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A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy
Başlık:
A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy
Yazar:
Lee, Jonathan Marriel, author.
ISBN:
9780438023468
Yazar Ek Girişi:
Fiziksel Tanımlama:
1 electronic resource (74 pages)
Genel Not:
Source: Masters Abstracts International, Volume: 57-06M(E).
Advisors: Da-Ming Zhu Committee members: Wai-Yim Ching; Paul Rulis.
Özet:
A current sensing atomic force miscroscope was employed to find simultaneous force-distance and current-distance curves for the ionic liquid EMI TFSI on HOPG. These current curves, found at various voltage biases were converted to find conductance- distance curves. The conductance curves were analyzed to see the cantilever, HOPG surface and ions in EMI TFSI act with a capacitor like behavior. Calculations for the capacitance and energy stored are included. Derivations for the jump off force for a tip, sample system in a liquid enviornment with potential difference have been performed. These formulas for the jump off forces have been evaluated and compared with the experimental jump off forces.
Notlar:
School code: 0134
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Yer Numarası | Demirbaş Numarası | Shelf Location | Lokasyon / Statüsü / İade Tarihi |
---|---|---|---|
XX(693612.1) | 693612-1001 | Proquest E-Tez Koleksiyonu | Arıyor... |
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