The physics of SiO₂ and its interfaces : proceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978
Başlık:
The physics of SiO₂ and its interfaces : proceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978
Yazar:
International Topical Conference on the Physics of SiO₂ and Its Interfaces (1978 : Yorktown Heights, N.Y.)