Defects and Dynamics in Block Copolymer Thin Films: A Study of Polymer Pattern Evolution with Environmentally-Controlled Atomic Force Microscopy
Başlık:
Defects and Dynamics in Block Copolymer Thin Films: A Study of Polymer Pattern Evolution with Environmentally-Controlled Atomic Force Microscopy
Yazar:
Raybin, Jonathan G., author. (orcid)0000-0001-9040-4241
Fiziksel Tanımlama:
1 electronic resource (173 pages)
Genel Not:
Source: Dissertation Abstracts International, Volume: 80-08(E), Section: B.
Advisors: Steven J. Sibener Committee members: Ka Yee C. Lee; Andrei Tokmakoff.
Notlar:
School code: 0330