Arama Sonuçları Reliability.SirsiDynix Enterprisehttp://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dReliability.$0026ic$003dtrue$0026ps$003d300;jsessionid=52703DB51B9ED403C77D2B50D96874E2?2026-01-22T07:20:39ZApplied reliabilityent://SD_ILS/0/SD_ILS:10084162026-01-22T07:20:39Z2026-01-22T07:20:39Zby Grous, Ammar.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1124027">Click to View</a><br/>Format: Elektronik Kaynak<br/>Applied reliabilityent://SD_ILS/0/SD_ILS:10284072026-01-22T07:20:39Z2026-01-22T07:20:39Zby Tobias, Paul A., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1648252">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:9896092026-01-22T07:20:39Z2026-01-22T07:20:39Zby Elsayed, Elsayed A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=843664">Click to View</a><br/>Format: Elektronik Kaynak<br/>Bayesian reliabilityent://SD_ILS/0/SD_ILS:9471882026-01-22T07:20:39Z2026-01-22T07:20:39Zby Hamada, Michael, 1955-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=364398">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:10291342026-01-22T07:20:39Z2026-01-22T07:20:39Zby Kapur, Kailash C., 1941- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1658817">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability in biomechanicsent://SD_ILS/0/SD_ILS:11196712026-01-22T07:20:39Z2026-01-22T07:20:39Zby Kharmanda, Ghias, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4718313">Click to View</a><br/>Format: Elektronik Kaynak<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:9898032026-01-22T07:20:39Z2026-01-22T07:20:39Zby Raheja, Dev.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=848525">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineering advancesent://SD_ILS/0/SD_ILS:10591322026-01-22T07:20:39Z2026-01-22T07:20:39Zby Hayworth, Gregory I.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3018679">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability-centred maintenanceent://SD_ILS/0/SD_ILS:11665462026-01-22T07:20:39Z2026-01-22T07:20:39Zby Moubray, John.<br/>Format: Kitap<br/>Advanced reliability modelingent://SD_ILS/0/SD_ILS:9334812026-01-22T07:20:39Z2026-01-22T07:20:39Zby Dohi, Tadashi.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=253960">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in reliabilityent://SD_ILS/0/SD_ILS:11841942026-01-22T07:20:39Z2026-01-22T07:20:39Zby Balakrishnan, N., 1956- editor.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/0444500782">Click for electronic access to e-book.</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444500786">http://www.sciencedirect.com/science/book/9780444500786</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/handbooks/01697161/20">http://www.sciencedirect.com/science/handbooks/01697161/20</a><br/>Format: Elektronik Kaynak<br/>Improving machinery reliabilityent://SD_ILS/0/SD_ILS:11852502026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bloch, Heinz P., 1933-<br/><a href="https://www.sciencedirect.com/science/bookseries/18746942/1">Available from ScienceDirect. Online version available for university members only. This requires an institutional login off-campus.</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Elektronik Kaynak<br/>Machine tool reliabilityent://SD_ILS/0/SD_ILS:11076132026-01-22T07:20:39Z2026-01-22T07:20:39Zby Lad, Bhupesh K., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4403257">Click to View</a><br/>Format: Elektronik Kaynak<br/>Solder Joint Reliabilityent://SD_ILS/0/SD_ILS:9386182026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ricky Lee, S. W.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=289873">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probabilistic reliability modelsent://SD_ILS/0/SD_ILS:9933952026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ushakov, I. A. (Igorʹ Alekseevich)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=894405">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of engineering materialsent://SD_ILS/0/SD_ILS:11772892026-01-22T07:20:39Z2026-01-22T07:20:39Zby Smith, Alrick L.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780408015073">http://www.sciencedirect.com/science/book/9780408015073</a><br/>Format: Elektronik Kaynak<br/>Reliability-based mechanical designent://SD_ILS/0/SD_ILS:11665402026-01-22T07:20:39Z2026-01-22T07:20:39Zby Le, Xiaobin.<br/>Format: Kitap<br/>Reliability of large systemsent://SD_ILS/0/SD_ILS:11866552026-01-22T07:20:39Z2026-01-22T07:20:39Zby Kołowrocki, Krzysztof.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format: Elektronik Kaynak<br/>Reliability engineering and servicesent://SD_ILS/0/SD_ILS:11441572026-01-22T07:20:39Z2026-01-22T07:20:39Zby Jin, Tongdan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630265">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and quality managementent://SD_ILS/0/SD_ILS:9548052026-01-22T07:20:39Z2026-01-22T07:20:39Zby Mishra, R. C.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=442134">Click to View</a><br/>Format: Elektronik Kaynak<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:9403262026-01-22T07:20:39Z2026-01-22T07:20:39Zby Neale, M. J. (Michael John)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=298350">Click to View</a><br/>Format: Elektronik Kaynak<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:11851292026-01-22T07:20:39Z2026-01-22T07:20:39Zby Neale, M. J. (Michael John)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Elektronik Kaynak<br/>Fatigue design and reliabilityent://SD_ILS/0/SD_ILS:11861712026-01-22T07:20:39Z2026-01-22T07:20:39Zby International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/bookseries/15661369/23">http://www.sciencedirect.com/science/bookseries/15661369/23</a><br/>Format: Elektronik Kaynak<br/>Reliability of analogue circuitsent://SD_ILS/0/SD_ILS:7051152026-01-22T07:20:39Z2026-01-22T07:20:39Zby Mohd Nawi, Illani Binti, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873624">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873624</a><br/>Format: Kitap<br/>Optimal warranty policies and reliability modelingent://SD_ILS/0/SD_ILS:9335252026-01-22T07:20:39Z2026-01-22T07:20:39Zby Chukova, Stefanka.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=254004">Click to View</a><br/>Format: Elektronik Kaynak<br/>Practical applications of Bayesian reliabilityent://SD_ILS/0/SD_ILS:11456932026-01-22T07:20:39Z2026-01-22T07:20:39Zby Liu, Yan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5741235">Click to View</a><br/>Format: Elektronik Kaynak<br/>Biomechanics : optimization, uncertainties and reliabilityent://SD_ILS/0/SD_ILS:11221052026-01-22T07:20:39Z2026-01-22T07:20:39Zby Kharmanda, Ghias, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4778401">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability growth : enhancing defense system reliabilityent://SD_ILS/0/SD_ILS:10865262026-01-22T07:20:39Z2026-01-22T07:20:39Zby Panel on Reliability Growth Methods for Defense Systems.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3379432">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in mathematical modeling for reliabilityent://SD_ILS/0/SD_ILS:9471512026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bedford, T.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=363211">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advanced reliability modeling part IIent://SD_ILS/0/SD_ILS:9379922026-01-22T07:20:39Z2026-01-22T07:20:39Zby Dohi, Tadashi.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=285510">Click to View</a><br/>Format: Elektronik Kaynak<br/>Systems reliability and failure preventionent://SD_ILS/0/SD_ILS:9309922026-01-22T07:20:39Z2026-01-22T07:20:39Zby Hecht, Herbert.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=227632">Click to View</a><br/>Format: Elektronik Kaynak<br/>Maintenance strategies and reliability optimizationent://SD_ILS/0/SD_ILS:9316892026-01-22T07:20:39Z2026-01-22T07:20:39Zby Artiba, A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=233913">Click to View</a><br/>Format: Elektronik Kaynak<br/>Semiconductor packaging materials interaction and reliabilityent://SD_ILS/0/SD_ILS:9835692026-01-22T07:20:39Z2026-01-22T07:20:39Zby Chen, Andrea.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=773636">Click to View</a><br/>Format: Elektronik Kaynak<br/>Construction reliability safety, variability and sustainabilityent://SD_ILS/0/SD_ILS:10085232026-01-22T07:20:39Z2026-01-22T07:20:39Zby Baroth, Julien.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1124658">Click to View</a><br/>Format: Elektronik Kaynak<br/>Optimal reliability design : fundamentals and applicationsent://SD_ILS/0/SD_ILS:11659812026-01-22T07:20:39Z2026-01-22T07:20:39Zby Kuo, Way.<br/>Format: Kitap<br/>System reliability : concepts and applicationsent://SD_ILS/0/SD_ILS:9221602026-01-22T07:20:39Z2026-01-22T07:20:39Zby Klaassen, Klaas B., 1941-<br/>Format: Kitap<br/>Advances in system reliability engineeringent://SD_ILS/0/SD_ILS:11436852026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ram, Mangey, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5603078">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of large and complex systemsent://SD_ILS/0/SD_ILS:10291132026-01-22T07:20:39Z2026-01-22T07:20:39Zby Kołowrocki, Krzysztof, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1657928">Click to View</a><br/>Format: Elektronik Kaynak<br/>Accelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:9782392026-01-22T07:20:39Z2026-01-22T07:20:39Zby Klyatis, Lev M.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=693204">Click to View</a><br/>Format: Elektronik Kaynak<br/>Multistate systems reliability theory with applicationsent://SD_ILS/0/SD_ILS:9721932026-01-22T07:20:39Z2026-01-22T07:20:39Zby Natvig, Bent, 1946-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=624778">Click to View</a><br/>Format: Elektronik Kaynak<br/>Mathematical methods of reliability theoryent://SD_ILS/0/SD_ILS:11773852026-01-22T07:20:39Z2026-01-22T07:20:39Zby Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781483230535">http://www.sciencedirect.com/science/book/9781483230535</a><br/>Format: Elektronik Kaynak<br/>An elementary guide to reliabilityent://SD_ILS/0/SD_ILS:11851412026-01-22T07:20:39Z2026-01-22T07:20:39Zby Dummer, G. W. A. (Geoffrey William Arnold)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format: Elektronik Kaynak<br/>Network reliability : measures and evaluationent://SD_ILS/0/SD_ILS:11136112026-01-22T07:20:39Z2026-01-22T07:20:39Zby Chaturvedi, Sanjay K., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4570714">Click to View</a><br/>Format: Elektronik Kaynak<br/>Lead-free solder interconnect reliabilityent://SD_ILS/0/SD_ILS:10550942026-01-22T07:20:39Z2026-01-22T07:20:39Zby Shangguan, Dongkai, 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002391">Click to View</a><br/>Format: Elektronik Kaynak<br/>Stochastic reliability modeling, optimization and applicationsent://SD_ILS/0/SD_ILS:10312382026-01-22T07:20:39Z2026-01-22T07:20:39Zby Nakamura, Syouji.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1681730">Click to View</a><br/>Format: Elektronik Kaynak<br/>Analysis of reliability and quality controlent://SD_ILS/0/SD_ILS:10670442026-01-22T07:20:39Z2026-01-22T07:20:39Zby Grous, Ammar.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3058885">Click to View</a><br/>Format: Elektronik Kaynak<br/>Software system reliability and securityent://SD_ILS/0/SD_ILS:9407012026-01-22T07:20:39Z2026-01-22T07:20:39Zby Broy, M., 1949-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=305176">Click to View</a><br/>Format: Elektronik Kaynak<br/>Introduction to reliability and quality engineeringent://SD_ILS/0/SD_ILS:383182026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bentley, John<br/>Format: Kitap<br/>Maintenance and reliability best practicesent://SD_ILS/0/SD_ILS:11659782026-01-22T07:20:39Z2026-01-22T07:20:39Zby Gulati, Ramesh, author<br/>Format: Kitap<br/>Human reliability : with human factorsent://SD_ILS/0/SD_ILS:11751732026-01-22T07:20:39Z2026-01-22T07:20:39Zby Dhillon, B. S. (Balbir S.), 1947-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080327747">http://www.sciencedirect.com/science/book/9780080327747</a><br/>Format: Elektronik Kaynak<br/>Transportation systems reliability and safetyent://SD_ILS/0/SD_ILS:9759462026-01-22T07:20:39Z2026-01-22T07:20:39Zby Dhillon, B. S. (Balbir S.), 1947-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=681292">Click to View</a><br/>Format: Elektronik Kaynak<br/>Process risk and reliability managementent://SD_ILS/0/SD_ILS:10374522026-01-22T07:20:39Z2026-01-22T07:20:39Zby Sutton, Ian, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1782850">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in Reliability and System Engineeringent://SD_ILS/0/SD_ILS:4808132026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ram, Mangey. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-48875-2">http://dx.doi.org/10.1007/978-3-319-48875-2</a><br/>Format: Elektronik Kaynak<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:4814862026-01-22T07:20:39Z2026-01-22T07:20:39Zby Birolini, Alessandro. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-54209-5">http://dx.doi.org/10.1007/978-3-662-54209-5</a><br/>Format: Elektronik Kaynak<br/>Cloud Reliability Engineering: Technologies and Toolsent://SD_ILS/0/SD_ILS:12141962026-01-22T07:20:39Z2026-01-22T07:20:39Zby Achary, Rathnakar<br/>Format: Kitap<br/>Leading a high reliability schoolent://SD_ILS/0/SD_ILS:11378652026-01-22T07:20:39Z2026-01-22T07:20:39Zby Marzano, Robert J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5395032">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability prediction and testing textbookent://SD_ILS/0/SD_ILS:11406412026-01-22T07:20:39Z2026-01-22T07:20:39Zby Klyatis, Lev M., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5452229">Click to View</a><br/>Format: Elektronik Kaynak<br/>Photovoltaic modules : technology and reliabilityent://SD_ILS/0/SD_ILS:11182802026-01-22T07:20:39Z2026-01-22T07:20:39Zby Wirth, Harry, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4691383">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and availability of cloud computingent://SD_ILS/0/SD_ILS:1398622026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bauer, Eric<br/>Format: Kitap<br/>Durability and reliability of medical polymersent://SD_ILS/0/SD_ILS:10244162026-01-22T07:20:39Z2026-01-22T07:20:39Zby Jenkins, Mike.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1581410">Click to View</a><br/>Format: Elektronik Kaynak<br/>Machine tools design, reliability and safetyent://SD_ILS/0/SD_ILS:10608292026-01-22T07:20:39Z2026-01-22T07:20:39Zby Anderson, Scott P.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3021649">Click to View</a><br/>Format: Elektronik Kaynak<br/>Safety and reliability of bridge structuresent://SD_ILS/0/SD_ILS:9673072026-01-22T07:20:39Z2026-01-22T07:20:39Zby New York City Bridge Conference (5th : 2009 : New York, N.Y.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=565988">Click to View</a><br/>Format: Elektronik Kaynak<br/>Measures of interobserver agreement and reliabilityent://SD_ILS/0/SD_ILS:9740262026-01-22T07:20:39Z2026-01-22T07:20:39Zby Shoukri, M. M. (Mohamed M.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=665632">Click to View</a><br/>Format: Elektronik Kaynak<br/>Accelerated quality and reliability solutionsent://SD_ILS/0/SD_ILS:11855832026-01-22T07:20:39Z2026-01-22T07:20:39Zby Klyatis, Lev M.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format: Elektronik Kaynak<br/>Recent advances in reliability and quality engineeringent://SD_ILS/0/SD_ILS:10304522026-01-22T07:20:39Z2026-01-22T07:20:39Zby Pham, Hoang.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679593">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and risk models : setting reliability requirementsent://SD_ILS/0/SD_ILS:11030842026-01-22T07:20:39Z2026-01-22T07:20:39Zby Todinov, M. T., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4039470">Click to View</a><br/>Format: Elektronik Kaynak<br/>Modern statistical and mathematical methods in reliabilityent://SD_ILS/0/SD_ILS:9400832026-01-22T07:20:39Z2026-01-22T07:20:39Zby Wilson, Alyson G., 1967-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=296177">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fault detection & reliability : knowledge based & other approachesent://SD_ILS/0/SD_ILS:11756352026-01-22T07:20:39Z2026-01-22T07:20:39Zby European Workshop on Fault Diagnostics, Reliability, and Related Knowledge-Based Approaches (2nd : 1987 : University of Manchester Institute of Science and Technology)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080349220">https://www.sciencedirect.com/science/book/9780080349220</a><br/>Format: Elektronik Kaynak<br/>Reliability of electronic packages and semiconductor devicesent://SD_ILS/0/SD_ILS:898862026-01-22T07:20:39Z2026-01-22T07:20:39Zby Giacomo, Giulio Di<br/>Format: Kitap<br/>Electronics reliability and measurement technology : nondestructive evaluationent://SD_ILS/0/SD_ILS:11898942026-01-22T07:20:39Z2026-01-22T07:20:39Zby Heyman, Joseph S.<br/>MacEwan University Access <a href="http://www.sciencedirect.com/science/book/9780815511717">(Unlimited Concurrent Users)</a> from ScienceDirect
ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780815511717">https://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Elektronik Kaynak<br/>System reliability : evaluation and prediction in engineeringent://SD_ILS/0/SD_ILS:661722026-01-22T07:20:39Z2026-01-22T07:20:39Zby Pages, Alain<br/>Format: Kitap<br/>Methods for reliability improvement and risk reductionent://SD_ILS/0/SD_ILS:11430312026-01-22T07:20:39Z2026-01-22T07:20:39Zby Todinov, Michael, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5553528">Click to View</a><br/>Format: Elektronik Kaynak<br/>Recent developments in reliability-based civil engineeringent://SD_ILS/0/SD_ILS:10149902026-01-22T07:20:39Z2026-01-22T07:20:39Zby Haldar, Achintya.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1214938">Click to View</a><br/>Format: Elektronik Kaynak<br/>An introduction to reliability and maintainability engineeringent://SD_ILS/0/SD_ILS:11666642026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ebeling, Charles E..<br/>Format: Kitap<br/>Rules of thumb for maintenance and reliability engineersent://SD_ILS/0/SD_ILS:9480132026-01-22T07:20:39Z2026-01-22T07:20:39Zby Smith, Ricky.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=405204">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability modelling and analysis in discrete timeent://SD_ILS/0/SD_ILS:11380092026-01-22T07:20:39Z2026-01-22T07:20:39Zby Nair, N. Unnikrishnan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5396573">Click to View</a><br/>Format: Elektronik Kaynak<br/>Artificial neural network for software reliability predictionent://SD_ILS/0/SD_ILS:11297882026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bisi, Manjubala, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5056371">Click to View</a><br/>Format: Elektronik Kaynak<br/>Human reliability and error in medical systement://SD_ILS/0/SD_ILS:10304172026-01-22T07:20:39Z2026-01-22T07:20:39Zby Dhillon, B. S. (Balbir S.), 1947-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679549">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk-based management : a reliability-centered approachent://SD_ILS/0/SD_ILS:10284562026-01-22T07:20:39Z2026-01-22T07:20:39Zby Jones, Richard B., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1649062">Click to View</a><br/>Format: Elektronik Kaynak<br/>Logics and languages for reliability and securityent://SD_ILS/0/SD_ILS:9666272026-01-22T07:20:39Z2026-01-22T07:20:39Zby Esparza, Javier.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=557042">Click to View</a><br/>Format: Elektronik Kaynak<br/>Rules of thumb for maintenance and reliability engineersent://SD_ILS/0/SD_ILS:11891422026-01-22T07:20:39Z2026-01-22T07:20:39Zby Smith, Ricky.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750678629">https://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Elektronik Kaynak<br/>Cognitive reliability and error analysis method : CREAMent://SD_ILS/0/SD_ILS:11857442026-01-22T07:20:39Z2026-01-22T07:20:39Zby Hollnagel, Erik, 1941-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Elektronik Kaynak<br/>The reliability, availability and productiveness of systemsent://SD_ILS/0/SD_ILS:378072026-01-22T07:20:39Z2026-01-22T07:20:39Zby Sherwin, D.J.<br/>Format: Kitap<br/>Reliability and maintainability of in service pipelinesent://SD_ILS/0/SD_ILS:11394242026-01-22T07:20:39Z2026-01-22T07:20:39Zby Mojtaba, Mahmoodian, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5434362">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability based airframe maintenance optimization and applicationsent://SD_ILS/0/SD_ILS:11245472026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ren, He, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4826425">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and radiation effects in compound semiconductorsent://SD_ILS/0/SD_ILS:9808382026-01-22T07:20:39Z2026-01-22T07:20:39Zby Johnston, Allan.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=731279">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk and reliability coastal and hydraulic engineeringent://SD_ILS/0/SD_ILS:9551842026-01-22T07:20:39Z2026-01-22T07:20:39Zby Reeve, Dominic.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=446907">Click to View</a><br/>Format: Elektronik Kaynak<br/>Managing risk and reliability of process plantsent://SD_ILS/0/SD_ILS:9380832026-01-22T07:20:39Z2026-01-22T07:20:39Zby Tweeddale, Mark.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=286711">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability characterisation of electrical and electronic systemsent://SD_ILS/0/SD_ILS:10440882026-01-22T07:20:39Z2026-01-22T07:20:39Zby Swingler, Jonathan, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1911716">Click to View</a><br/>Format: Elektronik Kaynak<br/>Process plant equipment operation, reliability, and controlent://SD_ILS/0/SD_ILS:9871642026-01-22T07:20:39Z2026-01-22T07:20:39Zby Holloway, Michael D., 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=822072">Click to View</a><br/>Format: Elektronik Kaynak<br/>Lead-free solders materials reliability for electronicsent://SD_ILS/0/SD_ILS:9918922026-01-22T07:20:39Z2026-01-22T07:20:39Zby Subramaniam, K. N., Ph. D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=875755">Click to View</a><br/>Format: Elektronik Kaynak<br/>BioWatch PCR assays : building confidence, ensuring reliabilityent://SD_ILS/0/SD_ILS:10967442026-01-22T07:20:39Z2026-01-22T07:20:39Zby National Research Council (U.S.). Board on Life Sciences. Committee on PCR Standards for the BioWatch Program, issuing body.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3439887">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability Approach to Risk Management in Watershedsent://SD_ILS/0/SD_ILS:6871032026-01-22T07:20:39Z2026-01-22T07:20:39Zby Teklitz, Allen, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10871571">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10871571</a><br/>Format: Kitap<br/>Managing risk and reliability of process plantsent://SD_ILS/0/SD_ILS:11879392026-01-22T07:20:39Z2026-01-22T07:20:39Zby Tweeddale, Mark.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750677349">https://www.sciencedirect.com/science/book/9780750677349</a><br/>Format: Elektronik Kaynak<br/>Power GaN Devices Materials, Applications and Reliabilityent://SD_ILS/0/SD_ILS:4804472026-01-22T07:20:39Z2026-01-22T07:20:39Zby Meneghini, Matteo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-43199-4">http://dx.doi.org/10.1007/978-3-319-43199-4</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability, and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11783002026-01-22T07:20:39Z2026-01-22T07:20:39Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750608541">http://www.sciencedirect.com/science/book/9780750608541</a><br/>Format: Elektronik Kaynak<br/>An introduction to the basics of reliability and risk analysisent://SD_ILS/0/SD_ILS:1329502026-01-22T07:20:39Z2026-01-22T07:20:39Zby Zio, Enrico<br/>Format: Kitap<br/>Reliability of maintained systems subjected to wear failure mechanisms : theory and applicationsent://SD_ILS/0/SD_ILS:11459602026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bayle, Franck, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5751853">Click to View</a><br/>Format: Elektronik Kaynak<br/>An introduction to the basics of reliability and risk analysisent://SD_ILS/0/SD_ILS:9423932026-01-22T07:20:39Z2026-01-22T07:20:39Zby Zio, Enrico.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=312287">Click to View</a><br/>Format: Elektronik Kaynak<br/>System and Bayesian reliability essays in honor of Professor Richard E. Barlow on his 70th birthdayent://SD_ILS/0/SD_ILS:10304512026-01-22T07:20:39Z2026-01-22T07:20:39Zby Hayakawa, Yu.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679591">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of high-power mechatronic systems. Volume 1, Aerospace and automotive applicationsent://SD_ILS/0/SD_ILS:11299822026-01-22T07:20:39Z2026-01-22T07:20:39Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5061866">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk and Reliability Analysis: Theory and Applications In Honor of Prof. Armen Der Kiureghianent://SD_ILS/0/SD_ILS:4810452026-01-22T07:20:39Z2026-01-22T07:20:39Zby Gardoni, Paolo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-52425-2">http://dx.doi.org/10.1007/978-3-319-52425-2</a><br/>Format: Elektronik Kaynak<br/>Reliability modeling in industry 4.0 : advances in reliability scienceent://SD_ILS/0/SD_ILS:12141792026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ram, Mangey, editor<br/>Format: Kitap<br/>Dynamic system reliability : modeling and analysis of dynamic and dependent behaviorsent://SD_ILS/0/SD_ILS:11441802026-01-22T07:20:39Z2026-01-22T07:20:39Zby Xing, Liudong, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630668">Click to View</a><br/>Format: Elektronik Kaynak<br/>Applied reliability engineering and risk analysis probabilistic models and statistical inferenceent://SD_ILS/0/SD_ILS:10183872026-01-22T07:20:39Z2026-01-22T07:20:39Zby Frenkel, Ilia, Ph.D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1360807">Click to View</a><br/>Format: Elektronik Kaynak<br/>Organizing for reliability : a guide for research and practiceent://SD_ILS/0/SD_ILS:11341172026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ramanujam, Rangaraj, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5219778">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability investigation of LED devices for public light applicationsent://SD_ILS/0/SD_ILS:11243342026-01-22T07:20:39Z2026-01-22T07:20:39Zby Baillot, Raphael, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4822046">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability technology principles and practice of failure prevention in electronic systemsent://SD_ILS/0/SD_ILS:9751502026-01-22T07:20:39Z2026-01-22T07:20:39Zby Pascoe, Norman.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=675299">Click to View</a><br/>Format: Elektronik Kaynak<br/>Spiritüel distres ölçeği'nin Türkçe'ye uyarlanması; geçerlik ve güvenirlik çalışması = Turkish adaptation of the spiritual distress scale; validity and reliability studyent://SD_ILS/0/SD_ILS:12295562026-01-22T07:20:39Z2026-01-22T07:20:39Zby Arpa, Hilal, yazar.<br/>Format: Kitap<br/>Sağlık Bilimleri Kanıta Dayalı Uygulama Anketi'nin türkçe geçerlilik ve güvenirliği = Turkish validity and reliability of The Health Sciences Evidence-Based Practice Questionnaireent://SD_ILS/0/SD_ILS:12296122026-01-22T07:20:39Z2026-01-22T07:20:39Zby Şahin, Ayşe Nur, yazar.<br/>Format: Kitap<br/>Tıkınırcasına yeme bozukluğu tarama anketinin ((BEDS-7) Binge-eating disordes screener)) Türkçe geçerlilik ve güvenilirlil çalışması = Validity and reliability study of the binge-eating disorder screening questionnaire (BEDS-7) in Turkishent://SD_ILS/0/SD_ILS:12293852026-01-22T07:20:39Z2026-01-22T07:20:39Zby Aker, Caner, Dr., yazar.<br/>Format: Kitap<br/>The international journal of quality & reliability management. Volume 25, Number 1, Best practice project portfolio managementent://SD_ILS/0/SD_ILS:9459112026-01-22T07:20:39Z2026-01-22T07:20:39Zby Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=348641">Click to View</a><br/>Format: Elektronik Kaynak<br/>Pipelines 2010 climbing new peaks to infrastructure reliability--renew, rehab, and reinvest : proceedings of the 2010 Pipeline Division Specialty Congress, August 28-September 1, 2010, Keystone Coloradoent://SD_ILS/0/SD_ILS:10683572026-01-22T07:20:39Z2026-01-22T07:20:39Zby Pipeline Division Specialty Congress (2010 : Keystone, Colo.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3115529">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advanced reliability modeling proceedings of the 2004 Asian International Workshop (AIWARM 2004) : Hiroshima, Japan, 26-27 August 2004ent://SD_ILS/0/SD_ILS:9399662026-01-22T07:20:39Z2026-01-22T07:20:39Zby Asian International Workshop on Advanced Reliability Modeling (2004 : Hiroshima-shi, Japan)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=296055">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advanced reliability modeling II reliability testing and improvement : proceedings of the 2nd Asian International Workshop (AIWARM 2006), Busan, Korea, 24-26 August 2006ent://SD_ILS/0/SD_ILS:10309782026-01-22T07:20:39Z2026-01-22T07:20:39Zby Asian International Workshop on Advanced Reliability Modeling (2nd : 2006 : Pusan, Korea)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1681416">Click to View</a><br/>Format: Elektronik Kaynak<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:11773902026-01-22T07:20:39Z2026-01-22T07:20:39Zby Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektronik Kaynak<br/>International Conference on Structural Safety and Reliability : Smithsonian Institution Museum of History and Technology, Constitution Avenue, Washington, D.C., April 9, 10 and 11, 1969ent://SD_ILS/0/SD_ILS:11817172026-01-22T07:20:39Z2026-01-22T07:20:39Zby International Conference on Structural Safety and Reliability (1st : 1969 : Smithsonian Institution)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080165660">https://www.sciencedirect.com/science/book/9780080165660</a><br/>Format: Elektronik Kaynak<br/>Problems of mechanics in pump and compressor engineering : selected, peer reviewed papers from the XIV International Scientific and Engineering Conference on Hermetic Sealing, Vibration Reliability and Ecological Safety of Pump and Compressor Machinery (HERVICON+PUMPS 2014), September 9-12, 2014, Sumy, Ukraineent://SD_ILS/0/SD_ILS:10439472026-01-22T07:20:39Z2026-01-22T07:20:39Zby International Scientific and Engineering Conference on Hermetic Sealing, Vibration Reliability and Ecological Safety of Pump and Compressor Machinery (14th : 2014 : Sumy, Ukraine)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1910938">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advances in product development and reliability III : selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, Chinaent://SD_ILS/0/SD_ILS:10415482026-01-22T07:20:39Z2026-01-22T07:20:39Zby International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China), issuing body.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1872895">Click to View</a><br/>Format: Elektronik Kaynak<br/>Evaluation of quantification of margins and uncertainties methodology for assessing and certifying the reliability of the nuclear stockpileent://SD_ILS/0/SD_ILS:11011012026-01-22T07:20:39Z2026-01-22T07:20:39Zby National Research Council (U.S.). Committee on the Evaluation of Quantification of Margins and Uncertainties Methodology for Assessing and Certifying the Reliability of the Nuclear Stockpile.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3564163">Click to View</a><br/>Format: Elektronik Kaynak<br/>Industrial lubrication and tribology. Volume 63, Number?, Selected papers from the 3rd International Conference on Integrity, Reliability and Failure 2009ent://SD_ILS/0/SD_ILS:9765212026-01-22T07:20:39Z2026-01-22T07:20:39Zby Seabra, J. (Jorge)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=683436">Click to View</a><br/>Format: Elektronik Kaynak<br/>Safety, reliability, and applications of emerging intelligent control technologies : a postprint volume from the IFAC workshop, Hong Kong, 12-14 December 1994ent://SD_ILS/0/SD_ILS:11782862026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ng, Tung-Sang.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080423746">http://www.sciencedirect.com/science/book/9780080423746</a><br/>Format: Elektronik Kaynak<br/>Multi-scale reliability and serviceability assessment of in-service long-span bridgesent://SD_ILS/0/SD_ILS:11376382026-01-22T07:20:39Z2026-01-22T07:20:39Zby Lu, Naiwei, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5382830">Click to View</a><br/>Format: Elektronik Kaynak<br/>Konstrüksiyon elemanlarında güvenirlik (reliability) ve ömür hesapları ; teorik açıklamalar ve uygulamalarent://SD_ILS/0/SD_ILS:4891562026-01-22T07:20:39Z2026-01-22T07:20:39Zby Tahralı, Necati<br/>Format: Kitap<br/>Reliability theory and models : stochastic failure models, optimal maintenance policies, life testing, and structuresent://SD_ILS/0/SD_ILS:11776332026-01-22T07:20:39Z2026-01-22T07:20:39Zby Abdel-Hameed, Mohamed S.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780120414208">https://www.sciencedirect.com/science/book/9780120414208</a><br/>Format: Elektronik Kaynak<br/>Reliability issues for DoD systems report of a workshopent://SD_ILS/0/SD_ILS:10827242026-01-22T07:20:39Z2026-01-22T07:20:39Zby Samaniego, Francisco.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3375321">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of safety-critical systems : theory and applicationent://SD_ILS/0/SD_ILS:10276452026-01-22T07:20:39Z2026-01-22T07:20:39Zby Rausand, Marvin.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1637653">Click to View</a><br/>Format: Elektronik Kaynak<br/>Improving product reliability and software quality : strategies, tools, process and implementationent://SD_ILS/0/SD_ILS:11456872026-01-22T07:20:39Z2026-01-22T07:20:39Zby Levin, Mark, 1959- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5741218">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11244862026-01-22T07:20:39Z2026-01-22T07:20:39Zby Smith, David J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4825735">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability engineering and risk analysis : a practical guideent://SD_ILS/0/SD_ILS:11381572026-01-22T07:20:39Z2026-01-22T07:20:39Zby Modarres, M. (Mohammad), author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5400700">Click to View</a><br/>Format: Elektronik Kaynak<br/>Gas and oil reliability engineering : modeling and analysisent://SD_ILS/0/SD_ILS:11113622026-01-22T07:20:39Z2026-01-22T07:20:39Zby Calixto, Eduardo, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4526461">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthdayent://SD_ILS/0/SD_ILS:10268912026-01-22T07:20:39Z2026-01-22T07:20:39Zby Nakamura, Syouji.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1611972">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability prediction from burn-in data fit to reliability modelsent://SD_ILS/0/SD_ILS:10283592026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bernstein, Joseph B., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1647477">Click to View</a><br/>Format: Elektronik Kaynak<br/>Practical reliability engineering and analysis for system design and life-cycle sustainmentent://SD_ILS/0/SD_ILS:9636322026-01-22T07:20:39Z2026-01-22T07:20:39Zby Wessels, William R.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=533784">Click to View</a><br/>Format: Elektronik Kaynak<br/>The OEE primer : understanding overall equipment effectiveness, reliability, and maintainabilityent://SD_ILS/0/SD_ILS:973522026-01-22T07:20:39Z2026-01-22T07:20:39Zby Stamatis, D.H.<br/>Format: Kitap<br/>Robust design methodology for reliability exploring the effects of variation and uncertaintyent://SD_ILS/0/SD_ILS:9558972026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bergman, Bo, 1943-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=454321">Click to View</a><br/>Format: Elektronik Kaynak<br/>HALT, HASS, and HASA explained : accelerated reliability techniquesent://SD_ILS/0/SD_ILS:10553092026-01-22T07:20:39Z2026-01-22T07:20:39Zby McLean, Harry W., 1946- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002645">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:9353752026-01-22T07:20:39Z2026-01-22T07:20:39Zby Smith, David John, 1943-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=269666">Click to View</a><br/>Format: Elektronik Kaynak<br/>World class reliability using Multiple Environment Overstress Tests to make it happenent://SD_ILS/0/SD_ILS:9329232026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bhote, Keki R., 1925-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=243100">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability, and supportability : best practices for systems engineersent://SD_ILS/0/SD_ILS:10431672026-01-22T07:20:39Z2026-01-22T07:20:39Zby Tortorella, Michael, 1947- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1896020">Click to View</a><br/>Format: Elektronik Kaynak<br/>Gas and oil reliability engineering modeling and analysisent://SD_ILS/0/SD_ILS:10016802026-01-22T07:20:39Z2026-01-22T07:20:39Zby Calixto, Eduardo.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1032940">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:9805752026-01-22T07:20:39Z2026-01-22T07:20:39Zby Smith, David J.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=730199">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, maintainability and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:11878352026-01-22T07:20:39Z2026-01-22T07:20:39Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format: Elektronik Kaynak<br/>Reliability, Maintainability and Risk 8e Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:1372392026-01-22T07:20:39Z2026-01-22T07:20:39Zby Smith, David J.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektronik Kaynak<br/>Reliability, Maintainability and Risk : Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:11838532026-01-22T07:20:39Z2026-01-22T07:20:39Zby Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080969022">https://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektronik Kaynak<br/>Importance measures in reliability, risk, and optimization principles and applicationsent://SD_ILS/0/SD_ILS:9944472026-01-22T07:20:39Z2026-01-22T07:20:39Zby Kuo, Way, 1951-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=912160">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk-based reliability analysis and generic principles for risk reductionent://SD_ILS/0/SD_ILS:11856452026-01-22T07:20:39Z2026-01-22T07:20:39Zby Todinov, M. T.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Elektronik Kaynak<br/>Reliability of MEMS testing of materials and devicesent://SD_ILS/0/SD_ILS:9609892026-01-22T07:20:39Z2026-01-22T07:20:39Zby Tabata, Osamu.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=481344">Click to View</a><br/>Format: Elektronik Kaynak<br/>Spacecraft reliability and multi-state failures a statistical approachent://SD_ILS/0/SD_ILS:9784342026-01-22T07:20:39Z2026-01-22T07:20:39Zby Saleh, Joseph H., 1971-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=697462">Click to View</a><br/>Format: Elektronik Kaynak<br/>Statistical theory of reliability and life testing : probability modelsent://SD_ILS/0/SD_ILS:6701822026-01-22T07:20:39Z2026-01-22T07:20:39Zby Barlow, Richard E.<br/>Format: Kitap<br/>Reliability analysis for asset management of electric power gridsent://SD_ILS/0/SD_ILS:11441452026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ross, Robert D., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630246">Click to View</a><br/>Format: Elektronik Kaynak<br/>Corporate communications. Volume 23, Number 2, An International Journal : Communicating/Organizing for Reliability, Resilience, and Safetyent://SD_ILS/0/SD_ILS:11373142026-01-22T07:20:39Z2026-01-22T07:20:39Zby Barbour, Joshua B., editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5351422">Click to View</a><br/>Format: Elektronik Kaynak<br/>Semi-Markov processes : applications in system reliability and maintenanceent://SD_ILS/0/SD_ILS:10381822026-01-22T07:20:39Z2026-01-22T07:20:39Zby Grabski, Franciszek, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1798310">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probability, statistics, and reliability for engineers and scientistsent://SD_ILS/0/SD_ILS:10272312026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ayyub, Bilal M., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1631123">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessmentent://SD_ILS/0/SD_ILS:11279302026-01-22T07:20:39Z2026-01-22T07:20:39Zby Modarres, M. (Mohammad), author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4901681">Click to View</a><br/>Format: Elektronik Kaynak<br/>Binary decision diagrams and extensions for system reliability analysisent://SD_ILS/0/SD_ILS:11032282026-01-22T07:20:39Z2026-01-22T07:20:39Zby Xing, Liudong, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4041105">Click to View</a><br/>Format: Elektronik Kaynak<br/>Oxide reliability a summary of silicon oxide wearout, breakdown, and reliabilityent://SD_ILS/0/SD_ILS:10303252026-01-22T07:20:39Z2026-01-22T07:20:39Zby Dumin, D. J.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679439">Click to View</a><br/>Format: Elektronik Kaynak<br/>Mathematical models for the study of the reliability of systemsent://SD_ILS/0/SD_ILS:11907132026-01-22T07:20:39Z2026-01-22T07:20:39Zby Kaufmann, A. (Arnold), 1911-1994.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780124023703">https://www.sciencedirect.com/science/book/9780124023703</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/publication?issn=00765392&volume=124">https://www.sciencedirect.com/science/publication?issn=00765392&volume=124</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/bookseries/00765392/124">https://www.sciencedirect.com/science/bookseries/00765392/124</a><br/>Format: Elektronik Kaynak<br/>Reliability in computing : the role of interval methods in scientific computingent://SD_ILS/0/SD_ILS:11759752026-01-22T07:20:39Z2026-01-22T07:20:39Zby Moore, Ramon E.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780125056304">https://www.sciencedirect.com/science/book/9780125056304</a><br/>Format: Elektronik Kaynak<br/>General principles : general principles on quality assurance for structures : general principles on reliability for structural design : reportent://SD_ILS/0/SD_ILS:11703082026-01-22T07:20:39Z2026-01-22T07:20:39Zby Joint Committee on Structural Safety.<br/>Format: Kitap<br/>Statistical models and methods for reliability and survival analysisent://SD_ILS/0/SD_ILS:10243132026-01-22T07:20:39Z2026-01-22T07:20:39Zby Couallier, Vincent.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1580028">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applicationsent://SD_ILS/0/SD_ILS:10155422026-01-22T07:20:39Z2026-01-22T07:20:39Zby Wu, Bin.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1222589">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:11844892026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ohring, Milton, 1936-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format: Elektronik Kaynak<br/>Software reliability : measurement, prediction, application / John D. Musa, Anthony Iannino, Kazuhira Okumoto.ent://SD_ILS/0/SD_ILS:9185242026-01-22T07:20:39Z2026-01-22T07:20:39Zby Musa, John D.<br/>Format: Kitap<br/>Fundamentals of reliability engineering : applications in multistage interconnection networksent://SD_ILS/0/SD_ILS:10279372026-01-22T07:20:39Z2026-01-22T07:20:39Zby Gunawan, Indra, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1641079">Click to View</a><br/>Format: Elektronik Kaynak<br/>Semi-Markov chains and hidden semi-Markov models toward applications their use in reliability and DNA analysisent://SD_ILS/0/SD_ILS:9501292026-01-22T07:20:39Z2026-01-22T07:20:39Zby Barbu, Vlad Stefan.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=417305">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fault injection techniques and tools for embedded systems reliability evaluationent://SD_ILS/0/SD_ILS:10625312026-01-22T07:20:39Z2026-01-22T07:20:39Zby Benso, Alfredo.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3036042">Click to View</a><br/>Format: Elektronik Kaynak<br/>Probabilistic safety assessment for optimum nuclear power plant life management (PLiM) theory and application of reliability analysis methods for major power plant componentsent://SD_ILS/0/SD_ILS:10239402026-01-22T07:20:39Z2026-01-22T07:20:39Zby Arkadov, Gennadij V.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1575572">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability Design of Mechanical Systems A Guide for Mechanical and Civil Engineersent://SD_ILS/0/SD_ILS:4809402026-01-22T07:20:39Z2026-01-22T07:20:39Zby Woo, Seongwoo. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-50829-0">http://dx.doi.org/10.1007/978-3-319-50829-0</a><br/>Format: Elektronik Kaynak<br/>Engineering maintainability : how to design for reliability and easy maintenanceent://SD_ILS/0/SD_ILS:11851692026-01-22T07:20:39Z2026-01-22T07:20:39Zby Dhillon, B. S. (Balbir S.), 1947-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152576">http://www.sciencedirect.com/science/book/9780884152576</a><br/>Format: Elektronik Kaynak<br/>Theory and Practice of Quality and Reliability Engineering in Asia Industryent://SD_ILS/0/SD_ILS:4817212026-01-22T07:20:39Z2026-01-22T07:20:39Zby Tan, Cher Ming. editor.<br/><a href="http://dx.doi.org/10.1007/978-981-10-3290-5">http://dx.doi.org/10.1007/978-981-10-3290-5</a><br/>Format: Elektronik Kaynak<br/>Reliability and Risk Evaluation of Wind Integrated Power Systemsent://SD_ILS/0/SD_ILS:1405572026-01-22T07:20:39Z2026-01-22T07:20:39Zby Billinton, Roy. editor.<br/><a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format: Elektronik Kaynak<br/>Process risk and reliability management : operational integrity managementent://SD_ILS/0/SD_ILS:11784322026-01-22T07:20:39Z2026-01-22T07:20:39Zby Sutton, Ian S.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format: Elektronik Kaynak<br/>Measures of response reliability in 1988 household labour force survey for Ankaraent://SD_ILS/0/SD_ILS:768492026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bilge, Hüsniye<br/>Format: Kitap<br/>Goal oriented methodology and applications in nuclear power plants : a modern systems reliability approachent://SD_ILS/0/SD_ILS:11487402026-01-22T07:20:39Z2026-01-22T07:20:39Zby Xiao-Jian, Yi, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5969498">Click to View</a><br/>Format: Elektronik Kaynak<br/>Mastering selenium webdriver 3.0 : boost the performance and reliability of your automated checks by mastering Selenium WebDriver.ent://SD_ILS/0/SD_ILS:11404512026-01-22T07:20:39Z2026-01-22T07:20:39Zby Collin, Mark, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5446029">Click to View</a><br/>Format: Elektronik Kaynak<br/>Firearm and toolmark identification : the scientific reliability of the forensic science disciplineent://SD_ILS/0/SD_ILS:11406762026-01-22T07:20:39Z2026-01-22T07:20:39Zby Nichols, Ronald, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5455401">Click to View</a><br/>Format: Elektronik Kaynak<br/>Solid oxide fuel cell lifetime and reliability : critical challenges in fuel cellsent://SD_ILS/0/SD_ILS:11265972026-01-22T07:20:39Z2026-01-22T07:20:39Zby Brandon, Nigel P., editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4865436">Click to View</a><br/>Format: Elektronik Kaynak<br/>Numerical methods of simulation and optimization of piecewise deterministic Markov processes : application to reliabilityent://SD_ILS/0/SD_ILS:11047542026-01-22T07:20:39Z2026-01-22T07:20:39Zby Saporta, Benoîte de, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4205869">Click to View</a><br/>Format: Elektronik Kaynak<br/>Simulation of stochastic processes with given accuracy and reliabilityent://SD_ILS/0/SD_ILS:11208622026-01-22T07:20:39Z2026-01-22T07:20:39Zby Kozachenko, Yuriy, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4747211">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability, robustness and failure mechanisms of led devices : methodology and evaluationent://SD_ILS/0/SD_ILS:11196022026-01-22T07:20:39Z2026-01-22T07:20:39Zby Deshayes, Yannick, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4717207">Click to View</a><br/>Format: Elektronik Kaynak<br/>Embedded mechatronic systems. Volume 1, Analysis of failures, predictive reliabilityent://SD_ILS/0/SD_ILS:10519342026-01-22T07:20:39Z2026-01-22T07:20:39Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=2086747">Click to View</a><br/>Format: Elektronik Kaynak<br/>Designing for human reliability : human factors engineering in the oil, gas, and process industriesent://SD_ILS/0/SD_ILS:10469492026-01-22T07:20:39Z2026-01-22T07:20:39Zby McLeod, Ronald W. , author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=2000913">Click to View</a><br/>Format: Elektronik Kaynak<br/>Flow networks analysis and optimization of repairable flow networks, networks with disturbed flows, static flow networks and reliability networksent://SD_ILS/0/SD_ILS:10075062026-01-22T07:20:39Z2026-01-22T07:20:39Zby Todinov, Michael T.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1114626">Click to View</a><br/>Format: Elektronik Kaynak<br/>Electric utility resource planning economics, reliability, and decision-makingent://SD_ILS/0/SD_ILS:9874722026-01-22T07:20:39Z2026-01-22T07:20:39Zby Sim, Steven.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=826969">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fault tolerant drive by wire systems impact on vehicle safety and reliabilityent://SD_ILS/0/SD_ILS:9985582026-01-22T07:20:39Z2026-01-22T07:20:39Zby Anwar, Sohel.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=976620">Click to View</a><br/>Format: Elektronik Kaynak<br/>The cost of being landlocked logistics, costs, and supply chain reliabilityent://SD_ILS/0/SD_ILS:9686422026-01-22T07:20:39Z2026-01-22T07:20:39Zby Arvis, Jean-François, 1960-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=589796">Click to View</a><br/>Format: Elektronik Kaynak<br/>Axiomatic quality integrating axiomatic design with six-sigma, reliability, and quality engineeringent://SD_ILS/0/SD_ILS:9309382026-01-22T07:20:39Z2026-01-22T07:20:39Zby El-Haik, Basem.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=227550">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability and validity of the Turkish version of the service quality assessment scaleent://SD_ILS/0/SD_ILS:846902026-01-22T07:20:39Z2026-01-22T07:20:39Zby Gürbüz, Bülent<br/>Format: Kitap<br/>Ecology, engineering, and management reconciling ecosystem rehabilitation and service reliabilityent://SD_ILS/0/SD_ILS:9506762026-01-22T07:20:39Z2026-01-22T07:20:39Zby Eeten, Michel van.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=422475">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability of medicare hospital discharge records report of a studyent://SD_ILS/0/SD_ILS:10848512026-01-22T07:20:39Z2026-01-22T07:20:39Zby Institute of Medicine (U.S.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3377596">Click to View</a><br/>Format: Elektronik Kaynak<br/>Electricity access in Sub-Saharan Africa : uptake, reliability, and complementary factors for economic impact, Moussa P. Blimpo and Malcolm Cosgrove-Davies.ent://SD_ILS/0/SD_ILS:11453922026-01-22T07:20:39Z2026-01-22T07:20:39Zby Blimpo, Moussa P., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5725963">Click to View</a><br/>Format: Elektronik Kaynak<br/>A big data analytics approach to quality, reliability and risk managementent://SD_ILS/0/SD_ILS:11456102026-01-22T07:20:39Z2026-01-22T07:20:39Zby Mazzuto, Giovanni, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5734581">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk and reliability in structural engineering : theoretical basisent://SD_ILS/0/SD_ILS:11465922026-01-22T07:20:39Z2026-01-22T07:20:39Zby Lu, Naiwei, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5780563">Click to View</a><br/>Format: Elektronik Kaynak<br/>Durability and reliability of polymers and other materials in photovoltaic modulesent://SD_ILS/0/SD_ILS:11468702026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bruckman, Laura, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5788821">Click to View</a><br/>Format: Elektronik Kaynak<br/>Bioelectronics and medical devices : from materials to devices - fabrication, applications and reliabilityent://SD_ILS/0/SD_ILS:11470392026-01-22T07:20:39Z2026-01-22T07:20:39Zby Pal, Kunal, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5796374">Click to View</a><br/>Format: Elektronik Kaynak<br/>Wide bandgap power semiconductor packaging : materials, components, and reliabilityent://SD_ILS/0/SD_ILS:11382432026-01-22T07:20:39Z2026-01-22T07:20:39Zby Suganuma, Katsuaki, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5404290">Click to View</a><br/>Format: Elektronik Kaynak<br/>Security, privacy and reliability in computer communications and networksent://SD_ILS/0/SD_ILS:11217842026-01-22T07:20:39Z2026-01-22T07:20:39Zby Sha, Kewei, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4771355">Click to View</a><br/>Format: Elektronik Kaynak<br/>Stochastic models in survival analysis and reliability set. Volume 1, Reliability of engineering systems and technological riskent://SD_ILS/0/SD_ILS:11152762026-01-22T07:20:39Z2026-01-22T07:20:39Zby Rykov, Vladimir, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4648726">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability assurance of big data in the cloud : cost-effective replication-based storageent://SD_ILS/0/SD_ILS:10425632026-01-22T07:20:39Z2026-01-22T07:20:39Zby Yang, Yun, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1888753">Click to View</a><br/>Format: Elektronik Kaynak<br/>Quality and reliability aspects in nuclear power reactor fuel engineeringent://SD_ILS/0/SD_ILS:11258542026-01-22T07:20:39Z2026-01-22T07:20:39Zby International Atomic Energy Agency.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4853266">Click to View</a><br/>Format: Elektronik Kaynak<br/>Reliability in cognitive neuroscience a meta-meta-analysisent://SD_ILS/0/SD_ILS:10821022026-01-22T07:20:39Z2026-01-22T07:20:39Zby Uttal, William R.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3339523">Click to View</a><br/>Format: Elektronik Kaynak<br/>Assessing the reliability of complex models mathematical and statistical foundations of verification, validation, and uncertainty quantificationent://SD_ILS/0/SD_ILS:10861332026-01-22T07:20:39Z2026-01-22T07:20:39Zby National Research Council (U.S.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3378995">Click to View</a><br/>Format: Elektronik Kaynak<br/>Using the Weibull distribution reliability, modeling, and inferenceent://SD_ILS/0/SD_ILS:9933922026-01-22T07:20:39Z2026-01-22T07:20:39Zby McCool, John, 1936-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=894399">Click to View</a><br/>Format: Elektronik Kaynak<br/>Recent advances in providing QoS and reliability in the future Internet backboneent://SD_ILS/0/SD_ILS:10591222026-01-22T07:20:39Z2026-01-22T07:20:39Zby Wang, Ning, 1974-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3018661">Click to View</a><br/>Format: Elektronik Kaynak<br/>Microsoft SQL Server 2008 high availability minimize downtime, speed up recovery, and achieve the highest level of availability and reliability for SQL server applications by mastering the concepts of database mirroring, log shipping, clustering, and replicationent://SD_ILS/0/SD_ILS:9968422026-01-22T07:20:39Z2026-01-22T07:20:39Zby Goswami, Hemantgiri S.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=948566">Click to View</a><br/>Format: Elektronik Kaynak<br/>Equipment management workbook key to equipment reliability and productivity in miningent://SD_ILS/0/SD_ILS:9734122026-01-22T07:20:39Z2026-01-22T07:20:39Zby Tomlingson, Paul D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=655785">Click to View</a><br/>Format: Elektronik Kaynak<br/>Equipment management key to equipment reliability and productivity in miningent://SD_ILS/0/SD_ILS:9573092026-01-22T07:20:39Z2026-01-22T07:20:39Zby Tomlingson, Paul D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=464572">Click to View</a><br/>Format: Elektronik Kaynak<br/>Safety and reliability in cooperating unmanned aerial systemsent://SD_ILS/0/SD_ILS:9807482026-01-22T07:20:39Z2026-01-22T07:20:39Zby Rabbath, Camille Alain, 1969-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=731173">Click to View</a><br/>Format: Elektronik Kaynak<br/>Advanced manufacturing process, lead free interconnect materials and reliability modeling for electronics packagingent://SD_ILS/0/SD_ILS:9350502026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bailey, Christopher.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=267393">Click to View</a><br/>Format: Elektronik Kaynak<br/>Risk, reliability, uncertainty, and robustness of water resources systemsent://SD_ILS/0/SD_ILS:9290212026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bogárdi, János.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=201907">Click to View</a><br/>Format: Elektronik Kaynak<br/>Digital instrumentation and control systems in nuclear power plants safety and reliability issues : final reportent://SD_ILS/0/SD_ILS:10830752026-01-22T07:20:39Z2026-01-22T07:20:39Zby National Research Council (U.S.). Committee on Application of Digital Instrumentation and Control Systems to Nuclear Power Plant Operations and Safety.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3375677">Click to View</a><br/>Format: Elektronik Kaynak<br/>On the Historical Reliability of Ancient Biographies: A thorough Examination of Xenophon's Agesilaus, Cornelius Nepos's Atticus, Tacitus's Agricola, and The Gospel According to Johnent://SD_ILS/0/SD_ILS:7014422026-01-22T07:20:39Z2026-01-22T07:20:39Zby Wright, Edward T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13815012">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13815012</a><br/>Format: Kitap<br/>Inter-rater reliability of the structured assessment of violence risk in youth (savry) amongst mental health professionalsent://SD_ILS/0/SD_ILS:7075042026-01-22T07:20:39Z2026-01-22T07:20:39Zby Selby, Sarah Elizabeth, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13876017">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13876017</a><br/>Format: Kitap<br/>Scheduling event-triggered and time-triggered applications with optimal reliability and predictability on networked multi-core chipsent://SD_ILS/0/SD_ILS:6855612026-01-22T07:20:39Z2026-01-22T07:20:39Zby Murshed, Ayman, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10869403">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10869403</a><br/>Format: Kitap<br/>The Implications of the Internet's Topological Structure for Its Efficiency, Security, and Reliabilityent://SD_ILS/0/SD_ILS:6989362026-01-22T07:20:39Z2026-01-22T07:20:39Zby Nur, Abdullah Yasin, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10980025">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10980025</a><br/>Format: Kitap<br/>Assessing the Reliability of the 1760 British Geographical Survey of the St. Lawrence River Valleyent://SD_ILS/0/SD_ILS:6991232026-01-22T07:20:39Z2026-01-22T07:20:39Zby Gliserman, Nicholas, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11016107">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11016107</a><br/>Format: Kitap<br/>The Reliability of Simultaneous Quantitative 3D Analysis of Bone and Soft Tissue Volumesent://SD_ILS/0/SD_ILS:6992632026-01-22T07:20:39Z2026-01-22T07:20:39Zby Mehryar, Paymon, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11017007">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11017007</a><br/>Format: Kitap<br/>Development and Evaluation of a Prototype Travel Time Reliability Monitoring System for Freeway Facilities in North Carolinaent://SD_ILS/0/SD_ILS:6993822026-01-22T07:20:39Z2026-01-22T07:20:39Zby Smith, Russell Charles, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11018101">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11018101</a><br/>Format: Kitap<br/>Performance-Based Economical Seismic Design of Multistory Reinforced Concrete Frame Buildings and Reliability Assessmentent://SD_ILS/0/SD_ILS:6997182026-01-22T07:20:39Z2026-01-22T07:20:39Zby Zhang, Chunyu, author. (orcid)0000-0002-1073-1902<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13424086">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13424086</a><br/>Format: Kitap<br/>Characterization of Self-Heating Effects and Assessment of Its Impact on Reliability in FinFET Technologyent://SD_ILS/0/SD_ILS:6996352026-01-22T07:20:39Z2026-01-22T07:20:39Zby Paliwoda, Peter Christopher, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13423034">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13423034</a><br/>Format: Kitap<br/>Reliability and Validity of the Active-mini for Quantifying Movement in Infants with Spinal Muscular Atrophyent://SD_ILS/0/SD_ILS:7017292026-01-22T07:20:39Z2026-01-22T07:20:39Zby Nelson, Leslie, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13846799">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13846799</a><br/>Format: Kitap<br/>Control of Wind Power Systems for Energy Efficiency and Reliabilityent://SD_ILS/0/SD_ILS:7017672026-01-22T07:20:39Z2026-01-22T07:20:39Zby Xiao, Yan, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13849196">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13849196</a><br/>Format: Kitap<br/>Reliability Assessment of a System Integrity Protection Scheme for Transmission Networksent://SD_ILS/0/SD_ILS:7026762026-01-22T07:20:39Z2026-01-22T07:20:39Zby Liu, Nan, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870347">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870347</a><br/>Format: Kitap<br/>On Grid Converter Reliability: Preserving the Life of Power Electronics Through Active Thermal Boundary Controlent://SD_ILS/0/SD_ILS:7037072026-01-22T07:20:39Z2026-01-22T07:20:39Zby Lewis, Patrick T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872130">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872130</a><br/>Format: Kitap<br/>Efficient reliability modelling & analysis of complex systems with application to nuclear power plant safetyent://SD_ILS/0/SD_ILS:7043572026-01-22T07:20:39Z2026-01-22T07:20:39Zby George-Williams, H., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872865">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872865</a><br/>Format: Kitap<br/>Energy saving and reliability of wireless body area networks for health applicationsent://SD_ILS/0/SD_ILS:7045662026-01-22T07:20:39Z2026-01-22T07:20:39Zby Alshaheen, H. S. S., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873074">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873074</a><br/>Format: Kitap<br/>Calibration of expensive computer models using engineering reliability methodsent://SD_ILS/0/SD_ILS:7050082026-01-22T07:20:39Z2026-01-22T07:20:39Zby Gong, Zitong, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873517">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873517</a><br/>Format: Kitap<br/>Stochastic methods for emulation, calibration and reliability analysis of engineering modelsent://SD_ILS/0/SD_ILS:7057362026-01-22T07:20:39Z2026-01-22T07:20:39Zby Garbuno Inigo, A., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13874246">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13874246</a><br/>Format: Kitap<br/>Reliability analysis for small wind turbines using bayesian hierarchical modellingent://SD_ILS/0/SD_ILS:7066022026-01-22T07:20:39Z2026-01-22T07:20:39Zby Wu, JenHao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13875114">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13875114</a><br/>Format: Kitap<br/>Advancements in Evaluating Reliability of Nondestructive Technologies for the Detection of Subsurface Fracture Damage in R.C. Bridge Decksent://SD_ILS/0/SD_ILS:7026012026-01-22T07:20:39Z2026-01-22T07:20:39Zby Sultan, Ali Abed, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870026">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870026</a><br/>Format: Kitap<br/>Evaluation of Factors Influencing Los Angeles Tiered-Dispatch System's Improvement on Bystander CPR Rate and Inter Reliability between Electronic Patient Care Report (ePCR) and 911 Call Review on Bystander CPR Rateent://SD_ILS/0/SD_ILS:6982772026-01-22T07:20:39Z2026-01-22T07:20:39Zby Zhang, Huihui, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10801261">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10801261</a><br/>Format: Kitap<br/>Target Levels of Reliability for Design of Bridge Foundations and Approach Embankments Using LRFDent://SD_ILS/0/SD_ILS:7025722026-01-22T07:20:39Z2026-01-22T07:20:39Zby Huaco, Daniel R., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13869883">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13869883</a><br/>Format: Kitap<br/>Modeling and simulation for microelectronic packaging assembly manufacturing, reliability and testingent://SD_ILS/0/SD_ILS:9867042026-01-22T07:20:39Z2026-01-22T07:20:39Zby Liu, S. (Sheng), 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=818629">Click to View</a><br/>Format: Elektronik Kaynak<br/>The evolution of animal communication reliability and deception in signaling systemsent://SD_ILS/0/SD_ILS:9614422026-01-22T07:20:39Z2026-01-22T07:20:39Zby Searcy, William A., 1950-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=485769">Click to View</a><br/>Format: Elektronik Kaynak<br/>Adhesives technology for electronic applications : materials, processes, reliabilityent://SD_ILS/0/SD_ILS:11900162026-01-22T07:20:39Z2026-01-22T07:20:39Zby Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515135">http://www.sciencedirect.com/science/book/9780815515135</a><br/>Format: Elektronik Kaynak<br/>Graph theory in modern engineering : computer aided design, control, optimization, reliability analysisent://SD_ILS/0/SD_ILS:11908862026-01-22T07:20:39Z2026-01-22T07:20:39Zby Henley, Ernest J.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780123408501">https://www.sciencedirect.com/science/book/9780123408501</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/publication?issn=00765392&volume=98">https://www.sciencedirect.com/science/publication?issn=00765392&volume=98</a>
ScienceDirect <a href="https://www.sciencedirect.com/science/bookseries/00765392/98">https://www.sciencedirect.com/science/bookseries/00765392/98</a><br/>Format: Elektronik Kaynak<br/>The Reliability of Symphony Link in Emergency Scenariosent://SD_ILS/0/SD_ILS:6896642026-01-22T07:20:39Z2026-01-22T07:20:39Zby Larson, Anna, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10786579">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10786579</a><br/>Format: Kitap<br/>Reliability of Highly Stretchable Flexible Electronic Interconnects and Surface Improvement of DMLS Printed Partsent://SD_ILS/0/SD_ILS:6932992026-01-22T07:20:39Z2026-01-22T07:20:39Zby Zachariah, Ashwin Varkey, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10816881">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10816881</a><br/>Format: Kitap<br/>Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliabilityent://SD_ILS/0/SD_ILS:1375512026-01-22T07:20:39Z2026-01-22T07:20:39Zby Levinson, David M.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format: Elektronik Kaynak<br/>Applications of Bayesian Hierarchical Models in Gene Expression and Product Reliabilityent://SD_ILS/0/SD_ILS:6781492026-01-22T07:20:39Z2026-01-22T07:20:39Zby Mittman, Eric T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10688357">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10688357</a><br/>Format: Kitap<br/>Reliability and Resiliency Driven Solutions for Electric Power Systems Operation and Planningent://SD_ILS/0/SD_ILS:6784832026-01-22T07:20:39Z2026-01-22T07:20:39Zby Sedzro, Kwami Senam A., author. (orcid)0000-0002-2107-8662<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748235">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748235</a><br/>Format: Kitap<br/>Canadian Matrimonial Litigation Requires Reliability Testing for Unaudited Financial Statementsent://SD_ILS/0/SD_ILS:6808722026-01-22T07:20:39Z2026-01-22T07:20:39Zby Mailloux, Athena, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812640">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812640</a><br/>Format: Kitap<br/>Reliability of Phenotype Estimation and Extended Classification of Ancestry for Forensic Applicationsent://SD_ILS/0/SD_ILS:6923982026-01-22T07:20:39Z2026-01-22T07:20:39Zby Weisz, Naomi A., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10813495">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10813495</a><br/>Format: Kitap<br/>Test-Retest Reliability of TRIMP and Training Effect in Collegiate Icehockey Playersent://SD_ILS/0/SD_ILS:6925302026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ulmer, Jason, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10814025">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10814025</a><br/>Format: Kitap<br/>The Effect of Overloading on Reliability of Wheel Loader Structural Componentsent://SD_ILS/0/SD_ILS:6882532026-01-22T07:20:39Z2026-01-22T07:20:39Zby Achelpohl, Eric Raymond, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10689117">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10689117</a><br/>Format: Kitap<br/>Reliability Evaluation and Improvement Based on Operational Failure Rate of Power Electronics in Islanded Microgrident://SD_ILS/0/SD_ILS:6930542026-01-22T07:20:39Z2026-01-22T07:20:39Zby Zhong, Wen, author. (orcid)0000-0002-5262-5067<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815889">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815889</a><br/>Format: Kitap<br/>Comparing Offender Characteristics in a Sample of Oklahoma Sexual Assault Cases with Population Demographics in Oklahoma: A Study of the Reliability of a Statistical Profiling Methodologyent://SD_ILS/0/SD_ILS:6881702026-01-22T07:20:39Z2026-01-22T07:20:39Zby Moses, Caitlin, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10685854">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10685854</a><br/>Format: Kitap<br/>Reliability and Security in Low Power Circuits and Systemsent://SD_ILS/0/SD_ILS:6875362026-01-22T07:20:39Z2026-01-22T07:20:39Zby Geng, Hui, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10186967">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10186967</a><br/>Format: Kitap<br/>Adhesives technology for electronic applications : materials, processing, reliabilityent://SD_ILS/0/SD_ILS:11838012026-01-22T07:20:39Z2026-01-22T07:20:39Zby Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format: Elektronik Kaynak<br/>Evaluating the reliability of emergency response systems for large-scale incident operationsent://SD_ILS/0/SD_ILS:9707202026-01-22T07:20:39Z2026-01-22T07:20:39Zby Jackson, Brian A., 1972-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=618726">Click to View</a><br/>Format: Elektronik Kaynak<br/>The delivery reliability of UK manufacturing plants: An empirical studyent://SD_ILS/0/SD_ILS:6831692026-01-22T07:20:39Z2026-01-22T07:20:39Zby Szwejczewski, Marek Gregory, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10832263">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10832263</a><br/>Format: Kitap<br/>Geographic Routing Reliability Enhancement in Urban Vehicular Ad Hoc Networksent://SD_ILS/0/SD_ILS:6808922026-01-22T07:20:39Z2026-01-22T07:20:39Zby Alzamzami, Ohoud, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812787">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812787</a><br/>Format: Kitap<br/>Novel Methods for Improving Performance and Reliability of Flash-Based Solid State Storage Systement://SD_ILS/0/SD_ILS:6963602026-01-22T07:20:39Z2026-01-22T07:20:39Zby Guo, Jiayang, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10891703">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10891703</a><br/>Format: Kitap<br/>Conditional Standard Errors of Measurement, Confidence Interval, and Reliability for Individual Level Student Growth Percentilesent://SD_ILS/0/SD_ILS:6880032026-01-22T07:20:39Z2026-01-22T07:20:39Zby Choi, Jinah, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10637021">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10637021</a><br/>Format: Kitap<br/>Assessing the Validity and Reliability of Computer-based Case Simulations in a Nurse Anesthesia Specialtyent://SD_ILS/0/SD_ILS:6885062026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ward, Robyn Camille, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10746481">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10746481</a><br/>Format: Kitap<br/>Counsel Confidently: Reliability of Bedside Estimated Fetal Weight to Predict Survival at Periviabilityent://SD_ILS/0/SD_ILS:6886782026-01-22T07:20:39Z2026-01-22T07:20:39Zby Krenitsky, Nicole M., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748282">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748282</a><br/>Format: Kitap<br/>Inter-rater Reliability of Physical Abuse Determinations and Abusive Fracture Incidence at a Level 1 Pediatric Trauma Centerent://SD_ILS/0/SD_ILS:6887912026-01-22T07:20:39Z2026-01-22T07:20:39Zby Buesser, Katherine Elizabeth, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10749089">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10749089</a><br/>Format: Kitap<br/>Task Relevant Source Based Brain Computer Interface: Exploration of Independent Component Analysis Based Spatial Filtering with Reliabilityent://SD_ILS/0/SD_ILS:6940382026-01-22T07:20:39Z2026-01-22T07:20:39Zby Cheema, Maninderpal Singh, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823332">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823332</a><br/>Format: Kitap<br/>Coating materials for electronic applications : polymers, processes, reliability, testingent://SD_ILS/0/SD_ILS:11900182026-01-22T07:20:39Z2026-01-22T07:20:39Zby Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815514923">http://www.sciencedirect.com/science/book/9780815514923</a><br/>Format: Elektronik Kaynak<br/>Human reliability : analysis, prediction, and prevention of human errorsent://SD_ILS/0/SD_ILS:11818202026-01-22T07:20:39Z2026-01-22T07:20:39Zby Park, Kyung S. (Kyung Soo)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780444427274">https://www.sciencedirect.com/science/book/9780444427274</a><br/>Format: Elektronik Kaynak<br/>The elasto-plastic buckling strength of imperfect hemispheres and their reliabilityent://SD_ILS/0/SD_ILS:6848632026-01-22T07:20:39Z2026-01-22T07:20:39Zby Shao, Wen Jiao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10868287">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10868287</a><br/>Format: Kitap<br/>Opto-Electro-Thermal Approach to Modeling Photovoltaic Performance and Reliability from Cell to Moduleent://SD_ILS/0/SD_ILS:6784262026-01-22T07:20:39Z2026-01-22T07:20:39Zby Sun, Xingshu, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10747508">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10747508</a><br/>Format: Kitap<br/>Reliability Modeling, Testing and Optimization of Systems with Mixtures of One-Shot Unitsent://SD_ILS/0/SD_ILS:6872652026-01-22T07:20:39Z2026-01-22T07:20:39Zby Cheng, Yao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902001">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902001</a><br/>Format: Kitap<br/>Automated Runtime Data Analysis for System Reliability Managementent://SD_ILS/0/SD_ILS:6873212026-01-22T07:20:39Z2026-01-22T07:20:39Zby He, Pinjia, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902155">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902155</a><br/>Format: Kitap<br/>Microgrid Reliability Evaluation Based on Condition-Dependent Failure Models of Power Electronic Devicesent://SD_ILS/0/SD_ILS:6930272026-01-22T07:20:39Z2026-01-22T07:20:39Zby Li, Qi, author. (orcid)0000-0001-7329-0991<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815787">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815787</a><br/>Format: Kitap<br/>Evaluation of the Reliability of Nondestructive Ultrasonic Inspection Methods for the Detection and the Characterization of Defects in Hydroelectric Turbine Welded Joints = &Eacute;valuation de la fiabilit&eacute; des m&eacute;thodes de contr&ocirc;le non destructives par ultrasons pour la d&eacute;tection et la caract&eacute;risation de d&eacute;fauts dans des joints soud&eacute;s de turbines hydro&eacute;lectriquesent://SD_ILS/0/SD_ILS:7013802026-01-22T07:20:39Z2026-01-22T07:20:39Zby Habibzadeh Boukani, Hamid, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13814436">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13814436</a><br/>Format: Kitap<br/>Evaluation of the Life-Cycle Reliability of Engineered Slopes Utilizing Multi-Source Monitoring Informationent://SD_ILS/0/SD_ILS:6967742026-01-22T07:20:39Z2026-01-22T07:20:39Zby Li, Xueyou, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903347">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903347</a><br/>Format: Kitap<br/>Semiconductor laser engineering, reliability and diagnostics a practical approach to high power and single mode devicesent://SD_ILS/0/SD_ILS:10078402026-01-22T07:20:39Z2026-01-22T07:20:39Zby Epperlein, Peter W.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1118506">Click to View</a><br/>Format: Elektronik Kaynak<br/>Aerospace and automotive applications : issues, testing and analysisent://SD_ILS/0/SD_ILS:11306052026-01-22T07:20:39Z2026-01-22T07:20:39Zby El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5108518">Click to View</a><br/>Format: Elektronik Kaynak<br/>Data-Driven Remaining Useful Life Prognosis Techniques Stochastic Models, Methods and Applicationsent://SD_ILS/0/SD_ILS:4814752026-01-22T07:20:39Z2026-01-22T07:20:39Zby Si, Xiao-Sheng. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-54030-5">http://dx.doi.org/10.1007/978-3-662-54030-5</a><br/>Format: Elektronik Kaynak<br/>Total quality management sustainabilityent://SD_ILS/0/SD_ILS:9315432026-01-22T07:20:39Z2026-01-22T07:20:39Zby Zairi, Mohamed.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=232302">Click to View</a><br/>Format: Elektronik Kaynak<br/>Fluid-structure interactions and uncertainties : Ansys and fluent toolsent://SD_ILS/0/SD_ILS:11239032026-01-22T07:20:39Z2026-01-22T07:20:39Zby El Hami, Abdelkhalak, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4816334">Click to View</a><br/>Format: Elektronik Kaynak<br/>Quality and supply chain management : integration challenges and impactsent://SD_ILS/0/SD_ILS:11109242026-01-22T07:20:39Z2026-01-22T07:20:39Zby Sampaio, Paulo, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4514356">Click to View</a><br/>Format: Elektronik Kaynak<br/>Innovative quality management casesent://SD_ILS/0/SD_ILS:9343222026-01-22T07:20:39Z2026-01-22T07:20:39Zby Iwaarden, Jos van.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=258154">Click to View</a><br/>Format: Elektronik Kaynak<br/>Best practice quality function deployment (QFD) casesent://SD_ILS/0/SD_ILS:9385502026-01-22T07:20:39Z2026-01-22T07:20:39Zby Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=289800">Click to View</a><br/>Format: Elektronik Kaynak<br/>The leading edge in quality function deploymentent://SD_ILS/0/SD_ILS:9315462026-01-22T07:20:39Z2026-01-22T07:20:39Zby Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=232305">Click to View</a><br/>Format: Elektronik Kaynak<br/>Quality improvement with design of experiments : a response surface approachent://SD_ILS/0/SD_ILS:446962026-01-22T07:20:39Z2026-01-22T07:20:39Zby Vuchkov, Ivan N.<br/>Format: Kitap<br/>Quality management and CSRent://SD_ILS/0/SD_ILS:9435452026-01-22T07:20:39Z2026-01-22T07:20:39Zby Hazlett, Shirley-Ann.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=320627">Click to View</a><br/>Format: Elektronik Kaynak<br/>Systemic Decision Making Fundamentals for Addressing Problems and Messesent://SD_ILS/0/SD_ILS:4811912026-01-22T07:20:39Z2026-01-22T07:20:39Zby Hester, Patrick T. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-54672-8">http://dx.doi.org/10.1007/978-3-319-54672-8</a><br/>Format: Elektronik Kaynak<br/>Corrosion Problems and Solutions in Oil Refining and Petrochemical Industryent://SD_ILS/0/SD_ILS:4805862026-01-22T07:20:39Z2026-01-22T07:20:39Zby Groysman, Alec. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-45256-2">http://dx.doi.org/10.1007/978-3-319-45256-2</a><br/>Format: Elektronik Kaynak<br/>Recurrent event modeling based on the Yule process : application to water network asset managementent://SD_ILS/0/SD_ILS:11047602026-01-22T07:20:39Z2026-01-22T07:20:39Zby Le Gat, Yves, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4205903">Click to View</a><br/>Format: Elektronik Kaynak<br/>Response modeling methodology empirical modeling for engineering and scienceent://SD_ILS/0/SD_ILS:9344452026-01-22T07:20:39Z2026-01-22T07:20:39Zby Shore, Haim.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=259265">Click to View</a><br/>Format: Elektronik Kaynak<br/>Failure analysis a practical guide for manufacturers of electronic components and systemsent://SD_ILS/0/SD_ILS:9751202026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bâzu, M. I. (Marius I.), 1948-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=675196">Click to View</a><br/>Format: Elektronik Kaynak<br/>Füze arayıcı başlığı için güvenilirlik analizi ve güvenilirlik iyileştirme çalışmasıent://SD_ILS/0/SD_ILS:11703152026-01-22T07:20:39Z2026-01-22T07:20:39Zby Çevik Bakırlı, Ebru.<br/>Format: Kitap<br/>Arıza ve tamir durumunda sistem güvenilirliği: genetik ve memetik algoritmalarent://SD_ILS/0/SD_ILS:11658112026-01-22T07:20:39Z2026-01-22T07:20:39Zby Uzuner Şahin, Merve.<br/>Format: Kitap<br/>Hastalık biliş anketi'nin geçerlik ve güvenilirliğient://SD_ILS/0/SD_ILS:11576492026-01-22T07:20:39Z2026-01-22T07:20:39Zby Aykul, Ayşegül.<br/>Format: Kitap<br/>İki parametreli üstel dağılımda rekor değerler ile ortak değişim katsayısı ve güvenirlik tahmin edicilerient://SD_ILS/0/SD_ILS:11961782026-01-22T07:20:39Z2026-01-22T07:20:39Zby Bıyıklı, Nurten.<br/>Format: Kitap<br/>Geçmiş dönem tatmini ve firmaya duyulan güvenin satınalma davranışı üzerine etkileri : beyaz eşya üzerine Ankara'da bir saha araştırmasıent://SD_ILS/0/SD_ILS:11603652026-01-22T07:20:39Z2026-01-22T07:20:39Zby Hızlı, Dilek.<br/>Format: Kitap<br/>Yüksek gaz basınç sensörlerinin sıcaklık ve titreşim koşullarında performansı ve güvenilirliğinin iyileştirilmesient://SD_ILS/0/SD_ILS:12328762026-01-22T07:20:39Z2026-01-22T07:20:39Zby Arslan, Yasin, yazar.<br/>Format: Kitap<br/>Elektro-mekanik aktüatörler için analitik hiyerarşi prosesi (AHP) kullanılarak güvenilirlik tabanlı bakım analizi (RCM) uygulamasıent://SD_ILS/0/SD_ILS:11563052026-01-22T07:20:39Z2026-01-22T07:20:39Zby Doğan, Deniz Can.<br/>Format: Kitap<br/>Pişirme ve yiyecek hazırlama becerileri ölçeğinin Türkçe geçerlik ve güvenirliğinin incelenmesient://SD_ILS/0/SD_ILS:11588472026-01-22T07:20:39Z2026-01-22T07:20:39Zby Keleş, Gizem.<br/>Format: Kitap<br/>Hareket korkusu nedenleri ölçeğinin (Kinesiophopia causes scale) Türkçe uyarlamasının geçerlik ve güvenilirliğient://SD_ILS/0/SD_ILS:11576532026-01-22T07:20:39Z2026-01-22T07:20:39Zby Çayır, Melis.<br/>Format: Kitap<br/>Stochastic risk analysis and managementent://SD_ILS/0/SD_ILS:11238892026-01-22T07:20:39Z2026-01-22T07:20:39Zby Harlamov, Boris, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4816215">Click to View</a><br/>Format: Elektronik Kaynak<br/>Serebral palsili çocuklarda oturma esnasındaki fotoğrafik postür analizinin güvenilirliği ve postürün gövde kontrolü ve kaba motor fonksiyonlar arasındaki ilişkisient://SD_ILS/0/SD_ILS:11576652026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ünsal, Betül.<br/>Format: Kitap<br/>Meme kanseri ilişkili lenfödem hastalarında 'quality of life measure for limb lymphoedema-arm' anketinin Türkçe geçerlilik ve güvenilirliğinin araştırılmasıent://SD_ILS/0/SD_ILS:11601632026-01-22T07:20:39Z2026-01-22T07:20:39Zby Kaya, Emine.<br/>Format: Kitap<br/>New autonomous systemsent://SD_ILS/0/SD_ILS:11090732026-01-22T07:20:39Z2026-01-22T07:20:39Zby Cardon, Alain, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4452676">Click to View</a><br/>Format: Elektronik Kaynak<br/>The social roots of risk : producing disasters, promoting resilienceent://SD_ILS/0/SD_ILS:10339202026-01-22T07:20:39Z2026-01-22T07:20:39Zby Tierney, Kathleen J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1731657">Click to View</a><br/>Format: Elektronik Kaynak<br/>Swans, swine, and swindlers coping with the growing threat of mega-crises and mega-messesent://SD_ILS/0/SD_ILS:9810172026-01-22T07:20:39Z2026-01-22T07:20:39Zby Alpaslan, Can M. (Can Murat)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=735411">Click to View</a><br/>Format: Elektronik Kaynak<br/>Vineland sosyal- duygusal erken çocukluk ölçeğinin geçerlik-güvenirlik çalışması ve okul öncesi eğitim kurumuna devam eden beş yaş çocuklarının sosyal-duygusal davranışlarına yaratıcı drama eğitiminin etkisinin incelenmesient://SD_ILS/0/SD_ILS:11629232026-01-22T07:20:39Z2026-01-22T07:20:39Zby Ceylan, Şehnaz.<br/>Format: Kitap<br/>