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      by 
      Birolini, Alessandro. author.
      Format: 
      Alıntı: 
      (RAMS) of components, equipment, and systems. It presents the state-of-the-art of reliability (RAMS
      by 
      Baschirotto, Andrea. editor.
      Format: 
      Alıntı: 
      electronics, and power management. This book serves as a valuable reference to the state-of-the-art, for
      by 
      Sklavos, Nicolas. editor.
      Format: 
      Alıntı: 
      AES Datapaths on FPGAs: a State of the Art Analysis -- Fault Attacks, Injection Techniques and
      by 
      Angelakis, Vangelis. editor.
      Format: 
      Alıntı: 
      . The book addresses the wide range of topics present in the design, development and running of smart
      by 
      Li, Yan. editor.
      Format: 
      Alıntı: 
      development. Provides comprehensive coverage of the state-of-the-art in 3D microelectronic packages Covers
      by 
      Pelgrom, Marcel. author.
      Format: 
      Alıntı: 
      generation, nyquist architectures and sigma-delta modulation. This book presents an overview of the state of
      by 
      Semmlow, John L.
      Format: 
      Alıntı: 
      Transformations; Analog Analysis in Sinusoidal Steady State; Analysis of Analog Models and Processes; Transfer and
      by 
      Hawkes, P. W.
      Format: 
      Alıntı: 
      Images; I. Introduction; II. Strain-State Analysis; III. Composition Evaluation by Lattice Fringe
      by 
      Marton, L. (Ladislaus), 1901-
      Format: 
      Alıntı: 
      IV. The Paramagnetic Two-Level Solid State MaserV. The Three-Level Solid State Cavity Maser; VI
      by 
      Marton, L. (Ladislaus), 1901-
      Format: 
      Alıntı: 
      Theory of the Magnetron; I. Introduction; II. The Fundamental Equations for the Steady State; III. The
      by 
      Rigatos, Gerasimos G. author.
      Format: 
      Alıntı: 
      application of state-space models in financial engineering means that the heuristics and empirical methods
      by 
      Morgan, B. L. (Brian Lealan), 1940-
      Format: 
      Alıntı: 
      Chapter 20. The Evaluation of Silicon CCDs for Imaging X-Ray Spectroscopy in the Range 1 to 8