:17:42Z2026-01-22T05:17:42Zby Klyatis, Lev M.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=693204">Click to View</a><br/>Format: Elektronik Kaynak<br/>Multistate systems reliability theory with applicationsent://SD_ILS/0/SD_ILS:9721932026-01-22T05:17:42Z2026-01-22T05:17:42Zby Natvig, Bent, 1946-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=624778">Click to View</a><br/>Format: Elektronik Kaynak<br/>Mathematical methods of reliability theoryent://SD_ILS/0/SD_ILS:11773852026-01-22T05:17:42Z2026-01-22T05:17:42Zby Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781483230535">http://www.sciencedirect.com/science/book/9781483230535</a><br/>Format: Elektronik Kaynak<br/>An elementary guide to reliabilityent://SD_ILS/0/SD_ILS:11851412026-01-22T05:17:42Z2026-01-22T05:17:42Zby Dummer, G. W. A. (Geoffrey William Arnold)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format: Elektronik Kaynak<br/>Analysis of reliability and quality controlent://SD_ILS/0/SD_ILS:10670442026-01-22T05:17:42Z2026-01-22T05:17:42Zby Grous, Ammar.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3058885">Click to View</a><br/>Format: Elektronik Kaynak<br/>Human reliability : with human factorsent://SD_ILS/0/SD_ILS:11751732026-01-22T05:17:42Z2026-01-22T05:17:42Zby Dhillon, B. S. (Balbir S.), 1947-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080327747">http://www.sciencedirect.com/science/book/9780080327747</a><br/>Format: Elektronik Kaynak<br/>Recent advances in reliability and quality engineeringent://SD_ILS/0/SD_ILS:10304522026-01-22T05:17:42Z2026-01-22T05:17:42Zby Pham, Hoang.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679593">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fault detection & reliability : knowledge based & other approachesent://SD_ILS/0/SD_ILS:11756352026-01-22T05:17:42Z2026-01-22T05:17:42Zby European Workshop on Fault Diagnostics, Reliability, and Related Knowledge-Based Approaches (2nd : 1987 : University of Manchester Institute of Science and Technology)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080349220">https://www.sciencedirect.com/science/book/9780080349220</a><br/>Format: Elektronik Kaynak<br/>System reliability : evaluation and prediction in engineeringent://SD_ILS/0/SD_ILS:661722026-01-22T05:17:42Z2026-01-22T05:17:42Zby Pages, Alain<br/>Format: Kitap<br/>Methods for reliability improvement and risk reductionent://SD_ILS/0/SD_ILS:11430312026-01-22T05:17:42Z2026-01-22T05:17:42Zby Todinov, Michael, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5553528">Click to View</a><br/>Format: Elektronik Kaynak<br/>Recent developments in reliability-based civil engineeringent://SD_ILS/0/SD_ILS:10149902026-01-22T05:17:42Z2026-01-22T05:17:42Zby Haldar, Achintya.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1214938">Click to View</a><br/>Format: Elektronik Kaynak<br/>Human reliability and error in medical systement://SD_ILS/0/SD_ILS:10304172026-01-22T05:17:42Z2026-01-22T05:17:42Zby Dhillon, B. S. (Balbir S.), 1947-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679549">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk-based management : a reliability-centered approachent://SD_ILS/0/SD_ILS:10284562026-01-22T05:17:42Z2026-01-22T05:17:42Zby Jones, Richard B., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1649062">Click to View</a><br/>Format: Elektronik Kaynak<br/>Cognitive reliability and error analysis method : CREAMent://SD_ILS/0/SD_ILS:11857442026-01-22T05:17:42Z2026-01-22T05:17:42Zby Hollnagel, Erik, 1941-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability, and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11783002026-01-22T05:17:42Z2026-01-22T05:17:42Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750608541">http://www.sciencedirect.com/science/book/9780750608541</a><br/>Format: Elektronik Kaynak<br/>An introduction to the basics of reliability and risk analysisent://SD_ILS/0/SD_ILS:1329502026-01-22T05:17:42Z2026-01-22T05:17:42Zby Zio, Enrico<br/>Format: Kitap<br/>Reliability of maintained systems subjected to wear failure mechanisms : theory and applicationsent://SD_ILS/0/SD_ILS:11459602026-01-22T05:17:42Z2026-01-22T05:17:42Zby Bayle, Franck, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5751853">Click to View</a><br/>Format: Elektronik Kaynak<br/>An introduction to the basics of reliability and risk analysisent://SD_ILS/0/SD_ILS:9423932026-01-22T05:17:42Z2026-01-22T05:17:42Zby Zio, Enrico.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=312287">Click to View</a><br/>Format: Elektronik Kaynak<br/>System and Bayesian reliability essays in honor of Professor Richard E. Barlow on his 70th birthdayent://SD_ILS/0/SD_ILS:10304512026-01-22T05:17:42Z2026-01-22T05:17:42Zby Hayakawa, Yu.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679591">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of high-power mechatronic systems. Volume 1, Aerospace and automotive applicationsent://SD_ILS/0/SD_ILS:11299822026-01-22T05:17:42Z2026-01-22T05:17:42Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5061866">Click to View</a><br/>Format: Elektronik Kaynak<br/>Dynamic system reliability : modeling and analysis of dynamic and dependent behaviorsent://SD_ILS/0/SD_ILS:11441802026-01-22T05:17:42Z2026-01-22T05:17:42Zby Xing, Liudong, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630668">Click to View</a><br/>Format: Elektronik Kaynak<br/>Applied reliability engineering and risk analysis probabilistic models and statistical inferenceent://SD_ILS/0/SD_ILS:10183872026-01-22T05:17:42Z2026-01-22T05:17:42Zby Frenkel, Ilia, Ph.D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1360807">Click to View</a><br/>Format: Elektronik Kaynak<br/>International Conference on Structural Safety and Reliability : Smithsonian Institution Museum of History and Technology, Constitution Avenue, Washington, D.C., April 9, 10 and 11, 1969ent://SD_ILS/0/SD_ILS:11817172026-01-22T05:17:42Z2026-01-22T05:17:42Zby International Conference on Structural Safety and Reliability (1st : 1969 : Smithsonian Institution)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080165660">https://www.sciencedirect.com/science/book/9780080165660</a><br/>Format: Elektronik Kaynak<br/>Reliability theory and models : stochastic failure models, optimal maintenance policies, life testing, and structuresent://SD_ILS/0/SD_ILS:11776332026-01-22T05:17:42Z2026-01-22T05:17:42Zby Abdel-Hameed, Mohamed S.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780120414208">https://www.sciencedirect.com/science/book/9780120414208</a><br/>Format: Elektronik Kaynak<br/>Reliability of safety-critical systems : theory and applicationent://SD_ILS/0/SD_ILS:10276452026-01-22T05:17:42Z2026-01-22T05:17:42Zby Rausand, Marvin.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1637653">Click to View</a><br/>Format: Elektronik Kaynak<br/>Improving product reliability and software quality : strategies, tools, process and implementationent://SD_ILS/0/SD_ILS:11456872026-01-22T05:17:42Z2026-01-22T05:17:42Zby Levin, Mark, 1959- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5741218">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11244862026-01-22T05:17:42Z2026-01-22T05:17:42Zby Smith, David J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4825735">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineering and risk analysis : a practical guideent://SD_ILS/0/SD_ILS:11381572026-01-22T05:17:42Z2026-01-22T05:17:42Zby Modarres, M. (Mohammad), author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5400700">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthdayent://SD_ILS/0/SD_ILS:10268912026-01-22T05:17:42Z2026-01-22T05:17:42Zby Nakamura, Syouji.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1611972">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability prediction from burn-in data fit to reliability modelsent://SD_ILS/0/SD_ILS:10283592026-01-22T05:17:42Z2026-01-22T05:17:42Zby Bernstein, Joseph B., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1647477">Click to View</a><br/>Format: Elektronik Kaynak<br/>Practical reliability engineering and analysis for system design and life-cycle sustainmentent://SD_ILS/0/SD_ILS:9636322026-01-22T05:17:42Z2026-01-22T05:17:42Zby Wessels, William R.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=533784">Click to View</a><br/>Format: Elektronik Kaynak<br/>Robust design methodology for reliability exploring the effects of variation and uncertaintyent://SD_ILS/0/SD_ILS:9558972026-01-22T05:17:42Z2026-01-22T05:17:42Zby Bergman, Bo, 1943-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=454321">Click to View</a><br/>Format: Elektronik Kaynak<br/>HALT, HASS, and HASA explained : accelerated reliability techniquesent://SD_ILS/0/SD_ILS:10553092026-01-22T05:17:42Z2026-01-22T05:17:42Zby McLean, Harry W., 1946- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002645">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:9353752026-01-22T05:17:42Z2026-01-22T05:17:42Zby Smith, David John, 1943-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=269666">Click to View</a><br/>Format: Elektronik Kaynak<br/>World class reliability using Multiple Environment Overstress Tests to make it happenent://SD_ILS/0/SD_ILS:9329232026-01-22T05:17:42Z2026-01-22T05:17:42Zby Bhote, Keki R., 1925-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=243100">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability, and supportability : best practices for systems engineersent://SD_ILS/0/SD_ILS:10431672026-01-22T05:17:42Z2026-01-22T05:17:42Zby Tortorella, Michael, 1947- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1896020">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:9805752026-01-22T05:17:42Z2026-01-22T05:17:42Zby Smith, David J.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=730199">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11878352026-01-22T05:17:42Z2026-01-22T05:17:42Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format: Elektronik Kaynak<br/>Reliability, Maintainability and Risk 8e Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:1372392026-01-22T05:17:42Z2026-01-22T05:17:42Zby Smith, David J.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektronik Kaynak<br/>Reliability, Maintainability and Risk : Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:11838532026-01-22T05:17:42Z2026-01-22T05:17:42Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080969022">https://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektronik Kaynak<br/>Importance measures in reliability, risk, and optimization principles and applicationsent://SD_ILS/0/SD_ILS:9944472026-01-22T05:17:42Z2026-01-22T05:17:42Zby Kuo, Way, 1951-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=912160">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk-based reliability analysis and generic principles for risk reductionent://SD_ILS/0/SD_ILS:11856452026-01-22T05:17:42Z2026-01-22T05:17:42Zby Todinov, M. T.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Elektronik Kaynak<br/>Probability, statistics, and reliability for engineers and scientistsent://SD_ILS/0/SD_ILS:10272312026-01-22T05:17:42Z2026-01-22T05:17:42Zby Ayyub, Bilal M., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1631123">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessmentent://SD_ILS/0/SD_ILS:11279302026-01-22T05:17:42Z2026-01-22T05:17:42Zby Modarres, M. (Mohammad), author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4901681">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applicationsent://SD_ILS/0/SD_ILS:10155422026-01-22T05:17:42Z2026-01-22T05:17:42Zby Wu, Bin.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1222589">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fundamentals of reliability engineering : applications in multistage interconnection networksent://SD_ILS/0/SD_ILS:10279372026-01-22T05:17:42Z2026-01-22T05:17:42Zby Gunawan, Indra, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1641079">Click to View</a><br/>Format: Elektronik Kaynak<br/>Engineering maintainability : how to design for reliability and easy maintenanceent://SD_ILS/0/SD_ILS:11851692026-01-22T05:17:42Z2026-01-22T05:17:42Zby Dhillon, B. S. (Balbir S.), 1947-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152576">http://www.sciencedirect.com/science/book/9780884152576</a><br/>Format: Elektronik Kaynak<br/>Process risk and reliability management : operational integrity managementent://SD_ILS/0/SD_ILS:11784322026-01-22T05:17:42Z2026-01-22T05:17:42Zby Sutton, Ian S.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format: Elektronik Kaynak<br/>Aerospace and automotive applications : issues, testing and analysisent://SD_ILS/0/SD_ILS:11306052026-01-22T05:17:42Z2026-01-22T05:17:42Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5108518">Click to View</a><br/>Format: Elektronik Kaynak<br/>Resilience of networked infrastructure systems : analysis and measurementent://SD_ILS/0/SD_ILS:10204412026-01-22T05:17:42Z2026-01-22T05:17:42Zby Mayada, Omer.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1441473">Click to View</a><br/>Format: Elektronik Kaynak<br/>Understanding process equipment for operators and engineersent://SD_ILS/0/SD_ILS:11464012026-01-22T05:17:42Z2026-01-22T05:17:42Zby Lieberman, Norman P., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5770967">Click to View</a><br/>Format: Elektronik Kaynak<br/>Handbook of performability engineeringent://SD_ILS/0/SD_ILS:9472042026-01-22T05:17:42Z2026-01-22T05:17:42Zby Misra, Krishna B., 1943-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=364544">Click to View</a><br/>Format: Elektronik Kaynak<br/>Resilience engineering concepts and preceptsent://SD_ILS/0/SD_ILS:9517552026-01-22T05:17:42Z2026-01-22T05:17:42Zby Hollnagel, Erik, 1941-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=429564">Click to View</a><br/>Format: Elektronik Kaynak<br/>Service availability principles and practiceent://SD_ILS/0/SD_ILS:9918882026-01-22T05:17:42Z2026-01-22T05:17:42Zby Toeroe, Maria.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=875747">Click to View</a><br/>Format: Elektronik Kaynak<br/>Resilience engineering in practice a guidebookent://SD_ILS/0/SD_ILS:9700572026-01-22T05:17:42Z2026-01-22T05:17:42Zby Hollnagel, Erik, 1941-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=615608">Click to View</a><br/>Format: Elektronik Kaynak<br/>Designing capable and reliable productsent://SD_ILS/0/SD_ILS:11877482026-01-22T05:17:42Z2026-01-22T05:17:42Zby Booker, J. D.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750650762">https://www.sciencedirect.com/science/book/9780750650762</a><br/>Format: Elektronik Kaynak<br/>Mission-critical and safety-critical systems handbook : design and development for embedded applicationsent://SD_ILS/0/SD_ILS:11930132026-01-22T05:17:42Z2026-01-22T05:17:42Zby Fowler, Kim R., 1956-<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750685672">https://www.sciencedirect.com/science/book/9780750685672</a><br/>Format: Elektronik Kaynak<br/>Mathematical modelling of system resilienceent://SD_ILS/0/SD_ILS:11463952026-01-22T05:17:42Z2026-01-22T05:17:42Zby Das, Kanchan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5770809">Click to View</a><br/>Format: Elektronik Kaynak<br/>The certified quality engineer handbookent://SD_ILS/0/SD_ILS:10553172026-01-22T05:17:42Z2026-01-22T05:17:42Zby Borror, Connie M., editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002655">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probabilistic design for optimization and robustness for engineersent://SD_ILS/0/SD_ILS:10344662026-01-22T05:17:42Z2026-01-22T05:17:42Zby Dodson, Bryan, 1962- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1744260">Click to View</a><br/>Format: Elektronik Kaynak<br/>RCM gateway to world class maintenanceent://SD_ILS/0/SD_ILS:9384232026-01-22T05:17:42Z2026-01-22T05:17:42Zby Smith, Anthony M.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=289011">Click to View</a><br/>Format: Elektronik Kaynak<br/>Viewpoints and controversies in sensory science and consumer product testingent://SD_ILS/0/SD_ILS:9465982026-01-22T05:17:42Z2026-01-22T05:17:42Zby Moskowitz, Howard R.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=353512">Click to View</a><br/>Format: Elektronik Kaynak<br/>Kolon ve Rektum Hastalıkları Dergisi.ent://SD_ILS/0/SD_ILS:620532026-01-22T05:17:42Z2026-01-22T05:17:42ZFormat: Devam Eden Süreli Yayınlar Süreli Yayın<br/>Highly dependable softwareent://SD_ILS/0/SD_ILS:11867212026-01-22T05:17:42Z2026-01-22T05:17:42Zby Zelkowitz, Marvin V., 1945-<br/><a href="http://www.sciencedirect.com/science/bookseries/00652458/58">to access electronic resource</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120121588">http://www.sciencedirect.com/science/book/9780120121588</a><br/>Format: Elektronik Kaynak<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:9307412026-01-22T05:17:42Z2026-01-22T05:17:42Zby Porter, Alex.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=226707">Click to View</a><br/>Format: Elektronik Kaynak<br/>RCM : gateway to world class maintenanceent://SD_ILS/0/SD_ILS:11878822026-01-22T05:17:42Z2026-01-22T05:17:42Zby Smith, Anthony M.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750674614">http://www.sciencedirect.com/science/book/9780750674614</a><br/>Format: Elektronik Kaynak<br/>Accelerated testing and validation : testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:11879152026-01-22T05:17:42Z2026-01-22T05:17:42Zby Porter, Alex.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Elektronik Kaynak<br/>The design analysis handbook : a practical guide to design validationent://SD_ILS/0/SD_ILS:11880282026-01-22T05:17:42Z2026-01-22T05:17:42Zby Walker, N. Edward.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750690881">http://www.sciencedirect.com/science/book/9780750690881</a><br/>Format: Elektronik Kaynak<br/>