![](/client/images/blank.gif)
Eylem Seç
![Carrier Scattering and Localization in nm-thick Al/Ru, Al/Co and Al/Mo Superlattices için kapak resmi Carrier Scattering and Localization in nm-thick Al/Ru, Al/Co and Al/Mo Superlattices için kapak resmi](/client/assets/d79c3e4af2b6d196/ctx/images/no_image.png)
Carrier Scattering and Localization in nm-thick Al/Ru, Al/Co and Al/Mo Superlattices
Başlık:
Carrier Scattering and Localization in nm-thick Al/Ru, Al/Co and Al/Mo Superlattices
Yazar:
Zhang, Yanli, author.
ISBN:
9780438010550
Yazar Ek Girişi:
Fiziksel Tanımlama:
1 electronic resource (79 pages)
Genel Not:
Source: Dissertation Abstracts International, Volume: 79-10(E), Section: B.
Advisors: T. S. Kuan Committee members: J. A. Ernst; J. C. Kimball; W. A. Lanford; G.-C. Wang.
Özet:
Thin films and superlattices are widely used in modern technologies. Certain metal superlattices with layer thickness between 1 to 10 nm have interesting magneto transport properties and unique applications in spintronics and data storage. We have studied electrical conductance of Al/Ru, Al/Co, and Al/Mo superlattices with layer thickness between 1 to 2 nm. By monitoring the resistance change during the growth of the superlattice, we are able to observe directly the effects of carrier localization and scattering when a highly disordered interface is being deposited.
We have observed a significant conductance drop when a transition metal layer is deposited on Al, suggesting a strong localization of Al carriers at the newly created interface. When Al is deposited on a transition metal, the rise of conductance with Al thickness is significantly delayed, indicating that carriers from the growing Al layer are filling the localized states at the new interface. No carriers from the transition metal are observed to be localized at the interface. Our measurements indicate the strongest localization occurs at the Ru/Al interface, followed by the Co/Al and Mo/Al interfaces. The Al/Ru, Al/Co and Al/Mo interfaces exhibit much weaker localization. Using Fuchs' formula, we can also determine the carrier mean free path within each layer.
The abruptness and smoothness of the interfaces are evaluated by atomic force microscopy (AFM), which indicates that surface roughness of our superlattices is within one to two monolayers. Post-growth annealing shows that species intermixing at the interface only happens at temperatures higher than 150°.
Notlar:
School code: 0668
Konu Başlığı:
Tüzel Kişi Ek Girişi:
Mevcut:*
Yer Numarası | Demirbaş Numarası | Shelf Location | Lokasyon / Statüsü / İade Tarihi |
---|---|---|---|
XX(680838.1) | 680838-1001 | Proquest E-Tez Koleksiyonu | Arıyor... |
On Order
Liste seç
Bunu varsayılan liste yap.
Öğeler başarıyla eklendi
Öğeler eklenirken hata oldu. Lütfen tekrar deneyiniz.
:
Select An Item
Data usage warning: You will receive one text message for each title you selected.
Standard text messaging rates apply.