Front Cover; Advances in Electronics and Electron Physics, Volume 62; Copyright Page; Contents; Contributors to Volume 62; Foreword; Chapter 1. Spin-Polarized Electrons in Solid-state Physics; I. Introduction; II. Experimental Techniques; III. Magnetism in Metals; IV. Magnetism in Systems with Localized Magnetic Moments; V. The Symmetry of Electronic States; VI. The Spin Dependence of the Elastic Scattering of Electrons from Solids; VII. Secondary Electrons; VIII. Surface Magnetochemistry; IX. Surface Magnetization Curves; X. Conclusion; References

Chapter 2. Predictions of Deep-Impurity-Level Energies in SemiconductorsI. Introduction; II. What Is a Deep Trap?; III. The Defect Molecule Picture; IV. The Koster-Slater Green's Function Method; V. The Tight-Binding Method; VI. General Theoretical Results; VII. Empirical Trends in Trap-Level Energies of Point Defects; VIII. Empirical Trends in g Factors of Deep Impurities; IX. Predictions; X. Chemical Trends in Transition-Metal Impurities; References; Chapter 3. Recent Advances in the Electron Microscopy of Materials; I. Introduction to Electron Optical Instrumentation

II. Advances in InstrumentationIII. Developments in Imaging in the Electron Microscope; IV. Crystallographic Information in the Electron Microscope; V. Chemical Analysis in the Electron Microscope; VI. Combinations of Techniques; VII. Conclusions; References; Auhtor Index; Subject Index