Arama Sonu&ccedil;lar&#305; Reliability. SirsiDynix Enterprise http://katalog.baskent.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dReliability.$0026ic$003dtrue$0026ps$003d300;jsessionid=52703DB51B9ED403C77D2B50D96874E2? 2026-01-22T07:20:39Z Applied reliability ent://SD_ILS/0/SD_ILS:1008416 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Grous, Ammar.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1124027">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Applied reliability ent://SD_ILS/0/SD_ILS:1028407 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Tobias, Paul A., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1648252">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability engineering ent://SD_ILS/0/SD_ILS:989609 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Elsayed, Elsayed A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=843664">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Bayesian reliability ent://SD_ILS/0/SD_ILS:947188 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Hamada, Michael, 1955-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=364398">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability engineering ent://SD_ILS/0/SD_ILS:1029134 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Kapur, Kailash C., 1941- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1658817">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability in biomechanics ent://SD_ILS/0/SD_ILS:1119671 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Kharmanda, Ghias, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4718313">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Design for reliability ent://SD_ILS/0/SD_ILS:989803 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Raheja, Dev.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=848525">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability engineering advances ent://SD_ILS/0/SD_ILS:1059132 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Hayworth, Gregory I.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3018679">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability-centred maintenance ent://SD_ILS/0/SD_ILS:1166546 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Moubray, John.<br/>Format:&#160;Kitap<br/> Advanced reliability modeling ent://SD_ILS/0/SD_ILS:933481 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Dohi, Tadashi.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=253960">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Advances in reliability ent://SD_ILS/0/SD_ILS:1184194 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Balakrishnan, N., 1956- editor.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/0444500782">Click for electronic access to e-book.</a> ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444500786">http://www.sciencedirect.com/science/book/9780444500786</a> ScienceDirect <a href="http://www.sciencedirect.com/science/handbooks/01697161/20">http://www.sciencedirect.com/science/handbooks/01697161/20</a><br/>Format:&#160;Elektronik Kaynak<br/> Improving machinery reliability ent://SD_ILS/0/SD_ILS:1185250 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Bloch, Heinz P., 1933-<br/><a href="https://www.sciencedirect.com/science/bookseries/18746942/1">Available from ScienceDirect. Online version available for university members only. This requires an institutional login off-campus.</a> ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format:&#160;Elektronik Kaynak<br/> Machine tool reliability ent://SD_ILS/0/SD_ILS:1107613 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Lad, Bhupesh K., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4403257">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Solder Joint Reliability ent://SD_ILS/0/SD_ILS:938618 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ricky Lee, S. W.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=289873">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Probabilistic reliability models ent://SD_ILS/0/SD_ILS:993395 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ushakov, I. A. (Igor&#697; Alekseevich)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=894405">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability of engineering materials ent://SD_ILS/0/SD_ILS:1177289 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Smith, Alrick L.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780408015073">http://www.sciencedirect.com/science/book/9780408015073</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability-based mechanical design ent://SD_ILS/0/SD_ILS:1166540 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Le, Xiaobin.<br/>Format:&#160;Kitap<br/> Reliability of large systems ent://SD_ILS/0/SD_ILS:1186655 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ko&#322;owrocki, Krzysztof.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability engineering and services ent://SD_ILS/0/SD_ILS:1144157 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Jin, Tongdan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630265">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability and quality management ent://SD_ILS/0/SD_ILS:954805 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Mishra, R. C.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=442134">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Lubrication and reliability handbook ent://SD_ILS/0/SD_ILS:940326 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Neale, M. J. (Michael John)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=298350">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Lubrication and reliability handbook ent://SD_ILS/0/SD_ILS:1185129 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Neale, M. J. (Michael John)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format:&#160;Elektronik Kaynak<br/> Fatigue design and reliability ent://SD_ILS/0/SD_ILS:1186171 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a> ScienceDirect <a href="http://www.sciencedirect.com/science/bookseries/15661369/23">http://www.sciencedirect.com/science/bookseries/15661369/23</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability of analogue circuits ent://SD_ILS/0/SD_ILS:705115 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Mohd Nawi, Illani Binti, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873624">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873624</a><br/>Format:&#160;Kitap<br/> Optimal warranty policies and reliability modeling ent://SD_ILS/0/SD_ILS:933525 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Chukova, Stefanka.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=254004">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Practical applications of Bayesian reliability ent://SD_ILS/0/SD_ILS:1145693 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Liu, Yan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5741235">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Biomechanics : optimization, uncertainties and reliability ent://SD_ILS/0/SD_ILS:1122105 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Kharmanda, Ghias, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4778401">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability growth : enhancing defense system reliability ent://SD_ILS/0/SD_ILS:1086526 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Panel on Reliability Growth Methods for Defense Systems.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3379432">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Advances in mathematical modeling for reliability ent://SD_ILS/0/SD_ILS:947151 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Bedford, T.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=363211">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Advanced reliability modeling part II ent://SD_ILS/0/SD_ILS:937992 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Dohi, Tadashi.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=285510">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Systems reliability and failure prevention ent://SD_ILS/0/SD_ILS:930992 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Hecht, Herbert.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=227632">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Maintenance strategies and reliability optimization ent://SD_ILS/0/SD_ILS:931689 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Artiba, A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=233913">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Semiconductor packaging materials interaction and reliability ent://SD_ILS/0/SD_ILS:983569 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Chen, Andrea.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=773636">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Construction reliability safety, variability and sustainability ent://SD_ILS/0/SD_ILS:1008523 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Baroth, Julien.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1124658">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Optimal reliability design : fundamentals and applications ent://SD_ILS/0/SD_ILS:1165981 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Kuo, Way.<br/>Format:&#160;Kitap<br/> System reliability : concepts and applications ent://SD_ILS/0/SD_ILS:922160 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Klaassen, Klaas B., 1941-<br/>Format:&#160;Kitap<br/> Advances in system reliability engineering ent://SD_ILS/0/SD_ILS:1143685 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ram, Mangey, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5603078">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability of large and complex systems ent://SD_ILS/0/SD_ILS:1029113 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ko&#322;owrocki, Krzysztof, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1657928">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Accelerated reliability and durability testing technology ent://SD_ILS/0/SD_ILS:978239 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Klyatis, Lev M.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=693204">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Multistate systems reliability theory with applications ent://SD_ILS/0/SD_ILS:972193 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Natvig, Bent, 1946-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=624778">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Mathematical methods of reliability theory ent://SD_ILS/0/SD_ILS:1177385 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781483230535">http://www.sciencedirect.com/science/book/9781483230535</a><br/>Format:&#160;Elektronik Kaynak<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:1185141 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Dummer, G. W. A. (Geoffrey William Arnold)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format:&#160;Elektronik Kaynak<br/> Network reliability : measures and evaluation ent://SD_ILS/0/SD_ILS:1113611 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Chaturvedi, Sanjay K., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4570714">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Lead-free solder interconnect reliability ent://SD_ILS/0/SD_ILS:1055094 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Shangguan, Dongkai, 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002391">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Stochastic reliability modeling, optimization and applications ent://SD_ILS/0/SD_ILS:1031238 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Nakamura, Syouji.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1681730">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Analysis of reliability and quality control ent://SD_ILS/0/SD_ILS:1067044 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Grous, Ammar.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3058885">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Software system reliability and security ent://SD_ILS/0/SD_ILS:940701 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Broy, M., 1949-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=305176">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Introduction to reliability and quality engineering ent://SD_ILS/0/SD_ILS:38318 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Bentley, John<br/>Format:&#160;Kitap<br/> Maintenance and reliability best practices ent://SD_ILS/0/SD_ILS:1165978 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Gulati, Ramesh, author<br/>Format:&#160;Kitap<br/> Human reliability : with human factors ent://SD_ILS/0/SD_ILS:1175173 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080327747">http://www.sciencedirect.com/science/book/9780080327747</a><br/>Format:&#160;Elektronik Kaynak<br/> Transportation systems reliability and safety ent://SD_ILS/0/SD_ILS:975946 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Dhillon, B. S. (Balbir S.), 1947-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=681292">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Process risk and reliability management ent://SD_ILS/0/SD_ILS:1037452 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Sutton, Ian, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1782850">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Advances in Reliability and System Engineering ent://SD_ILS/0/SD_ILS:480813 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ram, Mangey. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-48875-2">http://dx.doi.org/10.1007/978-3-319-48875-2</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:481486 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Birolini, Alessandro. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-54209-5">http://dx.doi.org/10.1007/978-3-662-54209-5</a><br/>Format:&#160;Elektronik Kaynak<br/> Cloud Reliability Engineering: Technologies and Tools ent://SD_ILS/0/SD_ILS:1214196 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Achary, Rathnakar<br/>Format:&#160;Kitap<br/> Leading a high reliability school ent://SD_ILS/0/SD_ILS:1137865 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Marzano, Robert J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5395032">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability prediction and testing textbook ent://SD_ILS/0/SD_ILS:1140641 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Klyatis, Lev M., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5452229">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Photovoltaic modules : technology and reliability ent://SD_ILS/0/SD_ILS:1118280 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Wirth, Harry, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4691383">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability and availability of cloud computing ent://SD_ILS/0/SD_ILS:139862 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Bauer, Eric<br/>Format:&#160;Kitap<br/> Durability and reliability of medical polymers ent://SD_ILS/0/SD_ILS:1024416 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Jenkins, Mike.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1581410">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Machine tools design, reliability and safety ent://SD_ILS/0/SD_ILS:1060829 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Anderson, Scott P.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3021649">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Safety and reliability of bridge structures ent://SD_ILS/0/SD_ILS:967307 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;New York City Bridge Conference (5th : 2009 : New York, N.Y.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=565988">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Measures of interobserver agreement and reliability ent://SD_ILS/0/SD_ILS:974026 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Shoukri, M. M. (Mohamed M.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=665632">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Accelerated quality and reliability solutions ent://SD_ILS/0/SD_ILS:1185583 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Klyatis, Lev M.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format:&#160;Elektronik Kaynak<br/> Recent advances in reliability and quality engineering ent://SD_ILS/0/SD_ILS:1030452 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Pham, Hoang.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679593">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability and risk models : setting reliability requirements ent://SD_ILS/0/SD_ILS:1103084 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Todinov, M. T., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4039470">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Modern statistical and mathematical methods in reliability ent://SD_ILS/0/SD_ILS:940083 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Wilson, Alyson G., 1967-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=296177">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Fault detection &amp; reliability : knowledge based &amp; other approaches ent://SD_ILS/0/SD_ILS:1175635 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;European Workshop on Fault Diagnostics, Reliability, and Related Knowledge-Based Approaches (2nd : 1987 : University of Manchester Institute of Science and Technology)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080349220">https://www.sciencedirect.com/science/book/9780080349220</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability of electronic packages and semiconductor devices ent://SD_ILS/0/SD_ILS:89886 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Giacomo, Giulio Di<br/>Format:&#160;Kitap<br/> Electronics reliability and measurement technology : nondestructive evaluation ent://SD_ILS/0/SD_ILS:1189894 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Heyman, Joseph S.<br/>MacEwan University Access <a href="http://www.sciencedirect.com/science/book/9780815511717">(Unlimited Concurrent Users)</a> from ScienceDirect ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780815511717">https://www.sciencedirect.com/science/book/9780815511717</a><br/>Format:&#160;Elektronik Kaynak<br/> System reliability : evaluation and prediction in engineering ent://SD_ILS/0/SD_ILS:66172 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Pages, Alain<br/>Format:&#160;Kitap<br/> Methods for reliability improvement and risk reduction ent://SD_ILS/0/SD_ILS:1143031 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Todinov, Michael, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5553528">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Recent developments in reliability-based civil engineering ent://SD_ILS/0/SD_ILS:1014990 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Haldar, Achintya.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1214938">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> An introduction to reliability and maintainability engineering ent://SD_ILS/0/SD_ILS:1166664 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ebeling, Charles E..<br/>Format:&#160;Kitap<br/> Rules of thumb for maintenance and reliability engineers ent://SD_ILS/0/SD_ILS:948013 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Smith, Ricky.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=405204">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability modelling and analysis in discrete time ent://SD_ILS/0/SD_ILS:1138009 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Nair, N. Unnikrishnan, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5396573">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Artificial neural network for software reliability prediction ent://SD_ILS/0/SD_ILS:1129788 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Bisi, Manjubala, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5056371">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Human reliability and error in medical system ent://SD_ILS/0/SD_ILS:1030417 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Dhillon, B. S. (Balbir S.), 1947-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679549">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Risk-based management : a reliability-centered approach ent://SD_ILS/0/SD_ILS:1028456 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Jones, Richard B., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1649062">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Logics and languages for reliability and security ent://SD_ILS/0/SD_ILS:966627 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Esparza, Javier.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=557042">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Rules of thumb for maintenance and reliability engineers ent://SD_ILS/0/SD_ILS:1189142 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Smith, Ricky.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750678629">https://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Elektronik Kaynak<br/> Cognitive reliability and error analysis method : CREAM ent://SD_ILS/0/SD_ILS:1185744 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Hollnagel, Erik, 1941-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format:&#160;Elektronik Kaynak<br/> The reliability, availability and productiveness of systems ent://SD_ILS/0/SD_ILS:37807 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Sherwin, D.J.<br/>Format:&#160;Kitap<br/> Reliability and maintainability of in service pipelines ent://SD_ILS/0/SD_ILS:1139424 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Mojtaba, Mahmoodian, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5434362">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability based airframe maintenance optimization and applications ent://SD_ILS/0/SD_ILS:1124547 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ren, He, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4826425">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability and radiation effects in compound semiconductors ent://SD_ILS/0/SD_ILS:980838 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Johnston, Allan.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=731279">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Risk and reliability coastal and hydraulic engineering ent://SD_ILS/0/SD_ILS:955184 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Reeve, Dominic.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=446907">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Managing risk and reliability of process plants ent://SD_ILS/0/SD_ILS:938083 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Tweeddale, Mark.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=286711">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability characterisation of electrical and electronic systems ent://SD_ILS/0/SD_ILS:1044088 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Swingler, Jonathan, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1911716">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Process plant equipment operation, reliability, and control ent://SD_ILS/0/SD_ILS:987164 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Holloway, Michael D., 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=822072">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Lead-free solders materials reliability for electronics ent://SD_ILS/0/SD_ILS:991892 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Subramaniam, K. N., Ph. D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=875755">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> BioWatch PCR assays : building confidence, ensuring reliability ent://SD_ILS/0/SD_ILS:1096744 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;National Research Council (U.S.). Board on Life Sciences. Committee on PCR Standards for the BioWatch Program, issuing body.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3439887">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability Approach to Risk Management in Watersheds ent://SD_ILS/0/SD_ILS:687103 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Teklitz, Allen, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10871571">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10871571</a><br/>Format:&#160;Kitap<br/> Managing risk and reliability of process plants ent://SD_ILS/0/SD_ILS:1187939 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Tweeddale, Mark.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a> ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780750677349">https://www.sciencedirect.com/science/book/9780750677349</a><br/>Format:&#160;Elektronik Kaynak<br/> Power GaN Devices Materials, Applications and Reliability ent://SD_ILS/0/SD_ILS:480447 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Meneghini, Matteo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-43199-4">http://dx.doi.org/10.1007/978-3-319-43199-4</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability, maintainability, and risk : practical methods for engineers ent://SD_ILS/0/SD_ILS:1178300 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750608541">http://www.sciencedirect.com/science/book/9780750608541</a><br/>Format:&#160;Elektronik Kaynak<br/> An introduction to the basics of reliability and risk analysis ent://SD_ILS/0/SD_ILS:132950 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Zio, Enrico<br/>Format:&#160;Kitap<br/> Reliability of maintained systems subjected to wear failure mechanisms : theory and applications ent://SD_ILS/0/SD_ILS:1145960 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Bayle, Franck, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5751853">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> An introduction to the basics of reliability and risk analysis ent://SD_ILS/0/SD_ILS:942393 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Zio, Enrico.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=312287">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> System and Bayesian reliability essays in honor of Professor Richard E. Barlow on his 70th birthday ent://SD_ILS/0/SD_ILS:1030451 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Hayakawa, Yu.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679591">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability of high-power mechatronic systems. Volume 1, Aerospace and automotive applications ent://SD_ILS/0/SD_ILS:1129982 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5061866">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Risk and Reliability Analysis: Theory and Applications In Honor of Prof. Armen Der Kiureghian ent://SD_ILS/0/SD_ILS:481045 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Gardoni, Paolo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-52425-2">http://dx.doi.org/10.1007/978-3-319-52425-2</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability modeling in industry 4.0 : advances in reliability science ent://SD_ILS/0/SD_ILS:1214179 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ram, Mangey, editor<br/>Format:&#160;Kitap<br/> Dynamic system reliability : modeling and analysis of dynamic and dependent behaviors ent://SD_ILS/0/SD_ILS:1144180 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Xing, Liudong, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630668">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Applied reliability engineering and risk analysis probabilistic models and statistical inference ent://SD_ILS/0/SD_ILS:1018387 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Frenkel, Ilia, Ph.D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1360807">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Organizing for reliability : a guide for research and practice ent://SD_ILS/0/SD_ILS:1134117 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ramanujam, Rangaraj, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5219778">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability investigation of LED devices for public light applications ent://SD_ILS/0/SD_ILS:1124334 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Baillot, Raphael, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4822046">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability technology principles and practice of failure prevention in electronic systems ent://SD_ILS/0/SD_ILS:975150 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Pascoe, Norman.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=675299">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Spirit&uuml;el distres &ouml;l&ccedil;e&#287;i'nin T&uuml;rk&ccedil;e'ye uyarlanmas&#305;; ge&ccedil;erlik ve g&uuml;venirlik &ccedil;al&#305;&#351;mas&#305; = Turkish adaptation of the spiritual distress scale; validity and reliability study ent://SD_ILS/0/SD_ILS:1229556 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Arpa, Hilal, yazar.<br/>Format:&#160;Kitap<br/> Sa&#287;l&#305;k Bilimleri Kan&#305;ta Dayal&#305; Uygulama Anketi'nin t&uuml;rk&ccedil;e ge&ccedil;erlilik ve g&uuml;venirli&#287;i = Turkish validity and reliability of The Health Sciences Evidence-Based Practice Questionnaire ent://SD_ILS/0/SD_ILS:1229612 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;&#350;ahin, Ay&#351;e Nur, yazar.<br/>Format:&#160;Kitap<br/> T&#305;k&#305;n&#305;rcas&#305;na yeme bozuklu&#287;u tarama anketinin ((BEDS-7) Binge-eating disordes screener)) T&uuml;rk&ccedil;e ge&ccedil;erlilik ve g&uuml;venilirlil &ccedil;al&#305;&#351;mas&#305; = Validity and reliability study of the binge-eating disorder screening questionnaire (BEDS-7) in Turkish ent://SD_ILS/0/SD_ILS:1229385 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Aker, Caner, Dr., yazar.<br/>Format:&#160;Kitap<br/> The international journal of quality &amp; reliability management. Volume 25, Number 1, Best practice project portfolio management ent://SD_ILS/0/SD_ILS:945911 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=348641">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Pipelines 2010 climbing new peaks to infrastructure reliability--renew, rehab, and reinvest : proceedings of the 2010 Pipeline Division Specialty Congress, August 28-September 1, 2010, Keystone Colorado ent://SD_ILS/0/SD_ILS:1068357 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Pipeline Division Specialty Congress (2010 : Keystone, Colo.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3115529">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Advanced reliability modeling proceedings of the 2004 Asian International Workshop (AIWARM 2004) : Hiroshima, Japan, 26-27 August 2004 ent://SD_ILS/0/SD_ILS:939966 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Asian International Workshop on Advanced Reliability Modeling (2004 : Hiroshima-shi, Japan)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=296055">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Advanced reliability modeling II reliability testing and improvement : proceedings of the 2nd Asian International Workshop (AIWARM 2006), Busan, Korea, 24-26 August 2006 ent://SD_ILS/0/SD_ILS:1030978 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Asian International Workshop on Advanced Reliability Modeling (2nd : 2006 : Pusan, Korea)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1681416">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:1177390 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Elektronik Kaynak<br/> International Conference on Structural Safety and Reliability : Smithsonian Institution Museum of History and Technology, Constitution Avenue, Washington, D.C., April 9, 10 and 11, 1969 ent://SD_ILS/0/SD_ILS:1181717 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;International Conference on Structural Safety and Reliability (1st : 1969 : Smithsonian Institution)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080165660">https://www.sciencedirect.com/science/book/9780080165660</a><br/>Format:&#160;Elektronik Kaynak<br/> Problems of mechanics in pump and compressor engineering : selected, peer reviewed papers from the XIV International Scientific and Engineering Conference on Hermetic Sealing, Vibration Reliability and Ecological Safety of Pump and Compressor Machinery (HERVICON+PUMPS 2014), September 9-12, 2014, Sumy, Ukraine ent://SD_ILS/0/SD_ILS:1043947 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;International Scientific and Engineering Conference on Hermetic Sealing, Vibration Reliability and Ecological Safety of Pump and Compressor Machinery (14th : 2014 : Sumy, Ukraine)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1910938">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Advances in product development and reliability III : selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, China ent://SD_ILS/0/SD_ILS:1041548 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China), issuing body.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1872895">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Evaluation of quantification of margins and uncertainties methodology for assessing and certifying the reliability of the nuclear stockpile ent://SD_ILS/0/SD_ILS:1101101 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;National Research Council (U.S.). Committee on the Evaluation of Quantification of Margins and Uncertainties Methodology for Assessing and Certifying the Reliability of the Nuclear Stockpile.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3564163">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Industrial lubrication and tribology. Volume 63, Number?, Selected papers from the 3rd International Conference on Integrity, Reliability and Failure 2009 ent://SD_ILS/0/SD_ILS:976521 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Seabra, J. (Jorge)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=683436">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Safety, reliability, and applications of emerging intelligent control technologies : a postprint volume from the IFAC workshop, Hong Kong, 12-14 December 1994 ent://SD_ILS/0/SD_ILS:1178286 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ng, Tung-Sang.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080423746">http://www.sciencedirect.com/science/book/9780080423746</a><br/>Format:&#160;Elektronik Kaynak<br/> Multi-scale reliability and serviceability assessment of in-service long-span bridges ent://SD_ILS/0/SD_ILS:1137638 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Lu, Naiwei, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5382830">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Konstr&uuml;ksiyon elemanlar&#305;nda g&uuml;venirlik (reliability) ve &ouml;m&uuml;r hesaplar&#305; ; teorik a&ccedil;&#305;klamalar ve uygulamalar ent://SD_ILS/0/SD_ILS:489156 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Tahral&#305;, Necati<br/>Format:&#160;Kitap<br/> Reliability theory and models : stochastic failure models, optimal maintenance policies, life testing, and structures ent://SD_ILS/0/SD_ILS:1177633 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Abdel-Hameed, Mohamed S.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780120414208">https://www.sciencedirect.com/science/book/9780120414208</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability issues for DoD systems report of a workshop ent://SD_ILS/0/SD_ILS:1082724 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Samaniego, Francisco.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3375321">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability of safety-critical systems : theory and application ent://SD_ILS/0/SD_ILS:1027645 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Rausand, Marvin.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1637653">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Improving product reliability and software quality : strategies, tools, process and implementation ent://SD_ILS/0/SD_ILS:1145687 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Levin, Mark, 1959- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5741218">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability, maintainability and risk : practical methods for engineers ent://SD_ILS/0/SD_ILS:1124486 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Smith, David J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4825735">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability engineering and risk analysis : a practical guide ent://SD_ILS/0/SD_ILS:1138157 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Modarres, M. (Mohammad), author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5400700">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Gas and oil reliability engineering : modeling and analysis ent://SD_ILS/0/SD_ILS:1111362 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Calixto, Eduardo, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4526461">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday ent://SD_ILS/0/SD_ILS:1026891 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Nakamura, Syouji.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1611972">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability prediction from burn-in data fit to reliability models ent://SD_ILS/0/SD_ILS:1028359 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Bernstein, Joseph B., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1647477">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Practical reliability engineering and analysis for system design and life-cycle sustainment ent://SD_ILS/0/SD_ILS:963632 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Wessels, William R.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=533784">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> The OEE primer : understanding overall equipment effectiveness, reliability, and maintainability ent://SD_ILS/0/SD_ILS:97352 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Stamatis, D.H.<br/>Format:&#160;Kitap<br/> Robust design methodology for reliability exploring the effects of variation and uncertainty ent://SD_ILS/0/SD_ILS:955897 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Bergman, Bo, 1943-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=454321">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> HALT, HASS, and HASA explained : accelerated reliability techniques ent://SD_ILS/0/SD_ILS:1055309 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;McLean, Harry W., 1946- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3002645">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability, maintainability and risk practical methods for engineers ent://SD_ILS/0/SD_ILS:935375 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Smith, David John, 1943-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=269666">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> World class reliability using Multiple Environment Overstress Tests to make it happen ent://SD_ILS/0/SD_ILS:932923 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Bhote, Keki R., 1925-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=243100">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability, maintainability, and supportability : best practices for systems engineers ent://SD_ILS/0/SD_ILS:1043167 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Tortorella, Michael, 1947- author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1896020">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Gas and oil reliability engineering modeling and analysis ent://SD_ILS/0/SD_ILS:1001680 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Calixto, Eduardo.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1032940">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability, maintainability and risk practical methods for engineers ent://SD_ILS/0/SD_ILS:980575 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Smith, David J.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=730199">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability, maintainability and risk : practical methods for engineers ent://SD_ILS/0/SD_ILS:1187835 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability, Maintainability and Risk 8e Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems. ent://SD_ILS/0/SD_ILS:137239 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Smith, David J.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability, Maintainability and Risk : Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems. ent://SD_ILS/0/SD_ILS:1183853 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Smith, David J. (David John), 1943 June 22-<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080969022">https://www.sciencedirect.com/science/book/9780080969022</a><br/>Format:&#160;Elektronik Kaynak<br/> Importance measures in reliability, risk, and optimization principles and applications ent://SD_ILS/0/SD_ILS:994447 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Kuo, Way, 1951-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=912160">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Risk-based reliability analysis and generic principles for risk reduction ent://SD_ILS/0/SD_ILS:1185645 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Todinov, M. T.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability of MEMS testing of materials and devices ent://SD_ILS/0/SD_ILS:960989 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Tabata, Osamu.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=481344">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Spacecraft reliability and multi-state failures a statistical approach ent://SD_ILS/0/SD_ILS:978434 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Saleh, Joseph H., 1971-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=697462">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Statistical theory of reliability and life testing : probability models ent://SD_ILS/0/SD_ILS:670182 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Barlow, Richard E.<br/>Format:&#160;Kitap<br/> Reliability analysis for asset management of electric power grids ent://SD_ILS/0/SD_ILS:1144145 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ross, Robert D., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5630246">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Corporate communications. Volume 23, Number 2, An International Journal : Communicating/Organizing for Reliability, Resilience, and Safety ent://SD_ILS/0/SD_ILS:1137314 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Barbour, Joshua B., editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5351422">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Semi-Markov processes : applications in system reliability and maintenance ent://SD_ILS/0/SD_ILS:1038182 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Grabski, Franciszek, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1798310">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Probability, statistics, and reliability for engineers and scientists ent://SD_ILS/0/SD_ILS:1027231 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ayyub, Bilal M., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1631123">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment ent://SD_ILS/0/SD_ILS:1127930 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Modarres, M. (Mohammad), author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4901681">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Binary decision diagrams and extensions for system reliability analysis ent://SD_ILS/0/SD_ILS:1103228 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Xing, Liudong, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4041105">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability ent://SD_ILS/0/SD_ILS:1030325 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Dumin, D. J.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1679439">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Mathematical models for the study of the reliability of systems ent://SD_ILS/0/SD_ILS:1190713 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Kaufmann, A. (Arnold), 1911-1994.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780124023703">https://www.sciencedirect.com/science/book/9780124023703</a> ScienceDirect <a href="https://www.sciencedirect.com/science/publication?issn=00765392&volume=124">https://www.sciencedirect.com/science/publication?issn=00765392&volume=124</a> ScienceDirect <a href="https://www.sciencedirect.com/science/bookseries/00765392/124">https://www.sciencedirect.com/science/bookseries/00765392/124</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability in computing : the role of interval methods in scientific computing ent://SD_ILS/0/SD_ILS:1175975 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Moore, Ramon E.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780125056304">https://www.sciencedirect.com/science/book/9780125056304</a><br/>Format:&#160;Elektronik Kaynak<br/> General principles : general principles on quality assurance for structures : general principles on reliability for structural design : report ent://SD_ILS/0/SD_ILS:1170308 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Joint Committee on Structural Safety.<br/>Format:&#160;Kitap<br/> Statistical models and methods for reliability and survival analysis ent://SD_ILS/0/SD_ILS:1024313 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Couallier, Vincent.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1580028">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications ent://SD_ILS/0/SD_ILS:1015542 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Wu, Bin.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1222589">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability and failure of electronic materials and devices ent://SD_ILS/0/SD_ILS:1184489 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ohring, Milton, 1936-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format:&#160;Elektronik Kaynak<br/> Software reliability : measurement, prediction, application / John D. Musa, Anthony Iannino, Kazuhira Okumoto. ent://SD_ILS/0/SD_ILS:918524 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Musa, John D.<br/>Format:&#160;Kitap<br/> Fundamentals of reliability engineering : applications in multistage interconnection networks ent://SD_ILS/0/SD_ILS:1027937 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Gunawan, Indra, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1641079">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Semi-Markov chains and hidden semi-Markov models toward applications their use in reliability and DNA analysis ent://SD_ILS/0/SD_ILS:950129 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Barbu, Vlad Stefan.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=417305">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Fault injection techniques and tools for embedded systems reliability evaluation ent://SD_ILS/0/SD_ILS:1062531 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Benso, Alfredo.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3036042">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Probabilistic safety assessment for optimum nuclear power plant life management (PLiM) theory and application of reliability analysis methods for major power plant components ent://SD_ILS/0/SD_ILS:1023940 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Arkadov, Gennadij V.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1575572">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability Design of Mechanical Systems A Guide for Mechanical and Civil Engineers ent://SD_ILS/0/SD_ILS:480940 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Woo, Seongwoo. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-50829-0">http://dx.doi.org/10.1007/978-3-319-50829-0</a><br/>Format:&#160;Elektronik Kaynak<br/> Engineering maintainability : how to design for reliability and easy maintenance ent://SD_ILS/0/SD_ILS:1185169 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152576">http://www.sciencedirect.com/science/book/9780884152576</a><br/>Format:&#160;Elektronik Kaynak<br/> Theory and Practice of Quality and Reliability Engineering in Asia Industry ent://SD_ILS/0/SD_ILS:481721 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Tan, Cher Ming. editor.<br/><a href="http://dx.doi.org/10.1007/978-981-10-3290-5">http://dx.doi.org/10.1007/978-981-10-3290-5</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability and Risk Evaluation of Wind Integrated Power Systems ent://SD_ILS/0/SD_ILS:140557 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Billinton, Roy. editor.<br/><a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format:&#160;Elektronik Kaynak<br/> Process risk and reliability management : operational integrity management ent://SD_ILS/0/SD_ILS:1178432 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Sutton, Ian S.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format:&#160;Elektronik Kaynak<br/> Measures of response reliability in 1988 household labour force survey for Ankara ent://SD_ILS/0/SD_ILS:76849 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Bilge, H&uuml;sniye<br/>Format:&#160;Kitap<br/> Goal oriented methodology and applications in nuclear power plants : a modern systems reliability approach ent://SD_ILS/0/SD_ILS:1148740 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Xiao-Jian, Yi, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5969498">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Mastering selenium webdriver 3.0 : boost the performance and reliability of your automated checks by mastering Selenium WebDriver. ent://SD_ILS/0/SD_ILS:1140451 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Collin, Mark, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5446029">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Firearm and toolmark identification : the scientific reliability of the forensic science discipline ent://SD_ILS/0/SD_ILS:1140676 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Nichols, Ronald, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5455401">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Solid oxide fuel cell lifetime and reliability : critical challenges in fuel cells ent://SD_ILS/0/SD_ILS:1126597 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Brandon, Nigel P., editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4865436">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Numerical methods of simulation and optimization of piecewise deterministic Markov processes : application to reliability ent://SD_ILS/0/SD_ILS:1104754 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Saporta, Beno&icirc;te de, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4205869">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Simulation of stochastic processes with given accuracy and reliability ent://SD_ILS/0/SD_ILS:1120862 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Kozachenko, Yuriy, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4747211">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability, robustness and failure mechanisms of led devices : methodology and evaluation ent://SD_ILS/0/SD_ILS:1119602 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Deshayes, Yannick, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4717207">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Embedded mechatronic systems. Volume 1, Analysis of failures, predictive reliability ent://SD_ILS/0/SD_ILS:1051934 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=2086747">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Designing for human reliability : human factors engineering in the oil, gas, and process industries ent://SD_ILS/0/SD_ILS:1046949 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;McLeod, Ronald W. , author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=2000913">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Flow networks analysis and optimization of repairable flow networks, networks with disturbed flows, static flow networks and reliability networks ent://SD_ILS/0/SD_ILS:1007506 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Todinov, Michael T.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1114626">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Electric utility resource planning economics, reliability, and decision-making ent://SD_ILS/0/SD_ILS:987472 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Sim, Steven.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=826969">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Fault tolerant drive by wire systems impact on vehicle safety and reliability ent://SD_ILS/0/SD_ILS:998558 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Anwar, Sohel.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=976620">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> The cost of being landlocked logistics, costs, and supply chain reliability ent://SD_ILS/0/SD_ILS:968642 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Arvis, Jean-Fran&ccedil;ois, 1960-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=589796">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Axiomatic quality integrating axiomatic design with six-sigma, reliability, and quality engineering ent://SD_ILS/0/SD_ILS:930938 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;El-Haik, Basem.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=227550">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability and validity of the Turkish version of the service quality assessment scale ent://SD_ILS/0/SD_ILS:84690 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;G&uuml;rb&uuml;z, B&uuml;lent<br/>Format:&#160;Kitap<br/> Ecology, engineering, and management reconciling ecosystem rehabilitation and service reliability ent://SD_ILS/0/SD_ILS:950676 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Eeten, Michel van.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=422475">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability of medicare hospital discharge records report of a study ent://SD_ILS/0/SD_ILS:1084851 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Institute of Medicine (U.S.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3377596">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Electricity access in Sub-Saharan Africa : uptake, reliability, and complementary factors for economic impact, Moussa P. Blimpo and Malcolm Cosgrove-Davies. ent://SD_ILS/0/SD_ILS:1145392 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Blimpo, Moussa P., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5725963">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> A big data analytics approach to quality, reliability and risk management ent://SD_ILS/0/SD_ILS:1145610 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Mazzuto, Giovanni, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5734581">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Risk and reliability in structural engineering : theoretical basis ent://SD_ILS/0/SD_ILS:1146592 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Lu, Naiwei, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5780563">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Durability and reliability of polymers and other materials in photovoltaic modules ent://SD_ILS/0/SD_ILS:1146870 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Bruckman, Laura, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5788821">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Bioelectronics and medical devices : from materials to devices - fabrication, applications and reliability ent://SD_ILS/0/SD_ILS:1147039 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Pal, Kunal, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5796374">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Wide bandgap power semiconductor packaging : materials, components, and reliability ent://SD_ILS/0/SD_ILS:1138243 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Suganuma, Katsuaki, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5404290">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Security, privacy and reliability in computer communications and networks ent://SD_ILS/0/SD_ILS:1121784 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Sha, Kewei, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4771355">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Stochastic models in survival analysis and reliability set. Volume 1, Reliability of engineering systems and technological risk ent://SD_ILS/0/SD_ILS:1115276 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Rykov, Vladimir, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4648726">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability assurance of big data in the cloud : cost-effective replication-based storage ent://SD_ILS/0/SD_ILS:1042563 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Yang, Yun, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1888753">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Quality and reliability aspects in nuclear power reactor fuel engineering ent://SD_ILS/0/SD_ILS:1125854 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;International Atomic Energy Agency.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4853266">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Reliability in cognitive neuroscience a meta-meta-analysis ent://SD_ILS/0/SD_ILS:1082102 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Uttal, William R.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3339523">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Assessing the reliability of complex models mathematical and statistical foundations of verification, validation, and uncertainty quantification ent://SD_ILS/0/SD_ILS:1086133 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;National Research Council (U.S.)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3378995">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Using the Weibull distribution reliability, modeling, and inference ent://SD_ILS/0/SD_ILS:993392 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;McCool, John, 1936-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=894399">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Recent advances in providing QoS and reliability in the future Internet backbone ent://SD_ILS/0/SD_ILS:1059122 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Wang, Ning, 1974-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3018661">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Microsoft SQL Server 2008 high availability minimize downtime, speed up recovery, and achieve the highest level of availability and reliability for SQL server applications by mastering the concepts of database mirroring, log shipping, clustering, and replication ent://SD_ILS/0/SD_ILS:996842 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Goswami, Hemantgiri S.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=948566">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Equipment management workbook key to equipment reliability and productivity in mining ent://SD_ILS/0/SD_ILS:973412 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Tomlingson, Paul D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=655785">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Equipment management key to equipment reliability and productivity in mining ent://SD_ILS/0/SD_ILS:957309 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Tomlingson, Paul D.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=464572">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Safety and reliability in cooperating unmanned aerial systems ent://SD_ILS/0/SD_ILS:980748 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Rabbath, Camille Alain, 1969-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=731173">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Advanced manufacturing process, lead free interconnect materials and reliability modeling for electronics packaging ent://SD_ILS/0/SD_ILS:935050 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Bailey, Christopher.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=267393">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Risk, reliability, uncertainty, and robustness of water resources systems ent://SD_ILS/0/SD_ILS:929021 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Bog&aacute;rdi, J&aacute;nos.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=201907">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Digital instrumentation and control systems in nuclear power plants safety and reliability issues : final report ent://SD_ILS/0/SD_ILS:1083075 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;National Research Council (U.S.). Committee on Application of Digital Instrumentation and Control Systems to Nuclear Power Plant Operations and Safety.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=3375677">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> On the Historical Reliability of Ancient Biographies: A thorough Examination of Xenophon's Agesilaus, Cornelius Nepos's Atticus, Tacitus's Agricola, and The Gospel According to John ent://SD_ILS/0/SD_ILS:701442 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Wright, Edward T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13815012">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13815012</a><br/>Format:&#160;Kitap<br/> Inter-rater reliability of the structured assessment of violence risk in youth (savry) amongst mental health professionals ent://SD_ILS/0/SD_ILS:707504 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Selby, Sarah Elizabeth, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13876017">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13876017</a><br/>Format:&#160;Kitap<br/> Scheduling event-triggered and time-triggered applications with optimal reliability and predictability on networked multi-core chips ent://SD_ILS/0/SD_ILS:685561 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Murshed, Ayman, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10869403">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10869403</a><br/>Format:&#160;Kitap<br/> The Implications of the Internet's Topological Structure for Its Efficiency, Security, and Reliability ent://SD_ILS/0/SD_ILS:698936 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Nur, Abdullah Yasin, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10980025">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10980025</a><br/>Format:&#160;Kitap<br/> Assessing the Reliability of the 1760 British Geographical Survey of the St. Lawrence River Valley ent://SD_ILS/0/SD_ILS:699123 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Gliserman, Nicholas, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11016107">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11016107</a><br/>Format:&#160;Kitap<br/> The Reliability of Simultaneous Quantitative 3D Analysis of Bone and Soft Tissue Volumes ent://SD_ILS/0/SD_ILS:699263 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Mehryar, Paymon, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11017007">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11017007</a><br/>Format:&#160;Kitap<br/> Development and Evaluation of a Prototype Travel Time Reliability Monitoring System for Freeway Facilities in North Carolina ent://SD_ILS/0/SD_ILS:699382 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Smith, Russell Charles, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11018101">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:11018101</a><br/>Format:&#160;Kitap<br/> Performance-Based Economical Seismic Design of Multistory Reinforced Concrete Frame Buildings and Reliability Assessment ent://SD_ILS/0/SD_ILS:699718 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Zhang, Chunyu, author. (orcid)0000-0002-1073-1902<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13424086">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13424086</a><br/>Format:&#160;Kitap<br/> Characterization of Self-Heating Effects and Assessment of Its Impact on Reliability in FinFET Technology ent://SD_ILS/0/SD_ILS:699635 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Paliwoda, Peter Christopher, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13423034">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13423034</a><br/>Format:&#160;Kitap<br/> Reliability and Validity of the Active-mini for Quantifying Movement in Infants with Spinal Muscular Atrophy ent://SD_ILS/0/SD_ILS:701729 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Nelson, Leslie, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13846799">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13846799</a><br/>Format:&#160;Kitap<br/> Control of Wind Power Systems for Energy Efficiency and Reliability ent://SD_ILS/0/SD_ILS:701767 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Xiao, Yan, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13849196">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13849196</a><br/>Format:&#160;Kitap<br/> Reliability Assessment of a System Integrity Protection Scheme for Transmission Networks ent://SD_ILS/0/SD_ILS:702676 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Liu, Nan, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870347">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870347</a><br/>Format:&#160;Kitap<br/> On Grid Converter Reliability: Preserving the Life of Power Electronics Through Active Thermal Boundary Control ent://SD_ILS/0/SD_ILS:703707 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Lewis, Patrick T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872130">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872130</a><br/>Format:&#160;Kitap<br/> Efficient reliability modelling &amp; analysis of complex systems with application to nuclear power plant safety ent://SD_ILS/0/SD_ILS:704357 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;George-Williams, H., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872865">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872865</a><br/>Format:&#160;Kitap<br/> Energy saving and reliability of wireless body area networks for health applications ent://SD_ILS/0/SD_ILS:704566 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Alshaheen, H. S. S., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873074">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873074</a><br/>Format:&#160;Kitap<br/> Calibration of expensive computer models using engineering reliability methods ent://SD_ILS/0/SD_ILS:705008 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Gong, Zitong, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873517">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13873517</a><br/>Format:&#160;Kitap<br/> Stochastic methods for emulation, calibration and reliability analysis of engineering models ent://SD_ILS/0/SD_ILS:705736 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Garbuno Inigo, A., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13874246">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13874246</a><br/>Format:&#160;Kitap<br/> Reliability analysis for small wind turbines using bayesian hierarchical modelling ent://SD_ILS/0/SD_ILS:706602 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Wu, JenHao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13875114">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13875114</a><br/>Format:&#160;Kitap<br/> Advancements in Evaluating Reliability of Nondestructive Technologies for the Detection of Subsurface Fracture Damage in R.C. Bridge Decks ent://SD_ILS/0/SD_ILS:702601 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Sultan, Ali Abed, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870026">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870026</a><br/>Format:&#160;Kitap<br/> Evaluation of Factors Influencing Los Angeles Tiered-Dispatch System's Improvement on Bystander CPR Rate and Inter Reliability between Electronic Patient Care Report (ePCR) and 911 Call Review on Bystander CPR Rate ent://SD_ILS/0/SD_ILS:698277 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Zhang, Huihui, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10801261">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10801261</a><br/>Format:&#160;Kitap<br/> Target Levels of Reliability for Design of Bridge Foundations and Approach Embankments Using LRFD ent://SD_ILS/0/SD_ILS:702572 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Huaco, Daniel R., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13869883">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13869883</a><br/>Format:&#160;Kitap<br/> Modeling and simulation for microelectronic packaging assembly manufacturing, reliability and testing ent://SD_ILS/0/SD_ILS:986704 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Liu, S. (Sheng), 1963-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=818629">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> The evolution of animal communication reliability and deception in signaling systems ent://SD_ILS/0/SD_ILS:961442 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Searcy, William A., 1950-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=485769">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Adhesives technology for electronic applications : materials, processes, reliability ent://SD_ILS/0/SD_ILS:1190016 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515135">http://www.sciencedirect.com/science/book/9780815515135</a><br/>Format:&#160;Elektronik Kaynak<br/> Graph theory in modern engineering : computer aided design, control, optimization, reliability analysis ent://SD_ILS/0/SD_ILS:1190886 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Henley, Ernest J.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780123408501">https://www.sciencedirect.com/science/book/9780123408501</a> ScienceDirect <a href="https://www.sciencedirect.com/science/publication?issn=00765392&volume=98">https://www.sciencedirect.com/science/publication?issn=00765392&volume=98</a> ScienceDirect <a href="https://www.sciencedirect.com/science/bookseries/00765392/98">https://www.sciencedirect.com/science/bookseries/00765392/98</a><br/>Format:&#160;Elektronik Kaynak<br/> The Reliability of Symphony Link in Emergency Scenarios ent://SD_ILS/0/SD_ILS:689664 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Larson, Anna, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10786579">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10786579</a><br/>Format:&#160;Kitap<br/> Reliability of Highly Stretchable Flexible Electronic Interconnects and Surface Improvement of DMLS Printed Parts ent://SD_ILS/0/SD_ILS:693299 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Zachariah, Ashwin Varkey, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10816881">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10816881</a><br/>Format:&#160;Kitap<br/> Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliability ent://SD_ILS/0/SD_ILS:137551 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Levinson, David M.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format:&#160;Elektronik Kaynak<br/> Applications of Bayesian Hierarchical Models in Gene Expression and Product Reliability ent://SD_ILS/0/SD_ILS:678149 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Mittman, Eric T., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10688357">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10688357</a><br/>Format:&#160;Kitap<br/> Reliability and Resiliency Driven Solutions for Electric Power Systems Operation and Planning ent://SD_ILS/0/SD_ILS:678483 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Sedzro, Kwami Senam A., author. (orcid)0000-0002-2107-8662<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748235">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748235</a><br/>Format:&#160;Kitap<br/> Canadian Matrimonial Litigation Requires Reliability Testing for Unaudited Financial Statements ent://SD_ILS/0/SD_ILS:680872 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Mailloux, Athena, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812640">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812640</a><br/>Format:&#160;Kitap<br/> Reliability of Phenotype Estimation and Extended Classification of Ancestry for Forensic Applications ent://SD_ILS/0/SD_ILS:692398 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Weisz, Naomi A., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10813495">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10813495</a><br/>Format:&#160;Kitap<br/> Test-Retest Reliability of TRIMP and Training Effect in Collegiate Icehockey Players ent://SD_ILS/0/SD_ILS:692530 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ulmer, Jason, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10814025">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10814025</a><br/>Format:&#160;Kitap<br/> The Effect of Overloading on Reliability of Wheel Loader Structural Components ent://SD_ILS/0/SD_ILS:688253 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Achelpohl, Eric Raymond, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10689117">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10689117</a><br/>Format:&#160;Kitap<br/> Reliability Evaluation and Improvement Based on Operational Failure Rate of Power Electronics in Islanded Microgrid ent://SD_ILS/0/SD_ILS:693054 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Zhong, Wen, author. (orcid)0000-0002-5262-5067<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815889">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815889</a><br/>Format:&#160;Kitap<br/> Comparing Offender Characteristics in a Sample of Oklahoma Sexual Assault Cases with Population Demographics in Oklahoma: A Study of the Reliability of a Statistical Profiling Methodology ent://SD_ILS/0/SD_ILS:688170 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Moses, Caitlin, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10685854">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10685854</a><br/>Format:&#160;Kitap<br/> Reliability and Security in Low Power Circuits and Systems ent://SD_ILS/0/SD_ILS:687536 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Geng, Hui, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10186967">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10186967</a><br/>Format:&#160;Kitap<br/> Adhesives technology for electronic applications : materials, processing, reliability ent://SD_ILS/0/SD_ILS:1183801 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format:&#160;Elektronik Kaynak<br/> Evaluating the reliability of emergency response systems for large-scale incident operations ent://SD_ILS/0/SD_ILS:970720 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href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812787">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812787</a><br/>Format:&#160;Kitap<br/> Novel Methods for Improving Performance and Reliability of Flash-Based Solid State Storage System ent://SD_ILS/0/SD_ILS:696360 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Guo, Jiayang, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10891703">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10891703</a><br/>Format:&#160;Kitap<br/> Conditional Standard Errors of Measurement, Confidence Interval, and Reliability for Individual Level Student Growth Percentiles ent://SD_ILS/0/SD_ILS:688003 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Choi, Jinah, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10637021">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10637021</a><br/>Format:&#160;Kitap<br/> Assessing the Validity and Reliability of Computer-based Case Simulations in a Nurse Anesthesia Specialty ent://SD_ILS/0/SD_ILS:688506 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ward, Robyn Camille, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10746481">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10746481</a><br/>Format:&#160;Kitap<br/> Counsel Confidently: Reliability of Bedside Estimated Fetal Weight to Predict Survival at Periviability ent://SD_ILS/0/SD_ILS:688678 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Krenitsky, Nicole M., author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748282">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748282</a><br/>Format:&#160;Kitap<br/> Inter-rater Reliability of Physical Abuse Determinations and Abusive Fracture Incidence at a Level 1 Pediatric Trauma Center ent://SD_ILS/0/SD_ILS:688791 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Buesser, Katherine Elizabeth, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10749089">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10749089</a><br/>Format:&#160;Kitap<br/> Task Relevant Source Based Brain Computer Interface: Exploration of Independent Component Analysis Based Spatial Filtering with Reliability ent://SD_ILS/0/SD_ILS:694038 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Cheema, Maninderpal Singh, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823332">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823332</a><br/>Format:&#160;Kitap<br/> Coating materials for electronic applications : polymers, processes, reliability, testing ent://SD_ILS/0/SD_ILS:1190018 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Licari, James J., 1930-<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815514923">http://www.sciencedirect.com/science/book/9780815514923</a><br/>Format:&#160;Elektronik Kaynak<br/> Human reliability : analysis, prediction, and prevention of human errors ent://SD_ILS/0/SD_ILS:1181820 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Park, Kyung S. (Kyung Soo)<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780444427274">https://www.sciencedirect.com/science/book/9780444427274</a><br/>Format:&#160;Elektronik Kaynak<br/> The elasto-plastic buckling strength of imperfect hemispheres and their reliability ent://SD_ILS/0/SD_ILS:684863 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Shao, Wen Jiao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10868287">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10868287</a><br/>Format:&#160;Kitap<br/> Opto-Electro-Thermal Approach to Modeling Photovoltaic Performance and Reliability from Cell to Module ent://SD_ILS/0/SD_ILS:678426 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Sun, Xingshu, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10747508">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10747508</a><br/>Format:&#160;Kitap<br/> Reliability Modeling, Testing and Optimization of Systems with Mixtures of One-Shot Units ent://SD_ILS/0/SD_ILS:687265 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Cheng, Yao, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902001">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902001</a><br/>Format:&#160;Kitap<br/> Automated Runtime Data Analysis for System Reliability Management ent://SD_ILS/0/SD_ILS:687321 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;He, Pinjia, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902155">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902155</a><br/>Format:&#160;Kitap<br/> Microgrid Reliability Evaluation Based on Condition-Dependent Failure Models of Power Electronic Devices ent://SD_ILS/0/SD_ILS:693027 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Li, Qi, author. (orcid)0000-0001-7329-0991<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815787">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815787</a><br/>Format:&#160;Kitap<br/> Evaluation of the Reliability of Nondestructive Ultrasonic Inspection Methods for the Detection and the Characterization of Defects in Hydroelectric Turbine Welded Joints = &amp;Eacute;valuation de la fiabilit&amp;eacute; des m&amp;eacute;thodes de contr&amp;ocirc;le non destructives par ultrasons pour la d&amp;eacute;tection et la caract&amp;eacute;risation de d&amp;eacute;fauts dans des joints soud&amp;eacute;s de turbines hydro&amp;eacute;lectriques ent://SD_ILS/0/SD_ILS:701380 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Habibzadeh Boukani, Hamid, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13814436">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13814436</a><br/>Format:&#160;Kitap<br/> Evaluation of the Life-Cycle Reliability of Engineered Slopes Utilizing Multi-Source Monitoring Information ent://SD_ILS/0/SD_ILS:696774 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Li, Xueyou, author.<br/><a href="http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903347">http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903347</a><br/>Format:&#160;Kitap<br/> Semiconductor laser engineering, reliability and diagnostics a practical approach to high power and single mode devices ent://SD_ILS/0/SD_ILS:1007840 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Epperlein, Peter W.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1118506">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Aerospace and automotive applications : issues, testing and analysis ent://SD_ILS/0/SD_ILS:1130605 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;El Hami, Abdelkhalak, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=5108518">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Data-Driven Remaining Useful Life Prognosis Techniques Stochastic Models, Methods and Applications ent://SD_ILS/0/SD_ILS:481475 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Si, Xiao-Sheng. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-54030-5">http://dx.doi.org/10.1007/978-3-662-54030-5</a><br/>Format:&#160;Elektronik Kaynak<br/> Total quality management sustainability ent://SD_ILS/0/SD_ILS:931543 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Zairi, Mohamed.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=232302">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Fluid-structure interactions and uncertainties : Ansys and fluent tools ent://SD_ILS/0/SD_ILS:1123903 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;El Hami, Abdelkhalak, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4816334">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Quality and supply chain management : integration challenges and impacts ent://SD_ILS/0/SD_ILS:1110924 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Sampaio, Paulo, editor.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4514356">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Innovative quality management cases ent://SD_ILS/0/SD_ILS:934322 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Iwaarden, Jos van.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=258154">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Best practice quality function deployment (QFD) cases ent://SD_ILS/0/SD_ILS:938550 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=289800">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> The leading edge in quality function deployment ent://SD_ILS/0/SD_ILS:931546 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Hunt, Robert A.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=232305">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Quality improvement with design of experiments : a response surface approach ent://SD_ILS/0/SD_ILS:44696 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Vuchkov, Ivan N.<br/>Format:&#160;Kitap<br/> Quality management and CSR ent://SD_ILS/0/SD_ILS:943545 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Hazlett, Shirley-Ann.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=320627">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Systemic Decision Making Fundamentals for Addressing Problems and Messes ent://SD_ILS/0/SD_ILS:481191 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Hester, Patrick T. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-54672-8">http://dx.doi.org/10.1007/978-3-319-54672-8</a><br/>Format:&#160;Elektronik Kaynak<br/> Corrosion Problems and Solutions in Oil Refining and Petrochemical Industry ent://SD_ILS/0/SD_ILS:480586 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Groysman, Alec. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-45256-2">http://dx.doi.org/10.1007/978-3-319-45256-2</a><br/>Format:&#160;Elektronik Kaynak<br/> Recurrent event modeling based on the Yule process : application to water network asset management ent://SD_ILS/0/SD_ILS:1104760 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Le Gat, Yves, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4205903">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Response modeling methodology empirical modeling for engineering and science ent://SD_ILS/0/SD_ILS:934445 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Shore, Haim.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=259265">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Failure analysis a practical guide for manufacturers of electronic components and systems ent://SD_ILS/0/SD_ILS:975120 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;B&acirc;zu, M. I. (Marius I.), 1948-<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=675196">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> F&uuml;ze aray&#305;c&#305; ba&#351;l&#305;&#287;&#305; i&ccedil;in g&uuml;venilirlik analizi ve g&uuml;venilirlik iyile&#351;tirme &ccedil;al&#305;&#351;mas&#305; ent://SD_ILS/0/SD_ILS:1170315 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;&Ccedil;evik Bak&#305;rl&#305;, Ebru.<br/>Format:&#160;Kitap<br/> Ar&#305;za ve tamir durumunda sistem g&uuml;venilirli&#287;i: genetik ve memetik algoritmalar ent://SD_ILS/0/SD_ILS:1165811 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Uzuner &#350;ahin, Merve.<br/>Format:&#160;Kitap<br/> Hastal&#305;k bili&#351; anketi'nin ge&ccedil;erlik ve g&uuml;venilirli&#287;i ent://SD_ILS/0/SD_ILS:1157649 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Aykul, Ay&#351;eg&uuml;l.<br/>Format:&#160;Kitap<br/> &#304;ki parametreli &uuml;stel da&#287;&#305;l&#305;mda rekor de&#287;erler ile ortak de&#287;i&#351;im katsay&#305;s&#305; ve g&uuml;venirlik tahmin edicileri ent://SD_ILS/0/SD_ILS:1196178 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;B&#305;y&#305;kl&#305;, Nurten.<br/>Format:&#160;Kitap<br/> Ge&ccedil;mi&#351; d&ouml;nem tatmini ve firmaya duyulan g&uuml;venin sat&#305;nalma davran&#305;&#351;&#305; &uuml;zerine etkileri : beyaz e&#351;ya &uuml;zerine Ankara'da bir saha ara&#351;t&#305;rmas&#305; ent://SD_ILS/0/SD_ILS:1160365 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;H&#305;zl&#305;, Dilek.<br/>Format:&#160;Kitap<br/> Y&uuml;ksek gaz bas&#305;n&ccedil; sens&ouml;rlerinin s&#305;cakl&#305;k ve titre&#351;im ko&#351;ullar&#305;nda performans&#305; ve g&uuml;venilirli&#287;inin iyile&#351;tirilmesi ent://SD_ILS/0/SD_ILS:1232876 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Arslan, Yasin, yazar.<br/>Format:&#160;Kitap<br/> Elektro-mekanik akt&uuml;at&ouml;rler i&ccedil;in analitik hiyerar&#351;i prosesi (AHP) kullan&#305;larak g&uuml;venilirlik tabanl&#305; bak&#305;m analizi (RCM) uygulamas&#305; ent://SD_ILS/0/SD_ILS:1156305 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Do&#287;an, Deniz Can.<br/>Format:&#160;Kitap<br/> Pi&#351;irme ve yiyecek haz&#305;rlama becerileri &ouml;l&ccedil;e&#287;inin T&uuml;rk&ccedil;e ge&ccedil;erlik ve g&uuml;venirli&#287;inin incelenmesi ent://SD_ILS/0/SD_ILS:1158847 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Kele&#351;, Gizem.<br/>Format:&#160;Kitap<br/> Hareket korkusu nedenleri &ouml;l&ccedil;e&#287;inin (Kinesiophopia causes scale) T&uuml;rk&ccedil;e uyarlamas&#305;n&#305;n ge&ccedil;erlik ve g&uuml;venilirli&#287;i ent://SD_ILS/0/SD_ILS:1157653 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;&Ccedil;ay&#305;r, Melis.<br/>Format:&#160;Kitap<br/> Stochastic risk analysis and management ent://SD_ILS/0/SD_ILS:1123889 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Harlamov, Boris, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4816215">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Serebral palsili &ccedil;ocuklarda oturma esnas&#305;ndaki foto&#287;rafik post&uuml;r analizinin g&uuml;venilirli&#287;i ve post&uuml;r&uuml;n g&ouml;vde kontrol&uuml; ve kaba motor fonksiyonlar aras&#305;ndaki ili&#351;kisi ent://SD_ILS/0/SD_ILS:1157665 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;&Uuml;nsal, Bet&uuml;l.<br/>Format:&#160;Kitap<br/> Meme kanseri ili&#351;kili lenf&ouml;dem hastalar&#305;nda 'quality of life measure for limb lymphoedema-arm' anketinin T&uuml;rk&ccedil;e ge&ccedil;erlilik ve g&uuml;venilirli&#287;inin ara&#351;t&#305;r&#305;lmas&#305; ent://SD_ILS/0/SD_ILS:1160163 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Kaya, Emine.<br/>Format:&#160;Kitap<br/> New autonomous systems ent://SD_ILS/0/SD_ILS:1109073 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Cardon, Alain, author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=4452676">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> The social roots of risk : producing disasters, promoting resilience ent://SD_ILS/0/SD_ILS:1033920 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Tierney, Kathleen J., author.<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=1731657">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Swans, swine, and swindlers coping with the growing threat of mega-crises and mega-messes ent://SD_ILS/0/SD_ILS:981017 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Alpaslan, Can M. (Can Murat)<br/><a href="https://ebookcentral.proquest.com/lib/baskent-ebooks/detail.action?docID=735411">Click to View</a><br/>Format:&#160;Elektronik Kaynak<br/> Vineland sosyal- duygusal erken &ccedil;ocukluk &ouml;l&ccedil;e&#287;inin ge&ccedil;erlik-g&uuml;venirlik &ccedil;al&#305;&#351;mas&#305; ve okul &ouml;ncesi e&#287;itim kurumuna devam eden be&#351; ya&#351; &ccedil;ocuklar&#305;n&#305;n sosyal-duygusal davran&#305;&#351;lar&#305;na yarat&#305;c&#305; drama e&#287;itiminin etkisinin incelenmesi ent://SD_ILS/0/SD_ILS:1162923 2026-01-22T07:20:39Z 2026-01-22T07:20:39Z by&#160;Ceylan, &#350;ehnaz.<br/>Format:&#160;Kitap<br/>