Transmission electron microscopy in micro-nanoelectronics
Başlık:
Transmission electron microscopy in micro-nanoelectronics
Yazar:
Claverie, A. (Alain)
Yayın Bilgileri:
Hoboken, N.J. : John Wiley &Sons, Inc., ; London : ISTE, 2013.
Fiziksel Tanımlama:
xiii, 243 p. : ill.
Seri:
Nanoscience and nanotechnology series