Cover; Contents; Contributors To Volume 43; Foreword; Chapter 1. Electron Micrograph Analysis by Optical Transforms; I. Introduction; II. Image Formation in an Electron Microscope; III. Optical Processing of Electron Microscopic Data; IV. Applications; References; Chapter 2. Recent Advances in Electron Beam Addressed Memories; I. Introduction; II. Background; III. Storage Media; IV. Surface Charge Storage; V. Bulk Charge Storage; VI. Alternative Storage Media; VII. Electron-Optical Systems; VIII. Beam Memory Systems; References

Chapter 3. Electron Beam as Analytical Tools in Surface Research: LEED and AESI. Introduction; II. Low Energy Electron Diffraction (LEED); III. Auger Electron Spectroscopy (AES); References; Chapter 4. X-Ray Image Intensifiers KIRBY G . VOSBURGH. ROBERT K . SWANK. AND JOHN M . HOUSTON; I. Introduction; II. Input Phosphors; III. Electron Optics; IV. Output Phosphors; V. XRII Performance; VI. Future Trends; Selected Bibliography; References; Author Index; Subject Index