Microelectronics failure analysis desk reference
Başlık:
Microelectronics failure analysis desk reference
Yayın Bilgileri:
Materials Park, Ohio : ASM International, c2011.
Fiziksel Tanımlama:
xi, 660 p. : ill.
İçerik:
section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.
