Arama Sonuçları Reliability.SirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dReliability.$0026ic$003dtrue$0026ps$003d300?2026-01-22T02:57:31ZApplied reliabilityent://SD_ILS/0/SD_ILS:10084162026-01-22T02:57:31Z2026-01-22T02:57:31Zby Grous, Ammar.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1124027">Click to View</a><br/>Format: Elektronik Kaynak<br/>Applied reliabilityent://SD_ILS/0/SD_ILS:10284072026-01-22T02:57:31Z2026-01-22T02:57:31Zby Tobias, Paul A., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1648252">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:9896092026-01-22T02:57:31Z2026-01-22T02:57:31Zby Elsayed, Elsayed A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=843664">Click to View</a><br/>Format: Elektronik Kaynak<br/>Bayesian reliabilityent://SD_ILS/0/SD_ILS:9471882026-01-22T02:57:31Z2026-01-22T02:57:31Zby Hamada, Michael, 1955-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=364398">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:10291342026-01-22T02:57:31Z2026-01-22T02:57:31Zby Kapur, Kailash C., 1941- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1658817">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability in biomechanicsent://SD_ILS/0/SD_ILS:11196712026-01-22T02:57:31Z2026-01-22T02:57:31Zby Kharmanda, Ghias, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4718313">Click to View</a><br/>Format: Elektronik Kaynak<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:9898032026-01-22T02:57:31Z2026-01-22T02:57:31Zby Raheja, Dev.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=848525">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineering advancesent://SD_ILS/0/SD_ILS:10591322026-01-22T02:57:31Z2026-01-22T02:57:31Zby Hayworth, Gregory I.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3018679">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability-centred maintenanceent://SD_ILS/0/SD_ILS:11665462026-01-22T02:57:31Z2026-01-22T02:57:31Zby Moubray, John.<br/>Format: Kitap<br/>Advanced reliability modelingent://SD_ILS/0/SD_ILS:9334812026-01-22T02:57:31Z2026-01-22T02:57:31Zby Dohi, Tadashi.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=253960">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in reliabilityent://SD_ILS/0/SD_ILS:11841942026-01-22T02:57:31Z2026-01-22T02:57:31Zby Balakrishnan, N., 1956- editor.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/0444500782">Click for electronic access to e-book.</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444500786">http://www.sciencedirect.com/science/book/9780444500786</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/handbooks/01697161/20">http://www.sciencedirect.com/science/handbooks/01697161/20</a><br/>Format: Elektronik Kaynak<br/>Improving machinery reliabilityent://SD_ILS/0/SD_ILS:11852502026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bloch, Heinz P., 1933-<br/><a href="https://www.sciencedirect.com/science/bookseries/18746942/1">Available from ScienceDirect. Online version available for university members only. This requires an institutional login off-campus.</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Elektronik Kaynak<br/>Machine tool reliabilityent://SD_ILS/0/SD_ILS:11076132026-01-22T02:57:31Z2026-01-22T02:57:31Zby Lad, Bhupesh K., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4403257">Click to View</a><br/>Format: Elektronik Kaynak<br/>Solder Joint Reliabilityent://SD_ILS/0/SD_ILS:9386182026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ricky Lee, S. W.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=289873">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probabilistic reliability modelsent://SD_ILS/0/SD_ILS:9933952026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ushakov, I. A. (Igorʹ Alekseevich)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=894405">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of engineering materialsent://SD_ILS/0/SD_ILS:11772892026-01-22T02:57:31Z2026-01-22T02:57:31Zby Smith, Alrick L.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780408015073">http://www.sciencedirect.com/science/book/9780408015073</a><br/>Format: Elektronik Kaynak<br/>Reliability-based mechanical designent://SD_ILS/0/SD_ILS:11665402026-01-22T02:57:31Z2026-01-22T02:57:31Zby Le, Xiaobin.<br/>Format: Kitap<br/>Reliability of large systemsent://SD_ILS/0/SD_ILS:11866552026-01-22T02:57:31Z2026-01-22T02:57:31Zby Kołowrocki, Krzysztof.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format: Elektronik Kaynak<br/>Reliability engineering and servicesent://SD_ILS/0/SD_ILS:11441572026-01-22T02:57:31Z2026-01-22T02:57:31Zby Jin, Tongdan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630265">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and quality managementent://SD_ILS/0/SD_ILS:9548052026-01-22T02:57:31Z2026-01-22T02:57:31Zby Mishra, R. C.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=442134">Click to View</a><br/>Format: Elektronik Kaynak<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:9403262026-01-22T02:57:31Z2026-01-22T02:57:31Zby Neale, M. J. (Michael John)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=298350">Click to View</a><br/>Format: Elektronik Kaynak<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:11851292026-01-22T02:57:31Z2026-01-22T02:57:31Zby Neale, M. J. (Michael John)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Elektronik Kaynak<br/>Fatigue design and reliabilityent://SD_ILS/0/SD_ILS:11861712026-01-22T02:57:31Z2026-01-22T02:57:31Zby International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/bookseries/15661369/23">http://www.sciencedirect.com/science/bookseries/15661369/23</a><br/>Format: Elektronik Kaynak<br/>Reliability of analogue circuitsent://SD_ILS/0/SD_ILS:7051152026-01-22T02:57:31Z2026-01-22T02:57:31Zby Mohd Nawi, Illani Binti, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873624">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873624</a><br/>Format: Kitap<br/>Optimal warranty policies and reliability modelingent://SD_ILS/0/SD_ILS:9335252026-01-22T02:57:31Z2026-01-22T02:57:31Zby Chukova, Stefanka.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=254004">Click to View</a><br/>Format: Elektronik Kaynak<br/>Practical applications of Bayesian reliabilityent://SD_ILS/0/SD_ILS:11456932026-01-22T02:57:31Z2026-01-22T02:57:31Zby Liu, Yan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5741235">Click to View</a><br/>Format: Elektronik Kaynak<br/>Biomechanics : optimization, uncertainties and reliabilityent://SD_ILS/0/SD_ILS:11221052026-01-22T02:57:31Z2026-01-22T02:57:31Zby Kharmanda, Ghias, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4778401">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability growth : enhancing defense system reliabilityent://SD_ILS/0/SD_ILS:10865262026-01-22T02:57:31Z2026-01-22T02:57:31Zby Panel on Reliability Growth Methods for Defense Systems.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3379432">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in mathematical modeling for reliabilityent://SD_ILS/0/SD_ILS:9471512026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bedford, T.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=363211">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advanced reliability modeling part IIent://SD_ILS/0/SD_ILS:9379922026-01-22T02:57:31Z2026-01-22T02:57:31Zby Dohi, Tadashi.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=285510">Click to View</a><br/>Format: Elektronik Kaynak<br/>Systems reliability and failure preventionent://SD_ILS/0/SD_ILS:9309922026-01-22T02:57:31Z2026-01-22T02:57:31Zby Hecht, Herbert.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=227632">Click to View</a><br/>Format: Elektronik Kaynak<br/>Maintenance strategies and reliability optimizationent://SD_ILS/0/SD_ILS:9316892026-01-22T02:57:31Z2026-01-22T02:57:31Zby Artiba, A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=233913">Click to View</a><br/>Format: Elektronik Kaynak<br/>Semiconductor packaging materials interaction and reliabilityent://SD_ILS/0/SD_ILS:9835692026-01-22T02:57:31Z2026-01-22T02:57:31Zby Chen, Andrea.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=773636">Click to View</a><br/>Format: Elektronik Kaynak<br/>Construction reliability safety, variability and sustainabilityent://SD_ILS/0/SD_ILS:10085232026-01-22T02:57:31Z2026-01-22T02:57:31Zby Baroth, Julien.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1124658">Click to View</a><br/>Format: Elektronik Kaynak<br/>Optimal reliability design : fundamentals and applicationsent://SD_ILS/0/SD_ILS:11659812026-01-22T02:57:31Z2026-01-22T02:57:31Zby Kuo, Way.<br/>Format: Kitap<br/>System reliability : concepts and applicationsent://SD_ILS/0/SD_ILS:9221602026-01-22T02:57:31Z2026-01-22T02:57:31Zby Klaassen, Klaas B., 1941-<br/>Format: Kitap<br/>Advances in system reliability engineeringent://SD_ILS/0/SD_ILS:11436852026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ram, Mangey, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5603078">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of large and complex systemsent://SD_ILS/0/SD_ILS:10291132026-01-22T02:57:31Z2026-01-22T02:57:31Zby Kołowrocki, Krzysztof, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1657928">Click to View</a><br/>Format: Elektronik Kaynak<br/>Accelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:9782392026-01-22T02:57:31Z2026-01-22T02:57:31Zby Klyatis, Lev M.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=693204">Click to View</a><br/>Format: Elektronik Kaynak<br/>Multistate systems reliability theory with applicationsent://SD_ILS/0/SD_ILS:9721932026-01-22T02:57:31Z2026-01-22T02:57:31Zby Natvig, Bent, 1946-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=624778">Click to View</a><br/>Format: Elektronik Kaynak<br/>Mathematical methods of reliability theoryent://SD_ILS/0/SD_ILS:11773852026-01-22T02:57:31Z2026-01-22T02:57:31Zby Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781483230535">http://www.sciencedirect.com/science/book/9781483230535</a><br/>Format: Elektronik Kaynak<br/>An elementary guide to reliabilityent://SD_ILS/0/SD_ILS:11851412026-01-22T02:57:31Z2026-01-22T02:57:31Zby Dummer, G. W. A. (Geoffrey William Arnold)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format: Elektronik Kaynak<br/>Network reliability : measures and evaluationent://SD_ILS/0/SD_ILS:11136112026-01-22T02:57:31Z2026-01-22T02:57:31Zby Chaturvedi, Sanjay K., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4570714">Click to View</a><br/>Format: Elektronik Kaynak<br/>Lead-free solder interconnect reliabilityent://SD_ILS/0/SD_ILS:10550942026-01-22T02:57:31Z2026-01-22T02:57:31Zby Shangguan, Dongkai, 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002391">Click to View</a><br/>Format: Elektronik Kaynak<br/>Stochastic reliability modeling, optimization and applicationsent://SD_ILS/0/SD_ILS:10312382026-01-22T02:57:31Z2026-01-22T02:57:31Zby Nakamura, Syouji.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1681730">Click to View</a><br/>Format: Elektronik Kaynak<br/>Analysis of reliability and quality controlent://SD_ILS/0/SD_ILS:10670442026-01-22T02:57:31Z2026-01-22T02:57:31Zby Grous, Ammar.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3058885">Click to View</a><br/>Format: Elektronik Kaynak<br/>Software system reliability and securityent://SD_ILS/0/SD_ILS:9407012026-01-22T02:57:31Z2026-01-22T02:57:31Zby Broy, M., 1949-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=305176">Click to View</a><br/>Format: Elektronik Kaynak<br/>Introduction to reliability and quality engineeringent://SD_ILS/0/SD_ILS:383182026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bentley, John<br/>Format: Kitap<br/>Maintenance and reliability best practicesent://SD_ILS/0/SD_ILS:11659782026-01-22T02:57:31Z2026-01-22T02:57:31Zby Gulati, Ramesh, author<br/>Format: Kitap<br/>Human reliability : with human factorsent://SD_ILS/0/SD_ILS:11751732026-01-22T02:57:31Z2026-01-22T02:57:31Zby Dhillon, B. S. (Balbir S.), 1947-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080327747">http://www.sciencedirect.com/science/book/9780080327747</a><br/>Format: Elektronik Kaynak<br/>Transportation systems reliability and safetyent://SD_ILS/0/SD_ILS:9759462026-01-22T02:57:31Z2026-01-22T02:57:31Zby Dhillon, B. S. (Balbir S.), 1947-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=681292">Click to View</a><br/>Format: Elektronik Kaynak<br/>Process risk and reliability managementent://SD_ILS/0/SD_ILS:10374522026-01-22T02:57:31Z2026-01-22T02:57:31Zby Sutton, Ian, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1782850">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in Reliability and System Engineeringent://SD_ILS/0/SD_ILS:4808132026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ram, Mangey. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-48875-2">http://dx.doi.org/10.1007/978-3-319-48875-2</a><br/>Format: Elektronik Kaynak<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:4814862026-01-22T02:57:31Z2026-01-22T02:57:31Zby Birolini, Alessandro. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-54209-5">http://dx.doi.org/10.1007/978-3-662-54209-5</a><br/>Format: Elektronik Kaynak<br/>Cloud Reliability Engineering: Technologies and Toolsent://SD_ILS/0/SD_ILS:12141962026-01-22T02:57:31Z2026-01-22T02:57:31Zby Achary, Rathnakar<br/>Format: Kitap<br/>Leading a high reliability schoolent://SD_ILS/0/SD_ILS:11378652026-01-22T02:57:31Z2026-01-22T02:57:31Zby Marzano, Robert J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5395032">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability prediction and testing textbookent://SD_ILS/0/SD_ILS:11406412026-01-22T02:57:31Z2026-01-22T02:57:31Zby Klyatis, Lev M., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5452229">Click to View</a><br/>Format: Elektronik Kaynak<br/>Photovoltaic modules : technology and reliabilityent://SD_ILS/0/SD_ILS:11182802026-01-22T02:57:31Z2026-01-22T02:57:31Zby Wirth, Harry, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4691383">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and availability of cloud computingent://SD_ILS/0/SD_ILS:1398622026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bauer, Eric<br/>Format: Kitap<br/>Durability and reliability of medical polymersent://SD_ILS/0/SD_ILS:10244162026-01-22T02:57:31Z2026-01-22T02:57:31Zby Jenkins, Mike.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1581410">Click to View</a><br/>Format: Elektronik Kaynak<br/>Machine tools design, reliability and safetyent://SD_ILS/0/SD_ILS:10608292026-01-22T02:57:31Z2026-01-22T02:57:31Zby Anderson, Scott P.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3021649">Click to View</a><br/>Format: Elektronik Kaynak<br/>Safety and reliability of bridge structuresent://SD_ILS/0/SD_ILS:9673072026-01-22T02:57:31Z2026-01-22T02:57:31Zby New York City Bridge Conference (5th : 2009 : New York, N.Y.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=565988">Click to View</a><br/>Format: Elektronik Kaynak<br/>Measures of interobserver agreement and reliabilityent://SD_ILS/0/SD_ILS:9740262026-01-22T02:57:31Z2026-01-22T02:57:31Zby Shoukri, M. M. (Mohamed M.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=665632">Click to View</a><br/>Format: Elektronik Kaynak<br/>Accelerated quality and reliability solutionsent://SD_ILS/0/SD_ILS:11855832026-01-22T02:57:31Z2026-01-22T02:57:31Zby Klyatis, Lev M.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format: Elektronik Kaynak<br/>Recent advances in reliability and quality engineeringent://SD_ILS/0/SD_ILS:10304522026-01-22T02:57:31Z2026-01-22T02:57:31Zby Pham, Hoang.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679593">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and risk models : setting reliability requirementsent://SD_ILS/0/SD_ILS:11030842026-01-22T02:57:31Z2026-01-22T02:57:31Zby Todinov, M. T., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4039470">Click to View</a><br/>Format: Elektronik Kaynak<br/>Modern statistical and mathematical methods in reliabilityent://SD_ILS/0/SD_ILS:9400832026-01-22T02:57:31Z2026-01-22T02:57:31Zby Wilson, Alyson G., 1967-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=296177">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fault detection & reliability : knowledge based & other approachesent://SD_ILS/0/SD_ILS:11756352026-01-22T02:57:31Z2026-01-22T02:57:31Zby European Workshop on Fault Diagnostics, Reliability, and Related Knowledge-Based Approaches (2nd : 1987 : University of Manchester Institute of Science and Technology)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080349220">https://www.sciencedirect.com/science/book/9780080349220</a><br/>Format: Elektronik Kaynak<br/>Reliability of electronic packages and semiconductor devicesent://SD_ILS/0/SD_ILS:898862026-01-22T02:57:31Z2026-01-22T02:57:31Zby Giacomo, Giulio Di<br/>Format: Kitap<br/>Electronics reliability and measurement technology : nondestructive evaluationent://SD_ILS/0/SD_ILS:11898942026-01-22T02:57:31Z2026-01-22T02:57:31Zby Heyman, Joseph S.<br/>MacEwan University Access <a href="http://www.sciencedirect.com/science/book/9780815511717">(Unlimited Concurrent Users)</a> from ScienceDirect
ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780815511717">https://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Elektronik Kaynak<br/>System reliability : evaluation and prediction in engineeringent://SD_ILS/0/SD_ILS:661722026-01-22T02:57:31Z2026-01-22T02:57:31Zby Pages, Alain<br/>Format: Kitap<br/>Methods for reliability improvement and risk reductionent://SD_ILS/0/SD_ILS:11430312026-01-22T02:57:31Z2026-01-22T02:57:31Zby Todinov, Michael, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5553528">Click to View</a><br/>Format: Elektronik Kaynak<br/>Recent developments in reliability-based civil engineeringent://SD_ILS/0/SD_ILS:10149902026-01-22T02:57:31Z2026-01-22T02:57:31Zby Haldar, Achintya.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1214938">Click to View</a><br/>Format: Elektronik Kaynak<br/>An introduction to reliability and maintainability engineeringent://SD_ILS/0/SD_ILS:11666642026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ebeling, Charles E..<br/>Format: Kitap<br/>Rules of thumb for maintenance and reliability engineersent://SD_ILS/0/SD_ILS:9480132026-01-22T02:57:31Z2026-01-22T02:57:31Zby Smith, Ricky.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=405204">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability modelling and analysis in discrete timeent://SD_ILS/0/SD_ILS:11380092026-01-22T02:57:31Z2026-01-22T02:57:31Zby Nair, N. Unnikrishnan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5396573">Click to View</a><br/>Format: Elektronik Kaynak<br/>Artificial neural network for software reliability predictionent://SD_ILS/0/SD_ILS:11297882026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bisi, Manjubala, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5056371">Click to View</a><br/>Format: Elektronik Kaynak<br/>Human reliability and error in medical systement://SD_ILS/0/SD_ILS:10304172026-01-22T02:57:31Z2026-01-22T02:57:31Zby Dhillon, B. S. (Balbir S.), 1947-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679549">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk-based management : a reliability-centered approachent://SD_ILS/0/SD_ILS:10284562026-01-22T02:57:31Z2026-01-22T02:57:31Zby Jones, Richard B., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1649062">Click to View</a><br/>Format: Elektronik Kaynak<br/>Logics and languages for reliability and securityent://SD_ILS/0/SD_ILS:9666272026-01-22T02:57:31Z2026-01-22T02:57:31Zby Esparza, Javier.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=557042">Click to View</a><br/>Format: Elektronik Kaynak<br/>Rules of thumb for maintenance and reliability engineersent://SD_ILS/0/SD_ILS:11891422026-01-22T02:57:31Z2026-01-22T02:57:31Zby Smith, Ricky.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750678629">https://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Elektronik Kaynak<br/>Cognitive reliability and error analysis method : CREAMent://SD_ILS/0/SD_ILS:11857442026-01-22T02:57:31Z2026-01-22T02:57:31Zby Hollnagel, Erik, 1941-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Elektronik Kaynak<br/>The reliability, availability and productiveness of systemsent://SD_ILS/0/SD_ILS:378072026-01-22T02:57:31Z2026-01-22T02:57:31Zby Sherwin, D.J.<br/>Format: Kitap<br/>Reliability and maintainability of in service pipelinesent://SD_ILS/0/SD_ILS:11394242026-01-22T02:57:31Z2026-01-22T02:57:31Zby Mojtaba, Mahmoodian, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5434362">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability based airframe maintenance optimization and applicationsent://SD_ILS/0/SD_ILS:11245472026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ren, He, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4826425">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and radiation effects in compound semiconductorsent://SD_ILS/0/SD_ILS:9808382026-01-22T02:57:31Z2026-01-22T02:57:31Zby Johnston, Allan.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=731279">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk and reliability coastal and hydraulic engineeringent://SD_ILS/0/SD_ILS:9551842026-01-22T02:57:31Z2026-01-22T02:57:31Zby Reeve, Dominic.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=446907">Click to View</a><br/>Format: Elektronik Kaynak<br/>Managing risk and reliability of process plantsent://SD_ILS/0/SD_ILS:9380832026-01-22T02:57:31Z2026-01-22T02:57:31Zby Tweeddale, Mark.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=286711">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability characterisation of electrical and electronic systemsent://SD_ILS/0/SD_ILS:10440882026-01-22T02:57:31Z2026-01-22T02:57:31Zby Swingler, Jonathan, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1911716">Click to View</a><br/>Format: Elektronik Kaynak<br/>Process plant equipment operation, reliability, and controlent://SD_ILS/0/SD_ILS:9871642026-01-22T02:57:31Z2026-01-22T02:57:31Zby Holloway, Michael D., 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=822072">Click to View</a><br/>Format: Elektronik Kaynak<br/>Lead-free solders materials reliability for electronicsent://SD_ILS/0/SD_ILS:9918922026-01-22T02:57:31Z2026-01-22T02:57:31Zby Subramaniam, K. N., Ph. D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=875755">Click to View</a><br/>Format: Elektronik Kaynak<br/>BioWatch PCR assays : building confidence, ensuring reliabilityent://SD_ILS/0/SD_ILS:10967442026-01-22T02:57:31Z2026-01-22T02:57:31Zby National Research Council (U.S.). Board on Life Sciences. Committee on PCR Standards for the BioWatch Program, issuing body.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3439887">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability Approach to Risk Management in Watershedsent://SD_ILS/0/SD_ILS:6871032026-01-22T02:57:31Z2026-01-22T02:57:31Zby Teklitz, Allen, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10871571">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10871571</a><br/>Format: Kitap<br/>Managing risk and reliability of process plantsent://SD_ILS/0/SD_ILS:11879392026-01-22T02:57:31Z2026-01-22T02:57:31Zby Tweeddale, Mark.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750677349">https://www.sciencedirect.com/science/book/9780750677349</a><br/>Format: Elektronik Kaynak<br/>Power GaN Devices Materials, Applications and Reliabilityent://SD_ILS/0/SD_ILS:4804472026-01-22T02:57:31Z2026-01-22T02:57:31Zby Meneghini, Matteo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-43199-4">http://dx.doi.org/10.1007/978-3-319-43199-4</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability, and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11783002026-01-22T02:57:31Z2026-01-22T02:57:31Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750608541">http://www.sciencedirect.com/science/book/9780750608541</a><br/>Format: Elektronik Kaynak<br/>An introduction to the basics of reliability and risk analysisent://SD_ILS/0/SD_ILS:1329502026-01-22T02:57:31Z2026-01-22T02:57:31Zby Zio, Enrico<br/>Format: Kitap<br/>Reliability of maintained systems subjected to wear failure mechanisms : theory and applicationsent://SD_ILS/0/SD_ILS:11459602026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bayle, Franck, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5751853">Click to View</a><br/>Format: Elektronik Kaynak<br/>An introduction to the basics of reliability and risk analysisent://SD_ILS/0/SD_ILS:9423932026-01-22T02:57:31Z2026-01-22T02:57:31Zby Zio, Enrico.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=312287">Click to View</a><br/>Format: Elektronik Kaynak<br/>System and Bayesian reliability essays in honor of Professor Richard E. Barlow on his 70th birthdayent://SD_ILS/0/SD_ILS:10304512026-01-22T02:57:31Z2026-01-22T02:57:31Zby Hayakawa, Yu.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679591">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of high-power mechatronic systems. Volume 1, Aerospace and automotive applicationsent://SD_ILS/0/SD_ILS:11299822026-01-22T02:57:31Z2026-01-22T02:57:31Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5061866">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk and Reliability Analysis: Theory and Applications In Honor of Prof. Armen Der Kiureghianent://SD_ILS/0/SD_ILS:4810452026-01-22T02:57:31Z2026-01-22T02:57:31Zby Gardoni, Paolo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-52425-2">http://dx.doi.org/10.1007/978-3-319-52425-2</a><br/>Format: Elektronik Kaynak<br/>Reliability modeling in industry 4.0 : advances in reliability scienceent://SD_ILS/0/SD_ILS:12141792026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ram, Mangey, editor<br/>Format: Kitap<br/>Dynamic system reliability : modeling and analysis of dynamic and dependent behaviorsent://SD_ILS/0/SD_ILS:11441802026-01-22T02:57:31Z2026-01-22T02:57:31Zby Xing, Liudong, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630668">Click to View</a><br/>Format: Elektronik Kaynak<br/>Applied reliability engineering and risk analysis probabilistic models and statistical inferenceent://SD_ILS/0/SD_ILS:10183872026-01-22T02:57:31Z2026-01-22T02:57:31Zby Frenkel, Ilia, Ph.D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1360807">Click to View</a><br/>Format: Elektronik Kaynak<br/>Organizing for reliability : a guide for research and practiceent://SD_ILS/0/SD_ILS:11341172026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ramanujam, Rangaraj, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5219778">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability investigation of LED devices for public light applicationsent://SD_ILS/0/SD_ILS:11243342026-01-22T02:57:31Z2026-01-22T02:57:31Zby Baillot, Raphael, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4822046">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability technology principles and practice of failure prevention in electronic systemsent://SD_ILS/0/SD_ILS:9751502026-01-22T02:57:31Z2026-01-22T02:57:31Zby Pascoe, Norman.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=675299">Click to View</a><br/>Format: Elektronik Kaynak<br/>Spiritüel distres ölçeği'nin Türkçe'ye uyarlanması; geçerlik ve güvenirlik çalışması = Turkish adaptation of the spiritual distress scale; validity and reliability studyent://SD_ILS/0/SD_ILS:12295562026-01-22T02:57:31Z2026-01-22T02:57:31Zby Arpa, Hilal, yazar.<br/>Format: Kitap<br/>Sağlık Bilimleri Kanıta Dayalı Uygulama Anketi'nin türkçe geçerlilik ve güvenirliği = Turkish validity and reliability of The Health Sciences Evidence-Based Practice Questionnaireent://SD_ILS/0/SD_ILS:12296122026-01-22T02:57:31Z2026-01-22T02:57:31Zby Şahin, Ayşe Nur, yazar.<br/>Format: Kitap<br/>Tıkınırcasına yeme bozukluğu tarama anketinin ((BEDS-7) Binge-eating disordes screener)) Türkçe geçerlilik ve güvenilirlil çalışması = Validity and reliability study of the binge-eating disorder screening questionnaire (BEDS-7) in Turkishent://SD_ILS/0/SD_ILS:12293852026-01-22T02:57:31Z2026-01-22T02:57:31Zby Aker, Caner, Dr., yazar.<br/>Format: Kitap<br/>The international journal of quality & reliability management. Volume 25, Number 1, Best practice project portfolio managementent://SD_ILS/0/SD_ILS:9459112026-01-22T02:57:31Z2026-01-22T02:57:31Zby Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=348641">Click to View</a><br/>Format: Elektronik Kaynak<br/>Pipelines 2010 climbing new peaks to infrastructure reliability--renew, rehab, and reinvest : proceedings of the 2010 Pipeline Division Specialty Congress, August 28-September 1, 2010, Keystone Coloradoent://SD_ILS/0/SD_ILS:10683572026-01-22T02:57:31Z2026-01-22T02:57:31Zby Pipeline Division Specialty Congress (2010 : Keystone, Colo.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3115529">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advanced reliability modeling proceedings of the 2004 Asian International Workshop (AIWARM 2004) : Hiroshima, Japan, 26-27 August 2004ent://SD_ILS/0/SD_ILS:9399662026-01-22T02:57:31Z2026-01-22T02:57:31Zby Asian International Workshop on Advanced Reliability Modeling (2004 : Hiroshima-shi, Japan)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=296055">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advanced reliability modeling II reliability testing and improvement : proceedings of the 2nd Asian International Workshop (AIWARM 2006), Busan, Korea, 24-26 August 2006ent://SD_ILS/0/SD_ILS:10309782026-01-22T02:57:31Z2026-01-22T02:57:31Zby Asian International Workshop on Advanced Reliability Modeling (2nd : 2006 : Pusan, Korea)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1681416">Click to View</a><br/>Format: Elektronik Kaynak<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:11773902026-01-22T02:57:31Z2026-01-22T02:57:31Zby Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektronik Kaynak<br/>International Conference on Structural Safety and Reliability : Smithsonian Institution Museum of History and Technology, Constitution Avenue, Washington, D.C., April 9, 10 and 11, 1969ent://SD_ILS/0/SD_ILS:11817172026-01-22T02:57:31Z2026-01-22T02:57:31Zby International Conference on Structural Safety and Reliability (1st : 1969 : Smithsonian Institution)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080165660">https://www.sciencedirect.com/science/book/9780080165660</a><br/>Format: Elektronik Kaynak<br/>Problems of mechanics in pump and compressor engineering : selected, peer reviewed papers from the XIV International Scientific and Engineering Conference on Hermetic Sealing, Vibration Reliability and Ecological Safety of Pump and Compressor Machinery (HERVICON+PUMPS 2014), September 9-12, 2014, Sumy, Ukraineent://SD_ILS/0/SD_ILS:10439472026-01-22T02:57:31Z2026-01-22T02:57:31Zby International Scientific and Engineering Conference on Hermetic Sealing, Vibration Reliability and Ecological Safety of Pump and Compressor Machinery (14th : 2014 : Sumy, Ukraine)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1910938">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in product development and reliability III : selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, Chinaent://SD_ILS/0/SD_ILS:10415482026-01-22T02:57:31Z2026-01-22T02:57:31Zby International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China), issuing body.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1872895">Click to View</a><br/>Format: Elektronik Kaynak<br/>Evaluation of quantification of margins and uncertainties methodology for assessing and certifying the reliability of the nuclear stockpileent://SD_ILS/0/SD_ILS:11011012026-01-22T02:57:31Z2026-01-22T02:57:31Zby National Research Council (U.S.). Committee on the Evaluation of Quantification of Margins and Uncertainties Methodology for Assessing and Certifying the Reliability of the Nuclear Stockpile.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3564163">Click to View</a><br/>Format: Elektronik Kaynak<br/>Industrial lubrication and tribology. Volume 63, Number?, Selected papers from the 3rd International Conference on Integrity, Reliability and Failure 2009ent://SD_ILS/0/SD_ILS:9765212026-01-22T02:57:31Z2026-01-22T02:57:31Zby Seabra, J. (Jorge)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=683436">Click to View</a><br/>Format: Elektronik Kaynak<br/>Safety, reliability, and applications of emerging intelligent control technologies : a postprint volume from the IFAC workshop, Hong Kong, 12-14 December 1994ent://SD_ILS/0/SD_ILS:11782862026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ng, Tung-Sang.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080423746">http://www.sciencedirect.com/science/book/9780080423746</a><br/>Format: Elektronik Kaynak<br/>Multi-scale reliability and serviceability assessment of in-service long-span bridgesent://SD_ILS/0/SD_ILS:11376382026-01-22T02:57:31Z2026-01-22T02:57:31Zby Lu, Naiwei, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5382830">Click to View</a><br/>Format: Elektronik Kaynak<br/>Konstrüksiyon elemanlarında güvenirlik (reliability) ve ömür hesapları ; teorik açıklamalar ve uygulamalarent://SD_ILS/0/SD_ILS:4891562026-01-22T02:57:31Z2026-01-22T02:57:31Zby Tahralı, Necati<br/>Format: Kitap<br/>Reliability theory and models : stochastic failure models, optimal maintenance policies, life testing, and structuresent://SD_ILS/0/SD_ILS:11776332026-01-22T02:57:31Z2026-01-22T02:57:31Zby Abdel-Hameed, Mohamed S.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780120414208">https://www.sciencedirect.com/science/book/9780120414208</a><br/>Format: Elektronik Kaynak<br/>Reliability issues for DoD systems report of a workshopent://SD_ILS/0/SD_ILS:10827242026-01-22T02:57:31Z2026-01-22T02:57:31Zby Samaniego, Francisco.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3375321">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of safety-critical systems : theory and applicationent://SD_ILS/0/SD_ILS:10276452026-01-22T02:57:31Z2026-01-22T02:57:31Zby Rausand, Marvin.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1637653">Click to View</a><br/>Format: Elektronik Kaynak<br/>Improving product reliability and software quality : strategies, tools, process and implementationent://SD_ILS/0/SD_ILS:11456872026-01-22T02:57:31Z2026-01-22T02:57:31Zby Levin, Mark, 1959- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5741218">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11244862026-01-22T02:57:31Z2026-01-22T02:57:31Zby Smith, David J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4825735">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineering and risk analysis : a practical guideent://SD_ILS/0/SD_ILS:11381572026-01-22T02:57:31Z2026-01-22T02:57:31Zby Modarres, M. (Mohammad), author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5400700">Click to View</a><br/>Format: Elektronik Kaynak<br/>Gas and oil reliability engineering : modeling and analysisent://SD_ILS/0/SD_ILS:11113622026-01-22T02:57:31Z2026-01-22T02:57:31Zby Calixto, Eduardo, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4526461">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthdayent://SD_ILS/0/SD_ILS:10268912026-01-22T02:57:31Z2026-01-22T02:57:31Zby Nakamura, Syouji.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1611972">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability prediction from burn-in data fit to reliability modelsent://SD_ILS/0/SD_ILS:10283592026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bernstein, Joseph B., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1647477">Click to View</a><br/>Format: Elektronik Kaynak<br/>Practical reliability engineering and analysis for system design and life-cycle sustainmentent://SD_ILS/0/SD_ILS:9636322026-01-22T02:57:31Z2026-01-22T02:57:31Zby Wessels, William R.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=533784">Click to View</a><br/>Format: Elektronik Kaynak<br/>The OEE primer : understanding overall equipment effectiveness, reliability, and maintainabilityent://SD_ILS/0/SD_ILS:973522026-01-22T02:57:31Z2026-01-22T02:57:31Zby Stamatis, D.H.<br/>Format: Kitap<br/>Robust design methodology for reliability exploring the effects of variation and uncertaintyent://SD_ILS/0/SD_ILS:9558972026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bergman, Bo, 1943-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=454321">Click to View</a><br/>Format: Elektronik Kaynak<br/>HALT, HASS, and HASA explained : accelerated reliability techniquesent://SD_ILS/0/SD_ILS:10553092026-01-22T02:57:31Z2026-01-22T02:57:31Zby McLean, Harry W., 1946- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002645">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:9353752026-01-22T02:57:31Z2026-01-22T02:57:31Zby Smith, David John, 1943-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=269666">Click to View</a><br/>Format: Elektronik Kaynak<br/>World class reliability using Multiple Environment Overstress Tests to make it happenent://SD_ILS/0/SD_ILS:9329232026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bhote, Keki R., 1925-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=243100">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability, and supportability : best practices for systems engineersent://SD_ILS/0/SD_ILS:10431672026-01-22T02:57:31Z2026-01-22T02:57:31Zby Tortorella, Michael, 1947- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1896020">Click to View</a><br/>Format: Elektronik Kaynak<br/>Gas and oil reliability engineering modeling and analysisent://SD_ILS/0/SD_ILS:10016802026-01-22T02:57:31Z2026-01-22T02:57:31Zby Calixto, Eduardo.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1032940">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:9805752026-01-22T02:57:31Z2026-01-22T02:57:31Zby Smith, David J.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=730199">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11878352026-01-22T02:57:31Z2026-01-22T02:57:31Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format: Elektronik Kaynak<br/>Reliability, Maintainability and Risk 8e Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:1372392026-01-22T02:57:31Z2026-01-22T02:57:31Zby Smith, David J.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektronik Kaynak<br/>Reliability, Maintainability and Risk : Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:11838532026-01-22T02:57:31Z2026-01-22T02:57:31Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080969022">https://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektronik Kaynak<br/>Importance measures in reliability, risk, and optimization principles and applicationsent://SD_ILS/0/SD_ILS:9944472026-01-22T02:57:31Z2026-01-22T02:57:31Zby Kuo, Way, 1951-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=912160">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk-based reliability analysis and generic principles for risk reductionent://SD_ILS/0/SD_ILS:11856452026-01-22T02:57:31Z2026-01-22T02:57:31Zby Todinov, M. T.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Elektronik Kaynak<br/>Reliability of MEMS testing of materials and devicesent://SD_ILS/0/SD_ILS:9609892026-01-22T02:57:31Z2026-01-22T02:57:31Zby Tabata, Osamu.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=481344">Click to View</a><br/>Format: Elektronik Kaynak<br/>Spacecraft reliability and multi-state failures a statistical approachent://SD_ILS/0/SD_ILS:9784342026-01-22T02:57:31Z2026-01-22T02:57:31Zby Saleh, Joseph H., 1971-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=697462">Click to View</a><br/>Format: Elektronik Kaynak<br/>Statistical theory of reliability and life testing : probability modelsent://SD_ILS/0/SD_ILS:6701822026-01-22T02:57:31Z2026-01-22T02:57:31Zby Barlow, Richard E.<br/>Format: Kitap<br/>Reliability analysis for asset management of electric power gridsent://SD_ILS/0/SD_ILS:11441452026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ross, Robert D., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630246">Click to View</a><br/>Format: Elektronik Kaynak<br/>Corporate communications. Volume 23, Number 2, An International Journal : Communicating/Organizing for Reliability, Resilience, and Safetyent://SD_ILS/0/SD_ILS:11373142026-01-22T02:57:31Z2026-01-22T02:57:31Zby Barbour, Joshua B., editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5351422">Click to View</a><br/>Format: Elektronik Kaynak<br/>Semi-Markov processes : applications in system reliability and maintenanceent://SD_ILS/0/SD_ILS:10381822026-01-22T02:57:31Z2026-01-22T02:57:31Zby Grabski, Franciszek, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1798310">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probability, statistics, and reliability for engineers and scientistsent://SD_ILS/0/SD_ILS:10272312026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ayyub, Bilal M., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1631123">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessmentent://SD_ILS/0/SD_ILS:11279302026-01-22T02:57:31Z2026-01-22T02:57:31Zby Modarres, M. (Mohammad), author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4901681">Click to View</a><br/>Format: Elektronik Kaynak<br/>Binary decision diagrams and extensions for system reliability analysisent://SD_ILS/0/SD_ILS:11032282026-01-22T02:57:31Z2026-01-22T02:57:31Zby Xing, Liudong, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4041105">Click to View</a><br/>Format: Elektronik Kaynak<br/>Oxide reliability a summary of silicon oxide wearout, breakdown, and reliabilityent://SD_ILS/0/SD_ILS:10303252026-01-22T02:57:31Z2026-01-22T02:57:31Zby Dumin, D. J.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679439">Click to View</a><br/>Format: Elektronik Kaynak<br/>Mathematical models for the study of the reliability of systemsent://SD_ILS/0/SD_ILS:11907132026-01-22T02:57:31Z2026-01-22T02:57:31Zby Kaufmann, A. (Arnold), 1911-1994.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780124023703">https://www.sciencedirect.com/science/book/9780124023703</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/publication?issn=00765392&volume=124">https://www.sciencedirect.com/science/publication?issn=00765392&volume=124</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/bookseries/00765392/124">https://www.sciencedirect.com/science/bookseries/00765392/124</a><br/>Format: Elektronik Kaynak<br/>Reliability in computing : the role of interval methods in scientific computingent://SD_ILS/0/SD_ILS:11759752026-01-22T02:57:31Z2026-01-22T02:57:31Zby Moore, Ramon E.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780125056304">https://www.sciencedirect.com/science/book/9780125056304</a><br/>Format: Elektronik Kaynak<br/>General principles : general principles on quality assurance for structures : general principles on reliability for structural design : reportent://SD_ILS/0/SD_ILS:11703082026-01-22T02:57:31Z2026-01-22T02:57:31Zby Joint Committee on Structural Safety.<br/>Format: Kitap<br/>Statistical models and methods for reliability and survival analysisent://SD_ILS/0/SD_ILS:10243132026-01-22T02:57:31Z2026-01-22T02:57:31Zby Couallier, Vincent.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1580028">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applicationsent://SD_ILS/0/SD_ILS:10155422026-01-22T02:57:31Z2026-01-22T02:57:31Zby Wu, Bin.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1222589">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:11844892026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ohring, Milton, 1936-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format: Elektronik Kaynak<br/>Software reliability : measurement, prediction, application / John D. Musa, Anthony Iannino, Kazuhira Okumoto.ent://SD_ILS/0/SD_ILS:9185242026-01-22T02:57:31Z2026-01-22T02:57:31Zby Musa, John D.<br/>Format: Kitap<br/>Fundamentals of reliability engineering : applications in multistage interconnection networksent://SD_ILS/0/SD_ILS:10279372026-01-22T02:57:31Z2026-01-22T02:57:31Zby Gunawan, Indra, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1641079">Click to View</a><br/>Format: Elektronik Kaynak<br/>Semi-Markov chains and hidden semi-Markov models toward applications their use in reliability and DNA analysisent://SD_ILS/0/SD_ILS:9501292026-01-22T02:57:31Z2026-01-22T02:57:31Zby Barbu, Vlad Stefan.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=417305">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fault injection techniques and tools for embedded systems reliability evaluationent://SD_ILS/0/SD_ILS:10625312026-01-22T02:57:31Z2026-01-22T02:57:31Zby Benso, Alfredo.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3036042">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probabilistic safety assessment for optimum nuclear power plant life management (PLiM) theory and application of reliability analysis methods for major power plant componentsent://SD_ILS/0/SD_ILS:10239402026-01-22T02:57:31Z2026-01-22T02:57:31Zby Arkadov, Gennadij V.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1575572">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability Design of Mechanical Systems A Guide for Mechanical and Civil Engineersent://SD_ILS/0/SD_ILS:4809402026-01-22T02:57:31Z2026-01-22T02:57:31Zby Woo, Seongwoo. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-50829-0">http://dx.doi.org/10.1007/978-3-319-50829-0</a><br/>Format: Elektronik Kaynak<br/>Engineering maintainability : how to design for reliability and easy maintenanceent://SD_ILS/0/SD_ILS:11851692026-01-22T02:57:31Z2026-01-22T02:57:31Zby Dhillon, B. S. (Balbir S.), 1947-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152576">http://www.sciencedirect.com/science/book/9780884152576</a><br/>Format: Elektronik Kaynak<br/>Theory and Practice of Quality and Reliability Engineering in Asia Industryent://SD_ILS/0/SD_ILS:4817212026-01-22T02:57:31Z2026-01-22T02:57:31Zby Tan, Cher Ming. editor.<br/><a href="http://dx.doi.org/10.1007/978-981-10-3290-5">http://dx.doi.org/10.1007/978-981-10-3290-5</a><br/>Format: Elektronik Kaynak<br/>Reliability and Risk Evaluation of Wind Integrated Power Systemsent://SD_ILS/0/SD_ILS:1405572026-01-22T02:57:31Z2026-01-22T02:57:31Zby Billinton, Roy. editor.<br/><a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format: Elektronik Kaynak<br/>Process risk and reliability management : operational integrity managementent://SD_ILS/0/SD_ILS:11784322026-01-22T02:57:31Z2026-01-22T02:57:31Zby Sutton, Ian S.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format: Elektronik Kaynak<br/>Measures of response reliability in 1988 household labour force survey for Ankaraent://SD_ILS/0/SD_ILS:768492026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bilge, Hüsniye<br/>Format: Kitap<br/>Goal oriented methodology and applications in nuclear power plants : a modern systems reliability approachent://SD_ILS/0/SD_ILS:11487402026-01-22T02:57:31Z2026-01-22T02:57:31Zby Xiao-Jian, Yi, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5969498">Click to View</a><br/>Format: Elektronik Kaynak<br/>Mastering selenium webdriver 3.0 : boost the performance and reliability of your automated checks by mastering Selenium WebDriver.ent://SD_ILS/0/SD_ILS:11404512026-01-22T02:57:31Z2026-01-22T02:57:31Zby Collin, Mark, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5446029">Click to View</a><br/>Format: Elektronik Kaynak<br/>Firearm and toolmark identification : the scientific reliability of the forensic science disciplineent://SD_ILS/0/SD_ILS:11406762026-01-22T02:57:31Z2026-01-22T02:57:31Zby Nichols, Ronald, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5455401">Click to View</a><br/>Format: Elektronik Kaynak<br/>Solid oxide fuel cell lifetime and reliability : critical challenges in fuel cellsent://SD_ILS/0/SD_ILS:11265972026-01-22T02:57:31Z2026-01-22T02:57:31Zby Brandon, Nigel P., editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4865436">Click to View</a><br/>Format: Elektronik Kaynak<br/>Numerical methods of simulation and optimization of piecewise deterministic Markov processes : application to reliabilityent://SD_ILS/0/SD_ILS:11047542026-01-22T02:57:31Z2026-01-22T02:57:31Zby Saporta, Benoîte de, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4205869">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, robustness and failure mechanisms of led devices : methodology and evaluationent://SD_ILS/0/SD_ILS:11196022026-01-22T02:57:31Z2026-01-22T02:57:31Zby Deshayes, Yannick, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4717207">Click to View</a><br/>Format: Elektronik Kaynak<br/>Simulation of stochastic processes with given accuracy and reliabilityent://SD_ILS/0/SD_ILS:11208622026-01-22T02:57:31Z2026-01-22T02:57:31Zby Kozachenko, Yuriy, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4747211">Click to View</a><br/>Format: Elektronik Kaynak<br/>Embedded mechatronic systems. Volume 1, Analysis of failures, predictive reliabilityent://SD_ILS/0/SD_ILS:10519342026-01-22T02:57:31Z2026-01-22T02:57:31Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=2086747">Click to View</a><br/>Format: Elektronik Kaynak<br/>Designing for human reliability : human factors engineering in the oil, gas, and process industriesent://SD_ILS/0/SD_ILS:10469492026-01-22T02:57:31Z2026-01-22T02:57:31Zby McLeod, Ronald W. , author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=2000913">Click to View</a><br/>Format: Elektronik Kaynak<br/>Flow networks analysis and optimization of repairable flow networks, networks with disturbed flows, static flow networks and reliability networksent://SD_ILS/0/SD_ILS:10075062026-01-22T02:57:31Z2026-01-22T02:57:31Zby Todinov, Michael T.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1114626">Click to View</a><br/>Format: Elektronik Kaynak<br/>Electric utility resource planning economics, reliability, and decision-makingent://SD_ILS/0/SD_ILS:9874722026-01-22T02:57:31Z2026-01-22T02:57:31Zby Sim, Steven.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=826969">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fault tolerant drive by wire systems impact on vehicle safety and reliabilityent://SD_ILS/0/SD_ILS:9985582026-01-22T02:57:31Z2026-01-22T02:57:31Zby Anwar, Sohel.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=976620">Click to View</a><br/>Format: Elektronik Kaynak<br/>The cost of being landlocked logistics, costs, and supply chain reliabilityent://SD_ILS/0/SD_ILS:9686422026-01-22T02:57:31Z2026-01-22T02:57:31Zby Arvis, Jean-François, 1960-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=589796">Click to View</a><br/>Format: Elektronik Kaynak<br/>Axiomatic quality integrating axiomatic design with six-sigma, reliability, and quality engineeringent://SD_ILS/0/SD_ILS:9309382026-01-22T02:57:31Z2026-01-22T02:57:31Zby El-Haik, Basem.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=227550">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and validity of the Turkish version of the service quality assessment scaleent://SD_ILS/0/SD_ILS:846902026-01-22T02:57:31Z2026-01-22T02:57:31Zby Gürbüz, Bülent<br/>Format: Kitap<br/>Ecology, engineering, and management reconciling ecosystem rehabilitation and service reliabilityent://SD_ILS/0/SD_ILS:9506762026-01-22T02:57:31Z2026-01-22T02:57:31Zby Eeten, Michel van.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=422475">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of medicare hospital discharge records report of a studyent://SD_ILS/0/SD_ILS:10848512026-01-22T02:57:31Z2026-01-22T02:57:31Zby Institute of Medicine (U.S.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3377596">Click to View</a><br/>Format: Elektronik Kaynak<br/>Electricity access in Sub-Saharan Africa : uptake, reliability, and complementary factors for economic impact, Moussa P. Blimpo and Malcolm Cosgrove-Davies.ent://SD_ILS/0/SD_ILS:11453922026-01-22T02:57:31Z2026-01-22T02:57:31Zby Blimpo, Moussa P., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5725963">Click to View</a><br/>Format: Elektronik Kaynak<br/>A big data analytics approach to quality, reliability and risk managementent://SD_ILS/0/SD_ILS:11456102026-01-22T02:57:31Z2026-01-22T02:57:31Zby Mazzuto, Giovanni, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5734581">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk and reliability in structural engineering : theoretical basisent://SD_ILS/0/SD_ILS:11465922026-01-22T02:57:31Z2026-01-22T02:57:31Zby Lu, Naiwei, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5780563">Click to View</a><br/>Format: Elektronik Kaynak<br/>Durability and reliability of polymers and other materials in photovoltaic modulesent://SD_ILS/0/SD_ILS:11468702026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bruckman, Laura, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5788821">Click to View</a><br/>Format: Elektronik Kaynak<br/>Bioelectronics and medical devices : from materials to devices - fabrication, applications and reliabilityent://SD_ILS/0/SD_ILS:11470392026-01-22T02:57:31Z2026-01-22T02:57:31Zby Pal, Kunal, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5796374">Click to View</a><br/>Format: Elektronik Kaynak<br/>Wide bandgap power semiconductor packaging : materials, components, and reliabilityent://SD_ILS/0/SD_ILS:11382432026-01-22T02:57:31Z2026-01-22T02:57:31Zby Suganuma, Katsuaki, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5404290">Click to View</a><br/>Format: Elektronik Kaynak<br/>Security, privacy and reliability in computer communications and networksent://SD_ILS/0/SD_ILS:11217842026-01-22T02:57:31Z2026-01-22T02:57:31Zby Sha, Kewei, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4771355">Click to View</a><br/>Format: Elektronik Kaynak<br/>Stochastic models in survival analysis and reliability set. Volume 1, Reliability of engineering systems and technological riskent://SD_ILS/0/SD_ILS:11152762026-01-22T02:57:31Z2026-01-22T02:57:31Zby Rykov, Vladimir, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4648726">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability assurance of big data in the cloud : cost-effective replication-based storageent://SD_ILS/0/SD_ILS:10425632026-01-22T02:57:31Z2026-01-22T02:57:31Zby Yang, Yun, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1888753">Click to View</a><br/>Format: Elektronik Kaynak<br/>Quality and reliability aspects in nuclear power reactor fuel engineeringent://SD_ILS/0/SD_ILS:11258542026-01-22T02:57:31Z2026-01-22T02:57:31Zby International Atomic Energy Agency.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4853266">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability in cognitive neuroscience a meta-meta-analysisent://SD_ILS/0/SD_ILS:10821022026-01-22T02:57:31Z2026-01-22T02:57:31Zby Uttal, William R.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3339523">Click to View</a><br/>Format: Elektronik Kaynak<br/>Using the Weibull distribution reliability, modeling, and inferenceent://SD_ILS/0/SD_ILS:9933922026-01-22T02:57:31Z2026-01-22T02:57:31Zby McCool, John, 1936-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=894399">Click to View</a><br/>Format: Elektronik Kaynak<br/>Assessing the reliability of complex models mathematical and statistical foundations of verification, validation, and uncertainty quantificationent://SD_ILS/0/SD_ILS:10861332026-01-22T02:57:31Z2026-01-22T02:57:31Zby National Research Council (U.S.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3378995">Click to View</a><br/>Format: Elektronik Kaynak<br/>Recent advances in providing QoS and reliability in the future Internet backboneent://SD_ILS/0/SD_ILS:10591222026-01-22T02:57:31Z2026-01-22T02:57:31Zby Wang, Ning, 1974-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3018661">Click to View</a><br/>Format: Elektronik Kaynak<br/>Microsoft SQL Server 2008 high availability minimize downtime, speed up recovery, and achieve the highest level of availability and reliability for SQL server applications by mastering the concepts of database mirroring, log shipping, clustering, and replicationent://SD_ILS/0/SD_ILS:9968422026-01-22T02:57:31Z2026-01-22T02:57:31Zby Goswami, Hemantgiri S.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=948566">Click to View</a><br/>Format: Elektronik Kaynak<br/>Equipment management workbook key to equipment reliability and productivity in miningent://SD_ILS/0/SD_ILS:9734122026-01-22T02:57:31Z2026-01-22T02:57:31Zby Tomlingson, Paul D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=655785">Click to View</a><br/>Format: Elektronik Kaynak<br/>Equipment management key to equipment reliability and productivity in miningent://SD_ILS/0/SD_ILS:9573092026-01-22T02:57:31Z2026-01-22T02:57:31Zby Tomlingson, Paul D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=464572">Click to View</a><br/>Format: Elektronik Kaynak<br/>Safety and reliability in cooperating unmanned aerial systemsent://SD_ILS/0/SD_ILS:9807482026-01-22T02:57:31Z2026-01-22T02:57:31Zby Rabbath, Camille Alain, 1969-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=731173">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advanced manufacturing process, lead free interconnect materials and reliability modeling for electronics packagingent://SD_ILS/0/SD_ILS:9350502026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bailey, Christopher.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=267393">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk, reliability, uncertainty, and robustness of water resources systemsent://SD_ILS/0/SD_ILS:9290212026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bogárdi, János.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=201907">Click to View</a><br/>Format: Elektronik Kaynak<br/>Digital instrumentation and control systems in nuclear power plants safety and reliability issues : final reportent://SD_ILS/0/SD_ILS:10830752026-01-22T02:57:31Z2026-01-22T02:57:31Zby National Research Council (U.S.). Committee on Application of Digital Instrumentation and Control Systems to Nuclear Power Plant Operations and Safety.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3375677">Click to View</a><br/>Format: Elektronik Kaynak<br/>On the Historical Reliability of Ancient Biographies: A thorough Examination of Xenophon's Agesilaus, Cornelius Nepos's Atticus, Tacitus's Agricola, and The Gospel According to Johnent://SD_ILS/0/SD_ILS:7014422026-01-22T02:57:31Z2026-01-22T02:57:31Zby Wright, Edward T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13815012">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13815012</a><br/>Format: Kitap<br/>Characterization of Self-Heating Effects and Assessment of Its Impact on Reliability in FinFET Technologyent://SD_ILS/0/SD_ILS:6996352026-01-22T02:57:31Z2026-01-22T02:57:31Zby Paliwoda, Peter Christopher, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13423034">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13423034</a><br/>Format: Kitap<br/>Performance-Based Economical Seismic Design of Multistory Reinforced Concrete Frame Buildings and Reliability Assessmentent://SD_ILS/0/SD_ILS:6997182026-01-22T02:57:31Z2026-01-22T02:57:31Zby Zhang, Chunyu, author. (orcid)0000-0002-1073-1902<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13424086">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13424086</a><br/>Format: Kitap<br/>Reliability and Validity of the Active-mini for Quantifying Movement in Infants with Spinal Muscular Atrophyent://SD_ILS/0/SD_ILS:7017292026-01-22T02:57:31Z2026-01-22T02:57:31Zby Nelson, Leslie, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13846799">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13846799</a><br/>Format: Kitap<br/>Control of Wind Power Systems for Energy Efficiency and Reliabilityent://SD_ILS/0/SD_ILS:7017672026-01-22T02:57:31Z2026-01-22T02:57:31Zby Xiao, Yan, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13849196">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13849196</a><br/>Format: Kitap<br/>Reliability Assessment of a System Integrity Protection Scheme for Transmission Networksent://SD_ILS/0/SD_ILS:7026762026-01-22T02:57:31Z2026-01-22T02:57:31Zby Liu, Nan, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870347">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870347</a><br/>Format: Kitap<br/>On Grid Converter Reliability: Preserving the Life of Power Electronics Through Active Thermal Boundary Controlent://SD_ILS/0/SD_ILS:7037072026-01-22T02:57:31Z2026-01-22T02:57:31Zby Lewis, Patrick T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872130">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872130</a><br/>Format: Kitap<br/>Efficient reliability modelling & analysis of complex systems with application to nuclear power plant safetyent://SD_ILS/0/SD_ILS:7043572026-01-22T02:57:31Z2026-01-22T02:57:31Zby George-Williams, H., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872865">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872865</a><br/>Format: Kitap<br/>Energy saving and reliability of wireless body area networks for health applicationsent://SD_ILS/0/SD_ILS:7045662026-01-22T02:57:31Z2026-01-22T02:57:31Zby Alshaheen, H. S. S., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873074">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873074</a><br/>Format: Kitap<br/>Calibration of expensive computer models using engineering reliability methodsent://SD_ILS/0/SD_ILS:7050082026-01-22T02:57:31Z2026-01-22T02:57:31Zby Gong, Zitong, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873517">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873517</a><br/>Format: Kitap<br/>Stochastic methods for emulation, calibration and reliability analysis of engineering modelsent://SD_ILS/0/SD_ILS:7057362026-01-22T02:57:31Z2026-01-22T02:57:31Zby Garbuno Inigo, A., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13874246">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13874246</a><br/>Format: Kitap<br/>Inter-rater reliability of the structured assessment of violence risk in youth (savry) amongst mental health professionalsent://SD_ILS/0/SD_ILS:7075042026-01-22T02:57:31Z2026-01-22T02:57:31Zby Selby, Sarah Elizabeth, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13876017">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13876017</a><br/>Format: Kitap<br/>Scheduling event-triggered and time-triggered applications with optimal reliability and predictability on networked multi-core chipsent://SD_ILS/0/SD_ILS:6855612026-01-22T02:57:31Z2026-01-22T02:57:31Zby Murshed, Ayman, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10869403">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10869403</a><br/>Format: Kitap<br/>The Implications of the Internet's Topological Structure for Its Efficiency, Security, and Reliabilityent://SD_ILS/0/SD_ILS:6989362026-01-22T02:57:31Z2026-01-22T02:57:31Zby Nur, Abdullah Yasin, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10980025">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10980025</a><br/>Format: Kitap<br/>Assessing the Reliability of the 1760 British Geographical Survey of the St. Lawrence River Valleyent://SD_ILS/0/SD_ILS:6991232026-01-22T02:57:31Z2026-01-22T02:57:31Zby Gliserman, Nicholas, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11016107">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11016107</a><br/>Format: Kitap<br/>The Reliability of Simultaneous Quantitative 3D Analysis of Bone and Soft Tissue Volumesent://SD_ILS/0/SD_ILS:6992632026-01-22T02:57:31Z2026-01-22T02:57:31Zby Mehryar, Paymon, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11017007">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11017007</a><br/>Format: Kitap<br/>Development and Evaluation of a Prototype Travel Time Reliability Monitoring System for Freeway Facilities in North Carolinaent://SD_ILS/0/SD_ILS:6993822026-01-22T02:57:31Z2026-01-22T02:57:31Zby Smith, Russell Charles, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11018101">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11018101</a><br/>Format: Kitap<br/>Advancements in Evaluating Reliability of Nondestructive Technologies for the Detection of Subsurface Fracture Damage in R.C. Bridge Decksent://SD_ILS/0/SD_ILS:7026012026-01-22T02:57:31Z2026-01-22T02:57:31Zby Sultan, Ali Abed, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870026">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870026</a><br/>Format: Kitap<br/>Reliability analysis for small wind turbines using bayesian hierarchical modellingent://SD_ILS/0/SD_ILS:7066022026-01-22T02:57:31Z2026-01-22T02:57:31Zby Wu, JenHao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13875114">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13875114</a><br/>Format: Kitap<br/>Evaluation of Factors Influencing Los Angeles Tiered-Dispatch System's Improvement on Bystander CPR Rate and Inter Reliability between Electronic Patient Care Report (ePCR) and 911 Call Review on Bystander CPR Rateent://SD_ILS/0/SD_ILS:6982772026-01-22T02:57:31Z2026-01-22T02:57:31Zby Zhang, Huihui, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10801261">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10801261</a><br/>Format: Kitap<br/>Target Levels of Reliability for Design of Bridge Foundations and Approach Embankments Using LRFDent://SD_ILS/0/SD_ILS:7025722026-01-22T02:57:31Z2026-01-22T02:57:31Zby Huaco, Daniel R., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13869883">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13869883</a><br/>Format: Kitap<br/>Modeling and simulation for microelectronic packaging assembly manufacturing, reliability and testingent://SD_ILS/0/SD_ILS:9867042026-01-22T02:57:31Z2026-01-22T02:57:31Zby Liu, S. (Sheng), 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=818629">Click to View</a><br/>Format: Elektronik Kaynak<br/>The evolution of animal communication reliability and deception in signaling systemsent://SD_ILS/0/SD_ILS:9614422026-01-22T02:57:31Z2026-01-22T02:57:31Zby Searcy, William A., 1950-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=485769">Click to View</a><br/>Format: Elektronik Kaynak<br/>Adhesives technology for electronic applications : materials, processes, reliabilityent://SD_ILS/0/SD_ILS:11900162026-01-22T02:57:31Z2026-01-22T02:57:31Zby Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515135">http://www.sciencedirect.com/science/book/9780815515135</a><br/>Format: Elektronik Kaynak<br/>Graph theory in modern engineering : computer aided design, control, optimization, reliability analysisent://SD_ILS/0/SD_ILS:11908862026-01-22T02:57:31Z2026-01-22T02:57:31Zby Henley, Ernest J.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780123408501">https://www.sciencedirect.com/science/book/9780123408501</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/publication?issn=00765392&volume=98">https://www.sciencedirect.com/science/publication?issn=00765392&volume=98</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/bookseries/00765392/98">https://www.sciencedirect.com/science/bookseries/00765392/98</a><br/>Format: Elektronik Kaynak<br/>Reliability of Highly Stretchable Flexible Electronic Interconnects and Surface Improvement of DMLS Printed Partsent://SD_ILS/0/SD_ILS:6932992026-01-22T02:57:31Z2026-01-22T02:57:31Zby Zachariah, Ashwin Varkey, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10816881">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10816881</a><br/>Format: Kitap<br/>The Reliability of Symphony Link in Emergency Scenariosent://SD_ILS/0/SD_ILS:6896642026-01-22T02:57:31Z2026-01-22T02:57:31Zby Larson, Anna, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10786579">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10786579</a><br/>Format: Kitap<br/>Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliabilityent://SD_ILS/0/SD_ILS:1375512026-01-22T02:57:31Z2026-01-22T02:57:31Zby Levinson, David M.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format: Elektronik Kaynak<br/>Canadian Matrimonial Litigation Requires Reliability Testing for Unaudited Financial Statementsent://SD_ILS/0/SD_ILS:6808722026-01-22T02:57:31Z2026-01-22T02:57:31Zby Mailloux, Athena, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812640">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812640</a><br/>Format: Kitap<br/>Reliability of Phenotype Estimation and Extended Classification of Ancestry for Forensic Applicationsent://SD_ILS/0/SD_ILS:6923982026-01-22T02:57:31Z2026-01-22T02:57:31Zby Weisz, Naomi A., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10813495">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10813495</a><br/>Format: Kitap<br/>Test-Retest Reliability of TRIMP and Training Effect in Collegiate Icehockey Playersent://SD_ILS/0/SD_ILS:6925302026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ulmer, Jason, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10814025">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10814025</a><br/>Format: Kitap<br/>Reliability Evaluation and Improvement Based on Operational Failure Rate of Power Electronics in Islanded Microgrident://SD_ILS/0/SD_ILS:6930542026-01-22T02:57:31Z2026-01-22T02:57:31Zby Zhong, Wen, author. (orcid)0000-0002-5262-5067<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815889">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815889</a><br/>Format: Kitap<br/>The Effect of Overloading on Reliability of Wheel Loader Structural Componentsent://SD_ILS/0/SD_ILS:6882532026-01-22T02:57:31Z2026-01-22T02:57:31Zby Achelpohl, Eric Raymond, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10689117">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10689117</a><br/>Format: Kitap<br/>Applications of Bayesian Hierarchical Models in Gene Expression and Product Reliabilityent://SD_ILS/0/SD_ILS:6781492026-01-22T02:57:31Z2026-01-22T02:57:31Zby Mittman, Eric T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10688357">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10688357</a><br/>Format: Kitap<br/>Reliability and Resiliency Driven Solutions for Electric Power Systems Operation and Planningent://SD_ILS/0/SD_ILS:6784832026-01-22T02:57:31Z2026-01-22T02:57:31Zby Sedzro, Kwami Senam A., author. (orcid)0000-0002-2107-8662<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748235">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748235</a><br/>Format: Kitap<br/>Comparing Offender Characteristics in a Sample of Oklahoma Sexual Assault Cases with Population Demographics in Oklahoma: A Study of the Reliability of a Statistical Profiling Methodologyent://SD_ILS/0/SD_ILS:6881702026-01-22T02:57:31Z2026-01-22T02:57:31Zby Moses, Caitlin, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10685854">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10685854</a><br/>Format: Kitap<br/>Reliability and Security in Low Power Circuits and Systemsent://SD_ILS/0/SD_ILS:6875362026-01-22T02:57:31Z2026-01-22T02:57:31Zby Geng, Hui, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10186967">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10186967</a><br/>Format: Kitap<br/>Adhesives technology for electronic applications : materials, processing, reliabilityent://SD_ILS/0/SD_ILS:11838012026-01-22T02:57:31Z2026-01-22T02:57:31Zby Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format: Elektronik Kaynak<br/>Evaluating the reliability of emergency response systems for large-scale incident operationsent://SD_ILS/0/SD_ILS:9707202026-01-22T02:57:31Z2026-01-22T02:57:31Zby Jackson, Brian A., 1972-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=618726">Click to View</a><br/>Format: Elektronik Kaynak<br/>The delivery reliability of UK manufacturing plants: An empirical studyent://SD_ILS/0/SD_ILS:6831692026-01-22T02:57:31Z2026-01-22T02:57:31Zby Szwejczewski, Marek Gregory, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10832263">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10832263</a><br/>Format: Kitap<br/>Geographic Routing Reliability Enhancement in Urban Vehicular Ad Hoc Networksent://SD_ILS/0/SD_ILS:6808922026-01-22T02:57:31Z2026-01-22T02:57:31Zby Alzamzami, Ohoud, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812787">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812787</a><br/>Format: Kitap<br/>Task Relevant Source Based Brain Computer Interface: Exploration of Independent Component Analysis Based Spatial Filtering with Reliabilityent://SD_ILS/0/SD_ILS:6940382026-01-22T02:57:31Z2026-01-22T02:57:31Zby Cheema, Maninderpal Singh, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823332">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823332</a><br/>Format: Kitap<br/>Conditional Standard Errors of Measurement, Confidence Interval, and Reliability for Individual Level Student Growth Percentilesent://SD_ILS/0/SD_ILS:6880032026-01-22T02:57:31Z2026-01-22T02:57:31Zby Choi, Jinah, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10637021">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10637021</a><br/>Format: Kitap<br/>Assessing the Validity and Reliability of Computer-based Case Simulations in a Nurse Anesthesia Specialtyent://SD_ILS/0/SD_ILS:6885062026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ward, Robyn Camille, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10746481">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10746481</a><br/>Format: Kitap<br/>Counsel Confidently: Reliability of Bedside Estimated Fetal Weight to Predict Survival at Periviabilityent://SD_ILS/0/SD_ILS:6886782026-01-22T02:57:31Z2026-01-22T02:57:31Zby Krenitsky, Nicole M., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748282">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748282</a><br/>Format: Kitap<br/>Inter-rater Reliability of Physical Abuse Determinations and Abusive Fracture Incidence at a Level 1 Pediatric Trauma Centerent://SD_ILS/0/SD_ILS:6887912026-01-22T02:57:31Z2026-01-22T02:57:31Zby Buesser, Katherine Elizabeth, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10749089">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10749089</a><br/>Format: Kitap<br/>Novel Methods for Improving Performance and Reliability of Flash-Based Solid State Storage Systement://SD_ILS/0/SD_ILS:6963602026-01-22T02:57:31Z2026-01-22T02:57:31Zby Guo, Jiayang, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10891703">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10891703</a><br/>Format: Kitap<br/>Coating materials for electronic applications : polymers, processes, reliability, testingent://SD_ILS/0/SD_ILS:11900182026-01-22T02:57:31Z2026-01-22T02:57:31Zby Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815514923">http://www.sciencedirect.com/science/book/9780815514923</a><br/>Format: Elektronik Kaynak<br/>Human reliability : analysis, prediction, and prevention of human errorsent://SD_ILS/0/SD_ILS:11818202026-01-22T02:57:31Z2026-01-22T02:57:31Zby Park, Kyung S. (Kyung Soo)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780444427274">https://www.sciencedirect.com/science/book/9780444427274</a><br/>Format: Elektronik Kaynak<br/>The elasto-plastic buckling strength of imperfect hemispheres and their reliabilityent://SD_ILS/0/SD_ILS:6848632026-01-22T02:57:31Z2026-01-22T02:57:31Zby Shao, Wen Jiao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10868287">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10868287</a><br/>Format: Kitap<br/>Evaluation of the Reliability of Nondestructive Ultrasonic Inspection Methods for the Detection and the Characterization of Defects in Hydroelectric Turbine Welded Joints = &Eacute;valuation de la fiabilit&eacute; des m&eacute;thodes de contr&ocirc;le non destructives par ultrasons pour la d&eacute;tection et la caract&eacute;risation de d&eacute;fauts dans des joints soud&eacute;s de turbines hydro&eacute;lectriquesent://SD_ILS/0/SD_ILS:7013802026-01-22T02:57:31Z2026-01-22T02:57:31Zby Habibzadeh Boukani, Hamid, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13814436">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13814436</a><br/>Format: Kitap<br/>Microgrid Reliability Evaluation Based on Condition-Dependent Failure Models of Power Electronic Devicesent://SD_ILS/0/SD_ILS:6930272026-01-22T02:57:31Z2026-01-22T02:57:31Zby Li, Qi, author. (orcid)0000-0001-7329-0991<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815787">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815787</a><br/>Format: Kitap<br/>Reliability Modeling, Testing and Optimization of Systems with Mixtures of One-Shot Unitsent://SD_ILS/0/SD_ILS:6872652026-01-22T02:57:31Z2026-01-22T02:57:31Zby Cheng, Yao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902001">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902001</a><br/>Format: Kitap<br/>Automated Runtime Data Analysis for System Reliability Managementent://SD_ILS/0/SD_ILS:6873212026-01-22T02:57:31Z2026-01-22T02:57:31Zby He, Pinjia, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902155">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902155</a><br/>Format: Kitap<br/>Opto-Electro-Thermal Approach to Modeling Photovoltaic Performance and Reliability from Cell to Moduleent://SD_ILS/0/SD_ILS:6784262026-01-22T02:57:31Z2026-01-22T02:57:31Zby Sun, Xingshu, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10747508">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10747508</a><br/>Format: Kitap<br/>Evaluation of the Life-Cycle Reliability of Engineered Slopes Utilizing Multi-Source Monitoring Informationent://SD_ILS/0/SD_ILS:6967742026-01-22T02:57:31Z2026-01-22T02:57:31Zby Li, Xueyou, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903347">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903347</a><br/>Format: Kitap<br/>Semiconductor laser engineering, reliability and diagnostics a practical approach to high power and single mode devicesent://SD_ILS/0/SD_ILS:10078402026-01-22T02:57:31Z2026-01-22T02:57:31Zby Epperlein, Peter W.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1118506">Click to View</a><br/>Format: Elektronik Kaynak<br/>Aerospace and automotive applications : issues, testing and analysisent://SD_ILS/0/SD_ILS:11306052026-01-22T02:57:31Z2026-01-22T02:57:31Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5108518">Click to View</a><br/>Format: Elektronik Kaynak<br/>Data-Driven Remaining Useful Life Prognosis Techniques Stochastic Models, Methods and Applicationsent://SD_ILS/0/SD_ILS:4814752026-01-22T02:57:31Z2026-01-22T02:57:31Zby Si, Xiao-Sheng. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-54030-5">http://dx.doi.org/10.1007/978-3-662-54030-5</a><br/>Format: Elektronik Kaynak<br/>Total quality management sustainabilityent://SD_ILS/0/SD_ILS:9315432026-01-22T02:57:31Z2026-01-22T02:57:31Zby Zairi, Mohamed.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=232302">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fluid-structure interactions and uncertainties : Ansys and fluent toolsent://SD_ILS/0/SD_ILS:11239032026-01-22T02:57:31Z2026-01-22T02:57:31Zby El Hami, Abdelkhalak, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4816334">Click to View</a><br/>Format: Elektronik Kaynak<br/>Quality and supply chain management : integration challenges and impactsent://SD_ILS/0/SD_ILS:11109242026-01-22T02:57:31Z2026-01-22T02:57:31Zby Sampaio, Paulo, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4514356">Click to View</a><br/>Format: Elektronik Kaynak<br/>Innovative quality management casesent://SD_ILS/0/SD_ILS:9343222026-01-22T02:57:31Z2026-01-22T02:57:31Zby Iwaarden, Jos van.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=258154">Click to View</a><br/>Format: Elektronik Kaynak<br/>Best practice quality function deployment (QFD) casesent://SD_ILS/0/SD_ILS:9385502026-01-22T02:57:31Z2026-01-22T02:57:31Zby Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=289800">Click to View</a><br/>Format: Elektronik Kaynak<br/>The leading edge in quality function deploymentent://SD_ILS/0/SD_ILS:9315462026-01-22T02:57:31Z2026-01-22T02:57:31Zby Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=232305">Click to View</a><br/>Format: Elektronik Kaynak<br/>Quality improvement with design of experiments : a response surface approachent://SD_ILS/0/SD_ILS:446962026-01-22T02:57:31Z2026-01-22T02:57:31Zby Vuchkov, Ivan N.<br/>Format: Kitap<br/>Quality management and CSRent://SD_ILS/0/SD_ILS:9435452026-01-22T02:57:31Z2026-01-22T02:57:31Zby Hazlett, Shirley-Ann.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=320627">Click to View</a><br/>Format: Elektronik Kaynak<br/>Corrosion Problems and Solutions in Oil Refining and Petrochemical Industryent://SD_ILS/0/SD_ILS:4805862026-01-22T02:57:31Z2026-01-22T02:57:31Zby Groysman, Alec. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-45256-2">http://dx.doi.org/10.1007/978-3-319-45256-2</a><br/>Format: Elektronik Kaynak<br/>Systemic Decision Making Fundamentals for Addressing Problems and Messesent://SD_ILS/0/SD_ILS:4811912026-01-22T02:57:31Z2026-01-22T02:57:31Zby Hester, Patrick T. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-54672-8">http://dx.doi.org/10.1007/978-3-319-54672-8</a><br/>Format: Elektronik Kaynak<br/>Recurrent event modeling based on the Yule process : application to water network asset managementent://SD_ILS/0/SD_ILS:11047602026-01-22T02:57:31Z2026-01-22T02:57:31Zby Le Gat, Yves, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4205903">Click to View</a><br/>Format: Elektronik Kaynak<br/>Response modeling methodology empirical modeling for engineering and scienceent://SD_ILS/0/SD_ILS:9344452026-01-22T02:57:31Z2026-01-22T02:57:31Zby Shore, Haim.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=259265">Click to View</a><br/>Format: Elektronik Kaynak<br/>Failure analysis a practical guide for manufacturers of electronic components and systemsent://SD_ILS/0/SD_ILS:9751202026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bâzu, M. I. (Marius I.), 1948-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=675196">Click to View</a><br/>Format: Elektronik Kaynak<br/>Füze arayıcı başlığı için güvenilirlik analizi ve güvenilirlik iyileştirme çalışmasıent://SD_ILS/0/SD_ILS:11703152026-01-22T02:57:31Z2026-01-22T02:57:31Zby Çevik Bakırlı, Ebru.<br/>Format: Kitap<br/>Arıza ve tamir durumunda sistem güvenilirliği: genetik ve memetik algoritmalarent://SD_ILS/0/SD_ILS:11658112026-01-22T02:57:31Z2026-01-22T02:57:31Zby Uzuner Şahin, Merve.<br/>Format: Kitap<br/>Hastalık biliş anketi'nin geçerlik ve güvenilirliğient://SD_ILS/0/SD_ILS:11576492026-01-22T02:57:31Z2026-01-22T02:57:31Zby Aykul, Ayşegül.<br/>Format: Kitap<br/>İki parametreli üstel dağılımda rekor değerler ile ortak değişim katsayısı ve güvenirlik tahmin edicilerient://SD_ILS/0/SD_ILS:11961782026-01-22T02:57:31Z2026-01-22T02:57:31Zby Bıyıklı, Nurten.<br/>Format: Kitap<br/>Geçmiş dönem tatmini ve firmaya duyulan güvenin satınalma davranışı üzerine etkileri : beyaz eşya üzerine Ankara'da bir saha araştırmasıent://SD_ILS/0/SD_ILS:11603652026-01-22T02:57:31Z2026-01-22T02:57:31Zby Hızlı, Dilek.<br/>Format: Kitap<br/>Yüksek gaz basınç sensörlerinin sıcaklık ve titreşim koşullarında performansı ve güvenilirliğinin iyileştirilmesient://SD_ILS/0/SD_ILS:12328762026-01-22T02:57:31Z2026-01-22T02:57:31Zby Arslan, Yasin, yazar.<br/>Format: Kitap<br/>Elektro-mekanik aktüatörler için analitik hiyerarşi prosesi (AHP) kullanılarak güvenilirlik tabanlı bakım analizi (RCM) uygulamasıent://SD_ILS/0/SD_ILS:11563052026-01-22T02:57:31Z2026-01-22T02:57:31Zby Doğan, Deniz Can.<br/>Format: Kitap<br/>Pişirme ve yiyecek hazırlama becerileri ölçeğinin Türkçe geçerlik ve güvenirliğinin incelenmesient://SD_ILS/0/SD_ILS:11588472026-01-22T02:57:31Z2026-01-22T02:57:31Zby Keleş, Gizem.<br/>Format: Kitap<br/>Hareket korkusu nedenleri ölçeğinin (Kinesiophopia causes scale) Türkçe uyarlamasının geçerlik ve güvenilirliğient://SD_ILS/0/SD_ILS:11576532026-01-22T02:57:31Z2026-01-22T02:57:31Zby Çayır, Melis.<br/>Format: Kitap<br/>Stochastic risk analysis and managementent://SD_ILS/0/SD_ILS:11238892026-01-22T02:57:31Z2026-01-22T02:57:31Zby Harlamov, Boris, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4816215">Click to View</a><br/>Format: Elektronik Kaynak<br/>Serebral palsili çocuklarda oturma esnasındaki fotoğrafik postür analizinin güvenilirliği ve postürün gövde kontrolü ve kaba motor fonksiyonlar arasındaki ilişkisient://SD_ILS/0/SD_ILS:11576652026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ünsal, Betül.<br/>Format: Kitap<br/>Meme kanseri ilişkili lenfödem hastalarında 'quality of life measure for limb lymphoedema-arm' anketinin Türkçe geçerlilik ve güvenilirliğinin araştırılmasıent://SD_ILS/0/SD_ILS:11601632026-01-22T02:57:31Z2026-01-22T02:57:31Zby Kaya, Emine.<br/>Format: Kitap<br/>New autonomous systemsent://SD_ILS/0/SD_ILS:11090732026-01-22T02:57:31Z2026-01-22T02:57:31Zby Cardon, Alain, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4452676">Click to View</a><br/>Format: Elektronik Kaynak<br/>The social roots of risk : producing disasters, promoting resilienceent://SD_ILS/0/SD_ILS:10339202026-01-22T02:57:31Z2026-01-22T02:57:31Zby Tierney, Kathleen J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1731657">Click to View</a><br/>Format: Elektronik Kaynak<br/>Swans, swine, and swindlers coping with the growing threat of mega-crises and mega-messesent://SD_ILS/0/SD_ILS:9810172026-01-22T02:57:31Z2026-01-22T02:57:31Zby Alpaslan, Can M. (Can Murat)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=735411">Click to View</a><br/>Format: Elektronik Kaynak<br/>Vineland sosyal- duygusal erken çocukluk ölçeğinin geçerlik-güvenirlik çalışması ve okul öncesi eğitim kurumuna devam eden beş yaş çocuklarının sosyal-duygusal davranışlarına yaratıcı drama eğitiminin etkisinin incelenmesient://SD_ILS/0/SD_ILS:11629232026-01-22T02:57:31Z2026-01-22T02:57:31Zby Ceylan, Şehnaz.<br/>Format: Kitap<br/>