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Advances in imaging and electron physics. Volume 125
Başlık:
Advances in imaging and electron physics. Volume 125
Yazar:
Hawkes, P. W.
ISBN:
9780080522241
9780120147670
9781281020642
9786611020644
Yayın Bilgileri:
Amsterdam ; Boston : Academic Press, ©2002.
Fiziksel Tanımlama:
1 online resource (xvi, 426 pages) : illustrations.
Seri:
Advances in imaging and electron physics ; 125
İçerik:
Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Contributors; Preface; Future Contributions; Chapter 1. An Algebraic Approach to Subband Signal Processing; I. Introduction; II. An Overview of Recursive Matrices; III. Recursive Operators of Filter Theory; IV. More Algebraic Results; V. Analysis and Synthesis Filter Banks; VI. M-Channel Filter Bank Systems; VII. Transmultiplexers; VIII. The M-Band Lifting; IX. Conclusion; References; Chapter 2. Determining the Locations of Chemical Species in Ordered Compounds: ALCHEMI; I. Background; II. Fundamentals
III. ALCHEMI ResultsIV. Predicting Sublattice Occupancies; V. Competing (or Supplementary) Techniques; VI. Summary; VII. Current Challenges and Future Directions (a Personal View); References; Chapter 3.Aspects of Mathematical Morphology; I. Introduction; II. Integral Geometry: Theory; III. Integral Geometry in Practice; IV. Illustrative Examples; V. Computer Tomography Images of Metal Foams; VI. Summary; Appendix A: Algorithm; Appendix B: Programming Example (Fortran 90); Appendix C: Derivation of Eq. (36); Appendix D: Proof of Eq. (56); Appendix E: Proof of Eq. (57); References
Appendix B. Gallager Codes: Technical DetailsAppendix C. MN Codes: Technical Details; References; Chapter 6.Computer-Aided Crystallographic Analysis in the TEM; I. Introduction; II. Electron Diffraction and Diffraction Contrast; III. A Universal Procedure for Orientation Determination from Electron Diffraction Patterns; IV. Automation of Orientation Determination in TEM; V. Characterization of Grain Boundaries; VI. Determination of Slip Systems; VII. Phase and Lattice Parameter Determination; VIII. Calibration; IX. Conclusions; References; Index
Özet:
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles onthe physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Elektronik Erişim:
ScienceDirect http://www.sciencedirect.com/science/book/9780120147670Mevcut:*
Yer Numarası | Demirbaş Numarası | Shelf Location | Lokasyon / Statüsü / İade Tarihi |
|---|---|---|---|
| QC793.5 .E62 A38 EB VOL. 125 | 1188837-1001 | Elsevier E-Kitap Koleksiyonu | Arıyor... |
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