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Characterization of Self-Heating Effects and Assessment of Its Impact on Reliability in FinFET Technology
Başlık:
Characterization of Self-Heating Effects and Assessment of Its Impact on Reliability in FinFET Technology
Yazar:
Paliwoda, Peter Christopher, author.
Fiziksel Tanımlama:
1 electronic resource (127 pages)
Genel Not:
Source: Dissertation Abstracts International, Volume: 80-08(E), Section: B.
Advisors: Durgamadhab Misra; Zakariae Chbili Committee members: Andreas Kerber; Hieu Nguyen; Marek Sosnowski; Leonid Tsybeskov.
Notlar:
School code: 0152