Half Title; Quantitative Data Processing in Scanning Probe Microscopy; Copyright; CONTENTS; Preface; 1 Motivation; 1.1 Why "Quantitative" Scanning Probe Microscopy?; 1.1.1 Book Organization; 1.1.2 Available Numerical Techniques; 1.2 What is Scanning Probe Microscopy?; 1.3 Basic Metrology Concepts; 1.3.1 Measurement Traceability; 1.3.2 Measurement Uncertainty; 1.4 Scanning Probe Microscopy and Quantitative Measurements; References; 2 Instrumentation Principles; 2.1 Few Components for the Price of a House?; 2.1.1 Scanner; 2.1.2 Probe; 2.1.3 Interaction Sensing Element & Feedback Loop.

2.1.4 Electronics2.1.5 Vibration Isolation; 2.2 Novel Approaches; 2.2.1 More Accurate Instruments; 2.2.2 Larger Range Measurements; 2.2.3 Faster Measurements; References; 3 Data Models; 3.1 From Analog to Digital; 3.2 Data Acquisition Basics; 3.2.1 Data Sampling; 3.2.2 Feedback Loop Effects; 3.3 Image Sampling; 3.3.1 Regular Sampling; 3.3.2 Irregular Sampling; 3.4 Data Storage; 3.5 Mechanical and Thermal Drifts; 3.6 Noise; 3.7 Try it Yourself; 3.8 Tips and Tricks; References; 4 Basic Data Processing*; 4.1 A Daily Bread?; 4.1.1 Gwyddion; 4.2 Data Visualization; 4.3 Local Data Manipulation.

4.3.1 Outliers4.3.2 Scars; 4.4 Global Data Manipulation; 4.4.1 Resampling and Interpolation; 4.4.2 Data Leveling and Background Extraction; 4.4.3 Fourier Transform Filtering; 4.4.4 Wavelet Filtering; 4.5 Multiple Channel Operations; 4.6 Scripting; 4.7 Data Generation; 4.8 Other Freely Available Data Processing Software; 4.8.1 GXSM; 4.8.2 WSxM; 4.9 Try it Yourself; 4.9.1 Read More; 4.10 Tips and Tricks; References; 5 Dimensional Measurements*; 5.1 The Easiest Measurement?; 5.2 Atomic Force Microscopy Principles; 5.2.1 Contact Mode; 5.2.2 Dynamic Modes; Amplitude Modulated AFM.

Frequency Modulated AFM5.3 Atomic Force Microscopy Dimensional Data Measurement and Evaluation; 5.3.1 Direct Dimensional Quantities; 5.3.2 Statistical Quantities; Probability Distribution of Heights and Angles; Autocorrelation Function; Height-height Correlation Function; Power Spectral Density Function; Fractal Dimension; Grain and Particle Analysis; Other Two Dimensional Statistical Functions; 5.4 Atomic Force Microscopy and Quantitative Dimensional Metrology; 5.4.1 International Documentary Standards for Scanning Probe Microscopy; 5.4.2 Dimensional Calibrations by Scanning Probe Microscope.

5.4.3 Ensuring Traceability: Transfer Standards for Scanning Probe Microscopes5.4.4 Calibration of the Vertical Axis with Step Height Standards; 5.4.5 Calibration of the Two Lateral Axes with Lateral Standards; 5.4.6 Alternative Calibration of all Three Axes with 3D Pyramidal Standards; 5.4.7 Uncertainties in Dimensional Measurements; 5.4.8 Positioning System Systematic Errors; 5.4.9 Positioning System Short and Long Time Instability; 5.4.10 Tip-Sample Convolution Effects; Tip Shape Estimation; Tip Influence on Direct Measurements; Tip Influence on Statistical Quantities; 5.5 Try it Yourself.