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University of Glasgow (United Kingdom). Department of Electronics and Electrical Engineering. degree granting institution.

(5)

The University of Wisconsin - Milwaukee. Engineering. degree granting institution.

(3)

Iowa State University. Electrical and Computer Engineering. degree granting institution.

(2)

Massachusetts Institute of Technology. degree granting institution.

(2)

The University of Manchester (United Kingdom). Department of Electrical Engineering and Electronics. degree granting institution.

(2)

Abushaiba, Ali Abdalla, author. (orcid)0000-0001-8114-8979

(1)

Ameen, Yashwant K., author.

(1)

Bhattacharyya, Debabrata, author.

(1)

Calderon, Brian Rene, author. (orcid)0000-0002-4089-8535

(1)

Chang, C. C., author.

(1)

Chen, Fan, author.

(1)

Chen, Song, author.

(1)

Columbia University. Electrical Engineering. degree granting institution.

(1)

Cornell University. Electrical & Computer Engineering. degree granting institution.

(1)

Cornell University. Electrical & Computer Engrng. degree granting institution.

(1)

Craig, Victoria, author.

(1)

Dartmouth College. Engineering. degree granting institution.

(1)

Dickason, Jonathan, author.

(1)

Dou, Wei, author.

(1)

Eddie, Iain Mackenzie, author.

(1)

Gaffar, Md Abdul, author.

(1)

Hau, William, author.

(1)

Hong Kong University of Science and Technology (Hong Kong). degree granting institution.

(1)

Hopper, Matthew S., author.

(1)

Illinois Institute of Technology. Electrical and Computer Engineering. degree granting institution.

(1)

Jiang, Chen, author. (orcid)0000-0002-6474-8400

(1)

Kan, Tianze, author.

(1)

Kankipati, J. V. M. S. Avinash, author.

(1)

Karisan, Yasir, author.

(1)

Kim, Min Ku, author.

(1)

Lewis, Patrick T., author.

(1)

Li, Kan, author. (orcid)0000-0003-4864-3446

(1)

Li, Qi, author. (orcid)0000-0001-7329-0991

(1)

Liu, Tianjiao, author.

(1)

Missouri University of Science and Technology. Mechanical Engineering. degree granting institution.

(1)

Modtland, Brian Joseph, author.

(1)

Nevarez, Jairo, author.

(1)

Northwestern University. Theoretical and Applied Mechanics. degree granting institution.

(1)

Piedra, Daniel, author.

(1)

Purdue University. Electrical and Computer Engineering. degree granting institution.

(1)

Purdue University. Mechanical Engineering. degree granting institution.

(1)

Purdue University. Physics and Astronomy. degree granting institution.

(1)

Ramadan, Mohamed Mahmoud, author.

(1)

Sarma, Rana Ranjit, author.

(1)

Shah, Krushal S., author.

(1)

Shah, Satvik, author.

(1)

Sun, Xingshu, author.

(1)

The Ohio State University. Electrical and Computer Engineering. degree granting institution.

(1)

The University of Manchester (United Kingdom). Electrical Engineering and Electronics. degree granting institution.

(1)

The University of Manchester (United Kingdom). School of Electrical and Electronics Engineering. degree granting institution.

(1)

The University of Toledo. Engineering. degree granting institution.

(1)

Tien, Kevin, author.

(1)

University of Arkansas. Electrical Engineering. degree granting institution.

(1)

University of California, San Diego. Engineering Sciences (ElecCompEng) Jt Doc SDSU. degree granting institution.

(1)

University of Delaware. Electrical and Computer Engineering. degree granting institution.

(1)

University of Kansas. Electrical Engineering & Computer Science. degree granting institution.

(1)

University of Pittsburgh. Electrical and Computer Engineering. degree granting institution.

(1)

University of South Florida. Electrical Engineering. degree granting institution.

(1)

Uppal, Hasan Javed, author.

(1)

Western Carolina University. Engineering and Engineering Technology. degree granting institution.

(1)

Zhang, Jian, author.

(1)

Zhong, Wen, author. (orcid)0000-0002-5262-5067

(1)

Ören, Seval, author. (orcid)0000-0002-4173-2633

(1)

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Heterogeneous Integration in Switchmode Electronics için kapak resmi

Heterogeneous Integration in Switchmode Electronics

1.

Heterogeneous Integration in Switchmode Electronics

by

Tien, Kevin, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13812357

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Heterogeneous Integration in Switchmode Electronics / Tien, Kevin, author.

Boron Nitride Growth and Electronics için kapak resmi

Boron Nitride Growth and Electronics

2.

Boron Nitride Growth and Electronics

by

Calderon, Brian Rene, author. (orcid)0000-0002-4089-8535

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10687068

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Boron Nitride Growth and Electronics / Calderon, Brian Rene, author. (orcid)0000-0002-4089-8535

Mechanical Design and Analysis of Three-Dimensional (3D) Assembly, with Applications on Wearable Electronics, Thermo-Electric Energy Harvester and Microflyer için kapak resmi

Mechanical Design and Analysis of Three-Dimensional (3D) Assembly, with Applications on Wearable Electronics, Thermo-Electric Energy Harvester and Microflyer

3.

Mechanical Design and Analysis of Three-Dimensional (3D) Assembly, with Applications on Wearable Electronics, Thermo-Electric Energy Harvester and Microflyer

by

Li, Kan, author. (orcid)0000-0003-4864-3446

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13427035

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Alıntı:

Electronics, Thermo-Electric Energy Harvester and Microflyer / Li, Kan, author. (orcid)0000-0003-4864-3446

On Grid Converter Reliability: Preserving the Life of Power Electronics Through Active Thermal Boundary Control için kapak resmi

On Grid Converter Reliability: Preserving the Life of Power Electronics Through Active Thermal Boundary Control

4.

On Grid Converter Reliability: Preserving the Life of Power Electronics Through Active Thermal Boundary Control

by

Lewis, Patrick T., author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872130

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Alıntı:

On Grid Converter Reliability: Preserving the Life of Power Electronics Through Active Thermal

Stretchable Thin-film Electronics for Wearable Biomedical Applications için kapak resmi

Stretchable Thin-film Electronics for Wearable Biomedical Applications

5.

Stretchable Thin-film Electronics for Wearable Biomedical Applications

by

Kim, Min Ku, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10793381

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Alıntı:

Stretchable Thin-film Electronics for Wearable Biomedical Applications / Kim, Min Ku, author.

Reliability Evaluation and Improvement Based on Operational Failure Rate of Power Electronics in Islanded Microgrid için kapak resmi

Reliability Evaluation and Improvement Based on Operational Failure Rate of Power Electronics in Islanded Microgrid

6.

Reliability Evaluation and Improvement Based on Operational Failure Rate of Power Electronics in Islanded Microgrid

by

Zhong, Wen, author. (orcid)0000-0002-5262-5067

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815889

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Reliability Evaluation and Improvement Based on Operational Failure Rate of Power Electronics in

Silicon Terahertz Electronics: Circuits and Systems for Future Applications için kapak resmi

Silicon Terahertz Electronics: Circuits and Systems for Future Applications

7.

Silicon Terahertz Electronics: Circuits and Systems for Future Applications

by

Jiang, Chen, author. (orcid)0000-0002-6474-8400

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10744554

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Silicon Terahertz Electronics: Circuits and Systems for Future Applications / Jiang, Chen, author

Nanoscale Performance, Degradation and Defect Analysis of MOS Devices Using High-kappa Dielectric Materials as Gate Stacks by Atomic Force Microscopy için kapak resmi

Nanoscale Performance, Degradation and Defect Analysis of MOS Devices Using High-kappa Dielectric Materials as Gate Stacks by Atomic Force Microscopy

8.

Nanoscale Performance, Degradation and Defect Analysis of MOS Devices Using High-kappa Dielectric Materials as Gate Stacks by Atomic Force Microscopy

by

Uppal, Hasan Javed, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870501

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Alıntı:

The University of Manchester (United Kingdom). School of Electrical and Electronics Engineering

A Study of Noise and Vibration Produced by Polyphase Induction Motors için kapak resmi

A Study of Noise and Vibration Produced by Polyphase Induction Motors

9.

A Study of Noise and Vibration Produced by Polyphase Induction Motors

by

Ramadan, Mohamed Mahmoud, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872297

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Alıntı:

The University of Manchester (United Kingdom). Department of Electrical Engineering and Electronics

Critical Current of Type-II Superconductors in Transverse Magnetic Fields için kapak resmi

Critical Current of Type-II Superconductors in Transverse Magnetic Fields

10.

Critical Current of Type-II Superconductors in Transverse Magnetic Fields

by

Chang, C. C., author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13871130

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Alıntı:

The University of Manchester (United Kingdom). Department of Electrical Engineering and Electronics

Thyristor-Commutation of A.C. Machines için kapak resmi

Thyristor-Commutation of A.C. Machines

11.

Thyristor-Commutation of A.C. Machines

by

Sarma, Rana Ranjit, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870585

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Alıntı:

The University of Manchester (United Kingdom). Electrical Engineering and Electronics. degree

Fabrication and DC characterisation of InP and InGaP heterojunction bipolar transistors için kapak resmi

Fabrication and DC characterisation of InP and InGaP heterojunction bipolar transistors

12.

Fabrication and DC characterisation of InP and InGaP heterojunction bipolar transistors

by

Craig, Victoria, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10867945

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University of Glasgow (United Kingdom). Department of Electronics and Electrical Engineering

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