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California State University, Long Beach. Electrical Engineering. degree granting institution.

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Semiconductor packaging materials interaction and reliability için kapak resmi

Semiconductor packaging materials interaction and reliability

1.

Semiconductor packaging materials interaction and reliability

by

Chen, Andrea.

Format:

Alıntı:

Semiconductor packaging materials interaction and reliability / Chen, Andrea.

Control of Wind Power Systems for Energy Efficiency and Reliability için kapak resmi

Control of Wind Power Systems for Energy Efficiency and Reliability

2.

Control of Wind Power Systems for Energy Efficiency and Reliability

by

Xiao, Yan, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13849196

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Alıntı:

Control of Wind Power Systems for Energy Efficiency and Reliability / Xiao, Yan, author.

Reliability Assessment of a System Integrity Protection Scheme for Transmission Networks için kapak resmi

Reliability Assessment of a System Integrity Protection Scheme for Transmission Networks

3.

Reliability Assessment of a System Integrity Protection Scheme for Transmission Networks

by

Liu, Nan, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870347

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Reliability Assessment of a System Integrity Protection Scheme for Transmission Networks / Liu, Nan

On Grid Converter Reliability: Preserving the Life of Power Electronics Through Active Thermal Boundary Control için kapak resmi

On Grid Converter Reliability: Preserving the Life of Power Electronics Through Active Thermal Boundary Control

4.

On Grid Converter Reliability: Preserving the Life of Power Electronics Through Active Thermal Boundary Control

by

Lewis, Patrick T., author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13872130

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Alıntı:

On Grid Converter Reliability: Preserving the Life of Power Electronics Through Active Thermal

Characterization of Self-Heating Effects and Assessment of Its Impact on Reliability in FinFET Technology için kapak resmi

Characterization of Self-Heating Effects and Assessment of Its Impact on Reliability in FinFET Technology

5.

Characterization of Self-Heating Effects and Assessment of Its Impact on Reliability in FinFET Technology

by

Paliwoda, Peter Christopher, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13423034

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Alıntı:

Characterization of Self-Heating Effects and Assessment of Its Impact on Reliability in FinFET

Reliability and Resiliency Driven Solutions for Electric Power Systems Operation and Planning için kapak resmi

Reliability and Resiliency Driven Solutions for Electric Power Systems Operation and Planning

6.

Reliability and Resiliency Driven Solutions for Electric Power Systems Operation and Planning

by

Sedzro, Kwami Senam A., author. (orcid)0000-0002-2107-8662

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10748235

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Alıntı:

Reliability and Resiliency Driven Solutions for Electric Power Systems Operation and Planning /

Reliability Evaluation and Improvement Based on Operational Failure Rate of Power Electronics in Islanded Microgrid için kapak resmi

Reliability Evaluation and Improvement Based on Operational Failure Rate of Power Electronics in Islanded Microgrid

7.

Reliability Evaluation and Improvement Based on Operational Failure Rate of Power Electronics in Islanded Microgrid

by

Zhong, Wen, author. (orcid)0000-0002-5262-5067

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815889

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Alıntı:

Reliability Evaluation and Improvement Based on Operational Failure Rate of Power Electronics in

Task Relevant Source Based Brain Computer Interface: Exploration of Independent Component Analysis Based Spatial Filtering with Reliability için kapak resmi

Task Relevant Source Based Brain Computer Interface: Exploration of Independent Component Analysis Based Spatial Filtering with Reliability

8.

Task Relevant Source Based Brain Computer Interface: Exploration of Independent Component Analysis Based Spatial Filtering with Reliability

by

Cheema, Maninderpal Singh, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823332

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Based Spatial Filtering with Reliability / Cheema, Maninderpal Singh, author.

Opto-Electro-Thermal Approach to Modeling Photovoltaic Performance and Reliability from Cell to Module için kapak resmi

Opto-Electro-Thermal Approach to Modeling Photovoltaic Performance and Reliability from Cell to Module

9.

Opto-Electro-Thermal Approach to Modeling Photovoltaic Performance and Reliability from Cell to Module

by

Sun, Xingshu, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10747508

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Alıntı:

Opto-Electro-Thermal Approach to Modeling Photovoltaic Performance and Reliability from Cell to

Microgrid Reliability Evaluation Based on Condition-Dependent Failure Models of Power Electronic Devices için kapak resmi

Microgrid Reliability Evaluation Based on Condition-Dependent Failure Models of Power Electronic Devices

10.

Microgrid Reliability Evaluation Based on Condition-Dependent Failure Models of Power Electronic Devices

by

Li, Qi, author. (orcid)0000-0001-7329-0991

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815787

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Alıntı:

Microgrid Reliability Evaluation Based on Condition-Dependent Failure Models of Power Electronic

New methods to engineer and seamlessly reconfigure time triggered Ethernet based systems during runtime based on the PROFINET IRT example için kapak resmi

New methods to engineer and seamlessly reconfigure time triggered Ethernet based systems during runtime based on the PROFINET IRT example

11.

New methods to engineer and seamlessly reconfigure time triggered Ethernet based systems during runtime based on the PROFINET IRT example

by

Wisniewski, Lukasz. author.

http://dx.doi.org/10.1007/978-3-662-54650-5

Format:

Alıntı:

Performance and Reliability.

Strategic Engineering for Cloud Computing and Big Data Analytics için kapak resmi

Strategic Engineering for Cloud Computing and Big Data Analytics

12.

Strategic Engineering for Cloud Computing and Big Data Analytics

by

Hosseinian-Far, Amin. editor.

http://dx.doi.org/10.1007/978-3-319-52491-7

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Alıntı:

Quality Control, Reliability, Safety and Risk.

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