Search ResultsElektronik Kaynaklar
Arama Sonuçlarını Sınırlandır
Yazar
Electronic Device Failure Analysis Society.
(2)
Hanaizumi, Osamu.
(2)
Hartmann, Heidi I.
(2)
Kraut, Robert E.
(2)
National Research Council (U.S.). Committee on Women's Employment and Related Social Issues. Panel on Technology and Women's Employment.
(2)
Materyal Türü
Dil
Yayın Yılı
-
Konu
Electronic books.
(29)
Microelectronics.
(9)
Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc.
(3)
Electronics -- Materials -- Testing -- Handbooks, manuals, etc.
(3)
Microelectronics -- Congresses.
(3)
Kütüphane
Lokasyon
Liste görünümüne geç
Küçük resim görünümüne geç
Eylem Seç
29 sonuç bulundu Arama sonuçlarına abone ol
000000000000DEFAULTTR
Yazdır
Liste seç
Bunu varsayılan liste yap.
Öğeler başarıyla eklendi
    Öğeler eklenirken hata oldu. Lütfen tekrar deneyiniz.
      Introduction to the physics of nanoelectronics için kapak resmi
      13. 
      Introduction to the physics of nanoelectronics
      by 
      Tan, Seng Ghee.
      Click to View
      Format: 
      Alıntı: 
      Microelectronics.
      System-level design with Rosetta için kapak resmi
      14. 
      System-level design with Rosetta
      by 
      Alexander, Perry.
      Click to View
      Format: 
      Alıntı: 
      Microelectronics.
      Case studies and policy perspectives technology and women's employment için kapak resmi
      15. 
      Case studies and policy perspectives technology and women's employment
      by 
      National Research Council (U.S.). Committee on Women's Employment and Related Social Issues. Panel on Technology and Women's Employment.
      Click to View
      Format: 
      Alıntı: 
      Microelectronics -- Social aspects.
      Atomic layer deposition principles, characteristics, and nanotechnology applications için kapak resmi
      16. 
      Silicon science and advanced micro-device engineering II selected, peer reviewed papers from the 6th International Symposium on Silicon Science and 2nd International Conference on Advanced Micro-Device Engineering (ISSS&AMDE 2010), December 9-10, 2010, Kiryu City Performing Arts Center, Kiryu, Japan için kapak resmi
      17. 
      Silicon science and advanced micro-device engineering I selected, peer reviewed papers from the 5th International Symposium on Silicon Science and the 1st International Conference on Advanced Micro-Device Engineering (ISSS & AMDE 2009), was held by the International Education and Research Center for Silicon Science and the Advanced Technology Research Center (ATEC), Gunma University on 10 and 11 December 2009 in Kiryu, Japan için kapak resmi
      18. 
      ESD basics from semiconductor manufacturing to use için kapak resmi
      19. 
      ESD basics from semiconductor manufacturing to use
      by 
      Voldman, Steven H.
      Click to View
      Format: 
      Alıntı: 
      Microelectronics.
      Digital holography for MEMS and microsystem metrology için kapak resmi
      20. 
      Digital holography for MEMS and microsystem metrology
      by 
      Asundi, Anand.
      Click to View
      Format: 
      Alıntı: 
      Microelectronics -- Measurement.
      Low-k nanoporous interdielectrics materials, thin film fabrications, structures and properties için kapak resmi
      21. 
      The PIC microcontroller your personal introductory course için kapak resmi
      22. 
      The PIC microcontroller your personal introductory course
      by 
      Morton, John, 1980-
      Click to View
      Format: 
      Alıntı: 
      Microelectronics.
      Crisis and innovation in Asian technology için kapak resmi
      23. 
      Crisis and innovation in Asian technology
      by 
      Keller, William W. (William Walton), 1950-
      Click to View
      Format: 
      Alıntı: 
      Microelectronics industry -- Southeast Asia.
      Microelectronic failure analysis desk reference. 2002 supplement için kapak resmi
      24. 
      Microelectronic failure analysis desk reference. 2002 supplement
      by 
      Electronic Device Failure Analysis Society.
      Click to View
      Format: 
      Alıntı: 
      Microelectronics -- Materials -- Defects -- Handbooks, manuals, etc.